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Introduction to Optical Methods for Characterizing Liquid Crystals at Interfaces

This Instructional Review describes methods and underlying principles that can be used to characterize both the orientations assumed spontaneously by liquid crystals (LCs) at interfaces and the strength with which the LCs are held in those orientations (so-called anchoring energies). The application of these methods to several different classes of LC interfaces is described, including solid and aqueous interfaces as well as planar and non-planar interfaces (such as those that define a LC-in-water emulsion droplet). These methods, which enable fundamental studies of the ordering of LCs at polymeric, chemically-functionalized and biomolecular interfaces, are described in this article at a level that can be easily understood by a non-expert reader such as an undergraduate or graduate student. Finally, we focus on optical methods because they are based on instrumentation that is found widely in research and teaching laboratories.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Optical Properties of Nanocrystal Interfaces in Compressed MgO Nanopowders

The optical properties and charge trapping phenomena observed on oxide nanoparticle ensembles can be strongly influenced by the presence of particle-particle interfaces. Powders of MgO nanocrystallites represent a convenient system to study these effects due to their well defined shape and adjustable size distributions. The spectroscopic properties of particle-particle interfaces are investigated by monitoring the dependence of absorption characteristics on the concentration of the interfaces in the nanopowders. The presence of interfaces is found to affect the absorption spectra of nanopowders more significantly than changing the size of the constituent nanocrystallites. We find a strong absorption band in the 4.0-5.5 eV energy range, which was previously attributed to surface features of individual nanocrystallites, such as corners and edges. These findings are supported by complementary first principles calculations. The possibility to directly address such interfaces by tuning the energy of excitation may provide new means for functionalization of nanostructures, chemical activation, and can help improve performance and reliability for many nanopowder applications, such as such as photo-catalysts and solar cells.

14 SOLAR ENERGY↗

Complexions at the iron-magnetite interface

Synthesizing distinct phases and controlling crystalline defects are key concepts in materials design. These approaches are often decoupled, with the former grounded in equilibrium thermodynamics and the latter in nonequilibrium kinetics. By unifying them through defect phase diagrams, we can apply phase equilibrium models to thermodynamically evaluate defects—including dislocations, grain boundaries, and phase boundaries—establishing a theoretical framework linking material imperfections to properties. Using scanning transmission electron microscopy (STEM) with differential phase contrast (DPC) imaging, we achieve the simultaneous imaging of heavy Fe and light O atoms, precisely mapping the atomic structure and chemical composition at the iron-magnetite (Fe/Fe 3 O 4 ) interface. We identify a well-ordered two-layer interface-stabilized phase state (referred to as complexion) at the Fe[001]/Fe 3 O 4 [001] interface. Using density-functional theory (DFT), we explain the observed complexion and map out various interface-stabilized phases as a function of the O chemical potential. The formation of complexions increases interface adhesion by 20% and alters charge transfer between adjacent materials, impacting transport properties. Our findings highlight the potential of tunable defect-stabilized phase states as a degree of freedom in materials design, enabling optimized corrosion protection, catalysis, and redox-driven phase transitions, with applications in materials sustainability, efficient energy conversion, and green steel production.

36 MATERIALS SCIENCE↗

Tailoring Heterovalent Interface Formation with Light

Integrating different semiconductor materials into an epitaxial device structure offers additional degrees of freedom to select for optimal material properties in each layer. However, interface between materials with different valences (i.e. III-V, II-VI and IV semiconductors) can be difficult to form with high quality. Using ZnSe/GaAs as a model system, we explore the use of UV illumination during heterovalent interface growth by molecular beam epitaxy as a way to modify the interface properties. We find that UV illumination alters the mixture of chemical bonds at the interface, permitting the formation of Ga-Se bonds that help to passivate the underlying GaAs layer. Illumination also helps to reduce defects in the ZnSe epilayer. Furthermore, these results suggest that moderate UV illumination during growth may be used as a way to improve the optical properties of both the GaAs and ZnSe layers on either side of the interface.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Non-uniform solute segregation at semi-coherent metal/oxide interfaces

The properties and performance of metal/oxide nanocomposites are governed by the structure and chemistry of the metal/oxide interfaces. Here we report an integrated theoretical and experimental study examining the role of interfacial structure, particularly misfit dislocations, on solute segregation at a metal/oxide interface. We find that the local oxygen environment, which varies significantly between the misfit dislocations and the coherent terraces, dictates the segregation tendency of solutes to the interface. Depending on the nature of the solute and local oxygen content, segregation to misfit dislocations can change from attraction to repulsion, revealing the complex interplay between chemistry and structure at metal/oxide interfaces. These findings indicate that the solute chemistry at misfit dislocations is controlled by the dislocation density and oxygen content. As a result, fundamental thermodynamic concepts – the Hume-Rothery rules and the Ellingham diagram – qualitatively predict the segregation behavior of solutes to such interfaces, providing design rules for novel interfacial chemistries.

