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At least 91 records · Page 5

The Impact of Back-Sputtered Carbon on the Accelerator Grid Wear Rates of the NEXT and NSTAR Ion Thrusters

A study was conducted to quantify the impact of back-sputtered carbon on the downstream accelerator grid erosion rates of the NASA's Evolutionary Xenon Thruster (NEXT) Long Duration Test (LDT1). A similar analysis that was conducted for the NASA's Solar Electric Propulsion Technology Applications Readiness Program (NSTAR) Life Demonstration Test (LDT2) was used as a foundation for the analysis developed herein. A new carbon surface coverage model was developed that accounted for multiple carbon adlayers before complete surface coverage is achieved. The resulting model requires knowledge of more model inputs, so they were conservatively estimated using the results of past thin film sputtering studies and particle reflection predictions. In addition, accelerator current densities across the grid were rigorously determined using an ion optics code to determine accelerator current distributions and an algorithm to determine beam current densities along a grid using downstream measurements. The improved analysis was applied to the NSTAR test results for evaluation. The improved analysis demonstrated that the impact of back-sputtered carbon on pit and groove wear rate for the NSTAR LDT2 was negligible throughout most of eroded grid radius. The improved analysis also predicted the accelerator current density for transition from net erosion to net deposition considerably more accurately than the original analysis. The improved analysis was used to estimate the impact of back-sputtered carbon on the accelerator grid pit and groove wear rate of the NEXT Long Duration Test (LDT1). Unlike the NSTAR analysis, the NEXT analysis was more challenging because the thruster was operated for extended durations at various operating conditions and was unavailable for measurements because the test is ongoing. As a result, the NEXT LDT1 estimates presented herein are considered preliminary until the results of future post-test analyses are incorporated. The worst-case impact of carbon back-sputtering was determined to be the full power operating condition, but the maximum impact of back-sputtered carbon was only a 4 percent reduction in wear rate. As a result, back-sputtered carbon is estimated to have an insignificant impact on the first failure mode of the NEXT LDT1 at all operating conditions.

Soulas, George C.↗

Mutagenesis in human cells with accelerated H and Fe ions

The overall goals of this research were to determine the risks of mutation induction and the spectra of mutations induced by energetic protons and iron ions at two loci in human lymphoid cells. During the three year grant period the research has focused in three major areas: (1) the acquisition of sufficient statistics for human TK6 cell mutation experiments using Fe ions (400 MeV/amu), Fe ions (600 MeV/amu) and protons (250 MeV/amu); (2) collection of thymidine kinase- deficient (tk) mutants or hypoxanthine phosphoribosyltransferase deficient (hprt) mutants induced by either Fe 400 MeV/amu, Fe 600 MeV/amu, or H 250 MeV/amu for subsequent molecular analysis; and (3) molecular characterization of mutants isolated after exposure to Fe ions (600 MeV/amu). As a result of the shutdown of the BEVALAC heavy ion accelerator in December 1992, efforts were rearranged somewhat in time to complete our dose-response studies and to complete mutant collections in particular for the Fe ion beams prior to the shutdown. These goals have been achieved. A major effort was placed on collection, re-screening, and archiving of 3 different series of mutants for the various particle beam exposures: tk-ng mutants, tk-sg mutants, and hprt-deficient mutants. Where possible, groups of mutants were isolated for several particle fluences. Comparative analysis of mutation spectra has occured with characterization of the mutation spectrum for hprt-deficient mutants obtained after exposure of TK6 cells to Fe ions (600 MeV/amu) and a series of spontaneous mutants.

