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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5
All sourcesNASA NTRSDOE OSTI
NASA NTRS1985

Outdoor performance testing of thin-film devices

The Advanced Systems Research Group supports the photovoltaic advanced R&D (PV AR&D) project by providing outdoor (global) testing of PV cells, submodules, modules, and arrays. The group also provides in house engineering and analysis to identify and determine how technical issues such as cell/module/system adaptations, long term stability, reliability, economics, materials availability, safety, and environmental impacts affect the development and ultimate use of advanced PV thin film, innovative cell, and material technologies. A major thrust of the research effort is to develop and utilize instrumentation and procedures for monitoring and analyzing PV cells and submodules including outdoor performance and stability testing and life cycle accelerated stress testing. To accomplish the above, the solar energy research institute (SERI) outdoor PV test facility was established in 1982. The group has designed testing systems and analysis procedures for, and has tested, numerous amorphous silicon thin film submodules provided by SERI subcontractors and has performed long term outdoor stability tests on CdS/CuIr Se sub 2 and hydrogen passivated silicon solar cells. A significant contribution from this facility over the past year was the testing of large area amorphous silicon submodules.

Source record↗
NASA NTRS2010

Nondestructive Evaluation and Monitoring Results from COPV Accelerated Stress Rupture Testing, NASA White Sands Test Facility (WSTF)

Develop and demonstrate NDE techniques for real-time characterization of CPVs and, where possible, identification of NDE capable of assessing stress rupture related strength degradation and/or making vessel life predictions (structural health monitoring or periodic inspection modes). Secondary: Provide the COPV user and materials community with quality carbon/epoxy (C/Ep) COPV stress rupture progression rate data. Aid in modeling, manufacturing, and application of COPVs for NASA spacecraft.

Saulsberry Regor↗
DOE OSTI2022

Investigating the Particle Growth in Bimodal Pt/C Catalysts by In-Situ Small-Angle X-ray Scattering: Challenges in the Evaluation of Stress Test Protocol-Dependent Degradation Mechanisms

The influence of different combinations of accelerated stress test (AST) protocols simulating load-cycle and start/stop conditions of a proton exchange membrane fuel cell (PEMFC) vehicle is investigated on a bimodal Pt/C catalyst. The bimodal Pt/C catalyst, prepared by mixing two commercial catalysts, serves as a model system and consists of two distinguishable size populations. The change in mean particle size was investigated by in situ small-angle X-ray scattering (SAXS). The comparison to the reference catalysts, i.e., the two single-size population catalysts, uncovers the presence of electrochemical Ostwald ripening as a degradation mechanism in the bimodal catalyst. Increasing the harshness of the applied AST protocol combinations by faster changing between load-cycle or start/stop conditions, the particle size of the larger population of the bimodal catalyst increases faster than expected. Surprisingly, the change in mean particle size of the smaller size population indicates a smaller increase for harsher AST protocols, which might be explained by a substantial electrochemical Ostwald ripening.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2022

PACT Perovskite PV Module Stress Testing Protocol (Version 0.0)

The purpose of this protocol is to use accelerated stress testing to assess the durability of metal halide perovskite (MHP) photovoltaic (PV) modules. The protocol aims to apply field relevant stressors to packaged MHP modules to screen for early failures that may be observed in the field. The current protocol has been designed with a glass/glass-PIB edge seal, no encapsulant package in mind. PACT anticipates adding additional testing sequences to evaluate additional stressors (e.g., PID, reverse bias) in the future.

42 ENGINEERING↗
NASA NTRS1986

Solar cell reliability testing

The progress and initial data on accelerated stress tests on small amorphous silicon test samples from several manufacturers are reported. The test samples include both single and tandem junction devices.

Lathrop, J.↗
NASA NTRS2006

Product Reliability Trends, Derating Considerations and Failure Mechanisms with Scaled CMOS

As microelectronics is scaled into the deep sub-micron regime, space and aerospace users of advanced technology CMOS are reassessing how scaling effects impact long-term product reliability. The effects of electromigration (EM), time-dependent-dielectric-breakdown (TDDB) and hot carrier degradation (HCI and NBTI) wearout mechanisms on scaled technologies and product reliability are investigated, accelerated stress testing across several technology nodes is performed, and FA is conducted to confirm the failure mechanism(s).

