SEARCH · Engineering Papers

Results for “Scanning Electron Microscopes”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

SourceResearch connectionFrom yearThrough year

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 91 records · Page 5

All sources NASA NTRS DOE OSTI

NASA NTRS1998

Evidence of Microfossils in Carbonaceous Chondrites

Investigations have been carried out on freshly broken, internal surfaces of the Murchison, Efremovka and Orgueil carbonaceous chondrites using Scanning Electron Microscopes (SEM) in Russia and the Environmental Scanning Electron Microscope (ESEM) in the United States. These independent studies on different samples of the meteorites have resulted in the detection of numerous spherical and ellipsoidal bodies (some with spikes) similar to the forms of uncertain biogenicity that were designated "organized elements" by prior researchers. We have also encountered numerous complex biomorphic microstructures in these carbonaceous chondrites. Many of these complex bodies exhibit diverse characteristics reminiscent of microfossils of cyanobacteria such as we have investigated in ancient phosphorites and high carbon rocks (e.g. oil shales). Energy Dispersive Spectroscopy (EDS) analysis and 2D elemental maps shows enhanced carbon content in the bodies superimposed upon the elemental distributions characteristic of the chondritic matrix. The size, distribution, composition, and indications of cell walls, reproductive and life cycle developmental stages of these bodies are strongly suggestive of biology' These bodies appear to be mineralized and embedded within the meteorite matrix, and can not be attributed to recent surface contamination effects. Consequently, we have interpreted these in-situ microstructures to represent the lithified remains of prokaryotes and filamentous cyanobacteria. We also detected in Orgueil microstructures morphologically similar to fibrous kerite crystals. We present images of many biomorphic microstructures and possible microfossils found in the Murchison, Efremovka, and Orgueil chondrites and compare these forms with known microfossils from the Cambrian phosphate-rich rocks (phosphorites) of Khubsugul, Northern Mongolia.

Hoover, Richard B.↗

NASA NTRS2002

Microfossils in the Murchison and Rainbow Carbonaceous Meteorites

Astrobiologists are working to develop methodologies for the recognition of bacterial microfossils, biominerals, and chemical biomarkers in terrestrial rocks, to provide a basis for the scientific assessment of possible microfossils in meteorites and other Astromaterials. During the past 5 years, we have conducted electron microscopy investigations to understand the morphology and chemical composition of microfossils in ancient terrestrial rocks and to search for microfossils presence in meteorites. We have detected evidence of indigenous microfossils and biominerals in-situ in every carbonaceous meteorite investigated but have found no evidence for microfossils in the nickel-iron and stony meteorites studied. In this paper, we provide a brief review of prior evidence for microfossils in meteorites and present Scanning and Environmental Scanning Electron Microscope (SEM and ESEM) and Field Emission Scanning Electron Microscope (FESEM) images of microfossils found in-situ in freshly fractured surfaces of the Murchison and Rainbow meteorites. We describe the techniques and methods used to protect the samples from contamination and for the discrimination of indigenous microfossils from recent terrestrial contaminants We provide data from Energy Dispersive Spectroscopy (EDS) and Link microprobe analysis of the chemical elements and 2D x-ray maps as strong evidence that these biogenic forms are indigenous to the meteorites and cannot logically be interpreted as recent bio-contaminants. We show evidence of framboidal magnetites and pyrites and compare them with framboidal magnetites and pyrites found in Cambrian richs from the Siberian Platform.

Hoover, Richard B.↗

NASA NTRS1990

Electron microscopy study of the iron meteorite Santa Catharina

A characterization of the microstructural features of Santa Catharina (SC) from the millimeter to submicron scale is presented. The same specimen was examined using an optical microscope, a scanning electron microscope, an electron probe microanalyzer, and an analytical electron microscope. Findings include the fact that SC metal nodules may have different bulk Ni values, leading to different microstructures upon cooling; that SC USNM 6293 is the less corroded sample, as tetrataenite exists as less than 10 nm ordered domains throughout the entire fcc matrix (it is noted that this structure is the same as that of the Twin City meteorite and identical to clear taenite II in the retained taenite regions of the octahedrites); that SC USNM 3043 has a more complicated microstructure due to corrosion; and that the low Ni phase of the cloudy zone was selectively corroded in some areas and formed the dark regions, indicating that the SC meteorite corrosion process was electrochemical in nature and may involve Cl-containing akaganeite.

