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Results for “aberration correction”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5
All sourcesNASA NTRSDOE OSTI
DOE OSTI2012

Examining the structure and bonding in complex oxides using aberration-corrected imaging and spectroscopy

Our ability to directly characterize the atomic and electronic structures is crucial to developing a fundamental understanding of structure-property relationships in complex-oxide materials. Here, we examine one specific example, the misfit-layered thermoelectric material Ca3Co4O9, which exhibits a high Seebeck coefficient governed by spin-entropy transport as well as hopping-mediated electron transport. However, the role of oxygen and its bonding with cobalt in thermoelectric transport remains unclear. We use atomic-resolution annular bright-field imaging to directly image the oxygen sublattice and to combine our experimental data with multislice image calculations to find that the oxygen atoms in the CoO2 subsystem are highly ordered, while the oxygen-atomic columns are displaced in the Ca2CoO3 subsystem. Atomic-column-resolved electron energy-loss spectroscopy and spectrum image calculations are used to quantify the bonding in the different subsystems of incommensurate Ca3Co4O9. We find that the holes in the CoO2 subsystem are delocalized, which could be responsible for the p-type conductivity found in the CoO2 subsystem.

36 MATERIALS SCIENCE↗
DOE OSTI2022

Visualization of defects in single-crystal and thin-film PdCoO 2 using aberration-corrected scanning transmission electron microscopy

Single-crystal delafossite PdCoO 2 is known to have an extremely low intrinsic impurity concentration of ~0.001%, demonstrating extraordinarily high conductivity with a mean free path of ~20 μm at low temperatures. However, when grown as thin films, the resistivity at room temperature increases by a factor of 3–80 times, depending on the film thickness. Using scanning transmission electron microscopy, we identify different classes of defects for the single crystal vs epitaxial thin film. The dominant defect for single-crystal PdCoO 2 is found to be ribbonlike defects. For the thin films, we identify different types of defects arising in epitaxial thin films mainly due to substrate termination that disrupt the lateral connectivity of the conducting planes. Further, our results are consistent with the high conductivity of single crystals and increased electrical resistivity of the thin films compared to that of single crystals, suggesting that selecting a proper substrate, improving surface quality, and reducing the step density are the keys to enhance the film quality for utilizing PdCoO 2 as a platform for future applications.

36 MATERIALS SCIENCE↗
DOE OSTI2019

PIE of Cycle 13 316SS Cladding Using Aberration Corrected STEM Image and Analys

Optical, SEM and TEM analysis confirmed the presence of moderate sensitization in the 20% cold worked 316SS after the iron aluminide coating was applied. The Cr depletion occurs on the grain boundaries between the closely spaced carbides, and at the interface between the carbides and matrix. Cr depletion varied from locally along the grain boundaries, in many cases showing levels down to 15 wt%, but a few isolated regions had depletion levels down to 12.5 wt%. Optical and SEM images taken from a weld heat affected zone revealed the recrystallization occurred after an end plug cap had been welded to the coated cladding. Irradiation did not affect the carbides in a noticeable manner, but radiation-induced segregation/depletion altered the Cr depletion profiles by removing the wide Cr depletion profile, and replacing it with a much deeper, more narrow profile. Cr levels were depleted to 8-10 wt%, Ni and Si were enriched to levels of 40 wt% and 12 wt% respectively. Substantial precipitation formed in the matrix, and on line dislocations in the matrix and on grain boundary dislocations. Voids were observed in the upper region of the TPBAR where the irradiation temperature exceeds 320C. The levels of Cr depletion and Ni/Si enrichment indicate a material in a state susceptible to irradiation assisted stress corrosion cracking.

316SS cladding↗
NASA NTRS2006

Modeling of Optical Aberration Correction using a Liquid Crystal Device

Gruneisen (sup 1-3), has shown that small, light weight, liquid crystal based devices can correct for the optical distortion caused by an imperfect primary mirror in a telescope and has discussed the efficiency of this correction. In this paper we expand on that work and propose a semi-analytical approach for quantifying the efficiency of a liquid crystal based wavefront corrector for this application.

Xinghua, Wang↗
DOE OSTI2023

Multi-element metasurface system for imaging in the near-infrared

Metasurfaces are optically thin 2D arrays of subwavelength scatterers that modify scalar and vector properties of incident electromagnetic fields. Metasurface lenses are of particular interest for imaging applications for their flat form factor, compatibility with CMOS fabrication processes, and potential for correcting aberrations with a small number of elements. Here, we advance this capability by realizing a millimeter-diameter, polarization-independent metalens triplet system with chromatic aberration correction over the wavelength range of 1.30–1.60 μm and monochromatic aberration correction enabling a field of view of 50°.