36 MATERIALS SCIENCE↗

Spin-polarized current injection induced magnetic reconstruction at oxide interface

Electrical manipulation of magnetism presents a promising way towards using the spin degree of freedom in very fast, low-power electronic devices. Though there has been tremendous progress in electrical control of magnetic properties using ferromagnetic (FM) nanostructures, an opportunity of manipulating antiferromagnetic (AFM) states should offer another route for creating a broad range of new enabling technologies. Here we selectively probe the interface magnetization of SrTiO 3 /La 0.5 Ca 0.5 MnO 3 /La 0.7 Sr 0.3 MnO 3 heterojunctions and discover a new spin-polarized current injection induced interface magnetoelectric (ME) effect. The accumulation of majority spins at the interface causes a sudden, reversible transition of the spin alignment of interfacial Mn ions from AFM to FM exchange-coupled, while the injection of minority electron spins alters the interface magnetization from C-type to A-type AFM state. In contrast, the bulk magnetization remains unchanged. We attribute the current-induced interface ME effect to modulations of the strong double-exchange interaction between conducting electron spins and local magnetic moments. As a result, the effect is robust and may serve as a viable route for electronic and spintronic applications.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

Transmission and total reflection of subhertz electromagnetic waves at the earth-atmosphere interface

For the purpose of providing for a theoretical background for the study of electromagnetic fields generated by precursory effects of earthquakes, the problem of transmission and total reflection at the earth-atmosphere interface is investigated in detail for a subhertz plane electromagnetic wave incident from the earth's crust. The term ''subhertz'' means 'below 1 Hz'. First, for the special case of normal incidence, the overall power transmission coefficient at the earth-atmosphere interface is found to take a maximum value at a definite frequency f{sub 0} which is inversely proportional to the square of the depth of a virtual hypocenter. A typical value of f{sub 0} falls around 0.01 Hz. For oblique incidence as well, this feature of the overall power transmission coefficient is retained except in the vicinity of the critical angle of incidence for the H-wave. At the critical angle of incidence, the power flow carried by a surface wave along the interface becomes anomalously large for the H-wave. However, over a wide range of angles of incidence greater than the critical angle, the power flow carried by the E-wave exceeds that carried by the H-wave by orders of magnitude. Finally, the energy conservation relations for the incident, reflected, and transmitted waves at the earth-atmosphere interface are discussed. For an incident wave coming from the earth's crust, the interactive power between the incident and reflected waves plays a crucial role for the conservation of energy at the interface.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

C{sub 6}H{sub 6}/Au(111): Interface dipoles, band alignment, charging energy, and van der Waals interaction

We analyze the benzene/Au(111) interface taking into account charging energy effects to properly describe the electronic structure of the interface and van der Waals interactions to obtain the adsorption energy and geometry. We also analyze the interface dipoles and discuss the barrier formation as a function of the metal work-function. We interpret our DFT calculations within the induced density of interface states (IDIS) model. Our results compare well with experimental and other theoretical results, showing that the dipole formation of these interfaces is due to the charge transfer between the metal and benzene, as described in the IDIS model.

36 MATERIALS SCIENCE↗

Organic Thin-Film Solar Cells Based on Donor-Acceptor Interpenetrating Nano-Interface

Photovoltaic cells with interpenetrating interfaces between a conducting polymer layer and a fullerene layer fabricated by a solvent corrosion method have been investigated. Using a weakly dissoluble combination of a solvent and an underlayer film, we fabricated a ''semi-layered'' structure that was maintaining a bilayer structure and furthermore interpenetrating at the interface of the conducting polymer and the fullerene layers. In these cells, high external quantum efficiencies (EQE) were obtained. The photovoltaic properties have been interpreted by the effective absorption of incident photons around the interface of conducting polymer and fullerene, the interpenetrating fullerene / conducting polymer interface involving the efficient photo-induced charge transfer, and the short distance between the electron-generation region and electrode resulting in the enhancement of the electron collection to the electrode. In these cells, both of the efficient exciton dissociations at the interpenetrating interface and the efficient carrier transports by each continuous pathway for electrons between fullerene molecules and for holes between conducting polymers occur.