Zhang, J.↗

NASA NTRS2003

Artifacts for Calibration of Submicron Width Measurements

Artifacts that are fabricated with the help of molecular-beam epitaxy (MBE) are undergoing development for use as dimensional calibration standards with submicron widths. Such standards are needed for calibrating instruments (principally, scanning electron microscopes and scanning probe microscopes) for measuring the widths of features in advanced integrated circuits. Dimensional calibration standards fabricated by an older process that involves lithography and etching of trenches in (110) surfaces of single-crystal silicon are generally reproducible to within dimensional tolerances of about 15 nm. It is anticipated that when the artifacts of the present type are fully developed, their critical dimensions will be reproducible to within 1 nm. These artifacts are expected to find increasing use in the semiconductor-device and integrated- circuit industries as the width tolerances on semiconductor devices shrink to a few nanometers during the next few years. Unlike in the older process, one does not rely on lithography and etching to define the critical dimensions. Instead, one relies on the inherent smoothness and flatness of MBE layers deposited under controlled conditions and defines the critical dimensions as the thicknesses of such layers. An artifact of the present type is fabricated in two stages (see figure): In the first stage, a multilayer epitaxial wafer is grown on a very flat substrate. In the second stage, the wafer is cleaved to expose the layers, then the exposed layers are differentially etched (taking advantage of large differences between the etch rates of the different epitaxial layer materials). The resulting structure includes narrow and well-defined trenches and a shelf with thicknesses determined by the thicknesses of the epitaxial layers from which they were etched. Eventually, it should be possible to add a third fabrication stage in which durable, electronically inert artifacts could be replicated in diamondlike carbon from a master made by MBE and etching as described above.

Grunthaner, Frank↗

NASA NTRS1974

Micropaleontological studies of lunar and terrestrial precambrian materials

Optical microscopic and scanning electron microscopic studies of rock chips and dust returned by Apollo 14, 15, 16, and 17 are analyzed along with optical microscopic studies of petrographic thin sections of breccias and basalts returned by Apollo 14, 15, and 16. Results show no evidence of modern or fossil lunar organisms. The lunar surface is now, and apparently has been throughout the geologic past, inimical to known biologic systems.

Schope, J. W.↗

NASA NTRS2004

Effect of a Silicone Contaminant Film on the Transmittance Properties of AR-coated Fused Silica

We present the results of a laboratory test to determine the effects of bulk deposited, DC-704 silicone contaminant film on the transmittance properties of an anti-reflective (AR) coated fused silica optical substrate. Testing and optical measurements were performed in vacuum in the Boeing Combined Effects Test Facility (CETF). The test and measurement procedures are described herein. Measurement results are presented showing the change in transmittance characteristics as a function of contaminant deposit thickness and vacuum ultra-violet (vuv) exposure levels. Measurement results show an initial degradation in the transmittance of the contaminated sample. This is followed by a partial recovery in sample transmittance as the sample is exposed to additional VUV radiation. Transmittance results also show a loss of transmission in the ultraviolet portion of the spectrum and an increase in transmission in the infrared portion of the spectrum. These transmittance results are characteristic of thin-film interference effects. Thin-film analyses indicate that some of the observed transmittance results can be successfully modeled, but only if the contaminant film is assumed to be SiO2 rather than DC-704 silicone. Post-test Scanning Electron Microscope (SEM) scans of the test sample indicate the formation of contaminant islands and the presence of a thin uniform coating of contaminant deposit on the sample

Boeder, Paul A.↗

NASA NTRS2015

Evaluation of Encapsulated Inhibitor for Autonomous Corrosion Protection

This work concerns the development of smart coating technologies based on microencapsulation for the autonomous control of corrosion. Microencapsulation allows the incorporation of corrosion inhibitors into coating which provides protection through corrosion-controlled release of these inhibitors.One critical aspect of a corrosion protective smart coating is the selection of corrosion inhibitor for encapsulation and comparison of the inhibitor function before and after encapsulation. For this purpose, a systematic approach is being used to evaluate free and encapsulated corrosion inhibitors by salt immersion. Visual, optical microscope, and Scanning Electron Microscope (with low-angle backscatter electron detector) are used to evaluate these inhibitors. It has been found that the combination of different characterization tools provide an effective method for evaluation of early stage localized corrosion and the effectiveness of corrosion inhibitors.

