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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5
All sourcesNASA NTRSDOE OSTI
NASA NTRS1987

Analytic representations of secondary-electron spectra

A general method for systematizing a bulk of data on the secondary-electron spectrum into a small number of indices is shown. The method is based on thorough examination of the mathematical physics that governs the spectrum. Several examples of the analysis of recent experimental data on proton impact are presented.

Inokuti, Mitio↗
NASA NTRS1985

Secondary electron emission from a charged dielectric

Charges on the surface of fluorinated-ethylene-propylene affect its secondary electron emission coefficient. Measurements with impact energies exceeding that energy which causes peak emission have been made in regions where the local electric field produced by the surface charge is normal to the surface and in regions where it is oblique. The surface of the 6-mm wide specimen was charged to either 6 or 10 kV. Because the impinging primary beam was deflected by the charged specimen, numerical modeling was used to predict the beam's impact energy E, impact angle theta, and the impact point. The formula predicts the coefficient in the region of normal field up to 60 deg although E(0) depends upon the electric field and also on the history of the specimen. Near the edges where the field is oblique, the measured coefficient departs significantly from what the formula predicts.

Budd, P. A.↗
NASA NTRS1991

A search for parallel electric fields by observing secondary electrons and photoelectrons in the low-altitude auroral zone

Model calculations are performed demonstrating the effect of weak parallel electric fields on the differential spectra of the low-energy electrons observed in the inverted-V electron precipitation events in the topside ionosphere. A comparison of the altitude dependence of the observed spectra with the model calculations shows that there can be, on average, no more than a 2-V potential drop between the altitudes of 400 and 900 km, corresponding to a distributed parallel dc electric field of less than 4 microV/m under the inverted-V electron precipitation regions. Statistical results are presented on the spectral dependence of secondary electrons on the inverted-V primary beam parameters.

Fung, Shing F.↗
NASA NTRS1995

A study of secondary electron emission effects for suppressing passive intermodulation interference in high power communication satellites

In this paper a study of secondary electron emission effects for suppressing passive intermodulation interference in high power communications satellites is studied. The test facility is described and the test results are provided. The effects of environmental factors on the secondary emission coefficient are given. It is found that certain refractory compounds are very promising in eliminating some of the passive intermodulation in satellite communications.

Bosisio, Renato G.↗
DOE OSTI2021

Advanced focusing system for secondary electrons in a bunch shape monitor

Non-destructive measurements of longitudinal beam profile in non-relativistic hadron accelerators are usually performed with Bunch Shape Monitors that utilize secondary electron emission to reproduce the shape of a primary ion beam. The existing devices, however, have poor electron collection efficiency from the wire and are limited to one dimensional measurements of the phase coordinate. Here, we present the development of a bunch shape monitor with improved performance for proton beams to be used in the Spallation Neutron Source accelerator. This improvement was achieved by adding focusing optics between the wire and the entrance slit, which will also allow measurements over a much higher dynamic range. Here we present the design, simulation and experimental test results of the developed new electron beam guidance system for the existing SNS bunch shape monitor that allowed significant improvement in the collection efficiency.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
NASA NTRS1977

Secondary-electron-emission properties of conducting surfaces with application to multistage depressed collectors for microwave amplifiers

To improve the efficiency of high power microwave tubes, low secondary electron yield electrode surface for use in depressed collectors are needed. The secondary emission characteristics of a number of materials were investigated. The materials studied were beryllium, carbon (soot and pyrolytic graphite), copper, titanium carbide, and tantalum. Both total secondary yield delta and relative reflected primary yield were measured. These measurements were made in conjunction with Auger spectroscopy so that the secondary emission characteristics could be determined as a function of surface contamination or purity. The results show that low atomic weight elements, such as beryllium and carbon, have the lowest reflected primary yield and that roughening the surface of an electrode can markedly decrease secondary yield both for delta and reflected primaries. All factors considered, a roughened pyrolytic graphite surface showed the greatest potential for use as an electrode surface in depressed collectors.

Forman, R.↗
DOE OSTI2025

Atomic-scale secondary electron imaging for heterogeneous catalysis research

Surface characterization at the atomic scale is essential for understanding the catalytic properties of supported metal nanoparticles. Secondary electron (SE) imaging in scanning transmission electron microscopy (STEM) provides three-dimensional surface topographic information, enabling the characterization of the size, morphology, and distribution of supported nanoparticles. Furthermore, real-time observation of catalyst materials in a gaseous environment would enhance the understanding of catalyst dynamics under operational conditions. Ongoing technical developments in SE-STEM and advancements in computational methods are expected to facilitate atomic-scale surface observations and enable more quantitative and statistical analyses. This progress will not only elucidate fundamental mechanisms at the atomic level but also provide comprehensive and universal insights into catalyst performances. Here, this minireview showcases the recent advancements and research findings in surface-sensitive SE imaging in STEM for the characterization of active catalyst materials.

77 NANOSCIENCE AND NANOTECHNOLOGY↗
NASA NTRS1993

An Effective Secondary Electron Emission Suppression Treatment For Copper MDC

Untreated oxygen-free, high-conductivity (OFHC) copper, commonly used for MDC electrodes, exhibits relatively high secondary electron emission characteristics. This paper describes a specialized ion-bombardment procedure for texturing copper surfaces which sharply reduces the emission properties relative to untreated copper. The resulting surface is a particle-free, robust, uniformly highly-textured all-metal structure. The use of this process requires no modifications to copper machining, brazing, or other MDC normal fabrication procedures. The flight TWT for a planned NASA deep space probe, the Cassini Mission, will incorporate copper MDC electrodes treated with the method described here.

