Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “Electron Backscatter Diffraction”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 1,045 records · Page 58

Formation mechanisms of periodic longitudinal microstructure and texture patterns in friction stir welded magnesium AZ80

Many studies of friction stir welding have shown that periodicity of metal flow around the tool pin may result in the formation of periodic differences in microstructure and texture in the weld nugget area correlated with the weld pitch. The current work investigates the periodicity of magnesium weld microtexture in the nugget region and its association with material flow using optical and electron microscopy. Two welds created in AZ80 at different processing conditions are presented in detail, one illustrating periodic longitudinal texture change, and one showing for the first time that periodic variations in texture, grain size, or composition are not defining features of periodic nugget flow. While nugget texture is dominated by shear deformation, it was found here to be affected to a lesser degree by compaction of material behind the welding tool, which led to reduction in intensity of the shear texture fiber. The decreased tendency for magnesium based alloys to form periodic patterns as compared to aluminum based alloys is explained with reference to the shear textures. - Highlights: •It is shown here that periodic material flow in the nugget does not necessitate longitudinal texture patterns. •Longitudinal texture patterns are shown to be present or absent in Mg AZ80 based on processing conditions. •Texture in the nugget is mainly dictated by shear deformation, but has measurable effects from other deformation modes. •Explanation of why longitudinal texture change is frequently reported in aluminum but not magnesium alloys is provided. •A new vector visualization of material flow based on EBSD data analysis is shown.

36 MATERIALS SCIENCE↗

Interface characteristics of Ti6Al4V-TiAl metal-intermetallic laminate (MIL) composites prepared by a novel hot-pack rolling

Highlights: • The Ti6Al4V/high Nb-TiAl metal-intermetallic (MIL) composite was fabricated. • The formation of γ and α{sub 2} phase at interface is diffusion controlled. • The formation of O phase at interface is due to the segregation of Nb atoms. • The Vickers hardness from Ti6Al4V to TiAl alloy shows a trend of a decrease then an increase and finally a decrease. - Abstract: Ti6Al4V (wt%)/Ti-44Al-8Nb-0.2W-0.2B-0.03Y (at.%) (high Nb-TiAl) metal–intermetallic laminate (MIL) composite with a defect-free interface was successfully prepared by hot-pack rolling and the interface microstructure was characterized by XRD, SEM, EBSD, and TEM techniques. The results showed that the interface was about 260 μm thick and consisted of four different microstructure regions. The thickness of each region was about 60–80 μm and the microstructure of the four regions consisted of acicular O, α{sub 2}, and β/B2 phases; acicular α{sub 2} phase; acicular α{sub 2} and β/B2 phases; and acicular γ, α{sub 2}, and β/B2 phases respectively. The resulting microstructure of the interface region was attributed to the interdiffusion of Ti atoms from the starting Ti6Al4V alloy layer to the high Nb-TiAl alloy layer and Al and Nb atoms from the high Nb-TiAl alloy layer to the Ti6Al4V alloy layer. The formation of acicular α{sub 2} and γ phases was diffusion-controlled and the Nb segregation at the interface caused the formation of O phase which had specific relationships with α{sub 2} and β/B2 phases. The detailed interface microstructural evolution of the Ti6Al4V/high Nb-TiAl MIL composite and the Vickers hardness of the composite are also discussed in this paper.

36 MATERIALS SCIENCE↗

Microstructure and texture evolution of deformed Mg-Zn alloy during recrystallization

Highlights: • The texture intensity in the Mg-Zn alloy relied on the microstructure. • Fine DRXed grains showed a fiber texture distributing between <10.0> and <11.0>. • Coarse DRXed grains mainly exhibited <11.0> fiber texture. • The preferred growth of <11.0> oriented grains resulted in texture evolution. - Abstract: The microstructure and texture evolution of Mg-Zn alloy during recrystallization was investigated by EBSD in the present study. Deformed region, fine DRXed region and coarse DRXed region were obtained in Mg-Zn alloy during deformation. It was found that the texture intensity in DRXed region was weaker compared with the deformed region. The second phase at grain boundaries resulted in the formation of fine DRXed grains with weaker texture compared with the coarse DRXed region. Additionally, a remarkable grain-size driven textural transition from <10.0>–<11.0> texture to <11.0> texture were detected with the growth of DRXed grains. The recrystallized grains with small grain size showed a fiber texture distributing homogeneously between <10.0> and <11.0>, while <11.0> fiber texture was predominant for the large recrystallized grains. It is suggested that <11.0> oriented grains grew faster than other oriented grains, which was ascribed to larger misorientation between <11.0> oriented grains and their neighboring grains.

