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All sourcesNASA NTRSDOE OSTI
NASA NTRS1988

A nonparametric software reliability growth model

Miller and Sofer have presented a nonparametric method for estimating the failure rate of a software program. The method is based on the complete monotonicity property of the failure rate function, and uses a regression approach to obtain estimates of the current software failure rate. This completely monotone software model is extended. It is shown how it can also provide long-range predictions of future reliability growth. Preliminary testing indicates that the method is competitive with parametric approaches, while being more robust.

Miller, Douglas R.↗
NASA NTRS1999

Human Reliability Analysis: An Overview

Human/process error is potentially a large contributor to failures of aerospace systems. For some systems, such as the space shuttle main engine, large amounts of data are available, and accurate failure rates can be determined empirically. For such systems, the human error is implicit in the empirical failure rate and does not need to be quantified separately. However, for other systems, such as the solid rocket boosters, large amounts of data are not available and the failure rates must be determined by more theoretical means. When empirical data is lacking, structural models and engineering judgment must be employed. In this case, the human/process error must be modeled explicitly. An extensive literature review was performed to determine what methods already exist for modeling human error for aerospace systems. No methods that apply directly were found, although there are a number of methods that have been developed specifically for the nuclear power industry that could probably be modified for space applications. The results of the literature review are presented, as well as recommendations for future research.

Navard, Sharon E.↗
NASA NTRS2014

Reliability Growth in Space Life Support Systems

A hardware system's failure rate often increases over time due to wear and aging, but not always. Some systems instead show reliability growth, a decreasing failure rate with time, due to effective failure analysis and remedial hardware upgrades. Reliability grows when failure causes are removed by improved design. A mathematical reliability growth model allows the reliability growth rate to be computed from the failure data. The space shuttle was extensively maintained, refurbished, and upgraded after each flight and it experienced significant reliability growth during its operational life. In contrast, the International Space Station (ISS) is much more difficult to maintain and upgrade and its failure rate has been constant over time. The ISS Carbon Dioxide Removal Assembly (CDRA) reliability has slightly decreased. Failures on ISS and with the ISS CDRA continue to be a challenge.

life support↗
NASA NTRS1996

Proportional and scale change models to project failures of mechanical components with applications to space station

In this paper we develop the mathematical theory of proportional and scale change models to perform reliability analysis. The results obtained will be applied for the Reaction Control System (RCS) thruster valves on an orbiter. With the advent of extended EVA's associated with PROX OPS (ISSA & MIR), and docking, the loss of a thruster valve now takes on an expanded safety significance. Previous studies assume a homogeneous population of components with each component having the same failure rate. However, as various components experience different stresses and are exposed to different environments, their failure rates change with time. In this paper we model the reliability of a thruster valves by treating these valves as a censored repairable system. The model for each valve will take the form of a nonhomogeneous process with the intensity function that is either treated as a proportional hazard model, or a scale change random effects hazard model. Each component has an associated z, an independent realization of the random variable Z from a distribution G(z). This unobserved quantity z can be used to describe heterogeneity systematically. For various models methods for estimating the model parameters using censored data will be developed. Available field data (from previously flown flights) is from non-renewable systems. The estimated failure rate using such data will need to be modified for renewable systems such as thruster valve.

Taneja, Vidya S.↗
NASA NTRS2015

Spherically Actuated Motor

A three degree of freedom (DOF) spherical actuator is proposed that will replace functions requiring three single DOF actuators in robotic manipulators providing space and weight savings while reducing the overall failure rate. Exploration satellites, Space Station payload manipulators, and rovers requiring pan, tilt, and rotate movements need an actuator for each function. Not only does each actuator introduce additional failure modes and require bulky mechanical gimbals, each contains many moving parts, decreasing mean time to failure. A conventional robotic manipulator is shown in figure 1. Spherical motors perform all three actuation functions, i.e., three DOF, with only one moving part. Given a standard three actuator system whose actuators have a given failure rate compared to a spherical motor with an equal failure rate, the three actuator system is three times as likely to fail over the latter. The Jet Propulsion Laboratory reliability studies of NASA robotic spacecraft have shown that mechanical hardware/mechanism failures are more frequent and more likely to significantly affect mission success than are electronic failures. Unfortunately, previously designed spherical motors have been unable to provide the performance needed by space missions. This inadequacy is also why they are unavailable commercially. An improved patentable spherically actuated motor (SAM) is proposed to provide the performance and versatility required by NASA missions.

Peeples, Steven↗
NASA NTRS1991

A nonparametric software-reliability growth model

The authors (1985) previously introduced a nonparametric model for software-reliability growth which is based on complete monotonicity of the failure rate. The authors extend the completely monotone software model by developing a method for providing long-range predictions of reliability growth, based on the model. They derive upper and lower bounds on extrapolation of the failure rate and the mean function. These are then used to obtain estimates for the future software failure rate and the mean future number of failures. Preliminary evaluation indicates that the method is competitive with parametric approaches, while being more robust.

