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Results for “interferometry metrology”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5
All sourcesNASA NTRSDOE OSTI
NASA NTRS2006

The Least-Squares Calibration on the Micro-Arcsecond Metrology Test Bed

The Space Interferometry Mission (S1M) will measure optical path differences (OPDs) with an accuracy of tens of picometers, requiring precise calibration of the instrument. In this article, we present a calibration approach based on fitting star light interference fringes in the interferometer using a least-squares algorithm. The algorithm is first analyzed for the case of a monochromatic light source with a monochromatic fringe model. Using fringe data measured on the Micro-Arcsecond Metrology (MAM) testbed with a laser source, the error in the determination of the wavelength is shown to be less than 10pm. By using a quasi-monochromatic fringe model, the algorithm can be extended to the case of a white light source with a narrow detection bandwidth. In SIM, because of the finite bandwidth of each CCD pixel, the effect of the fringe envelope can not be neglected, especially for the larger optical path difference range favored for the wavelength calibration.

interferometer calibrations↗
NASA NTRS2012

High-Speed Digital Interferometry

Digitally enhanced heterodyne interferometry (DI) is a laser metrology technique employing pseudo-random noise (PRN) codes phase-modulated onto an optical carrier. Combined with heterodyne interferometry, the PRN code is used to select individual signals, returning the inherent interferometric sensitivity determined by the optical wavelength. The signal isolation arises from the autocorrelation properties of the PRN code, enabling both rejection of spurious signals (e.g., from scattered light) and multiplexing capability using a single metrology system. The minimum separation of optical components is determined by the wavelength of the PRN code.

De Vine, Glenn↗
DOE OSTI2022

Asymptotic optimality of twist-untwist protocols for Heisenberg scaling in atom-based sensing

Twist-untwist protocols for quantum metrology consist of a serial application of (1) unitary nonlinear dynamics (e.g., spin squeezing or Kerr nonlinearity), (2) parameterized dynamics U ( φ ) (e.g., a collective rotation or phase space displacement), and (3) time reversed application of step 1. Such protocols are known to produce states that allow Heisenberg scaling for experimentally accessible estimators of φ even when the nonlinearities are applied for times much shorter than required to produce Schrödinger cat states. In this work, we prove that, asymptotically in the number of particles, twist-untwist protocols provide the lowest estimation error among quantum metrology protocols that utilize two calls to a weakly nonlinear evolution and a readout involving only first and second moments of a total spin operator n → · J → . We consider the following physical settings: all-to-all interactions generated by one-axis twisting J z 2 (e.g., interacting Bose gases), constant finite range spin-spin interactions of distinguishable or bosonic atoms (e.g., trapped ions or Rydberg atoms, or lattice bosons). In these settings, we further show that the optimal twist-untwist protocols asymptotically achieve 85% and 92% of the respective quantum Cramér-Rao bounds. We show that the error of a twist-untwist protocol can be decreased by a factor of L without an increase in the noise of the spin measurement if the twist-untwist protocol can be noiselessly iterated as an L layer quantum alternating operator ansatz.

74 ATOMIC AND MOLECULAR PHYSICS↗
DOE OSTI2023

Ion Beam Figuring System for Synchrotron X-Ray Mirrors Achieving Sub-0.2-µrad and Sub-0.5-nm Root Mean Square

Abstract Optics with high-precision height and slope are increasingly desired in numerous industrial fields. For instance, Kirkpatrick–Baez (KB) mirrors play an important role in synchrotron X-ray applications. A KB system is composed of two aspherical, grazing-incidence mirrors used to focus an X-ray beam. The fabrication of KB mirrors is challenging due to the aspherical departure of the mirror surfaces from base geometries and the high-quality requirements for slope and height residuals. In this paper, we present the process of manufacturing an elliptical cylinder KB mirror using our in-house-developed ion beam figuring (IBF) and metrology technologies. First, the key aspects of figuring and finishing processes with IBF are illustrated in detail. The effect of positioning error on the convergence of the residual slope error is highlighted and compensated. Finally, inspection and cross-validation using different metrology instruments are performed and used as the final validation of the mirror. Results confirm that relative to the requested off-axis ellipse, the mirror has achieved 0.15-µrad root mean square (RMS) and 0.36-nm RMS residual slope and height errors, respectively, while maintaining the initial 0.3-nm RMS microroughness.

36 MATERIALS SCIENCE↗
DOE OSTI2022

Nonlinear quantum interferometric spectroscopy with entangled photon pairs

Here, we develop closed expressions for a time-resolved photon counting signal induced by an entangled photon pair in an interferometric spectroscopy setup. Superoperator expressions in Liouville-space are derived that can account for relaxation and dephasing induced by coupling to a bath. Interferometric setups mix matter and light variables non-trivially, which complicates their interpretation. We provide an intuitive modular framework for this setup that simplifies its description. Based on the separation between the detection stage and the light–matter interaction processes, we show that the pair entanglement time and the interferometric time-variables control the observed physics time scale. Only a few processes contribute in the limiting case of small entanglement time with respect to the sample response, and specific contributions can be singled out.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
NASA NTRS2002

SIM: An end-to-end simulation of the Space Interferometer Mission

We present the basic elements and first results of an end-to-end simulation package whose purpose is to test the validity of the Space Interferometer Mission design. The fundamental simulation time step is one millisecond, with substructure at 118 ms, and the total duration of the simulation is five years. The end product of a given wide-angle astrometry run is an estimated grid star catalog over the entire sky with an accuracy of about 4 micro-arcseconds.

SIM Space Interferometer Mission Space telescopes ↗
NASA NTRS2002

The starlight metrology subsystem

Describes a metrology subsystem for NASA's Starlight mission, a space-based separated-spacecraft stellar interferometer.

metrology, stellar interferometry↗
NASA NTRS2000

Dual Target Metrology

Explore the source record for details and available documents.

metrology optical interferometry dual target heter↗