Kronenberg, Amy↗

Degradation mechanisms of materials for large space systems in low Earth orbit

Degradation was explored of various materials used in aerospace vehicles after severe loss of polymeric material coatings (Kapton) was observed on an early shuttle flight in low Earth orbit. Since atomic oxygen is the major component of the atmosphere at 300 km, and the shuttle's orbital velocity produced relative motion corresponding to approx. 5 eV of oxygen energy, it was natural to attribute much of this degradation to oxygen interaction. This assumption was tested using large volume vacuum systems and ion beam sources, in an exploratory effort to produce atomic oxygen of the appropriate energy, and to observe mass loss from various samples as well as optical radiation. Several investigations were initiated and the results of these investigations are presented in four papers. These papers are summarized. They are entitled: (1) The Space Shuttle Glow; (2) Laboratory Degradation of Kapton in a Low Energy Oxygen Ion Beam; (3) The Energy Dependence and Surface Morphology of Kapton Degradation Under Atomic Oxygen Bombardment; and (4) Surface Analysis of STS 8 Samples.

Gordon, William L.↗

A future, intense source of negative hydrogen ions

By directly heating lithium hydride in a vacuum, up to 18 micro-A/sq cm of negative hydrogen has been obtained from the crystal lattice. The amount of ion current extracted and analyzed is closely related to the temperature of the sample and to the rate at which the temperature is changed. The ion current appears to be emission limited and saturates with extraction voltage. For a fixed extraction voltage, the ion current could be maximized by placing a grid between the sample surface and the extraction electrode. Electrons accompanying the negative ions were removed by a magnetic trap. A Wein velocity filter was designed and built to provide definitive mass analysis of the extracted ion species. This technique when applied to other alkali hydrides may produce even higher intensity beams possessing low values of emittance.

Siefken, Hugh↗

Electromagnetic Cyclotron Waves in the Solar Wind: Wind Observation and Wave Dispersion Analysis

Wind observed long-lasting electromagnetic cyclotron waves near the proton cyclotron frequency on 11 March 2005, in the descending part of a fast wind stream. Bi-Maxwellian velocity distributions are fitted for core protons, beam protons, and alpha-particles. Using the fitted plasma parameters we conduct kinetic linear dispersion analysis and find ion cyclotron and/or firehose instabilities grow in six of 10 wave intervals. After Doppler shift, some of the waves have frequency and polarization consistent with observation, thus may be correspondence to the cyclotron waves observed.

cyclotron↗

A data acquisition and storage system for the ion auxiliary propulsion system cyclic thruster test

A nine-track tape drive interfaced to a standard personal computer was used to transport data from a remote test site to the NASA Lewis mainframe computer for analysis. The Cyclic Ground Test of the Ion Auxiliary Propulsion System (IAPS), which successfully achieved its goal of 2557 cycles and 7057 hr of thrusting beam on time generated several megabytes of test data over many months of continuous testing. A flight-like controller and power supply were used to control the thruster and acquire data. Thruster data was converted to RS232 format and transmitted to a personal computer, which stored the raw digital data on the nine-track tape. The tape format was such that with minor modifications, mainframe flight data analysis software could be used to analyze the Cyclic Ground Test data. The personal computer also converted the digital data to engineering units and displayed real time thruster parameters. Hardcopy data was printed at a rate dependent on thruster operating conditions. The tape drive provided a convenient means to transport the data to the mainframe for analysis, and avoided a development effort for new data analysis software for the Cyclic test. This paper describes the data system, interfacing and software requirements.

Hamley, John A.↗

AUREOL-3 observations of new boundaries in the auroral ion precipitation

Interesting and well-separated structures in the 1-20 keV ion precipitation pattern have been revealed by an analysis of more than 50 crossings of the nightside (21-03 MLT) auroral zone by the AUREOL-3 satellite. First, velocity-dispersed ion structures (VDIS) are crossed near the poleward edge of the oval, and are the best ionospheric signature of ion beams flowing along the plasma sheet boundary layer. Proceeding equatorward, a large majority of VDIS events are bounded by a new and interesting narrow band of strongly reduced precipitation, or a gap, which delineates VDIS from the diffuse precipitation region connected to the CPS. A statistical analysis shows that the gap has an extent of about 1-2 deg, which is almost independent of magnetic activity; its location, about 70 deg ILAT, shifts significantly equatorward with higher magnetic activity levels. Intense electron arcs are observed near the equatorward edge of the gap. An important result is that the overall sequence of VDIS-gap-CPS can be explained in terms of orbital dynamics in the tail. The gap in precipitation appears as the counterpart of the 'wall' regime in the equatorial plane, in which a cross-tail current carried by energetic ions is strongly enhanced between 8 and 12 R(E). This region has important consequences for the development of substorms.