36 MATERIALS SCIENCE↗

Structure, Morphology, and Optical Properties of Amorphous and Nanocrystalline Gallium Oxide Thin Films

Ga2O3 thin films were produced by sputter deposition by varying the substrate temperature (Ts) in a wide range (Ts=25-800 oC). The structural characteristics and optical properties of Ga2O3 films were evaluated using X-ray diffraction (XRD), scanning electron microscopy (SEM), energy-dispersive X-ray spectrometry (EDS), Rutherford backscattering spectrometry (RBS) and spectrophotometric measurements. The effect of growth temperature is significant on the chemistry, crystal structure and morphology of Ga2O3 films. XRD and SEM analyses indicate that the Ga2O3 films grown at lower temperatures were amorphous while those grown at Ts≥500 oC were nanocrystalline. RBS measurements indicate the well-maintained stoichiometry of Ga2O3 films at Ts=300-700 oC. The spectral transmission of the films increased with increasing temperature. The band gap of the films varied from 4.96 eV to 5.17 eV for a variation in Ts in the range 25-800 oC. A relationship between microstructure and optical property is discussed.

Environmental Molecular Sciences Laboratory↗

Plastic strain arrangement in copper single crystals in sliding

Deformation of tribologically loaded contact zone is one of the wear mechanisms in spite of the fact that no mass loss may occur during this process. Generation of optimal crystallographic orientations of the grains in a polycrystalline materials (texturing) may cause hardening and reducing the deformation wear. To reveal the orientation dependence of an individual gain and simplify the task we use copper single crystals with the orientations of the compression axis along [111] and [110]. The plastic deformation was investigated by means of optical, scanning electron microscopy and EBSD techniques. It was established that at least four different zones were generated in the course of sliding test, such as non-deformed base metal, plastic deformation layer sliding, crystalline lattice reorientation layer and subsurface grain structure layer. The maximum plastic strain penetration depth was observed on [110]-single crystals. The minimum stability of [111]-crystals with respect to rotation deformation mode as well as activation of shear in the sliding contact plane provide for rotation deformation localization below the worn surface. The high-rate accumulation of misorientations and less strain penetration depth was observed on [111]-crystals as compared to those of [110]-oriented ones.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Effects of the Laser Irradiation on Graphene Oxide Foils in Vacuum and Air

A Nd:YAG laser operating at 1064 nm was used to irradiate, at different intensities, graphene oxide foils placed in vacuum and in air. The laser irradiated GO foils were analysed successively by using different techniques such as 2.0 MeV alpha particle Rutherford backscattering spectrometry, X-ray photoemission spectroscopy and SEM-EDX. In particular, in vacuum irradiated graphene oxide samples the oxygen reduction has been observed with increment of the carbon content. In air irradiated GO samples an increase in oxygen has instead been highlighted. Furthermore thermal and chemical effects are induced by the photon irradiation. Results will be presented and discussed.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Gallium Oxide Nanostructures for High Temperature Sensors

Gallium oxide (Ga 2 O 3 ) thin films were produced by sputter deposition by varying the substrate temperature (T s ) in a wide range (T s =25-800 °C). The structural characteristics and electronic properties of Ga 2 O 3 films were evaluated using X-ray diffraction (XRD), scanning electron microscopy (SEM), energy-dispersive X-ray spectrometry (EDS), Rutherford backscattering spectrometry (RBS) and spectrophotometric measurements. The effect of growth temperature is significant on the chemistry, crystal structure and morphology of Ga 2 O 3 films. XRD and SEM analyses indicate that the Ga 2 O 3 films grown at lower temperatures were amorphous while those grown at T s ≥500 oC were nanocrystalline. RBS measurements indicate the well-maintained stoichiometry of Ga 2 O 3 films at T s =300-800 °C. The electronic structure determination indicated that the nanocrystalline Ga 2 O 3 films exhibit a band gap of ~5 eV. Tungsten (W) incorporated Ga 2 O 3 films were produced by co-sputter deposition. W-concentration was varied by the applied sputtering-power. No secondary phase formation was observed in W-incorporated Ga 2 O 3 films. W-induced effects were significant on the structure and electronic properties of Ga2O3 films. The band gap of Ga 2 O 3 films without W-incorporation was ~5 eV. Oxygen sensor characteristics evaluated using optical and electrical methods indicate a faster response in W-doped Ga 2 O 3 films compared to intrinsic Ga 2 O 3 films. The results demonstrate the applicability of both intrinsic and W-doped Ga-oxide films for oxygen sensor application at temperatures ≥700 °C.