Curren, Arthur N.↗
NASA NTRS2012

Laboratory Measurements on Charging of Individual Micron-Size Apollo-11 Dust Grains by Secondary Electron Emissions

Observations made during Apollo missions, as well as theoretical models indicate that the lunar surface and dust grains are electrostatically charged, levitated and transported. Lunar dust grains are charged by UV photoelectric emissions on the lunar dayside and by the impact of the solar wind electrons on the nightside. The knowledge of charging properties of individual lunar dust grains is important for developing appropriate theoretical models and mitigating strategies. Currently, very limited experimental data are available for charging of individual micron-size size lunar dust grains in particular by low energy electron impact. However, experimental results based on extensive laboratory measurements on the charging of individual 0.2-13 micron size lunar dust grains by the secondary electron emissions (SEE) have been presented in a recent publication. The SEE process of charging of micron-size dust grains, however, is found to be very complex phenomena with strong particle size dependence. In this paper we present some examples of the complex nature of the SEE properties of positively charged individual lunar dust grains levitated in an electrodynamic balance (EDB), and show that they remain unaffected by the variation of the AC field employed in the above mentioned measurements.

Tankosic, D.↗
NASA NTRS2020

Methods of Measuring Secondary Electron Emission and Analysis of Spacecraft Charging Simulation

The scope of the internship project was to help the Electrostatics and Surface Physics Laboratory (ESPL) at KSC gain an understanding as to what parameters related to secondary electron emission (SEE), and electrostatic discharge (ESD) could be measured within its own facilities. As well as assistance in developing a plan for the ESPL to acquire the capabilities to measure other necessary parameters, to reduce the reliance on measurement data from facilities outside of the agency. The intern also worked closely with agency customers of the Launch Services Program (LSP) in expanding the MAPTIS database to incorporate various electrostatic and physical properties of materials used in the Gateway Program. This involved cross-center collaboration with industry and NASA contracted academia members in order to fill in the gaps of data that is missing from the database. Overall, the internship provided assistance in coordinating the approval for more materials to be added to the MAPTIS database, and continuing to assist the team at the ESPL in their consulting work for the agency through the use of various spacecraft charging and ESD simulation programs (i.e., NASCAP, NUMIT2.1). As well as assisting in the CAD design and implementation of an electrodynamic dust shield (EDS) for use in upcoming spaceflight missions. This was all done with the aim of helping the ESPL demonstrate its capabilities for the agency, and to continue expanding and localizing measurement techniques at KSC to help streamline obtaining the information NASA needs to ensure safety in current and future missions.

dust↗
NASA NTRS1998

Diamond Analyzed by Secondary Electron Emission Spectroscopy

Diamond is a promising semiconductor material for novel electronic applications because of its chemical stability and inertness, heat conduction properties, and so-called negative electron affinity (NEA). When a surface has NEA, electrons generated inside the bulk of the material are able to come out into the vacuum without any potential barrier (work function). Such a material would have an extremely high secondary electron emission coefficient o, very high photoelectron (quantum) yield, and would probably be an efficient field emitter. Chemical-vapor-deposited (CVD) polycrystalline diamond films have even more advantages than diamond single crystals. Their fabrication is relatively easy and inexpensive, and they can be grown with high levels of doping--consequently, they can have relatively high conductivity. Because of these properties, diamond can be used for cold cathodes and photocathodes in high-power electronics and in high-frequency and high-temperature semiconductor devices.

Krainsky, Isay L.↗
NASA NTRS1979

The role of energetic particle precipitation in Jovian magnetospherics. I - Secondary electrons from the ionosphere of Jupiter

Escape of photoelectrons from the Jovian ionosphere produces only a meager source of thermal plasma for the inflated centrifugally unstable magnetosphere and is unable to account for the 100 eV thermal plasma temperatures of the magnetosphere. Since the Jovian magnetosphere is well populated with highly energetic electrons, the creation of secondaries and the energy degradation of the primaries precipitating into the lower ionosphere provide additional sources of magnetospheric thermal plasma as well as of the energy for further elevating the plasma temperatures in the top side ionosphere. The efficiencies with which escaping electrons are created by precipitating electrons with energies up to several MeV are computed using energetic electron transport and thermalization codes. The more energetic incident fluxes are far less efficient in creating escaping electrons than the lower energy fluxes with only 0.001% of the secondaries escaping for a 1 MeV source versus 3% for a 1 keV source. Incident fluxes of the order of 10 to 100 per sq cm per sec per eV between 100 eV and 100 keV are required to produce 50 eV escape fluxes comparable to those generated by solar EUV.

Swartz, W. E.↗
DOE OSTI2025

NOVEL METHODS FOR IN SITU HIGH DENSITY SURFACE CLEANING SCRUBBING OF ULTRAHIGH VAC LONG NARROW TUBES TO REDUCE SECONDARY ELECTRON YIELD AND OUT GASSING

This project developed new methods for cleaning the inside surfaces of very long, narrow vacuum tubes used in particle accelerators. Traditional cleaning approaches are expensive, slow, or difficult to implement in accelerator tunnels. We designed and tested a portable plasma discharge cleaning system that uses lower-cost microwave and magnetron technologies to reduce outgassing and secondary electron emission from stainless steel and copper surfaces. The system, called the Plasma Discharge Test System (PDTS), allows accelerator components to be scrubbed more efficiently, which can improve performance and reduce maintenance costs for research and industrial applications.

POOLE, JOE HENRY [PRESIDENT]↗