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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5
All sourcesNASA NTRSDOE OSTI
DOE OSTI2013

Novel Scanning Lens Instrument for Evaluating Fresnel Lens Performance: Equipment Development and Initial Results (Presentation)

A system dedicated to the optical transmittance characterization of Fresnel lenses has been developed at NREL, in collaboration with the UPM. The system quantifies the optical efficiency of the lens by generating a performance map. The shape of the focused spot may also be analyzed to understand change in the lens performance. The primary instrument components (lasers and CCD detector) have been characterized to confirm their capability for performing optical transmittance measurements. Measurements performed on SoG and PMMA lenses subject to a variety of indoor conditions (e.g., UV and damp heat) identified differences in the optical efficiency of the evaluated lenses, demonstrating the ability of the Scanning Lens Instrument (SLI) to distinguish between the aged lenses.

14 SOLAR ENERGY↗
DOE OSTI2014

Impact of environmental conditions on the chemical surface properties of Cu(In,Ga)(S,Se){sub 2} thin-film solar cell absorbers

Environmentally driven aging effects play a crucial role in thin-film solar cells based on Cu(In,Ga)(S,Se){sub 2}, both for long-term stability and short air exposure during production. For a better understanding of such effects, Cu(In,Ga)(S,Se){sub 2} absorber surfaces were investigated by x-ray photoelectron and Auger electron spectroscopy after exposure to different environmental conditions. Identical absorbers were stored in a nitrogen atmosphere, in damp heat, and under ambient conditions for up to 14 days. We find varying degrees of diffusion of sulfur, copper, and sodium towards the surface, with potential impact on the electronic surface structure (band gap) and the properties of the interface to a buffer layer in a solar cell device. Furthermore, we observe an oxidation (in decreasing order) of indium, copper, and selenium (but no oxidation of sulfur). And finally, varying amounts of carbon- and oxygen-containing adsorbates are found. In particular, the findings suggest that, for ambient air exposure, sodium carbonate is formed at the surface.

36 MATERIALS SCIENCE↗
DOE OSTI2015

Environmental stability of high-mobility indium-oxide based transparent electrodes

Large-scale deployment of a wide range of optoelectronic devices, including solar cells, critically depends on the long-term stability of their front electrodes. Here, we investigate the performance of Sn-doped In{sub 2}O{sub 3} (ITO), H-doped In{sub 2}O{sub 3} (IO:H), and Zn-doped In{sub 2}O{sub 3} (IZO) electrodes under damp heat (DH) conditions (85 °C, 85% relative humidity). ITO, IO:H capped with ITO, and IZO show high stability with only 3%, 9%, and 13% sheet resistance (R{sub s}) degradation after 1000 h of DH, respectively. For uncapped IO:H, we find a 75% R{sub s} degradation, due to losses in electron Hall mobility (μ{sub Hall}). We propose that this degradation results from chemisorbed OH- or H{sub 2}O-related species in the film, which is confirmed by thermal desorption spectroscopy and x-ray photoelectron spectroscopy. While μ{sub Hall} strongly degrades during DH, the optical mobility (μ{sub optical}) remains unchanged, indicating that the degradation mainly occurs at grain boundaries.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Metal Halide Perovskite Solar Module Encapsulation Using Polyolefin Elastomers: The Role of Morphology in Preventing Delamination

The development of perovskite solar cells (PSCs) has ushered in a new era of solar technology, characterized by its exceptional efficiency and cost-effective production. However, the soft and fragile nature of perovskites makes module encapsulation challenging. Polyolefin elastomers (POEs) have been reported to be promising encapsulants for perovskite modules. However, little research exists on identifying criteria among different types of POEs as encapsulants. Here, two POEs with different morphologies were compared as encapsulants. The first POE crystallizes during encapsulation (crystal content ∼40%), and the resulting shrinkage or warpage leads to delamination, causing minimodule failure. In contrast, perovskite minimodules encapsulated with a mostly amorphous POE exhibited better reliability and reproducibility. The best perovskite minimodules passed the thermal cycling test for 240 cycles between −40 and 85 °C and the damp heat test for 1419 h, according to the IEC 61215 standard. This study highlights the importance of the morphology of encapsulants in achieving high-quality encapsulation. Published by the American Physical Society 2024