47 OTHER INSTRUMENTATION↗

Friction and Wear Properties of As-deposited and Carbon Ion-implanted Diamond Films

Recent work on the friction and wear properties of as-deposited and carbon ion-implanted diamond films was reviewed. Diamond films were produced by the microwave plasma chemical vapor deposition (CVD) technique. Diamond films with various grain sizes and surface roughnesses were implanted with carbon ions at 60 ke V ion energy, resulting in a dose of 1.2310(exp 17) carbon ions/cm(exp 2). Various analytical techniques, including Raman spectroscopy, proton recoil analysis, Rutherford backscattering, transmission and scanning electron microscopy, x-ray photoelectron spectroscopy, and x-ray diffraction, were utilized to characterize the diamond films. Sliding friction experiments were conducted with a polished natural diamond pin in contact with diamond films in the three environments: humid air (40 percent relative humidity), dry nitrogen (less than 1 percent relative humidity), and ultrahigh vacuum (10(exp -7) Pa). The CVD diamond films indeed have friction and were properties similar to those of natural diamond in the three environments. The as-deposited, fine-grain diamond films can be effectively used as self-lubricating, wear-resistant coatings that have low coefficients of friction (0.02 to 0.04) and low wear rates (10(exp -7) to 10(exp -8)mm(exp 3)/N-m) in both humid air and dry nitrogen. However, they have high coefficients of friction (1.5 to 1.7) and a high wear rate (10(exp -4)mm(exp 3/N-m) in ultrahigh vacuum. The carbon ion implanation produced a thin surficial layer (less than 0.1 micron thick) of amorphous, nondiamond carbon on the diamond films. In humid air and dry nitrogen, the ion-implanted, fine- and coarse-grain diamond films have a low coefficient of friction (around 0.1) and a low wear rate (10(exp -7)mm(exp 3/N-m). Even in ultrahigh vacuum, the presence of the nondiamond carbon layer reduced the coefficient of friction of fine-grain diamond films to 0.1 or lower and the wear rate to 10(exp -6)mm(exp 3)/N-m. Thus, the carbon ion-implanted, fine-grain diamond films can be effectively used as wear-resistant, self-lubricating coatings not only in air and dry nitrogen, but also in ultrahigh vacuum. The wear mechanism of diamond films is that of small fragments chipping off the surface. The size of wear particles is related to the extent of wear rates.

Miyoshi, Kazuhisa↗

Friction and Wear Properties of As-Deposited and Carbon Ion-Implanted Diamond Films

