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We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics.This paper is a summary of test results.
We present the results of single event effect (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
The NASA Electronic Parts and Packaging (NEPP) program, and its subset the NASA Electronic Parts Assurance Group (NEPAG), are NASA's point-of-contacts for reliability and radiation tolerance of electrical, electronic, and electromechanical (EEE) parts and their packages. This presentation includes a Fiscal Year 2015 program overview.
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
NASA Electronic Parts and Packaging (NEPP) Program and NASA Electronic Parts Assurance Group (NEPAG) are NASAs point-of-contacts for reliability and radiation tolerance of EEE parts and their packages. This presentation includes an FY18 program overview.
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
The last few years have seen a surge in technology, device, and architecture introductions in commercial memories such as SDRAM and NAND driven by the explosion of handheld and portable electronics. Some of the resultant devices provide high density in very small and light packages, which may be possible to leverage for the miniaturization of future GN&C systems in addition to providing considerable memory capacity to enable advanced capabilities such as image-based navigation or adaptive/autonomous operations. We will show that these advanced SDRAM and NAND technologies are worth serious consideration for the next generation of GN&C needs by highlighting reliability and radiation effects results from some of these devices.
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
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Non-volatile memory technology as defined by NAND architecture flash memory continues to lead the process scaling and device shrinking efforts of the entire integrated circuit industry. 45- nm technology nodes are now producing commercial 32Gb devices. These latest 32Gb devices are pioneering new charge trapping memory cell technologies using metal gates and high-k dielectric materials. These cells are called TANOS and consist of tantalum-nitride, aluminum oxide (high k material), nitride, oxide, and silicon. Such high-density memories continue to revolutionize commercial electronics in terms of new high-speed data architectures and significant reductions in overall power and weight consumption. In stark contrast, nearly all science-based interplanetary and earth-orbiting NASA spacecraft are still designing in and around mid-1980s-level non-volatile technology with 1Mb Electrically Erasable Read-Only Memory (EEPROM) devices. NASA has typically shunned the use of modern flash devices because of radiation and reliability concerns due to the commercial-offthe– shelf (COTS) nature of the NAND flash technology. Given the significant potential increases in overall system capability these modern flash devices could bring to NASA missions, it is important to continue to investigate these devices. This report will investigate certain portions of the reliability performance of NAND flash devices, specifically the disturb properties. Understanding the possible limitations such new non-volatile memory technology presents to NASA is the goal of this report.
This paper outlines several testing issues posed by novel memories and approaches to testing for radiation and reliability effects.
This paper presents radiation dosimetry results from the radiation and reliability experiments on the Clementine spacecraft and Interstage Adapter Satellite. The dosimetry instruments used low dose response p-channel field effect transistor and proton sensitive static random access memory dosimeters. They were an order of magnitude lower in mass and power than previous systems. A solar proton event early in the mission allowed comparison with another dosimeter in orbit.
We present an overview of the Systems Engineering and Assurance Modeling (SEAM) platform, a web-browser-based tool which is designed to help engineers evaluate the radiation vulnerabilities and develop an assurance approach for electronic parts in space systems. The SEAM framework consists of three interconnected modeling tools, a SysML compatible system description tool, a Goal Structuring Notation (GSN) visual argument tool, and Bayesian Net and Fault Tree extraction and export tools. The SysML and GSN sections also have a coverage check application that ensures that every radiation fault identified on the SysML side is also addressed in the assurance case in GSN. The SEAM platform works on space systems of any degree of radiation hardness but is especially helpful for assessing radiation performance in systems with commercial-off-the-shelf (COTS) electronic components.
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, and bipolar devices.
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, and bipolar devices.
A high-power Laser Transmitter Assembly (LTA) was developed to support the Deep Space Optical Communications (DSOC) technology demonstration being developed by the Jet Propulsion Laboratory. NASA’s Psyche Mission plans to host the DSOC flight subsystem for testing space-to-ground high-bandwidth laser communications en route to the 16 Psyche asteroid. We review the design, performance, and qualification of the LTA Engineering Model and Flight Model (EM and FM) delivered to JPL. The LTA uses a master-oscillator power amplifier (MOPA) design and delivers up to 4.5 W at 1550 nm, with a highly efficient, cladding-pumped, polarization-maintaining erbium-ytterbium fiber amplifier. The master oscillator generates a range of pulse widths and repetition rates to support modulation formats from 16- to 128-PPM for optical data transmission at >100 Mbps. The LTA was designed for high reliability and radiation hardness, and includes redundant signal and pumping paths to reduce single points of failure, hardware interlocks to ensure safe operation and protection against damage, closed-loop control of optical power, and detailed health and status via telemetry. The LTA EM and FM were subjected to unit-appropriate space qualification testing. We describe the performance testing of the EM and FM, for the characterization of key metrics such as wavelength stability, signal linewidth, optical pulse width, jitter, and extinction ratio, and polarization extinction ratio. The management of optical nonlinearities (self-phase modulation, Brillouin scattering, or pulse-to-pulse energy variation), which could result in an optical link penalty or damage to the LTA, is also detailed, and factors affecting the power efficiency are discussed.
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single-event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).