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NASA NTRS2003

Life Cycle Testing of Viscoelastic Material for Hubble Space Telescope Solar Array 3 Damper

During the March 2002 Servicing Mission by Space Shuttle (STS 109), the Hubble Space Telescope (HST) was refurbished with two new solar arrays that now provide all of its power. These arrays were built with viscoelastic/titanium dampers, integral to the supporting masts, which reduce the interaction of the wing bending modes with the Telescope. Damping of over 3% of critical was achieved. To assess the damper s ability to maintain nominal performance over the 10-year on-orbit design goal, material specimens were subjected to an accelerated life test. The test matrix consisted of scheduled events to expose the specimens to pre-determined combinations of temperatures, frequencies, displacement levels, and numbers of cycles. These exposure events were designed to replicate the life environment of the damper from fabrication through testing to launch and life on-orbit. To determine whether material degradation occurred during the exposure sequence, material performance was evaluated before and after the accelerated aging with complex stiffness measurements. Based on comparison of pre- and post-life-cycle measurements, the material is expected to maintain nominal performance through end of life on-orbit. Recent telemetry from the Telescope indicates that the dampers are performing nominally.

Maly, Joseph R.↗

NASA NTRS1994

An Acoustic Charge Transport Imager for High Definition Television Applications: Reliability Modeling and Parametric Yield Prediction of GaAs Multiple Quantum Well Avalanche Photodiodes

Reliability modeling and parametric yield prediction of GaAs/AlGaAs multiple quantum well (MQW) avalanche photodiodes (APDs), which are of interest as an ultra-low noise image capture mechanism for high definition systems, have been investigated. First, the effect of various doping methods on the reliability of GaAs/AlGaAs multiple quantum well (MQW) avalanche photodiode (APD) structures fabricated by molecular beam epitaxy is investigated. Reliability is examined by accelerated life tests by monitoring dark current and breakdown voltage. Median device lifetime and the activation energy of the degradation mechanism are computed for undoped, doped-barrier, and doped-well APD structures. Lifetimes for each device structure are examined via a statistically designed experiment. Analysis of variance shows that dark-current is affected primarily by device diameter, temperature and stressing time, and breakdown voltage depends on the diameter, stressing time and APD type. It is concluded that the undoped APD has the highest reliability, followed by the doped well and doped barrier devices, respectively. To determine the source of the degradation mechanism for each device structure, failure analysis using the electron-beam induced current method is performed. This analysis reveals some degree of device degradation caused by ionic impurities in the passivation layer, and energy-dispersive spectrometry subsequently verified the presence of ionic sodium as the primary contaminant. However, since all device structures are similarly passivated, sodium contamination alone does not account for the observed variation between the differently doped APDs. This effect is explained by the dopant migration during stressing, which is verified by free carrier concentration measurements using the capacitance-voltage technique.

Hunt, W. D.↗

NASA NTRS2010

Nondestructive Evaluation and Monitoring Results from COPV Accelerated Stress Rupture Testing, NASA White Sands Test Facility (WSTF)

Develop and demonstrate NDE techniques for real-time characterization of CPVs and, where possible, identification of NDE capable of assessing stress rupture related strength degradation and/or making vessel life predictions (structural health monitoring or periodic inspection modes). Secondary: Provide the COPV user and materials community with quality carbon/epoxy (C/Ep) COPV stress rupture progression rate data. Aid in modeling, manufacturing, and application of COPVs for NASA spacecraft.

Saulsberry Regor↗

NASA NTRS2000

Assessment of The Compatibility of Composite Materials With High-Test Hydrogen Peroxide

The compatibility of composite materials with high-test hydrogen peroxide (HTP) was assessed using various chemical and mechanical techniques. Methods included classical schemes combining concentration assay with accelerated aging by means of a heated water bath. Exothermic reactivity was observed using Isothermal Microcalorimetry. Mechanical Properties testing determined degradation of the composite material. Photoacoustic Infrared Spectroscopy was used to monitor chemical alteration of the resin matrix. Other materials were examined including some polymers and metals.

Gostowski, Rudy↗

NASA NTRS2009

Effect of Electrostatic Discharge on Electrical Characteristics of Discrete Electronic Components

This article reports on preliminary results of a study conducted to examine how temporary electrical overstress seed fault conditions in discrete power electronic components that cannot be detected with reliability tests but impact longevity of the device. These defects do not result in formal parametric failures per datasheet specifications, but result in substantial change in the electrical characteristics when compared with pristine device parameters. Tests were carried out on commercially available 600V IGBT devices using transmission line pulse (TLP) and system level ESD stress. It was hypothesized that the ESD causes local damage during the ESD discharge which may greatly accelerate degradation mechanisms and thus reduce the life of the components. This hypothesis was explored in simulation studies where different types of damage were imposed to different parts of the device. Experimental results agree qualitatively with the simulation for a number of tests which will motivate more in-depth modeling of the damage.