CMOS integrated circuits↗
DOE OSTI2022

A study of degradation mechanisms in PVDF-based photovoltaic backsheets

Abstract Commercial backsheets based on polyvinylidene fluoride (PVDF) can experience premature field failures in the form of outer layer cracking. This work seeks to provide a better understanding of the changes in material properties that lead to crack formation and find appropriate accelerated tests to replicate them. The PVDF-based backsheet outer layer can have a different structure and composition, and is often blended with a poly(methyl methacrylate) (PMMA) polymer. We observed depletion of PMMA upon aging with sequential (MAST) and combined (C-AST) accelerated stress testing. In field-aged samples from Arizona and India, where PVDF crystallizes in its predominant α-phase, the degree of crystallinity greatly increased. MAST and C-AST protocols were, to some extent, able to replicate the increase in crystallinity seen in PVDF after ~ 7 years in the field, but no single-stress test condition (UV, damp heat, thermal cycling) resulted in significant changes in the material properties. The MAST regimen used here was too extreme to produce realistic degradation, but the test was useful in discovering weaknesses of the particular PVDF-based outer layer structure studied. No excessive β-phase formation was observed after aging with any test condition; however, the presence of β-phase was identified locally by Fourier transform infrared spectroscopy (FTIR). We conclude that both MAST and C-AST are relevant tests for screening outdoor failure mechanisms in PVDF backsheets, as they were successful in producing material degradation that led to cracking.

14 SOLAR ENERGY↗
DOE OSTI2026

Relief Zones Enhance the Durability of Ultrathin Membranes in Electrochemical Conversion Devices

Premature failures in electrochemical conversion systems often result when membrane electrode assemblies (MEAs) use ultrathin (≤15 μm-thick) polymer electrolyte membranes, susceptible to mechanical degradation from stress concentrations arising from device-level integration. Herein, relief zones were developed to mitigate mechanical degradation by alleviating excess and nonuniform compression across active areas. Relief zones, created through ablation of carbonaceous diffusion media, enable seamless adaptation across MEA dimensions without need for hardware modifications. Demonstrated using fuel cells as a case study, accelerated stress tests revealed a 6-fold lifetime improvement (∼1500 h) compared to conventional edge-protected MEAs, decoupling device-level engineering effects from material limitations.

accelerated stress test↗
DOE OSTI2026

A Relief Zone Architecture for Enhanced Durability of Ultrathin Membranes in Electrochemical Conversion Devices

Premature cell failures in electrochemical conversion systems often result when membrane electrode assemblies (MEAs) are prepared with ultra-thin (= 15 micrometer-thick) polymer electrolyte membranes (PEMs). These high-performance PEMs are susceptible to mechanical degradation from stress concentrations arising from component and device-level integration. Herein, a relief zone was developed to mitigate mechanical degradation by alleviating excess and non-uniform compression across the active area. Relief zones, created through the ablation of carbonaceous diffusion material achieves a seamless adaptation across a range of MEA dimensions and electrochemical applications without need for costly hardware modifications. This concept was demonstrated using fuel cells as a case study. Accelerated stress test (AST) validations yielded a 6-fold improvement for MEAs prepared with relief zones (i.e., lifetime approximately 1500 h) compared to those fabricated using conventional edge-protection techniques, showcasing the utility of this technique in decoupling integration and device-level engineering effects from intrinsic material limitations for durable electrochemical devices.

14 SOLAR ENERGY↗
DOE OSTI2024

The influence of electrode crack dimensions on the durability of polymer electrolyte membrane fuel cells

Electrode cracks in polymer electrolyte membrane fuel cells (PEMFCs) are correlated with early onset failures. Here, in this work we investigate the influence of cracked gas diffusion electrodes (GDEs) on the durability of the membrane electrode assembly (MEA) using a combined chemical-mechanical accelerated stress test (AST). Electrode crack dimensions were systematically tuned using ink formulations and material selection strategies. A parameter to describe the crack width areal density (Φ CW ) was used to quantify the degree of discontinuity in the electrode surfaces. Open circuit voltage (OCV) transient analyses were used to benchmark and characterize the failure mechanisms in the MEAs as a function of the Φ CW . While smaller electrode-level cracks, on the order of microns, yielded a 28 % decrease in operating lifetime, larger cracks that propagated from a discontinuous, microporous layer (MPL) coating, decreased the operating lifetime by 56 %. This work emphasizes the need for material processing strategies that consider defect tolerances to limit membrane failures in PEMFCs.