Autonomous↗

NASA NTRS1989

A densitometric analysis of commercial 35mm films

IIaO films have been subjected to various sensitometric tests. The have included thermal and aging effects and reciprocity failure studies. In order to compare the special IIaO film with popular brands of 35 mm films and their possible use in astrophotography, Agfa, Fuji and Kodak print and slide formats, as well as black and white and color formats, were subjected to sensitometric, as well as densitometric analysis. A scanning electron microscope was used to analyze grain structure size, and shape as a function of both speed and brand. Preliminary analysis of the grain structure using an ISI-SS40 scanning electron microscope indicates that the grain sizes for darker densities are much larger than the grain size for lighter densities. Researchers analyze the scanning electron microscope findings of the various grains versus densities as well as enhancement of the grains, using the IP-8500 Digital Image Processor.

Hammond, Ernest C., Jr.↗

NASA NTRS1974

Study of radiation damage and structure of Luna 16 sample particles using high-resolution electron microscopes

Using an electron scanning microscope and a high voltage microscope, a study was made of the radiation damage and structure of micron sized grains and grains separated from the 200-mesh fraction of the L-16-19 surface material sample. Then the structural features were compared with those found by studying with the same techniques grains separated from 20 different samples of lunar dust taken from the Apollo 11, Apollo 12, Apollo 14, and Apollo 15 collections. The L-16-19 sample is similar to the most intensely irradiated samples returned to earth by Apollo craft.

Borg, J.↗

NASA NTRS1972

Profiling with the electron microscope.

Discussion of a profiling technique using a scanning electron microscope for obtaining depth information on a single micrograph of a small specimen. A stationary electron beam is used to form a series of contamination spots in a line across the specimen. Micrographs obtained by this technique are useful as a means of projection and display where stereo viewers are not practical.

Vedder, J. F.↗

NASA NTRS1967

New electron microscope employs new video display technique

Video display system for a scanning electron microscope provides slow scanning rates, a self-generated color gradient technique, and allows leisurely viewing of several hours. It also enables the viewing of areas where selected energy regions contribute relatively few electrons, and the changing of specimen position and magnification without adjustments.

Brookshier, W. K.↗

NASA NTRS1977

Metallurgical characterization of the fracture of several high strength aluminum alloys

The fracture behavior for structural aluminum alloys (2024, 6061, 7075, and 7178) was examined in selected heat treatments. The investigation included tensile, shear, and precracked notch-bend specimens fractured at ambient temperature under monotonic loading. Specimens were obtained from thin sheets and thick plates and were tested in longitudinal and transverse orientations at different strain rates. Microstructures of alloys were examined using the optical microscope and the scanning electron microscope with associated energy dispersive X ray chemical analysis. Several different types of second phase particles, some not reported by other investigators, were identified in the alloys. Fracture morphology was related to microstructural variables, test variables, and type of commercial product. Specimen orientation examined in the present investigation had little effect on fracture morphology. Test strain rate changes resulted in some change in shear fracture morphology, but not in fracture morphology of tensile specimens.

Bhandarkar, M. D.↗

NASA NTRS1993

Densities of 5-15 micron interplanetary dust particles

We have measured the densities of about 100 5-15 micron stratospheric IDPs. Great care was taken to minimize selection bias in the sample population. Masses were determined using an absolute x-ray analysis technique with a transmission electron microscope, and volumes were found using scanning electron microscope imagery. Unmelted chondritic particles have densities between 0.5 and 6.0 g/cc. Roughly half of the particles have densities below 2 g/cc, indicating appreciable porosity, but porosities greater than about 70 percent are rare. IDPs with densities above 3.5 g/cc usually contain large sulfide grains. We find no evidence of bimodality in the unmelted particle density distribution. Chondritic spherules (melted particles) have densities near 3.5 g/cc, consistent with previous results for deep sea spherules.

Love, S. G.↗

NASA NTRS1994

Densities of stratospheric micrometeorites

We have measured the densities of roughly 150 5- to 15-microns interplanetary dust particles (IDPs) harvested in the stratosphere. Care was taken to minimize selection bias in the sample population. Masses were determined using an absolute X-ray analysis technique with a transmission electron microscope, and volumes were found using scanning electron microscope imagery. Unmelted chondritic particles have densities ranging between 0.3 and 6.2 g/cu cm, averaging 2.0 g/cu cm. The low medium densities indicates appreciable porosity, suggesting primitive, uncompacted parent bodies for these particles. Porosities greater than 70% are rare. IDPs with densities above 3.5 g/cu cm usually contain large sulfide grains. We find no evidence of bimodality in the unmelted particle density distribution. Chondritic spherules (melted particles) have densities near 3.4 g/cu cm, consistent with previous results for stony spheurles culled from deep-sea sediments.