14 SOLAR ENERGY↗
DOE OSTI2017

Encapsulant Adhesion to Surface Metallization on Photovoltaic Cells

Delamination of encapsulant materials from PV cell surfaces often appears to originate at regions with metallization. Using a fracture mechanics based metrology, the adhesion of ethylene vinyl acetate (EVA) encapsulant to screen-printed silver metallization was evaluated. At room temperature, the fracture energy Gc [J/m2] of the EVA/silver interface (952 J/m2) was ~70% lower than that of the EVA/antireflective (AR) coating (>2900 J/m2) and ~60% lower than that of the EVA to the surface of cell (2265 J/m2). After only 300 h of damp heat aging, the adhesion energy of the silver interface dropped to and plateaued at ~50-60 J/m2 while that of the EVA/AR coating and EVA/cell remained mostly unchanged. Elemental surface analysis showed that the EVA separates from the silver in a purely adhesive manner, indicating that bonds at the interface were likely displaced in the presence of humidity and chemical byproducts at elevated temperature, which in part accounts for the propensity of metalized surfaces to delaminate in the field.

14 SOLAR ENERGY↗
DOE OSTI2019

FTIR Investigation of EVA Chemical Bonding Environment and Its Impact on Debond Energy

The chemical makeup of ethylene vinyl acetate (EVA) interfaces in photovoltaic (PV) modules is probed via Fourier-transform infrared spectroscopy (FTIR) to determine the impact of the EVA formulation on the adhesion degradation. EVA samples laminated with glass particles are used to demonstrate the effect of damp heat exposure on the glass-EVA interface, showing that increasing silane content increases chemical stability. Delamination interfaces created in one cell modules demonstrate a high correlation between the siloxane bonding at the silicon cell-EVA interface and the debond energy. A significant decrease in debond energy after UV exposure is also shown to be due in part to decreasing siloxane bond density at the interface. However, FTIR results indicated contributions to the adhesion beyond the chemical interface, and a basic tensile test indicates increasing bulk mechanical properties with increasing silane. These results demonstrate the importance of the EVA formulation on its adhesion performance and long-term reliability. Furthermore, it is shown that FTIR is a capable technique for assessing and quantifying chemical mechanisms within PV modules. These results can then be used to more effectively model module lifetimes and to better design polymer systems for PV modules.

14 SOLAR ENERGY↗
DOE OSTI2020

Generalized and Mechanistic PV Module Performance Prediction From Computer Vision and Machine Learning on Electroluminescence Images

Electroluminescence (EL) imaging of photovoltiac (PV) modules offers high-speed, high-resolution information about device performance, affording opportunities for greater insight and efficiency in module characterization across manufacturing, research and development, and power plant operations and management. Predicting module electrical properties from EL image features is a critical step toward these applications. In this article, we demonstrate quantification of both generalized and performance mechanism-specific EL image features, using pixel intensity-based and machine learning classification algorithms. From EL image features, we build predictive models for PV module power and series resistance, using time-series current-voltage (I-V) and EL data obtained stepwise on five brands of modules spanning three Si cell types through two accelerated exposures: damp heat (DH) (85°C/85% RH) and thermal cycling (TC) (IEC 61215). Overall, 195 pairs of EL images and I-V characteristics were analyzed, yielding 11700 individual PV cell images. A convolutional neural network was built to classify cells by the severity of busbar corrosion with high accuracy (95%). Generalized power predictive models estimated the maximum power of PV modules from EL images with high confidence and an adjusted-R 2 of 0.88, across all module brands and cell types in extended DH and TC exposures. Mechanistic degradation prediction was demonstrated by quantification of busbar corrosion in EL images of three module brands in DH, and subsequent modeling of series resistance using these mechanism-specific EL image features. For modules exhibiting busbar corrosion, we demonstrated series resistance predictive models with adjusted-R 2 of up to 0.73.

14 SOLAR ENERGY↗
DOE OSTI2025

Characterization of Field-Exposed Photovoltaic Modules Featuring Signs of Contact Degradation

Here, this work investigates several photovoltaic (PV) modules that have shown signs of metal contact corrosion due to field exposure in a hot and humid climate. This includes two multicrystalline silicon aluminum back surface field systems with 10 and 14 years of exposure and one monocrystalline silicon passivated emitter and rear cell system with four years of exposure. A comprehensive, multiscale characterization process is used to evaluate these PV modules in great detail. Current–voltage (I−V), Suns-V OC measurements, electroluminescence imaging, infrared imaging, and ultraviolet fluorescence imaging were performed, and locations of interest were cored and analyzed using cross-sectional scanning electron microscopy (SEM). A rigorous, quantitative analysis procedure for the cross-sectional SEM images is proposed and implemented. Careful characterization does reveal that some of these PV modules do indeed exhibit the same classic signs of acetic-acid-based corrosion of the glass frit that is present at the silver/silicon interface, which have been observed previously in PV modules exposed to damp heat in an environmental chamber.