Recent work on the friction and wear properties of as-deposited and carbon ion-implanted diamond films was reviewed. Diamond films were produced by the microwave plasma chemical vapor deposition (CVD) technique. Diamond films with various grain sizes and surface roughnesses were implanted with carbon ions at 60 keV ion energy, resulting in a dose of 1.2 x 10(exp 17) carbon ions per cm(exp 2). Various analytical techniques, including Raman spectroscopy, proton recoil analysis, Rutherford backscattering, transmission and scanning electron microscopy, X-ray photoelectron spectroscopy, and X-ray diffraction, were utilized to characterize the diamond films. Sliding friction experiments were conducted with a polished natural diamond pin in contact with diamond films in the three environments: humid air (40% relative humidity), dry nitrogen (less than 1 percent relative humidity), and ultrahigh vacuum (10(exp -7) Pa). The CVD diamond films indeed have friction and wear properties similar to those of natural diamond in the three environments. The as-deposited, fine-grain diamond films can be effectively used as self-lubricating, wear-resistant coatings that have low coefficients of friction (0.02 to 0.04) and low wear rates (10(exp -7) to lO(exp -8) mm(exp 3) N(exp -1) m(exp -1)) in both humid air and dry nitrogen. However, they have high coefficients of friction (1.5 to 1.7) and a high wear rate (10(exp -4) mm(exp 7) N(exp -1) m(exp -1)) in ultrahigh vacuum. The carbon ion implantation produced a thin surficial layer (less than 0.1 micron thick) of amorphous, non-diamond carbon on the diamond films. In humid air and dry nitrogen, the ion-implanted, fine and coarse-grain diamond films have a low coefficient of friction (around 0.1) and a low wear rate (10(exp -7) mm(exp 3) N(exp -1) m(exp-1)). Even in ultrahigh vacuum, the presence of the non-diamond carbon layer reduced the coefficient of friction of fine-grain diamond films to 0.1 or lower and the wear rate to 10(exp -6) mm(exp 3) N(exp -1) m(exp -1). Thus, the carbon ion-implanted, fine-grain diamond films can be effectively used as wear-resistant, self-lubricating coatings not only in air and dry nitrogen, but also in ultrahigh vacuum.

Miyoshi, Kazuhisa↗

High quality transmission Kikuchi diffraction analysis of deformed alloys - Case study

Modern scanning electron microscopes (SEM) equipped with thermally assisted field emission guns (Schottky FEG) are capable of imaging with a resolution in the range of several nanometers or better. Simultaneously, the high electron beam current can be used, which enables fast chemical and crystallographic analysis with a higher resolution than is normally offered by SEM with a tungsten cathode. The current resolution that limits the EDS and EBSD analysis is related to materials' physics, particularly to the electron-specimen interaction volume. The application of thin, electron-transparent specimens, instead of bulk samples, improves the resolution and allows for the detailed analysis of very fine microstructural features. Beside the typical imaging mode, it is possible to use a standard EBSD camera in such a configuration that only transmitted and scattered electrons are detected. This modern approach was successfully applied to various materials giving rise to significant resolution improvement, especially for the light element magnesium based alloys. This paper presents an insight into the application of the transmission Kikuchi diffraction (TKD) technique applied to the most troublesome, heavily-deformed materials. In particular, the values of the highest possible acquisition rates for high resolution and high quality mapping were estimated within typical imaging conditions of stainless steel and magnesium-yttrium alloy. - Highlights: •Monte Carlo simulations were used to simulate EBSD camera intensity for various measuring conditions. •Transmission Kikuchi diffraction parameters were evaluated for highly deformed, light and heavy elements based alloys. •High quality maps with 20 nm spatial resolution were acquired for Mg and Fe based alloys. •High speed TKD measurements were performed at acquisition rates comparable to the reflection EBSD.

36 MATERIALS SCIENCE↗

Nucleation and growth of ZnO on PMMA by low-temperature atomic layer deposition

ZnO films were grown by atomic layer deposition at 35 °C on poly(methyl methacrylate) substrates using diethylzinc and water precursors. The film growth, morphology, and crystallinity were studied using Rutherford backscattering spectrometry, time-of-flight elastic recoil detection analysis, atomic force microscopy, scanning electron microscopy, and x-ray diffraction. The uniform film growth was reached after several hundreds of deposition cycles, preceded by the precursor penetration into the porous bulk and island-type growth. After the full surface coverage, the ZnO films were stoichiometric, and consisted of large grains (diameter 30 nm) with a film surface roughness up to 6 nm (RMS). The introduction of Al{sub 2}O{sub 3} seed layer enhanced the initial ZnO growth substantially and changed the surface morphology as well as the crystallinity of the deposited ZnO films. Furthermore, the water contact angles of the ZnO films were measured, and upon ultraviolet illumination, the ZnO films on all the substrates became hydrophilic, independent of the film crystallinity.

