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At least 829 records · Page 46

Preliminary measurements of the edge magnetic field pitch from 2-D Doppler backscattering in MAST and NSTX-U (invited)

The Synthetic Aperture Microwave Imaging (SAMI) system is a novel diagnostic consisting of an array of 8 independently phased antennas. At any one time, SAMI operates at one of the 16 frequencies in the range 10-34.5 GHz. The imaging beam is steered in software post-shot to create a picture of the entire emission surface. In SAMI’s active probing mode of operation, the plasma edge is illuminated with a monochromatic source and SAMI reconstructs an image of the Doppler back-scattered (DBS) signal. By assuming that density fluctuations are extended along magnetic field lines, and knowing that the strongest back-scattered signals are directed perpendicular to the density fluctuations, SAMI’s 2-D DBS imaging capability can be used to measure the pitch of the edge magnetic field. In this paper, we present preliminary pitch angle measurements obtained by SAMI on the Mega Amp Spherical Tokamak (MAST) at Culham Centre for Fusion Energy and on the National Spherical Torus Experiment Upgrade at Princeton Plasma Physics Laboratory. Lastly, the results demonstrate encouraging agreement between SAMI and other independent measurements.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Surface registration using a multi-beam optical probe and backscatter reflectometer

We introduce a technique for locating the position and orientation of an object surrounding a compound optical probe. The probe allows for simultaneous measurement of 150 points of laser velocimetry, and prior to a dynamic experiment it is important to know the initial position of the surface. Using an optical switch and a Luna OBR rangefinder, we measure the surface distance at hundreds of locations. These measurements are then combined with a dimensional inspection of the object and analysis routines to report the orientation and location of the inner surface relative to the probe. In addition, we present a technique to simultaneously measure the beam paths using a reference hemispherical surface and a number of distance measurements.

47 OTHER INSTRUMENTATION↗