Wysocki, Phil↗

NASA NTRS2012

Prognostics of Power Electronics, Methods and Validation Experiments

Abstract Failure of electronic devices is a concern for future electric aircrafts that will see an increase of electronics to drive and control safety-critical equipment throughout the aircraft. As a result, investigation of precursors to failure in electronics and prediction of remaining life of electronic components is of key importance. DC-DC power converters are power electronics systems employed typically as sourcing elements for avionics equipment. Current research efforts in prognostics for these power systems focuses on the identification of failure mechanisms and the development of accelerated aging methodologies and systems to accelerate the aging process of test devices, while continuously measuring key electrical and thermal parameters. Preliminary model-based prognostics algorithms have been developed making use of empirical degradation models and physics-inspired degradation model with focus on key components like electrolytic capacitors and power MOSFETs (metal-oxide-semiconductor-field-effect-transistor). This paper presents current results on the development of validation methods for prognostics algorithms of power electrolytic capacitors. Particularly, in the use of accelerated aging systems for algorithm validation. Validation of prognostics algorithms present difficulties in practice due to the lack of run-to-failure experiments in deployed systems. By using accelerated experiments, we circumvent this problem in order to define initial validation activities.

Kulkarni, Chetan S.↗

NASA NTRS2011

Towards Prognostics of Electrolytic Capacitors

A remaining useful life prediction algorithm and degradation model for electrolytic capacitors is presented. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management research. Prognostics provides a way to assess remaining useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. In particular, experimental results of an accelerated aging test under electrical stresses are presented. The capacitors used in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This preliminary remaining life prediction algorithm serves as a demonstration of how prognostics methodologies could be used for electrolytic capacitors.

Celaya, Jose R.↗

NASA NTRS1984

Investigation of accelerated stress factors and failure/degradation mechanisms in terrestrial solar cells

Research on the reliability of terrestrial solar cells was performed to identify failure/degradation modes affecting solar cells and to relate these to basic physical, chemical, and metallurgical phenomena. Particular concerns addressed were the reliability attributes of individual single crystalline, polycrystalline, and amorphous thin film silicon cells. Results of subjecting different types of crystalline cells to the Clemson accelerated test schedule are given. Preliminary step stress results on one type of thin film amorphous silicon (a:Si) cell indicated that extraneous degradation modes were introduced above 140 C. Also described is development of measurement procedures which are applicable to the reliability testing of a:Si solar cells as well as an approach to achieving the necessary repeatability of fabricating a simulated a:Si reference cell from crystalline silicon photodiodes.

Lathrop, J. W.↗

NASA NTRSDate not supplied

Infant Mortality and Wear-Out Failures in Polymer and MnO2 Tantalum Capacitors

Reliability testing of modern tantalum capacitors shows the presence of both types, infant mortality (IM) and wearout (WO) failures. To assure reliable operation, the probability of IM failures should be reduced to below the specified level, and the time of WO inception should be greater than the required useful life of the parts at operation conditions. In this work, several types of MnO2 and polymer cathode tantalum capacitors have been tested at highly accelerated conditions to assess voltage acceleration factors, determine adequate burn-in conditions, and assess the useful life. A modified time dependent dielectric breakdown (TDDB) model has been suggested to explain both types of failure, and a physical mechanism of degradation that is based on migration and reactions of oxygen vacancies explains increase of the defect related, IM failures with the level of stress.

tantalum capacitors↗

NASA NTRS2004

Epoxy Adhesives for Stator Magnet Assembly in Stirling Radioisotope Generators (SRG)