36 MATERIALS SCIENCE↗

The influence of power spinning and annealing temperature on microstructures and properties of Cu-Sn alloy

Highlights: • The strengthening effect of power spinning is mainly achieved by strengthening fine grains and dislocations. • Twins formed by the aggregation and overlapping of stacking faults grow and widen • In power spinning of Cu-Sn alloy, plastic deformation is primarily powered by dislocation sliding. - Abstract: Electron back scatter diffraction pattern (EBSD), metallographic microscope (OM) and transmission electron microscope (TEM) are used to analyze the microstructural state of the Cu-Sn alloy before and after power spinning and annealing. The results show that after power spinning, the α phase grains are refined and gradually evolve into small and fine α{sub II} and deformed α{sub III} crystal grains, with an average grain size of about 2.2 μm. Work hardening results in massive network-like subgrain boundaries distributed in power spinning microstructure. Annealing at 400 °C contributes to the formation of dislocation cells and stacking faults, and high-angle grain boundaries (HABS) start to migrate and slide. After the formation of less defective equiaxed grains at 500 °C, twins continue to grow and widen based through continuous accumulation of stacking faults. Further testing of mechanical properties reveals that power spinning is conducive to the improvement of mechanical properties of Cu-Sn alloy.

36 MATERIALS SCIENCE↗

Structure and properties of solid surfaces

Difficulties in experimental studies of crystalline surfaces are related to the fact that surface atoms have an intrinsic tendency to react with their environment. A second problem is connected with the effective thickness of surfaces, which ranges from one to several atom layers. The phenomenology of surface interactions with gases are considered, taking into account physical adsorption, chemisorption, and the oxidation of surfaces. Studies of the surface structure are discussed, giving attention to field emission microscopy, field-ion microscopy, electron diffraction techniques, Auger spectroscopy, scanning electron microscopy, electron probe microanalysis, ion microprobe methods, and low-energy backscattering spectroscopy. Investigations of semiconductor surfaces are also described.

Gatos, H. C.↗

Epitaxial growth of rock salt MgZrN 2 semiconductors on MgO and GaN

Ternary nitride compound semiconductors have attracted recent attention as electronic materials since their properties can be tuned by cation stoichiometry and ordering. A recently discovered example is MgZrN 2 , a ternary analog to the rock salt semiconductor ScN. MgZrN 2 has a larger bandgap and stronger dielectric response than the binary compound. Polycrystalline thin films of MgZrN 2 have been studied, but demonstration of high-quality growth is still required to establish its suitability for technological applications. Here, we report on epitaxial growth of MgZrN 2 thin films on (100) and (111) MgO substrates and (001) GaN templates. The MgZrN 2 composition is confirmed by Rutherford backscattering spectrometry, showing no oxygen in the film except for a thin surface oxide layer. Epitaxial growth results in MgZrN 2 with x-ray diffraction rocking curves with a full-width at half-maximum in the range of 0.3–3.0°, depending on the substrate. Transmission electron microscopy analysis of the MgZrN 2 film grown on a (111) MgO substrate confirms epitaxial growth and shows a sharp film/substrate interface. In-plane temperature-dependent Hall effect measurements show that the material is an n-type semiconductor with a relatively high concentration ( n 300K ≈ 10 19 –10 20 cm -3 ) of thermally activated electrons. Room-temperature transport measurements show a conductivity of 25 S cm -1 and a Seebeck coefficient of -80 μ V K -1 . Overall, these results provide an important step toward integration of rock salt MgZrN 2 with other technological nitrides for device applications.

36 MATERIALS SCIENCE↗

Simulation Kinetics of Austenitic Phase Transformation in Ti+Nb Stabilized IF and Microalloyed Steels

In the present study, the influence of cooling rates (low to ultrafast) on diffusion controlled and displacive transformation of Ti-Nb IF and microalloyed steels has been thoroughly investigated. Mechanisms of nucleation and formation of non-equiaxed ferrite morphologies (i.e., acicular ferrite and bainitic ferrite) have been analyzed in details. The continuous cooling transformation behavior has been studied in a thermomechanical simulator (Gleeble 3800) using the cooling rates of 1-150 °C/s. On the basis of the dilatometric analysis of each cooling rate, continuous cooling transformation (CCT) diagrams have been constructed for both the steels to correlate the microstructural features at each cooling rate in different critical zones. In the case of the IF steel, massive ferrite grains along with granular bainite structures have been developed at cooling rates > 120 °C/s. On the other hand, a mixture of lath bainitic and lath martensite structures has been formed at a cooling rate of ~ 80 °C/s in the microalloyed steel. A strong dependence of the cooling rates and C content on the microstructures and mechanical properties has been established. The steel samples that were fast cooled to a mixture of bainite ferrite and martensite showed a significant improvement of impact toughness and hardness (157 J, for IF steel and 174 J for microalloyed steel) as compared to that of the as-received specimens (133 J for IF steel and 116 J for microalloyed steel). Thus, it can be concluded that the hardness and impact toughness properties are correlated well with the microstructural constituents as indicated by the CCT diagram. Transformation mechanisms and kinetics of austenitic transformation to different phase morphologies at various cooling rates have been discussed in details to correlate microstructural evolution and mechanical properties.

