Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “dielectrics”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 937 records · Page 52

Sensor Integrated Metal Dielectric Filters for Solar-Blind Silicon Ultraviolet Detectors

A filter for electromagnetic radiation including one or more dielectric spacer regions and one or more reflective regions integrated on a semiconductor substrate, the semiconductor substrate including a semiconductor photodetector, such that the filter transmits ultraviolet radiation to the semiconductor photodetector, the ultraviolet radiation having a range of wavelengths, and the filter suppresses transmission of electromagnetic radiation, having wavelengths outside the range of wavelengths, to the semiconductor photodetector.

Hoenk, Michael E.↗

On the Convergence of Numerical Computations for Both Exact and Approximate Solutions for Electromagnetic Scattering by Nonspherical Dielectric Particles

We summarize the size parameter range of the applicability of four lightscattering computational methods for nonspheric dielectric particles. These methods include two exact methods - the extended boundary condition method (EBCM) and the invariant imbedding T-matrix method (II-TM) and two approximate approaches - the physical-geometric optics method (PGOM) and the improved geometric optics method (IGOM). For spheroids, the single-scattering properties computed by EBCM and II-TM agree for size parameters up to 150, and the comparison gives us confidence in using IITM as a benchmark for size parameters up to 150 for other geometries (e.g., hexagonal columns) because the applicability of II-TM with respect to particle shape is generic, as demonstrated in our previous studies involving a complex aggregate. This study demonstrates the convergence of the exact II-TM and approximate PGOM solutions for the complete set of single-scattering properties of a nonspherical shape other than spheroids and circular cylinders with particle sizes of ~48λ, specifically a hexagonal column with a size parameter of length as kL=300, where k=2π/λ and L is the column length. IGOM is also quite accurate except near the exact 180º backscattering direction. This study demonstrates that a synergetic combination of the numerically-exact II-TM and the approximate PGOM can seamlessly cover the entire size parameter range of practical interest. To demonstrate the applicability of the approach, we compute the optical properties of dust particles with a downstream application to the retrieval of dust aerosol optical thickness and effective particle size from polarimetric observations.

Ping Yang↗

A Test-Bed Validation of Electromagnetic Surface Wave Propagation Along a Dielectric-Coated Metal Pipe

This paper provides a summary of the results of an attempt at experimental verification of the propagation of electromagnetic surface waves at microwaves frequencies, in and along the uniform dielectric coating of a circular cylindrical metal pipe, based on the previously established theoretical investigation. These experimental results are of value for the diagnostic of anomalies on the surface of tar-coated pipes used in protecting the underground power transmission cables (feeder pipes). A test-bed was designed and implemented using an aluminum tubes (10” diameter) with an acrylic tube coating (0.25” thickness). Two identical wave launcher/receiver arrays, each of 32 elements around the tube for relatively uniform radiation/reception, were designed and fabricated at the frequency of interest (~6 GHz). This arrangement was put in a specially designed small anechoic chamber and attached to a network analyzer. A variety of tests were performed to establish the launch efficiency, prove surface wave propagation along, and reflection from different types of anomalies on the coating. In the paper, a number of test results and supporting graphs will be provided and future work for improving the performance of the launch array and the test-bed arrangement for better results will be outlined.

Gatti, Mark↗

Effect of High-K Dielectric Layer on 1/f Noise Behavior in Graphene Field-Effect Transistors

We report the 1/f noise characteristics at low-frequency in graphene field-effect transistors that utilized a high- dielectric tantalum oxide encapsulated layer (a few nanometers thick) placed by atomic layer deposition on Si3N4. A low-noise level of ~ 2.2  10-10 Hz-1 has been obtained at f = 10 Hz. The origin and physical mechanism of the noise can be interpreted by the McWhorter context, where fluctuations in the carrier number contribute dominantly to the low-frequency noise. Optimizing fabrication processes reduced the number of charged impurities in the graphene field-effect transistors. The study has provided insights into the underlying physical mechanisms of the noise at low-frequency for reducing the noise in graphene-based devices.