Sofer, Ariela↗
NASA NTRS1990

Surrogate oracles, generalized dependency and simpler models

Software reliability models require the sequence of interfailure times from the debugging process as input. It was previously illustrated that using data from replicated debugging could greatly improve reliability predictions. However, inexpensive replication of the debugging process requires the existence of a cheap, fast error detector. Laboratory experiments can be designed around a gold version which is used as an oracle or around an n-version error detector. Unfortunately, software developers can not be expected to have an oracle or to bear the expense of n-versions. A generic technique is being investigated for approximating replicated data by using the partially debugged software as a difference detector. It is believed that the failure rate of each fault has significant dependence on the presence or absence of other faults. Thus, in order to discuss a failure rate for a known fault, the presence or absence of each of the other known faults needs to be specified. Also, in simpler models which use shorter input sequences without sacrificing accuracy are of interest. In fact, a possible gain in performance is conjectured. To investigate these propositions, NASA computers running LIC (RTI) versions are used to generate data. This data will be used to label the debugging graph associated with each version. These labeled graphs will be used to test the utility of a surrogate oracle, to analyze the dependent nature of fault failure rates and to explore the feasibility of reliability models which use the data of only the most recent failures.

Wilson, Larry↗
NASA NTRS1973

A new algorithm for finding survival coefficients employed in reliability equations

Product reliabilities are predicted from past failure rates and reasonable estimate of future failure rates. Algorithm is used to calculate probability that product will function correctly. Algorithm sums the probabilities of each survival pattern and number of permutations for that pattern, over all possible ways in which product can survive.

Bouricius, W. G.↗
NASA NTRS1993

Comparative analysis of different configurations of PLC-based safety systems from reliability point of view

The study of a comparative analysis of distinct multiplex and fault-tolerant configurations for a PLC-based safety system from a reliability point of view is presented. It considers simplex, duplex and fault-tolerant triple redundancy configurations. The standby unit in case of a duplex configuration has a failure rate which is k times the failure rate of the standby unit, the value of k varying from 0 to 1. For distinct values of MTTR and MTTF of the main unit, MTBF and availability for these configurations are calculated. The effect of duplexing only the PLC module or only the sensors and the actuators module, on the MTBF of the configuration, is also presented. The results are summarized and merits and demerits of various configurations under distinct environments are discussed.

Tapia, Moiez A.↗
NASA NTRS2010

Scaled CMOS Technology Reliability Users Guide

The desire to assess the reliability of emerging scaled microelectronics technologies through faster reliability trials and more accurate acceleration models is the precursor for further research and experimentation in this relevant field. The effect of semiconductor scaling on microelectronics product reliability is an important aspect to the high reliability application user. From the perspective of a customer or user, who in many cases must deal with very limited, if any, manufacturer's reliability data to assess the product for a highly-reliable application, product-level testing is critical in the characterization and reliability assessment of advanced nanometer semiconductor scaling effects on microelectronics reliability. A methodology on how to accomplish this and techniques for deriving the expected product-level reliability on commercial memory products are provided.Competing mechanism theory and the multiple failure mechanism model are applied to the experimental results of scaled SDRAM products. Accelerated stress testing at multiple conditions is applied at the product level of several scaled memory products to assess the performance degradation and product reliability. Acceleration models are derived for each case. For several scaled SDRAM products, retention time degradation is studied and two distinct soft error populations are observed with each technology generation: early breakdown, characterized by randomly distributed weak bits with Weibull slope (beta)=1, and a main population breakdown with an increasing failure rate. Retention time soft error rates are calculated and a multiple failure mechanism acceleration model with parameters is derived for each technology. Defect densities are calculated and reflect a decreasing trend in the percentage of random defective bits for each successive product generation. A normalized soft error failure rate of the memory data retention time in FIT/Gb and FIT/cm2 for several scaled SDRAM generations is presented revealing a power relationship. General models describing the soft error rates across scaled product generations are presented. The analysis methodology may be applied to other scaled microelectronic products and their key parameters.

Microelectronics Reliability↗
NASA NTRSDate not supplied

Four Problematic Methods in Reliability Analysis

Some basic methods used in reliability analysis are problematic because they produce incorrect and overoptimistic predictions. Initially gratifying forecasts are often invalidated by testing and operational experience. The problematic methods in reliability analysis include estimating the system failure rate as the sum of component failure rates, assuming that reliability growth continues indefinitely during testing, overestimating the benefits of redundancy, and using the fault tolerance count instead of a detailed reliability analysis. Reliability analysis can produce more optimism than accuracy. This bug may now be a feature. The optimistic bias inevitable in project planning should be corrected by realistic reliability analysis that reflects relevant experience. That the repeated poor performance of reliability analysis is found to be surprising suggests willful blindness. Rigorous methods and impartial critical review are necessary to improve reliability analysis.

Reliability analysis↗
NASA NTRSDate not supplied

Four Problematic Methods in Reliability Analysis

Some basic methods used in reliability analysis are problematic because they produce incorrect and overoptimistic predictions. Initially gratifying forecasts are often invalidated by testing and operational experience. The problematic methods in reliability analysis include estimating the system failure rate as the sum of component failure rates, assuming that reliability growth continues indefinitely during testing, overestimating the benefits of redundancy, and using the fault tolerance count instead of a detailed reliability analysis. Reliability analysis can produce more optimism than accuracy. This bug may now be a feature. The optimistic bias inevitable in project planning should be corrected by realistic reliability analysis that reflects relevant experience. That the repeated poor performance of reliability analysis is found to be surprising suggests willful blindness. Rigorous methods and impartial critical review are necessary to improve reliability analysis.