Bosqued, Jean M.↗

Diagnosis of NMOS DRAM functional performance as affected by a picosecond dye laser

A picosec pulsed dye laser beam was at selected wavelengths successfully used to simulate heavy-ion single-event effects (SEEs) in negative channel NMOS DRAMs. A DRAM was used to develop the test technique because bit-mapping capability and previous heavy-ion upset data were available. The present analysis is the first to establish such a correlation between laser and heavy-ion data for devices, such as the NMOS DRAM, where charge collection is dominated by long-range diffusion, which is controlled by carrier density at remote distances from a depletion region. In the latter case, penetration depth is an important parameter and is included in the present analysis. A single-pulse picosecond dye laser beam (1.5 microns diameter) focused onto a single cell component can upset a single memory cell; clusters of memory cell upsets (multiple errors) were observed when the laser energy was increased above the threshold energy. The multiple errors were analyzed as a function of the bias voltage and total energy of a single pulse. A diffusion model to distinguish the multiple upsets from the laser-induced charge agreed well with previously reported heavy ion data.

Kim, Q.↗

Transmission Electron Microscopy of Magnetite Plaquettes in Orgueil

Magnetite sometimes takes the form of a plaquette - barrel-shaped stack of magnetite disks - in carbonaceous chondrites (CC) that show evidence of aqueous alteration. The asymmetric nature of the plaquettes caused Pizzarello and Groy to propose magnetite plaquettes as a naturally asymmetric mineral that can indroduce symmetry-breaking in organic molecules. Our previous synchrotron X-ray computed microtomography (SXRCT) and electron backscatter diffraction (EBSD) analyses of the magnetite plaquettes in fifteen CCs indicate that magnetite plaquettes are composed of nearly parallel discs, and the crystallographic orientations of the discs change around a rotational axis normal to the discs surfaces. In order to further investigate the nanostructures of magnetite plaquettes, we made two focused ion beam (FIB) sections of nine magnetite plaquettes from a thin section of CI Orgueil for transmission electron microscope (TEM) analysis. The X-ray spectrum imaging shows that the magnetite discs are purely iron oxide Fe3O4 (42.9 at% Fe and 57.1 at% O), which suggest that the plaquettes are of aqueous origin as it is difficult to form pure magnetite as a nebular condensate. The selected area electron diffraction (SAED) patterns acquired across the plaquettes show that the magnetite discs are single crystals. SEM and EBSD analyses suggest that the planar surfaces of the magnetite discs belong to the {100} planes of the cubic inverse spinel structure, which are supported by our TEM observations. Kerridge et al. suggested that the epitaxial relationship between magnetite plaquette and carbonate determines the magnetite face. However, according to our TEM observation, the association of magnetite with porous networks of phyllosilicate indicates that the epitaxial relationship with carbonate is not essential to the formation of magnetite plaquettes. It was difficult to determine the preferred rotational orientation of the plaquettes due to the symmetry of the cubic structure, however, we are able to observe small but consistent rotational orientation across several discs within a plaquette.

