X-ray nanotomography of SiO{sub 2}-coated Pt{sub 90}Ir{sub 10} tips with sub-micron conducting apex
Hard x-ray nanotomography provides an important three-dimensional view of insulator-coated ''smart tips'' that can be utilized for modern emerging scanning probe techniques. Tips, entirely coated by an insulating SiO{sub 2} film except at the very tip apex, are fabricated by means of electron beam physical vapor deposition, focused ion beam milling and ion beam-stimulated oxide growth. Although x-ray tomography studies confirm the structural integrity of the oxide film, transport measurements suggest the presence of defect-induced states in the SiO{sub 2} film. The development of insulator-coated tips can facilitate nanoscale analysis with electronic, chemical, and magnetic contrast by synchrotron-based scanning probe microscopy.