Love, Stanley G.↗

NASA NTRS2012

Microbiological Characterization of the International Space Station Water Processor Assembly External Filter Assembly S/N 01

The External Filter Assembly (EFA) S/N 01 is a mesh screen filter with a pore size of approximately 300 micron that was installed in the International Space Station (ISS) Water Processor Assembly (WPA) between the Waste Tank and the Mostly Liquid Separator (MLS) on February 11, 2010 to protect clearances in the MLS solenoid valve SV_1121_3. A removal & replacement of the EFA Filter was performed on March 22, 2011 in response to increasing pressure across the Waste Tank solenoid valve SV_1121_1 and the EFA Filter. The EFA Filter was returned on ULF6 and received in the Boeing Huntsville Laboratory on June 13, 2011. The filter was aseptically removed from the housing, and the residual water was collected for enumeration and identification of bacteria and fungi. Swab samples of the filter surface were also collected for microbiological enumeration and identification. Sample analyses were performed by Boeing Huntsville Laboratory and NASA Johnson Space Center Microbiology for comparison. Photographic documentation of the EFA filter was performed using a stereo microscope and environmental scanning electron microscope. This paper characterizes the amount and types of microorganisms on the filter surface and in the residual water from the filter housing following 1 year of utilization in the ISS WPA.

Weir, Natalee↗

NASA NTRS2013

Nanoscale Mineralogy and Composition of Experimental Regolith Agglutinates Produced under Asteroidal Impact Conditions

On the Moon, the energetics of smaller impactors and the physical/chemical characteristics of the granular regolith target combine to form a key product of lunar space weathering: chemically reduced shock melts containing optically-active nanophase Fe metal grains (npFe0) [1]. In addition to forming the optically dark glassy matrix phase in lunar agglutinitic soil particles [1], these shock melts are becoming increasingly recognized for their contribution to optically active patina coatings on a wide range of exposed rock and grain surfaces in the lunar regolith [2]. In applying the lessons of lunar space weathering to asteroids, the potential similarities and differences in regolith-hosted shock melts on the Moon compared to those on asteroids has become a topic of increasing interest [3,4]. In a series of impact experiments performed at velocities applicable to the asteroid belt [5], Horz et al. [6] and See and Horz [7] have previously shown that repeated impacts into a gabbroic regolith analog target can produce melt-welded grain aggregates morphologically very similar to lunar agglutinates [6,7]. Although these agglutinate-like particles were extensively analyzed by electron microprobe and scanning electron microscopy (SEM) as part of the original study [7], a microstructural and compositional comparison of these aggregates to lunar soil agglutinates at sub-micron scales has yet to be made. To close this gap, we characterized a representative set of these aggregates using a JEOL 7600 field-emission scanning electron microscope (FE-SEM), and JEOL 2500SE field-emission scanning transmission electron microscope (FE-STEM) both optimized for energy dispersive X-ray spectroscopy (EDX) compositional spectrum imaging at respective analytical spatial resolutions of 0.5 to 1 micron, and 2 to 4 nm.

Christoffersen, Roy↗

NASA NTRS1991

Particulate impacts on the UHCRE cosmic ray experiment teflon covers: The ESA programme

The optical scanning equipment at the University of Kent Unit for Space Science consists of a 102.5 by 42.5 cm computer controlled motorized stage which has a reproduction accuracy of 30 microns over the entire area. This is used with an optical microscope connected to two charge coupled device video cameras which can be used to obtain stereo color images of any features found. A coordinate system can be defined on each cover by means of two or more reference marks which allow a feature to be located using different equipment such as a scanning electron microscope, providing two known marks can be found. By using back illumination, penetrating features can be found automatically, and their sizes, circularity, and positions logged for later revisiting either on the optical system or using a scanning electron microscope.

Mcdonnell, J. A. M.↗

NASA NTRS1982

Synchronized voltage contrast display analysis system

An apparatus and method for comparing internal voltage potentials of first and second operating electronic components such as large scale integrated circuits (LSI's) in which voltage differentials are visually identified via an appropriate display means are described. More particularly, in a first embodiment of the invention a first and second scanning electron microscope (SEM) are configured to scan a first and second operating electronic component respectively. The scan pattern of the second SEM is synchronized to that of the first SEM so that both simultaneously scan corresponding portions of the two operating electronic components. Video signals from each SEM corresponding to secondary electron signals generated as a result of a primary electron beam intersecting each operating electronic component in accordance with a predetermined scan pattern are provided to a video mixer and color encoder.

Johnston, M. F.↗