36 MATERIALS SCIENCE↗

Microstructure and interface control of GaN/MgAl{sub 2}O{sub 4} grown by metalorganic chemical vapor deposition: Substrate-orientation dependence

GaN films with single-crystal and polycrystalline structure were deposited on (111) and (100) MgAl{sub 2}O{sub 4} substrates by metalorganic chemical vapor deposition using a substrate modified by chemical etching and thermal passivation. The interface structure and chemical bonding state of the GaN/MgAl{sub 2}O{sub 4} interface was investigated using angle-resolved x-ray photoelectron spectroscopy and resulting valence band spectra. Our results indicate that the Al{sub 2}O{sub 3} buffered layer induced by thermal passivation of the (111) substrate remains unchanged during GaN deposition, which is primarily responsible for the epitaxial growth of GaN on (111) MgAl{sub 2}O{sub 4} substrate. However, for the as-processed (100) substrate, interfacial reactions take place between the formed MgO-terminated surface and GaN films and GaN with a polycrystalline structure on (100) substrate forms. From the interface engineering viewpoint, the appropriate interface modification will allow control of the interface reaction to obtain high-quality GaN films for future optoelectronic devices.

36 MATERIALS SCIENCE↗

Structure of the InAlAs/InP interface by atomically resolved energy dispersive spectroscopy

The structure of epitaxially grown InAlAs/InP interfaces was studied using atomically resolved x-ray energy dispersive spectroscopy in scanning transmission electron microscopy. As and P sublattices show sharp termination on the interface. The In sublattice is continuous across the interface. The study has shown the depletion of the Al concentration at the interface; at the last atomic columns of the InAlAs, In occupancy is close to 100%, while Al occupancy is almost zero. A monolayer of InAs at the interface is consistent with substitution of As for P at the surface preceding growth.

36 MATERIALS SCIENCE↗

The role of Mg interface layer in MgO magnetic tunnel junctions with CoFe and CoFeB electrodes

The tunneling spin polarization (TSP) is directly measured from reactively sputter deposited crystalline MgO tunnel barriers with various CoFe(B) compositions using superconducting tunneling spectroscopy. We find that the Mg interface layer thickness dependence of TSP values for CoFeB/Mg/MgO junctions is substantially different from those for CoFe/Mg/MgO especially in the pre-annealed samples due to the formation of boron oxide at the CoFeB/MgO interface. Annealing depletes boron at the interface thus requiring a finite Mg interface layer to prevent CoFeOx formation at the CoFeB/MgO interface so that the TSP values can be optimized by controlling Mg thickness.

36 MATERIALS SCIENCE↗

Positron annihilation studies of the AlO{sub x}/SiO{sub 2}/Si interface in solar cell structures

Film and film/substrate interface characteristics of 30 and 60 nm-thick AlO{sub x} films grown on Si substrates by thermal atomic layer deposition (ALD), and 30 nm-thick AlO{sub x} films by sputtering, have been probed using variable-energy positron annihilation spectroscopy (VEPAS) and Doppler-broadened spectra ratio curves. All samples were found to have an interface which traps positrons, with annealing increasing this trapping response, regardless of growth method. Thermal ALD creates an AlO{sub x}/SiO{sub x}/Si interface with positron trapping and annihilation occurring in the Si side of the SiO{sub x}/Si boundary. An induced positive charge in the Si next to the interface reduces diffusion into the oxides and increases annihilation in the Si. In this region there is a divacancy-type response (20 {+-} 2%) before annealing which is increased to 47 {+-} 2% after annealing. Sputtering seems to not produce samples with this same electrostatic shielding; instead, positron trapping occurs directly in the SiO{sub x} interface in the as-deposited sample, and the positron response to it increases after annealing as an SiO{sub 2} layer is formed. Annealing the film has the effect of lowering the film oxygen response in all film types. Compared to other structural characterization techniques, VEPAS shows larger sensitivity to differences in film preparation method and between as-deposited and annealed samples.