Reliability analysis↗
NASA NTRS1990

Remote operation of an orbital maneuvering vehicle in simulated docking maneuvers

Simulated docking maneuvers were performed to assess the effect of initial velocity on docking failure rate, mission duration, and delta v (fuel consumption). Subjects performed simulated docking maneuvers of an orbital maneuvering vehicle (OMV) to a space station. The effect of the removal of the range and rate displays (simulating a ranging instrumentation failure) was also examined. Naive subjects were capable of achieving a high success rate in performing simulated docking maneuvers without extensive training. Failure rate was a function of individual differences; there was no treatment effect on failure rate. The amount of time subjects reserved for final approach increased with starting velocity. Piloting of docking maneuvers was not significantly affected in any way by the removal of range and rate displays. Radial impulse was significant both by subject and by treatment. NASA's 0.1 percent rule, dictating an approach rate no greater than 0.1 percent of the range, is seen to be overly conservative for nominal docking missions.

Brody, Adam R.↗
NASA NTRS1982

The effects of inherent flaws on the time and rate dependent failure of adhesively bonded joints

Inherent flaws, as well as the effects of rate and time, are shown by tests on viscoelastic adhesive-bonded single lap joints to be as critical in joint failure as environmental and stress concentration effects, with random inherent flaws and loading rate changes resulting in an up to 40% reduction in joint strength. It is also found that the asymptotic creep stress, below which no delayed failure may occur, may under creep loading be as much as 45% less than maximum adhesive strength. Attention is given to test results for the case of titanium-LARC-3 adhesive single-lap specimens.

Sancaktar, E.↗
NASA NTRS1979

Trends in reliability modeling technology for fault tolerant systems

Developments in reliability modeling for large fault tolerant avionic computing systems are presented. Issues of state size and complexity, fault coverage, and practical computation are addressed. A two-fold developmental effort is described based on the structural and fault coverage modeling approaches. A technique which was successfully applied to an 865 state pure death stationary Markov model is presented. Of particular interest is a short computer program which executes very quickly to produce reliability results of a large state space model. This model also incorporates fault coverage states for processor, memory, and bus line replaceable units. A second structural reliability modeling scheme is aimed at solving nonstationary Markov models. This technique provides the tool required for studying the reliability of systems with nonconstant failure rates and includes intermittent/transient faults, electronic hardware which exhibits decreasing failure rates, and hydromechanical devices which typically have wearout failure mechanisms. Several aspects of fault coverage, including modeling and data measurement of intermittent/transient faults and latent faults, are elucidated and illustrated. The CARE II (computer-aided reliability estimation) coverage is presented and shortcomings to be eliminated are discussed.

Bavuso, S. J.↗
DOE OSTI2024

Solar Photovoltaic (PV) Damage Assessment After Typhoon Mawar: Findings and Recommendations for Resilient PV on Guam

A team from the National Renewable Energy Laboratory (NREL) visited Guam in August 2023 to assess failure modes of solar photovoltaic (PV) systems after Typhoon Mawar and to provide recommendations to increase the resilience of PV systems on Guam. The team visited 30 systems: commercial and utility scale, and rooftop and ground-mounted. The team observed systems with no apparent damage, as well as systems that were completely lost. Systems fared very well overall. The average failure rate of rooftop systems was 18%, with a median failure rate of 2%, meaning the few systems that suffered total loss pulled up the average. Only eight 8 of the 25 rooftop systems suffered more than 5% damage. All ground-mounted systems suffered less than 0.5% damage, aside from a carport that lost 16% of its modules. PV systems at Andersen Air Force Base suffered 5% damage on average, with a median system failure of 0.6%. In almost all cases, failures were the result of: (1) Inadequate clamping of the module frame to the mount, (2) Module mounting clamps rotating out of underlying support rail (i.e., T-bolt that rotates free at less than 60 degrees of rotation), (3) An object hitting the panel resulting in a fracture, and in some cases leading to a cascading failure of several more panels, and (4) Excessive tilt angle (in Guam, greater than 5 degrees can be a risk due to wind speed, and power production trade-offs are insignificant).

14 SOLAR ENERGY↗
NASA NTRS1977

Test effectiveness study report: An analytical study of system test effectiveness and reliability growth of three commercial spacecraft programs

Failure data from 16 commercial spacecraft were analyzed to evaluate failure trends, reliability growth, and effectiveness of tests. It was shown that the test programs were highly effective in ensuring a high level of in-orbit reliability. There was only a single catastrophic problem in 44 years of in-orbit operation on 12 spacecraft. The results also indicate that in-orbit failure rates are highly correlated with unit and systems test failure rates. The data suggest that test effectiveness estimates can be used to guide the content of a test program to ensure that in-orbit reliability goals are achieved.

Feldstein, J. F.↗