Methods of design stage reliability analysis.
Reliability methodology in design and development stage, discussing component stresses, performance variation, etc
SEARCH · Engineering Papers
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.
Reliability methodology in design and development stage, discussing component stresses, performance variation, etc
IR techniques for reliability enhancement of microelectronics
Centralized parts and materials reliability information center /PRINCE/APIC/, explaining data storage and retrieval
Metallurgical aspects of nitrided component application in unmanned satellite drive systems to remedy sliding wear and increase reliability
Ground system design approach integrating reliability and maintainability with performance requirements, using Saturn V simulation as example
Integrated reliability program for Scout launch vehicle in terms of design specification, review functions, malfunction reporting, failed parts analysis, quality control, standardization and certification
Reliability contribution of pilot using manual backup control for first stage of Saturn V tested using simulation
Apollo gyro reliability covering Guidance, Navigation and Control systems, stressing failure mode prediction
Methodology used to implement high reliability objectives for Surveyor pressure vessels, tabulating burst test results
This paper reports the results of an experiment that utilized the JPL's area array consortium test vehicle design, containing a myriad of mixed technology components with an OSP finish. The details of the reliability study are presented in this paper.
This paper describes a case study quantifying reliability and endurance results of two FRAM nonvolatile memories.
A JPL-led chip scale package consortium of enterprises recently joined together to pool in-kind resources for developing the quality and reliability of chip scale packages for a variety of projects. The experience of the consortium in building more than 150 test vehicle assemblies, single and double sided multilayer PWBs, and the environmental test results has now been published as a chip scale package guidelines document.
The JPL-led MicrotypeBGA Consortium of enterprises representing government agencies and private companies have jointed together to pool in-kind resources for developing the quality and reliability of chip scale packages (CSPs) for a variety of projects.
A JPL-led chip scale package (CSP) Consortium, composed of team members representing government agencies and private companies, recently joined together to pool in-kind resources for developing the quality and reliability of chip scale packages (CSPs) for a variety of projects.
It is reported by some users and has been demonstrated by others via testing and qualification that the quality and reliability of plastic-encapsulated microcircuits (PEMs) manufactured today are excellent in commercial applications and closely equivalent, and in some cases superior to their hemetic counterparts.
Reviews the many factors that affect interconnect reliability of emerging chip scale package (CSP) assemblies. These include: package type, package build, board design, and assembly variables.
Reliability and quality issues are two of the main bottlenecks choking the effective commercialization of microsystem technology.
There have been few reports on the behavior of software reliability models under controlled conditions. That is to say, most of the reported experience with the models is during the testing phase of actual projects, during which researchers have little or no control over the data with which they work. Give that failure data for actual projects can be noisy, distorted, and uncertain, reported procedures for determining model applicability may be incomplete.