Fast scanning infrared microscope for semiconductor evaluation.
Fast scanning IR microscope for semiconductor evaluation used for engineering design analysis, reliability improvement, failure analysis, etc
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Results for “Semiconductor”
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Status of ultrachemical analysis for semiconductors
Status of ultratrace chemical analyses of materials for semiconductors was studied. This study covered atomic absorption spectroscopy, emission spectroscopy, and activation analyses. It makes recommendations to improve sensitivity, reliability and versatility for ultratrace chemical analysis.
Dilts, R. V.↗
Development of reliability prediction technique for semiconductor diodes
New fundamental technique of reliability prediction for semiconductor diodes based on realistic mathematical models can be applied to component failure rate prediction including mechanical degradation, electrical degradation, environmental stress factors, and electrical load stress factors.
Ryerson, C. M.↗
Semiconductor ac static power switch
Semiconductor ac static power switch has long life and high reliability, contains no moving parts, and operates satisfactorily in severe environments, including high vibration and shock conditions. Due to their resistance to shock and vibration, static switches are used where accidental switching caused by mechanical vibration or shock cannot be tolerated.
Vrancik, J.↗
Amorphous semiconductors Final report, 10 Jun. 1964 - 2 Aug. 1967
Electrical and optical properties of amorphous thin film semiconductors
Source record↗
Vapor phase growth technique and system for several 3-5 compound semiconductors Quarterly technical report
Single vapor phase growth system for preparing semiconductor materials
Clough, R.↗
Study of millimeter bulk semiconductor effects Final report
Bibliography, theory, and experiments on optical mixing in bulk semiconductors for millimeter wave generation
Gilbert, K. D.↗
Experimental investigation of electron-phonon interactions in semiconductors Quarterly progress report, 1 Jul. - 30 Sep. 1967
Growth and analysis of thin film piezoelectric transducers in study of electron phonon interactions in semiconductors
Martin, J. P.↗
External visual inspection criteria for semiconductor devices
External visual inspection criteria for semiconductor devices
Cole, C. G.↗
Radiation damage to semiconductors by high energy electrons Final progress report, 15 Mar. 1967 - 15 Mar. 1968
Radiation damage to silicon and germanium semiconductors by high energy electrons
Corelli, J. C.↗
The interrelation of process techniques and space radiation effects in metal-insulator-semiconductor structures Final report, 21 Apr. 1966 - 31 Jul. 1967
Interrelation of process techniques and space radiation effects in metal oxide semiconductors
Dennehy, W. J.↗
Experimental investigation of electron-phonon interactions in semiconductors Final report, 16 Dec. 1966 - 30 Jan. 1968
Preparation of vapor deposited cadmium sulfide thin films on indium antimonide semiconductors for acoustic propagation studies of electron- phonon interaction
Martin, J. P.↗
Mechanism of cathodic processes on the semiconductor zinc oxide.
Current-voltage characteristics of cathodic reduction of aqueous ferricyanide ion, using single crystal of n-type semiconductor zinc oxide
Freund, T.↗
Spherical drilling - A new method for the measurement of junction depths in semiconductor devices.
Junction depths measurement in semiconductor devices by drilling with rotating sphere
Lagnado, I.↗
Predicted transition temperatures of very thin films and whiskers of superconducting semiconductors - Application to SrTiO sub 3.
Bardeen-Cooper-Schrieffer energy gap equation /with constant kernel/ approximate solution derivation for superconducting semiconductors, discussing predicted very thin film transition temperatures
Eagles, D. M.↗
Radiation Effects in Semiconductor Devices.
Book on radiation effects in semiconductor devices, discussing displacement, transient and surface damage
Larin, F.↗
The impact of the flight specifications on semiconductor failure rates.
Flight specifications effects on failure rates of semiconductor parts in Apollo Guidance Computer, detailing procurement, screen, burn-in and field history
Hanley, L. D.↗
Total single-particle energy of isotropic semiconductors.
Total single particle energy of isotropic semiconductors, discussing energy spectra of bonded crystals for diamond and silicon
Van Vechten, J. A.↗