DOE OSTI2019
Microcrystalline CeO 2 , ThO 2 , and UO 2 were irradiated with 198 MeV 132 Xe ions to the same fluence at temperatures ranging from 25°C to 700°C then characterized by synchrotron X-ray diffraction and X-ray absorption spectroscopy. All samples retain crystallinity and their nominal fluorite-type phase at a fluence of 1.5x10 13 ions/cm 2 . Both CeO 2 and ThO 2 display defect-induced unit cell expansion after irradiation at room temperature (~0.15% and ~0.10%, respectively), yet as irradiation temperature increases, the maximum swelling produced decreases to ~0.02%. Alternatively, UO 2 shows an initial contraction in unit cell parameter (approximately -0.05%), for room temperature irradiation most likely related to irradiation-enhanced annealing or irradiation-induced oxidation. At higher temperatures (above 200°C), UO 2 begins to swell, surpassing its unit cell parameter prior to irradiation (~0.05%), an effect which could be attributed to minor reduction in uranium oxidation state in vacuum. However, while CeO 2 irradiated at room temperature undergoes partial reduction, both UO 2 and ThO 2 exhibit no measurable change in cation oxidation state as evidenced by X-ray absorption spectroscopy. All samples display a decrease in irradiation-induced heterogeneous microstrain as a function of increasing irradiation temperature.