Yifei Wang↗

Seawater Dielectric Constant At L-Band: How Consistent Are New Parametrisations Inferred from Smos and Laboratory Measurements?

The accuracy of the Sea Surface Salinity (SSS) retrieved from L-Band radiometer measurements is strongly dependent on the accuracy of the modelling of the dielectric constant (ε). Two new ε parametrizations have recently been developed based on one hand on the Soil Moisture and Ocean Salinity (SMOS) satellite multi-angular brightness temperature measurements and on the other hand on new laboratory measurements. These two approaches are fully independent. These new ε parametrizations are compared with each other and with the ε models previously in use in the SMOS, Soil Moisture Active Passive (SMAP) and Aquarius SSS retrievals. The two new ε parametrizations are found to be in closer agreement than with earlier parametrizations for most common ocean conditions. We will further study to which extent the recent SMOS CCI+SSS v3 reprocessing confirms the above results and could help resolve remaining inconsistencies.

SMOS↗

A Heuristic Method for Determining the Necessary Time Duration of Electron Beam Tests ESD of Spacecraft Dielectrics

Electrostatic discharge or ESD can pose a significant risk to spacecraft in many space environments. Laboratory electron beam facilities can be used to test the performance of candidate spacecraft dielectrics. However, limited resources necessitate accelerated testing. The aim of this work is the development of a criterion for determining when an ESD test has run for sufficient time to capture representative ESD behavior. Such a criterion has the potential of saving hours of personnel and facility time per test. A comparison of the distributions of ESD event magnitudes from consecutive segments of an ESD test can be used to determine when the test has reached a quasi-steady state. Once this quasi-steady state has been observed the test may be truncated without a significant reduction in test fidelity.

Chinn, James↗

Measurement of Secondary Electron Yield from Dielectric Materials

Secondary Electron Yield (SEY) is a material property that plays a fundamental role in material and spacecraft charging. SEY values for dielectric materials (insulators) are crucial inputs to models used to assess mission risk posed by high differential voltages and electrostatic discharge (ESD) on spacecraft. There are only two (non-NASA) facilities that attempt such measurements. The lack of NASA capability results in high cost and long, unpredictable schedules to obtain measurements. Future Artemis crewed lunar surface missions will involve the first use of many insulating materials for which SEY properties are poorly understood or absent entirely. Unconstrained SEY values in models increase uncertainty in charging/ESD risk assessment. The capability for reliable SEY determination will lead to improved charging and ESD risk assessments. We are developing a new capability, using pulsed ultralow (<femtoampere) incident electron beam intensity to eliminate sample charging, coupled with sensitive non-contact surface potential measurements, to measure secondary electron yield (SEY) from insulating materials. Present methods for SEY measurement on insulators suffer from highly inconsistent results due to sample charging from the incident electron beam during the measurement. In this first phase we are leveraging existing EM41 instrumentation, facilities, and expertise to perform proof-of-concept tests.

secondary electron emission↗

Isotropic etchback method of linewidth tailoring multilayer dielectric diffraction gratings for improvement of laser damage resistance and diffraction efficiency

A method of fabricating a multilayer dielectric (MLD) diffraction grating by providing a multilayer stack having a grating layer, and anisotropically etching the grating layer to form grating lines having an initial lineheight, an initial linewidth, and an initial grating duty cycle, that are greater than a target lineheight, a target linewidth, and a target grating duty cycle, respectively. An isotropic wet etch solution is then used to etch back the grating lines to the target lineheight, the target linewidth, and the target grating duty cycle so as to minimize electric field intensities and maximize diffraction efficiency for a given set of MLD illumination conditions.

Britten, Jerald A.↗

Efficient ultrathin all-dielectric nonlinear optical device

An apparatus and method are provided for generating harmonic light from a pump beam that is impinged on a metasurface comprising a plurality of all-dielectric resonator bodies. A multiple quantum well structure formed in each resonator body includes asymmetric coupled quantum wells having intersubband transition frequencies that couple to Mie resonances of the resonator bodies.

Sarma, Raktim↗