08 HYDROGEN↗
DOE OSTI2025

Studying the Durability of Molybdenum Carbide Aerogel as an Electrocatalyst Support for Proton Exchange Membrane Fuel Cells

Carbon-supported platinum nanoparticles (Pt/C) are currently the state-of-the-art catalyst in proton exchange membrane fuel cells (PEMFCs). Unfortunately, the carbon support lacks the ability to stabilize the metal catalyst, as platinum tends to dissolve and agglomerate, significantly compromising the durability. Herein, we synthesized a ceramic material, molybdenum carbide aerogel (MCAG), and utilized it as a Pt support for PEMFCs, as an alternative for conventional carbon supports. N 2 adsorption and XRD analysis showed that the MCAG possesses a combination of high porosity and a well-defined ceramic crystalline structure. The Pt/MCAG system was studied for its electrocatalytic activity toward ORR in a half-cell and demonstrated satisfactory reaction kinetics and electrochemical active surface area, comparable to the commercial Pt/C. For durability examination, an accelerated stress test (AST) in a single cell was conducted with the Pt/MCAG catalyst at the cathode, following the U.S. DOE electrocatalyst AST protocol. Intermediate polarization curves and cyclic voltammograms were recorded over the course of the AST to monitor the aging process. The results indicated that the MCAG support exhibited superior durability in long-term fuel cell operation compared to a carbon support. The Pt/MCAG system demonstrated stable behavior during the progressive stages of the AST, retaining more than 50% of its initial performance by the end of the test, whereas carbon-supported Pt preserved only 30%.

25 ENERGY STORAGE↗
DOE OSTI2024

The impact of hot-press conditions on the durability of polymer electrolyte membrane fuel cells

The proton exchange membrane integrity can be compromised during hot-press fabrication of membrane electrode assemblies (MEAs) causing premature cell failures during operation. In this work, infrared (IR) thermography was used as a diagnostic tool to spatially visualize hydrogen (H 2 ) crossover and identify process-induced-membrane irregularities (PIMs). These irregularities were identified as seed locations for MEA failures. Fine tuning of hot-press conditions was used to mitigate premature cell failures informed by accelerated stress testing (AST). The impact of PIMs on the initial performance, high-frequency resistances, open-circuit voltage, and H 2 crossover are reported. Nafion XL and 212 membranes, hot-pressed with a force of 16 kg/cm 2 and temperature of 120°C, were found to be consistently irregularity-free. Irregularity-free MEAs using Nafion 211, 212, and XL membranes demonstrated AST lifetime improvements of 58, 64 and 400%, respectively, compared to those fabricated with non-optimized conditions. In conclusion, this work highlights the importance of fabrication parameters on premature cell failures.

08 HYDROGEN↗
NASA NTRS1985

Observed changes in a-Si:H cell characteristics due to long term temperature stress

Determination of thermally induced degradation mechanisms affecting thin film amorphous silicon solar cells through the use of laboratory accelerated stress testing requires acquisition of specially constructed, individually addressable test cells and the development of highly repeatable instrumentation which is not influenced by short-term reversible optical effects. This paper illustrates these considerations by describing accelerated temperature stress procedures and test results for one type of a-Si:H cell. Observed electrical characteristic changes indicate that two types of stress induced mechanisms are operating - one of which is self limiting and can be observed at lower temperatures and one which continues to complete degradation. The self limiting mechanism can result in a dramatic improvement to cells having initially low Voc values.

Lathrop, Jay W.↗
NASA NTRS1983

Accelerated degradation of silicon metallization systems

Clemson University has been engaged for the past five years in a program to determine the reliability attributes of solar cells by means of accelerated test procedures. The cells are electrically measured and visually inspected and then subjected for a period of time to stress in excess of that normally encountered in use, and then they are reinspected. Changes are noted and the process repeated. This testing has thus far involved 23 different unencapsulated cell types from 12 different manufacturers, and 10 different encapsulated cell types from 9 different manufacturers. Reliability attributes of metallization systems can be classified as major or minor, depending on the severity of the effects observed. As a result of the accelerated testing conducted under the Clemson program, major effects have been observed related to contact resistance and to mechanical adherence and solderability. This paper does not attempt a generalized survey of accelerated test results, but rather concentrates on one particular attribute of metallization that has been observed to cause electrical degradation - increased contact resistance due to Schottky barrier formation. In this example basic semiconductor theory was able to provide an understanding of the electrical effects observed during accelerated stress testing.