14 SOLAR ENERGY↗
DOE OSTI2025

Sequential Stress Identifies Processing Defects in Bifacial Photovoltaic Modules That Limit Durability

Here, we use sequential stress to investigate hurdles to bifacial photovoltaic (PV) module durability from lamination defects. We test mini-modules with glass/glass (G/G) and glass/transparent-backsheet (G/TB) constructions using either ethylene vinyl acetate or polyolefin elastomer (POE) based encapsulants under a modified IEC 63209-2 sequential stress. This sequence includes multiple iterations of damp heat (DH200), full spectrum light exposure (A3), thermal cycling (TC50), and humidity/freeze (HF10). We compare indoor stress with outdoor exposure. Results show similar relative trends in degradation after a year outdoors compared to our first stress cycle. Subsequent stress cycles impart more severe damage than outdoor exposure for the short outdoor duration used here. Edge-pinch lamination defects in G/G mini-modules limit durability causing delamination and cell cracks. Conversely, we observe greater degradation in G/TB mini-modules compared to G/G in the later stages of the stress sequence when the backsheets are directly exposed to UV-containing light. Our results highlight: 1) the utility of sequential stress testing to uncover degradation modes in bifacial PV, 2) implications of using mini-modules for testing PV quality, and 3) the importance of lamination defects that must be avoided to ensure durability as the industry adopts G/G or G/TB packaging.

14 SOLAR ENERGY↗
DOE OSTI2026

Extended Accelerated Stress Testing of Lamination-Free Edge-Sealed Photovoltaic Minimodules

Lamination-free minimodules are constructed with silicon solar cells between glass sheets and an edge seal of polyisobutylene and silicone. These samples are stressed using a repeated sequential testing sequence including ultraviolet-containing simulated solar spectrum light exposure at elevated temperature, damp heat, humidity freeze, and thermal cycling adapted from the International Electrotechnical Commission (IEC) TS 63209-2:2022. The minimodule performance throughout the stressing is characterized by flash testing and electroluminescence imaging. Results are compared to conventional laminated minimodules using the same type of solar cells. The lamination-free minimodules experience up to 8% power loss compared to roughly 3% for the laminated versions. However, those losses, dominated by current and fill factor, are caused by glass soiling and busbar ribbon separation on the cells. When glass is replaced and the stressed cells are contacted with probes bypassing the delaminated ribbons, the initial performance is recovered, and overall losses of the lamination-free samples become negligible.

14 SOLAR ENERGY↗
DOE OSTI2014

Trial-Run of a Junction-Box Attachment Test for Use in Photovoltaic Module Qualification: Preprint

Engineering robust adhesion of the junction box (j-box) is a hurdle typically encountered by photovoltaic module manufacturers during product development and manufacturing process control. There are historical incidences of adverse effects (e.g., fires) caused when the j-box/adhesive/module system has failed in the field. The addition of a weight to the j-box during the 'damp-heat,' 'thermal-cycle,' or 'creep' tests within the IEC qualification protocol is proposed to verify the basic robustness of the adhesion system. The details of the proposed test are described, in addition to a trial-run of the test procedure. The described experiments examine four moisture-cured silicones, four foam tapes, and a hot-melt adhesive used in conjunction with glass, KPE, THV, and TPE substrates. For the purpose of validating the experiment, j-boxes were adhered to a substrate, loaded with a prescribed weight, and then subjected to aging. The replicate mock-modules were aged in an environmental chamber (at 85 degrees C/85% relative humidity for 1000 hours; then 100 degrees C/<10% relative humidity for 200 hours) or fielded in Golden (CO), Miami (FL), and Phoenix (AZ) for one year. Attachment strength tests, including pluck and shear test geometries, were also performed on smaller component specimens.

