DOE OSTI2021
The Discrete Fourier transform (DFT) based measurement algorithms are one of the most common measurement algorithms for grid parameter estimation such as rms, phase angle, frequency. Over the past few years, many DFT based algorithms have been developed to enhance its measurement accuracy under steady-state and/or dynamic grid conditions. For example, an adaptive band-pass filter utilizing exponential modulation filter has been proposed to reduce measurement errors at the presence of large frequency deviations. Measurement accuracy of different algorithms including FIR filter, extended Kalman filtering (EKF), and enhanced DFT method have been compared in detail under different grid conditions. Two artificial signals that have 90-degree phase difference were constructed by the Clarke transformation to address the frequency spectrum leakage of DFT. A multi-module approach was developed to enhance both steady-state and dynamic measurement accuracies, in which each module was developed to eliminate some specific errors. Besides DFT-based measurement algorithms, some signal model-based algorithms have been developed to further improve the accuracy under dynamic conditions. However, a key drawback of the state-of-the-art algorithms is that they cannot perform measurements accurately during system transient faults. In the Blue Cut Fire event, there was a phase angle jump of about 26 degrees in the voltage waveform during the transient fault. The phase angle jump fault will cause waveform discontinuity, and these algorithms will fail to provide reliable measurements during this period because they typically assume the waveform to be measured is continuous, no matter what method (DFT, PLL, EKF, FIR, or Taylor WLS) is used for estimation. In fact, the measurement errors during the system transient faults like phase-jump is not required in the IEEE Standard. As a result, although a measurement instrument can pass the strict IEEE Standard, it could still be the source of the problem in the future if we have similar system transient faults, which could happen again. Therefore, developing the fault-tolerant measurement technology is the key to solve the problem.