36 MATERIALS SCIENCE↗

Role of Ti phases in the modulation of border traps at the TiO{sub 2}/n-Si interfaces

Charge accumulation at interfaces is a key issue for the use of high dielectric constant materials in nanoelectronics. In this work, we report the charge accumulation behavior at the TiO{sub 2}/n-Si interfaces formed at various growth temperatures. Growth of TiO{sub 2} in an oxygen deficient environment led to the formation of rutile phase in the as-grown films. The anatase phase was recovered by annealing in air and the ratio of anatase to rutile phase in the TiO{sub 2} films improved considerably. The amount of charge accumulation and the direction of charge injection were studied by obtaining C-V hysteresis curves in the as-grown and the annealed TiO{sub 2} films. It was observed that the amount of accumulated charges decreased as the density of interface border traps dropped considerably due to annealing. X-ray photo-electron spectroscopy revealed the presence of two major phases corresponding to TiO{sub 2} and Ti{sub 2}O{sub 3}, due to the existence of oxygen deficiencies. The annealing in air resulted in appreciable increase in the weight percentage of TiO{sub 2} phase in samples grown at high temperatures. The healing of oxygen vacancies improved with the increase in the weight percentage of TiO{sub 2}. Thus, it was concluded that the accumulated charges were mainly due to oxygen deficiencies and the healing of oxygen defects led to a drop in the interface charges, thus, bringing the interface close to ideal.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Thermodynamics of Iodide Adsorption at the Instantaneous Air-Water Interface.

We perform simulations using both polarizable and non-polarizable force fields to study the adsorption of iodide to the air-water interface. A novel aspect of our analysis is that the progress of the adsorption is measured as the distance from the instantaneous interface, which is defined by a coarse-graining scheme proposed recently by Willard and Chandler.\cite{chandler1} Referring structural and thermodynamic quantities to the instantaneous interface unmasks molecular-scale details that are obscured by thermal fluctuations when the same quantities are referred to an average measure of the position of the interface, such as the Gibbs dividing surface. Our results suggest that an ion adsorbed at the interface resides primarily in the topmost layer water.

Ion adsorption to the water/air Interface↗

Fabricating superconducting interfaces between artificially grown LaAlO{sub 3} and SrTiO{sub 3} thin films

Realization of a fully metallic two-dimensional electron gas (2DEG) at the interface between artificially grown LaAlO{sub 3} and SrTiO{sub 3} thin films has been an exciting challenge. Here we present for the first time the successful realization of a superconducting 2DEG at interfaces between artificially grown LaAlO{sub 3} and SrTiO{sub 3} thin films. Our results highlight the importance of two factors—the growth temperature and the SrTiO{sub 3} termination. We use local friction force microscopy and transport measurements to determine that in normal growth conditions the absence of a robust metallic state at low temperature in the artificially grown LaAlO{sub 3}/SrTiO{sub 3} interface is due to the nanoscale SrO segregation occurring on the SrTiO{sub 3} film surface during the growth and the associated defects in the SrTiO{sub 3} film. By adopting an extremely high SrTiO{sub 3} growth temperature, we demonstrate a way to realize metallic, down to the lowest temperature, and superconducting 2DEG at interfaces between LaAlO{sub 3} layers and artificially grown SrTiO{sub 3} thin films. This study paves the way to the realization of functional LaAlO{sub 3}/SrTiO{sub 3} superlattices and/or artificial LaAlO{sub 3}/SrTiO{sub 3} interfaces on other substrates.

36 MATERIALS SCIENCE↗

Characterization of very fast states in the vicinity of the conduction band edge at the SiO{sub 2}/SiC interface by low temperature conductance measurements

We have investigated the unique interface states (NI) generated by NO annealing at the SiO{sub 2}/SiC interfaces by low-temperature conductance measurements, which is more suitable for characterization of very fast interface states than high-frequency conductance measurements at room temperature. Although only a part of the NI states can be evaluated by measurements at room temperature, the whole picture of the NI states, especially near the conduction band edge (0.07 eV ≤ E{sub C}−E{sub T}), has been revealed by the low temperature measurements. The NI peak was present at the interface even without NO annealing. The NI density increased with NO annealing temperature. The NI density at the energy levels shallower than 0.2 eV exceeded 10{sup 12} cm{sup −2}eV{sup −1} after NO annealing. The capture cross section of the NI states is uniquely larger than that of conventional interface states.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Atomically flat La-silicate/Si interface using tungsten carbide gate electrode with nano-sized grain

Interface properties of La-silicate gate dielectrics on Si substrates with W or nano-sized grain W{sub 2}C gate electrodes have been investigated. A low interface state density of 2.5 × 10{sup 11} cm{sup −2}/eV has been achieved with W{sub 2}C gate electrodes, which is one third of those with W gate electrode. An interface roughness of 0.33 nm with spatial frequency comparable to the grain size of W gate electrode has been observed. Besides, an atomically flat interface of 0.12 nm has been obtained with W{sub 2}C gate electrode. The origin of flat interface may be attributed to the elimination of inhomogeneous stress by grains in metal electrode.

36 MATERIALS SCIENCE↗