Chan, Q. H. S.↗

Laboratory Studies in UV and EUV Solar Physics

The Ion Beam Experiment at the Center for Astrophysics is dedicated to the study of ion-electron collision processes of importance in solar physics. The analysis of measurements of Electron Impact Excitation (EIE) from the 3s3p(exp 3)P(exp o) metastable state to the 3s3p(exp 1)P state of Si(2+) was completed during the past year and a paper describing the results is available as a preprint. Our current program is directed at measuring absolute cross sections for dielectronic recombination (DR) and EIE in Si(3+), one of the primary ions used for probing the solar transition region. Our study of DR is particularly concerned with the effects of electric and magnetic fields on the recombination rates. Measurements of silicon ions with charge greater than n=2 have necessitated upgrading the experiment with a new ion source. The new source is also suitable for producing C(2+) beams to be used for measurements of EIE and DR for that system. The source is expected to be capable of producing beams of more highly charged systems as well.

Parkinson, W. H.↗

Preparation of Regular Specimens for Atom Probes

A method of preparation of specimens of non-electropolishable materials for analysis by atom probes is being developed as a superior alternative to a prior method. In comparison with the prior method, the present method involves less processing time. Also, whereas the prior method yields irregularly shaped and sized specimens, the present developmental method offers the potential to prepare specimens of regular shape and size. The prior method is called the method of sharp shards because it involves crushing the material of interest and selecting microscopic sharp shards of the material for use as specimens. Each selected shard is oriented with its sharp tip facing away from the tip of a stainless-steel pin and is glued to the tip of the pin by use of silver epoxy. Then the shard is milled by use of a focused ion beam (FIB) to make the shard very thin (relative to its length) and to make its tip sharp enough for atom-probe analysis. The method of sharp shards is extremely time-consuming because the selection of shards must be performed with the help of a microscope, the shards must be positioned on the pins by use of micromanipulators, and the irregularity of size and shape necessitates many hours of FIB milling to sharpen each shard. In the present method, a flat slab of the material of interest (e.g., a polished sample of rock or a coated semiconductor wafer) is mounted in the sample holder of a dicing saw of the type conventionally used to cut individual integrated circuits out of the wafers on which they are fabricated in batches. A saw blade appropriate to the material of interest is selected. The depth of cut and the distance between successive parallel cuts is made such that what is left after the cuts is a series of thin, parallel ridges on a solid base. Then the workpiece is rotated 90 and the pattern of cuts is repeated, leaving behind a square array of square posts on the solid base. The posts can be made regular, long, and thin, as required for samples for atom-probe analysis. Because of their small volume and regularity, the amount of FIB-milling time can be much less than that of the method of sharp shards. Individual posts can be broken off for mounting in a manner similar to that of the method of sharp shards. Alternatively, the posts can be left intact on the base and the base can be cut to a small square (e.g., 3 by 3 mm) suitable for mounting in an atom probe of a type capable of accepting multiple-tip specimens. The advantage of multiple-tip specimens is the possibility of analyzing many tips without the time-consuming interchange of specimens.

Kuhlman, Kim↗

Testing and Analysis of NEXT Ion Engine Discharge Cathode Assembly Wear

Experimental and analytical investigations were conducted to predict the wear of the discharge cathode keeper in the NASA Evolutionary Xenon Thruster. The ion current to the keeper was found to be highly dependent upon the beam current, and the average beam current density was nearly identical to that of the NSTAR thruster for comparable beam current density. The ion current distribution was highly peaked toward the keeper orifice. A deterministic wear assessment predicted keeper orifice erosion to the same diameter as the cathode tube after processing 375 kg of xenon. A rough estimate of discharge cathode assembly life limit due to sputtering indicated that the current design exceeds the qualification goal of 405 kg. Probabilistic wear analysis showed that the plasma potential and the sputter yield contributed most to the uncertainty in the wear assessment. It was recommended that fundamental experimental and modeling efforts focus on accurately describing the plasma potential and the sputtering yield.