14 SOLAR ENERGY↗
DOE OSTI2015

Accelerated Testing and Modeling of Potential-Induced Degradation as a Function of Temperature and Relative Humidity

An acceleration model based on the Peck equation was applied to power performance of crystalline silicon cell modules as a function of time and of temperature and humidity, the two main environmental stress factors that promote potential-induced degradation. This model was derived from module power degradation data obtained semi-continuously and statistically by in-situ dark current-voltage measurements in an environmental chamber. The modeling enables prediction of degradation rates and times as functions of temperature and humidity. Power degradation could be modeled linearly as a function of time to the second power; additionally, we found that coulombs transferred from the active cell circuit to ground during the stress test is approximately linear with time. Therefore, the power loss could be linearized as a function of coulombs squared. With this result, we observed that when the module face was completely grounded with a condensed phase conductor, leakage current exceeded the anticipated corresponding degradation rate relative to the other tests performed in damp heat.

14 SOLAR ENERGY↗
DOE OSTI2016

Interfacial Modifiers for Enhanced Stability and Reduced Degradation of Cu(In,Ga)Se2 Devices

Transparent conductive oxide (TCO) degradation is a known failure mode in thin-film photovoltaic (PV) devices through mechanisms such as resistivity increase and delamination. Here we apply thin interfacial modifiers to aluminum-doped zinc oxide (AZO) to mitigate damp heat induced degradation of electrical performance. Additionally, we demonstrate that these modifiers can be applied to the AZO front contact of a Cu(In, Ga)Se2 device without significantly degrading the device performance, a promising step towards improving the lifetime performance.

14 SOLAR ENERGY↗
DOE OSTI2018

Encapsulant Adhesion to Surface Metallization on Photovoltaic Cells

Delamination of encapsulant materials from PV cell surfaces often appears to originate at regions with metallization. Using a fracture mechanics based metrology, the adhesion of EVA encapsulant to screen printed silver metallization was evaluated. At room temperature, the fracture energy, G c [J/m 2 ], of the EVA/silver interface (952 J/m 2 ) was ~70% lower than that of the EVA/AR coating (>2900 J/m 2 ) and ~60% lower than that of the EVA to the surface of cell (2265 J/m 2 ). After only 300 hours of damp heat aging, the adhesion energy of the silver interface dropped to and plateaued at ~50-60 J/m 2 , while that of the EVA/AR coating and EVA/cell remained mostly unchanged. Elemental surface analysis showed that the EVA separates from the silver in a purely adhesive manner, indicating that bonds at the interface were likely displaced in the presence of humidity and chemical byproducts at elevated temperature, which in part accounts for the propensity of metallized surfaces to delaminate in the field.

14 SOLAR ENERGY↗
DOE OSTI2018

Evaluation of the PID-s Susceptibility of Modules Encapsulated in Materials of Varying Resistivity

A common mechanism of potential-induced degradation is by shunting (PID-s) in PV modules, usually associated with the transport of sodium ions (Na+) through the encapsulant and penetrating the front junction of solar cells under voltage stress. Encapsulants with high volume resistivity have been suggested as a potentially cost-effective solution to this degradation mechanism. In this work, we examine three polyolefin elastomer (POE) encapsulants with volume resistivity varying over two orders of magnitude (ranging from 9 x 10^13 to 1 x 10^16 ..omega.. cm) that show equivalent and complete resistance to PID at the damp heat stress test level of 85 degrees C and 85% relative humidity and -1000 V system voltage stress. Performance is compared with a PID-susceptible ethylene vinyl acetate (EVA) encapsulant with resistivity 1 x 10^13 ..omega.. cm. The independence of PID susceptibility with respect to the resistivity of the polyolefin is attributed to the impermeability of POEs to Na + ions. Specific ions (i.e. Na + ), rather than charge-carrying species in general, are responsible for this degradation mechanism.

14 SOLAR ENERGY↗
DOE OSTI2021

UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing

Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF, which are formed and subsequently quenched at varying rates. Ultimately, such understanding could enable estimating when cracks were formed.

41 EE - Solar Energy Technologies Office (EE-4S)↗
DOE OSTI2022

Near-Busbar Degradation of Screen-Printed Metallization in Silicon Photovoltaic Modules

We study photovoltaic (PV) module degradation after extended accelerated stress testing including 2000 hours of damp heat followed by a current-injection procedure meant to stabilize defects linked to light-induced degradation. In addition to de-stabilization/recovery of light-induced defects, we observe severe series resistance due to loss of contact between the Si cell and near-busbar screen-printed metallization (i.e. grid finger delamination). Using scanning electron microscopy and energy dispersive x-ray spectroscopy on cell fragments cored from the module, we show poor contact is caused by a gap between the screen-printed Ag metallization and Si due to missing glass frit.

degradation↗