Lathrop, J. W.↗
NASA NTRS2004

Alternative Test Methods for Electronic Parts

It is common practice within NASA to test electronic parts at the manufacturing lot level to demonstrate, statistically, that parts from the lot tested will not fail in service using generic application conditions. The test methods and the generic application conditions used have been developed over the years through cooperation between NASA, DoD, and industry in order to establish a common set of standard practices. These common practices, found in MIL-STD-883, MIL-STD-750, military part specifications, EEE-INST-002, and other guidelines are preferred because they are considered to be effective and repeatable and their results are usually straightforward to interpret. These practices can sometimes be unavailable to some NASA projects due to special application conditions that must be addressed, such as schedule constraints, cost constraints, logistical constraints, or advances in the technology that make the historical standards an inappropriate choice for establishing part performance and reliability. Alternate methods have begun to emerge and to be used by NASA programs to test parts individually or as part of a system, especially when standard lot tests cannot be applied. Four alternate screening methods will be discussed in this paper: Highly accelerated life test (HALT), forward voltage drop tests for evaluating wire-bond integrity, burn-in options during or after highly accelerated stress test (HAST), and board-level qualification.

Plante, Jeannette↗
NASA NTRS2010

Scaled CMOS Technology Reliability Users Guide

The desire to assess the reliability of emerging scaled microelectronics technologies through faster reliability trials and more accurate acceleration models is the precursor for further research and experimentation in this relevant field. The effect of semiconductor scaling on microelectronics product reliability is an important aspect to the high reliability application user. From the perspective of a customer or user, who in many cases must deal with very limited, if any, manufacturer's reliability data to assess the product for a highly-reliable application, product-level testing is critical in the characterization and reliability assessment of advanced nanometer semiconductor scaling effects on microelectronics reliability. A methodology on how to accomplish this and techniques for deriving the expected product-level reliability on commercial memory products are provided.Competing mechanism theory and the multiple failure mechanism model are applied to the experimental results of scaled SDRAM products. Accelerated stress testing at multiple conditions is applied at the product level of several scaled memory products to assess the performance degradation and product reliability. Acceleration models are derived for each case. For several scaled SDRAM products, retention time degradation is studied and two distinct soft error populations are observed with each technology generation: early breakdown, characterized by randomly distributed weak bits with Weibull slope (beta)=1, and a main population breakdown with an increasing failure rate. Retention time soft error rates are calculated and a multiple failure mechanism acceleration model with parameters is derived for each technology. Defect densities are calculated and reflect a decreasing trend in the percentage of random defective bits for each successive product generation. A normalized soft error failure rate of the memory data retention time in FIT/Gb and FIT/cm2 for several scaled SDRAM generations is presented revealing a power relationship. General models describing the soft error rates across scaled product generations are presented. The analysis methodology may be applied to other scaled microelectronic products and their key parameters.

Microelectronics Reliability↗
DOE OSTI2021

High Performance non-PGM Transition Metal Oxide ORR Catalysts of PEMFCs

This project was designed to develop acid-stable PGM-free transition metal oxide oxygen reduction reaction (ORR) electrocatalysts to meet or exceed the performance and durability of the DOE 2020 Technical Targets for platinum-group metal (PGM) free electrocatalysts from first-principles to incorporation into membrane-electrode assemblies (MEAs) for polymer electrolyte membrane (PEM) fuel cells. The planned project was to accomplish this goal with a multi-step approach: 1) materials modeling and experimental screening to identify acid-stable oxides with high ORR activity, 2) optimization of catalyst particle size and catalyst/carbon/ionomer catalyst layer composition, 3) fabrication of MEAs for performance and durability testing. During the course of this project: 1) acid-stability descriptors were developed for manganese oxides; 2) a family of acid-stable multicomponent oxides based on antimony were developed; 3) a flexible synthesis for the formation of nanocrystalline nonstoichiometric oxides was developed; 4) limited ORR activity but modest and improving oxygen evolution reaction (OER) activity was measured for multicomponent antimony oxides. The project was programmed into five technical tasks: The development of acid-stable ORR electrocatalytic oxides through 1) identification and optimization of acid-stable oxide compositions, and 2) electrochemical characterization; 3) optimization of catalyst layer composition for MEAs using identified ORR electrocatalysts; 4) MEA fabrication and performance testing to result in performance of 44 mA-cm-2 at 0.9 V vs. RHE; and 5) accelerated-stress testing of optimized MEAs. Because no acid-stable oxide was identified with the requisite activity for ORR (4.4 µA-cm-2oxide intrinsic activity at 0.9 V vs. RHE) within the time and budget allotted in Tasks 1 and 2, the project was halted at the end of phase 1, with no activity in Tasks 3-5. The research output, while not succeeding in developing ORR electrocatalysts, advanced the development of acid-stable oxide materials, showing potential for further improvement as OER electrocatalysts.

08 HYDROGEN↗