Domonkos, Matthew T.↗

Observations of enhanced ion line frequency spectrum during Arecibo ionospheric modification experiment

The Arecibo 430 MHz incoherent scatter radar (ISR) was used to monitor the effects of modifying the ionosphere by a high power HF transmitter feeding the 305 m reflector antenna. When in the ordinary magnetoionic mode parametric instabilities develop in the ionosphere near the reflection level. Manifestations of these instabilities are the strong enhancement of Langmuir oscillations in the direction of the ISR beam at a wavelength of 35 cm and the simultaneous much weaker enhancement of ion oscillations in that direction. The spectral analysis of the enhanced peak with a height resolution of 2.4 km shows that the ionic mode enhancement most often has a double humped frequency spectrum corresponding to up- and down-going ion acoustic waves. The shape of the frequency spectrum is interpreted in terms of a stable oscillation which is driven by a secondary electrostatic field caused by nonlinear interaction of Langmuir waves within a cone centered on the magnetic field and by the scattering of the pump field on stable Langmuir waves travelling along the direction of the ISR.

Hagfors, T.↗

A model for nitrogen chemisorption in ion thrusters

A theoretical model describing the formation of nitrogen species subject to chemisorption on ion thruster discharge chamber surfaces is presented. Molecules, atoms, atomic ions and molecular ions are identified as the important species in the analysis. Current densities of the atomic and molecular ions predicted by the model are compared to current densities measured in the beam of a SERT II thruster. The predicted and measured values of these two current densities are shown to agree within about + or - 100%. The mechanisms involved in the erosion of a surface subjected to simultaneous nitrogen chemisorption and sputter erosion by high energy ions are also discussed.

Wilbur, P. J.↗

Spectroscopic chemical analysis methods and apparatus

Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. Chemical analysis instruments employed in some embodiments include capillary and gel plane electrophoresis, capillary electrochromatography, high performance liquid chromatography, flow cytometry, flow cells for liquids and aerosols, and surface detection instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification. In some embodiments Raman analysis is conducted simultaneously with native fluorescence spectroscopy to provide high levels of sensitivity and specificity in the same instrument.

Hug, William F.↗

Spectroscopic chemical analysis methods and apparatus

Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. Chemical analysis instruments employed in some embodiments include capillary and gel plane electrophoresis, capillary electrochromatography, high performance liquid chromatography, flow cytometry, flow cells for liquids and aerosols, and surface detection instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification. In some embodiments Raman analysis is conducted simultaneously with native fluorescence spectroscopy to provide high levels of sensitivity and specificity in the same instrument.

Hug, William F.↗

Spectroscopic chemical analysis methods and apparatus

Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. Chemical analysis instruments employed in some embodiments include capillary and gel plane electrophoresis, capillary electrochromatography, high performance liquid chromatography, flow cytometry, flow cells for liquids and aerosols, and surface detection instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification. In some embodiments Raman analysis is conducted along with photoluminescence spectroscopy (i.e. fluorescence and/or phosphorescence spectroscopy) to provide high levels of sensitivity and specificity in the same instrument.

Hug, William F.↗

Spectroscopic Chemical Analysis Methods and Apparatus

Spectroscopic chemical analysis methods and apparatus are disclosed which employ deep ultraviolet (e.g. in the 200 nm to 300 nm spectral range) electron beam pumped wide bandgap semiconductor lasers, incoherent wide bandgap semiconductor light emitting devices, and hollow cathode metal ion lasers to perform non-contact, non-invasive detection of unknown chemical analytes. These deep ultraviolet sources enable dramatic size, weight and power consumption reductions of chemical analysis instruments. In some embodiments, Raman spectroscopic detection methods and apparatus use ultra-narrow-band angle tuning filters, acousto-optic tuning filters, and temperature tuned filters to enable ultra-miniature analyzers for chemical identification. In some embodiments Raman analysis is conducted along with photoluminescence spectroscopy (i.e. fluorescence and/or phosphorescence spectroscopy) to provide high levels of sensitivity and specificity in the same instrument.

Hug, William F.↗