As NASA seeks to fulfill its goals of exploration and understanding through missions planned to visit the moons of Saturn and beyond, a number of challenges arise from the idea of deep space flight. One of the first problems associated with deep space travel is electrical power production for systems on the spacecraft. Conventional methods such as solar power are not practical because efficiency decreases substantially as the craft moves away from the Sun. The criterion for power generation during deep space missions are very specific, the main points requiring high reliability, low mass, minimal vibration and a long lifespan. A Stirling generator, although fairly old in concept, is considered to be a potential solution for electrical power generation for deep space flight. A Stirling generator works on the same electromagnetic principles of a standard generator, using the linear motion of the alternator through the stationary stator which produces electric induction. The motion of the alternator, however, is produced by the heating and cooling dynamics of pressurized gases. Essentially heating one end and cooling another of a contained gas will cause a periodic expansion and compression of the gas from one side to the other, which a displacer translates into linear mechanical motion. NASA needs to confirm that the materials used in the generator will be able to withstand the rigors of space and the life expectancy of the mission. I am working on the verification of the epoxy adhesives used to bond magnets to the steel lamination stack to complete the stator; in terms of in-service performance and durability under various space environments. Understanding the proper curing conditions, high temperature properties, and degassing problems as well as production difficulties are crucial to the long term success of the generator. system and steel substrate used in the stator. To optimize the curing conditions of the epoxies, modulated differential scanning calorimetry analysis was done as a function of cure time and temperatures. Adhesion bond strength was tested at various temperatures with lap shear samples using Hiperco 50 substrate to ensure that the proper adhesive is being used. To try and solve the problem of bondline thickness, micro glass beads of 0.0017" in diameter were investigated to see if any other physical properties of the epoxy were affected. Efforts will be made to develop a standard, optimized, fabrication process/procedure of sub-scale magnet-stator assemblies for various adhesive performance evaluation studies under simulated generator conditions. Also, accelerated aging testing will be done in a pressurized canister with stator assembly samples for three years to verify if any degassing or thermal degradation of the epoxy occurs. The necessity of verifying the correct epoxy adhesive system for the stator magnet in the SRG is crucial because failure of the stator assembly would jeopardize the electrical system, and thereby the entire mission itself. My work involves specimen fabrications, testing, and data analyses of the epoxy adhesive system for the stator magnet in the SRG is crucial because failure of the stator assembly would jeopardize the electrical system, and thereby the entire mission itself.

Cater, George M.↗

NASA NTRS2017

Parametric Failures in COTS Capacitors

Insertion of COTS components into hi-rel systems require extensive environmental testing of the parts that often results in parametric failures. Based on experience with commercial and hi-rel PME and BME ceramic capacitors and polymer and MnO2 cathode tantalum capacitors, this presentation discusses two major reasons for parametric failures. One is due to the marketing pressure that forces manufacturers to squeeze performance of COTS components thus leaving insufficient margin between the rated and actual characteristics. Another, and probably a more serious reason is degradation of characteristics caused by physico-chemical processes in materials under environmental stresses. Reliability assessment requires development of models to predict behavior of the parts during applications based on accelerated testing that might be outside the specified conditions and target applications. Examples of models developed to simulate and predict wear-out failures are presented. Risks associated with overstressing during HALT are discussed.

Teverovsky, Alexander↗

NASA NTRS1984

Assessing photovoltaic module life from long-term environmental tests

An assessment is made of results obtained by an experimental program having as its aim the identification of critical temperature-humidity bias degradation mechanisms in solar cell modules intended to have an operating lifetime of the order of 20-30 years. These mechanisms are studied in the context of conditions encountered over the course of long term operation in various sites in the U.S. Accelerated tests for the assessment of product lifetime entail the development of a correlation between test and application conditions; this has been accomplished through an analytical procedure for the correlation of time-varying field exposures to constant-stress accelerated environments.

Otth, D. H.↗

NASA NTRS2024

Single Event Effects Test Report IXYS IXTA96P085T P-Channel -85V MOSFET

This study was undertaken to determine the destructive single event effect and degradation susceptibility of the IXTA96P085T P-Channel -85V MOSFET from IXYS. The device was monitored for destructive single event effects and degradation during exposure to a heavy ion beam at the Berkeley Accelerator Space Effects (BASE) Facility at the Lawrence Berkeley National Laboratory (LBNL). Gate and drain currents were measured during irradiation and a basic set of electrical characterizations was performed following each fluence exposure to assess heavy ion induced damage. The test date was April 10, 2024. This characterization is application specific.

MOSFET↗

NASA NTRS1978

Fiber reinforced PMR polyimide composites

Commercially obtained PMR-15 polyimide prepregs with S-glass and graphite fiber reinforcements were evaluated along with in-house prepared glass and graphite cloth PMR 2 materials. A novel autoclave approach was conceived and used to demonstrate that both the PMR systems respond to 1.4 MPa (200 psi) autoclave pressures to produce void free composites equivalent to die molded laminates. Isothermal gravimetric analysis and subsequent mechanical property tests indicated that the PMR 2 system was significantly superior in thermo-oxidative stability, and that S-glass reinforcements may contribute to the accelerated degradation of composites at 316 C (600 F) when compared to graphite fiber reinforced composites. Fully reversed bending fatigue experiments were conducted with a type of fixture unused for organic matrix composites. These studies indicated that the graphite fiber composites were clearly superior in fatigue resistance to the glass fiber reinforced material and that PMR matrix composite systems yield performance of the same order as composite materials employing other families of matrices.