77 NANOSCIENCE AND NANOTECHNOLOGY↗
DOE OSTI2011

Correction of Spherical Aberration in Grazing-Incidence X-ray Optics by Combination of Spherical-Concave Mirrors

In grazing-incidence total-reflection mirror optics for x-rays, spherical aberrations and coma are the most serious aberrations for microfocusing and microimaging. High-resolution imaging is believed to be possible only when an aspherical mirror system is used. However, the spherical aberrations of a spherical-concave mirror in a grazing-incidence condition can be eliminated by sequential reflection of spherical mirrors of similar shapes. A sub-micrometer one-dimensional focusing is easily achieved by the spherical-aberration-corrected tandem-spherical mirror optics. By configuring four spherical mirrors in an analogy of the crossed mirror optics (Kirkpatrick-Baez optics), it is possible to achieve sub-micrometer focused beam size in the hard x-ray region. Preliminary experiments on x-ray microfocusing have been carried out at beamline 20XU of SPring-8, and a 0.5 {mu}mx0.4 {mu}m beam size was achieved at 8 keV.

07 ISOTOPE AND RADIATION SOURCES↗
DOE OSTI2014

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

In this paper, we demonstrate a method to achieve high efficiency phase contrast imaging in aberration corrected scanning transmission electron microscopy (STEM) with a pixelated detector. The pixelated detector is used to record the Ronchigram as a function of probe position which is then analyzed with ptychography. Ptychography has previously been used to provide super-resolution beyond the diffraction limit of the optics, alongside numerically correcting for spherical aberration. Here we rely on a hardware aberration corrector to eliminate aberrations, but use the pixelated detector data set to utilize the largest possible volume of Fourier space to create high efficiency phase contrast images. The use of ptychography to diagnose the effects of chromatic aberration is also demonstrated. In conclusion, the four dimensional dataset is used to compare different bright field detector configurations from the same scan for a sample of bilayer graphene. Our method of high efficiency ptychography produces the clearest images, while annular bright field produces almost no contrast for an in-focus aberration-corrected probe.

36 MATERIALS SCIENCE↗
NASA NTRS1984

Aberrations of varied line-space grazing incidence gratings in converging light beams

Analyses of the imaging properties of several designs for varied-line space gratings in converging beams of light in grazing-incidence spectrometers are presented. An explicit model is defined for the case of a plane-reflection grating intercepting light that converges and is reflected to a stigmatic point associated with the zero-order image of the grating. Smooth spatial variation of the grating constant then permits aberration correction. The aberrations are expressed as polynomials in the grating lens coordinates using power series expansions. Application of the model is illustrated in terms of aberrations experienced with the short wavelength spectrometer on the EUVE satellite. Attention is given to straight and parallel in-plane grooves, curved groove in-plane designs and off-plane grooves. Aberrations due to dispersions and misalignment are also considered.

Hettrick, M. C.↗
NASA NTRS1984

The correction of aberrations computed in the aperture plane of multifrequency microwave radiometer antennas

An analytical/numerical approach to identifying and correcting the aberrations introduced by a general displacement of the feed from the focal point of a single offset paraboloid antenna used in deployable radiometer systems is developed. A 15 meter reflector with 18 meter focal length is assumed for the analysis, which considers far field radiation pattern quality, focal region fields, and aberrations appearing in the aperture plane. The latter are obtained by ray tracing in the transmit mode and are expressed in terms of optical notation. Attention is given to the physical restraints imposed on corrective elements by real microwave systems and to the intermediate near field aspects of the problem in three dimensions. The subject of wave fronts and caustics in the receive mode is introduced for comparative purposes. Several specific examples are given for aberration reduction at eight beamwidths of scan at a frequency of 1.414 GHz.

Schmidt, R. F.↗
DOE OSTI2014

The influence of C s /C c correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy

Aberration correction in scanning/transmission electron microscopy (S/TEM) owes much to the efforts of a small dedicated group of innovators. Leading that frontier has been Prof. Harald Rose. To date his leadership and dynamic personality has spearheaded our ability to leave behind many of the limitations imposed by spherical aberration (C s ) in high resolution phase contrast imaging. Following shortly behind, has been the development of chromatic aberration correction (C c ) which augments those accomplishments. In this study we will review and summarize how the combination of C s /C c technology enhances our ability to conduct hyperspectral imaging and spectroscopy in today's and future computationally mediated experiments in both thin as well as realistic specimens in vacuo and during in-situ/environmental experiments.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