Real-time Hardware-in-the-Loop Evaluation of a Partially Turboelectric Propulsion Control Design
In support of aviation fuel burn and emission reduction goals, NASA is pursuing high-payoff research investments that promise to transform aviation. This includes investments in Electrified Aircraft Propulsion (EAP). Multiple technology challenges must be addressed to unlock the full potential of EAP. This includes addressing challenges related to propulsion controls, which will be vital for ensuring efficient coordinated operation of EAP subsystems. This paper presents results from real-time hardware-in-the-loop testing of a control design for a single aisle partially-turboelectric aircraft propulsion concept conducted at the NASA Electric Aircraft Testbed (NEAT) facility. The control system under test is designed for a propulsion concept consisting of two wing-mounted turbofan engines that produce thrust and generate electrical power to drive a boundary layer ingesting tailfan propulsor via an electrical motor. An integrated control strategy is applied to ensure coordinated operation of the turbofan and tailfan subsystems during steady-state and transient operation throughout the flight envelope. The NEAT test of this integrated control design consists of a partially hardware-in-the-loop, partially simulated configuration. A subscale representation of the electrical system design is implemented in hardware and mechanically coupled to electric machines that emulate turbomachinery and propulsor shaft dynamics. The hardware configuration is then operated under the control of a real-time computer application that runs a simulation of the propulsion system and the developed control logic. The NEAT facility test campaign includes a series of experiments that subject the control design to throttle transients conducted throughout the flight envelope and full-flight mission profiles. Testing under simulated performance degradation is also conducted to evaluate control design robustness. This includes constant and abrupt changes in degradation levels. Results from the hardware-in-the-loop test are presented and shown to be in good agreement with pre-test simulation predictions demonstrating the efficacy of the integrated control design approach.