Cavano, P. J.↗

NASA NTRS1979

An analytical approach to evaluation of space radiation effects on materials for long-life missions

An analytical model was developed which quantifies effects on organic composite matrix materials of high energy electrons and of UV as well as interactions between the two radiations. Literature data on polyethylene were used to construct a degradation kinetics scheme corresponding to an Earth orbit at L=3. Analysis of the model showed that steady state concentrations of radicals put limits on accelerated test conditions. These conclusions were validated by an experimental study on polymethylmethacrylate using UV laser excitation. Relationships for balancing electron and UV radiations to equal acceleration factors are derived. Pulse radiolysis using an electron-beam along with time-resolved spectroscopy is shown to be able to separate primary form secondary reactions. Implications of these reactions to changes in engineering material properties are indicated. The use of mechanistic studies is discussed in the context of general test strategies for evaluating materials for space applications.

Moacanin, J.↗

NASA NTRSDate not supplied

Stress Testing of Chip Aluminum Polymer Capacitors

Layered aluminum polymer capacitors (APC) may be viable replacements to current chip tantalum capacitors due to their lower ESR, weight, and smaller size. So far, there is a lack of information regarding the reliability of these parts. Available technical literature is mostly related to the effect on humidity. Although APCs have a limited moisture resistance, it may be contained to the level sufficient for space applications. In this work, seven types of commercial APCs manufactured by four vendors and rated to voltages from 6.3 to 35 V were used to evaluate reliability of the parts under environmental stresses and highly accelerated life tests. Characteristics of the parts, including breakdown voltages, the level of anomalous charging currents (ACC), capacitance, DF, ESR and leakage currents were measured in the process of storage at high-temperatures (from 100 to 150 °C) and high humidity at 85 °C. Monitored highly accelerated life tests have been carried out at temperatures of 85 °C and 125 °C and voltages varying from 1.2 to 1.9 times the rated voltage. Degradation processes and reliability of APCs have been analyzed and compared to polymer tantalum capacitors.

Alexander Teverovsky↗

NASA NTRS2024

Evaluation of Aluminum Polymer Capacitors for Space Applications

Layered aluminum polymer capacitors (APC) may be viable replacements to currently used chip tantalum capacitors due to their lower ESR, weight, and smaller size. So far, there is a lack of information regarding the reliability of these parts. Available technical literature is mostly related to the effect of humidity. Although APCs have a limited moisture resistance, it may be contained to the level sufficient for space applications. This work analyzes construction and characteristics of seven types of commercial APCs manufactured by four vendors and rated to voltages from 6.3 to 35 V were analyzed. Their reliability under environmental stresses and highly accelerated life tests was assessed in the range of temperatures and voltages to determine reliability acceleration factors. For this purpose, characteristics of the parts, including breakdown voltages, the level of anomalous charging currents (ACC), capacitance, DF, ESR and leakage currents were measured in the process of storage at high-temperatures (from 100 to 150 °C) and high humidity at 85 °C. Monitored highly accelerated life tests have been carried out at temperatures of 85 °C and 125 °C and voltages varying from 1.2 to 1.9 times the rated voltage. Degradation processes and reliability of APCs have been compared to polymer tantalum capacitors.

Alexander A Teverovsky↗

NASA NTRS2012

NASA's Evolutionary Xenon Thruster (NEXT) Long-Duration Test as of 736 kg of Propellant Throughput

The NASA s Evolutionary Xenon Thruster (NEXT) program is developing the next-generation solar-electric ion propulsion system with significant enhancements beyond the state-of-the-art NASA Solar Electric Propulsion Technology Application Readiness (NSTAR) ion propulsion system to provide future NASA science missions with enhanced mission capabilities. A Long-Duration Test (LDT) was initiated in June 2005 to validate the thruster service life modeling and to qualify the thruster propellant throughput capability. The thruster has set electric propulsion records for the longest operating duration, highest propellant throughput, and most total impulse demonstrated. At the time of this publication, the NEXT LDT has surpassed 42,100 h of operation, processed more than 736 kg of xenon propellant, and demonstrated greater than 28.1 MN s total impulse. Thruster performance has been steady with negligible degradation. The NEXT thruster design has mitigated several lifetime limiting mechanisms encountered in the NSTAR design, including the NSTAR first failure mode, thereby drastically improving thruster capabilities. Component erosion rates and the progression of the predicted life-limiting erosion mechanism for the thruster compare favorably to pretest predictions based upon semi-empirical ion thruster models used in the thruster service life assessment. Service life model validation has been accomplished by the NEXT LDT. Assuming full-power operation until test article failure, the models and extrapolated erosion data predict penetration of the accelerator grid grooves after more than 45,000 hours of operation while processing over 800 kg of xenon propellant. Thruster failure due to degradation of the accelerator grid structural integrity is expected after

Shastry, Rohit↗