36 MATERIALS SCIENCE↗

Expanding the Zinc Precursor Toolbox: A Comparative Study of Precursors for Thermal ALD of ZnO Thin Films

Atomic layer deposition (ALD) of zinc oxide (ZnO) has been widely researched using diethyl zinc (DEZ)-based methods. The significant importance of thin films of ZnO as transparent conductive oxides (TCO) in optoelectronic devices and photovoltaics warrants examining alternative Zn precursors for ZnO ALD as potential replacements for the pyrophoric DEZ. In this study, we investigated three alternative Zn precursors: Zn(EEKI)2, Zn(DMP)2, ZnEt(HMDS), in the process development for high-quality ZnO thin films and compared them to DEZ. The ALD processes were studied using in situ spectroscopic ellipsometry. The properties of the ALD ZnO films were characterized using ex situ X-ray photoelectron spectroscopy (XPS), Rutherford backscattering spectrometry and nuclear reaction analysis (RBS/NRA), X-ray diffraction (XRD), atomic force microscopy (AFM), transmission electron microscopy (TEM), and ultraviolet-visible (UV/Vis) spectrophotometry. These measurements confirmed the formation of pure, stoichiometric, and polycrystalline ZnO films using all four Zn precursors. Although the selected precursors are chemically diverse Zn compounds, they all yielded saturating ALD processes and high-quality ZnO thin films at 200 °C. This study highlights the potential benefits of alternative zinc precursors in designing ALD processes for ZnO thin films.

Obenlüneschloß, Jorit↗

Variation of lattice constant and cluster formation in GaAsBi

We investigate the structural properties of GaAsBi layers grown by molecular beam epitaxy on GaAs at substrate temperatures between 220–315 °C. Irrespective of the growth temperature, the structures exhibited similar Bi compositions, and good overall crystal quality as deduced from X-Ray diffraction measurements. After thermal annealing at temperatures as low as 500 °C, the GaAsBi layers grown at the lowest temperatures exhibited a significant reduction of the lattice constant. The lattice variation was significantly larger for Bi-containing samples than for Bi-free low-temperature GaAs samples grown as a reference. Rutherford backscattering spectrometry gave no evidence of Bi diffusing out of the layer during annealing. However, dark-field and Z-contrast transmission electron microscopy analyses revealed the formation of GaAsBi clusters with a Bi content higher than in the surrounding matrix, as well as the presence of metallic As clusters. The apparent reduction of the lattice constant can be explained by a two-fold process: the diffusion of the excess As incorporated within As{sub Ga} antisites to As clusters, and the reduction of the Bi content in the GaAs matrix due to diffusion of Bi to GaAsBi clusters. Diffusion of both As and Bi are believed to be assisted by the native point defects, which are present in the low-temperature as-grown material.

36 MATERIALS SCIENCE↗

Particle stimulated nucleation during dynamic and metadynamic recrystallisation of Ni-30%Fe-Nb-C alloy

For the first time, a combination of scanning transmission electron microscopy and electron back-scattering diffraction is used to elucidate the early stages of particle stimulated recrystallisation at Nb carbides in Ni-30wt.%Fe alloy subjected to high temperature plane strain compression. While particles with sizes even below 1 μm were found to induce dynamic or metadynamic recrystallisation, only a small fraction of coarse particles served as nucleation sites. - Highlights: • The early stages of particle stimulated recrystallisation at Nb carbides are elucidated • A combination of transmission electron microscopy and electron back scattering diffraction used • Particles below 1 μm size could induce dynamic or metadynamic recrystallization.

36 MATERIALS SCIENCE↗