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At least 811 records · Page 45
All sourcesNASA NTRSDOE OSTI
DOE OSTI2015

Probing depth dependent structure and magnetic properties of thin films using polarized neutron reflectivity

Novel properties of materials produced using nanoscale manufacturing processes often arise from interactions across interfaces between dissimilar materials. In order to understand the physical and magnetic properties of such nanostructures, a thorough and detailed structural and magnetic characterization with interface specificity is required. X-ray reflectivity and polarized neutron reflectivity (PNR) are two nondestructive techniques that provide quantitative measures of the chemical and magnetic depth profiles of the films with less than nanometer resolution averaged over the lateral dimensions of the entire sample (typically 100 mm{sup 2}). PNR specifically gives simultaneous structure and magnetic information of the interfaces. Unquestionably, neutron reflectivity has played a decisive role in the development and study of new emergent phenomena at interfaces.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2015

Non-thermal effects on femtosecond laser ablation of polymers extracted from the oscillation of time-resolved reflectivity

The dynamics of femtosecond laser ablation of transparent polymers were examined using time-resolved reflectivity. When these polymers were irradiated by a pump pulse with fluence above the ablation threshold of 0.8–2.0 J/cm{sup 2}, we observed the oscillation of the reflectivity caused by the interference between the reflected probe pulses from the sample surface and the thin layer due to the non-thermal photomechanical effects of spallation. As the fluence of the pump pulse increased, the separation velocity of the thin layer increased from 6 km/s to the asymptotic value of 11 km/s. It is suggested that the velocities are determined by shock-wave velocities of the photo-excited layer.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2015

Probing carrier dynamics of individual layers in a heterostructure using transient reflectivity

We report the wavelength dependent transient reflectivity measurements in AlGaAs-GaAs heterostructures having two-dimensional electron (or hole) gas near the interface. Using a multilayer model for transient reflectivity, we show that the magnitude and sign of contributions from the carriers in two-dimensional electron (or hole) gas and GaAs to the total signal depends on the wavelength. Further, it has been shown that it is possible to study the carrier dynamics in a given layer of a heterostructure by performing transient reflectivity at specific wavelengths.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2015

Measurements of low-energy electron reflection at a plasma boundary

It is demonstrated that low-energy (<3 eV) electron reflection from a solid surface in contact with a low-temperature plasma can have significant variation with time. An uncontaminated, i.e., “clean,” metallic surface (just after heating up to glow) in a plasma environment may have practically no reflection of low-energy incident electrons. However, a contaminated, i.e., “dirty,” surface (in some time after cleaning by heating) that has a few monolayers of absorbent can reflect low-energy incident electrons and therefore significantly affect the net electron current collected by the surface. This effect may significantly change plasma properties and should be taken into account in plasma experiments and models. A diagnostic method is demonstrated for measurements of low-energy electron absorption coefficient in plasmas with a mono-energetic electron group.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
DOE OSTI2015

A simplified method for generating periodic nanostructures by interference lithography without the use of an anti-reflection coating

Interference lithography has proven to be a useful technique for generating periodic sub-diffraction limited nanostructures. Interference lithography can be implemented by exposing a photoresist polymer to laser light using a two-beam arrangement or more simply a one beam configuration based on a Lloyd's Mirror Interferometer. For typical photoresist layers, an anti-reflection coating must be deposited on the substrate to prevent adverse reflections from cancelling the holographic pattern of the interfering beams. For silicon substrates, such coatings are typically multilayered and complex in composition. By thinning the photoresist layer to a thickness well below the quarter wavelength of the exposing beam, we demonstrate that interference gratings can be generated without an anti-reflection coating on the substrate. We used ammonium dichromate doped polyvinyl alcohol as the positive photoresist because it provides excellent pinhole free layers down to thicknesses of 40 nm, and can be cross-linked by a low-cost single mode 457 nm laser, and can be etched in water. Gratings with a period of 320 nm and depth of 4 nm were realized, as well as a variety of morphologies depending on the photoresist thickness. This simplified interference lithography technique promises to be useful for generating periodic nanostructures with high fidelity and minimal substrate treatments.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2016

Dynamics of spallation during femtosecond laser ablation studied by time-resolved reflectivity with double pump pulses

The dynamics of photomechanical spallation during femtosecond laser ablation of fused silica was studied by time-resolved reflectivity with double pump pulses. Oscillation of reflectivity was caused by interference between the probe pulses reflected at the sample surface and the spallation layer, and was enhanced when the surface was irradiated with the second pump pulse within a time interval, Δτ, of several picoseconds after the first pump pulse. However, as Δτ was increased, the oscillation amplitude decreased with an exponential decay time of 10 ps. The oscillation disappeared when Δτ exceeded 20 ps. This result suggests that the formation time of the spallation layer is approximately 10 ps. A second pump pulse with Δτ shorter than 10 ps excites the bulk sample. The spallation layer that is photo-excited by the first and second pump pulses is separated afterward. In contrast, a pulse with Δτ longer than the formation time excites and breaks up the spallation layer that has already been separated from the bulk. The formation time of the spallation layer, as determined in this experiment, is attributed to the characteristic time of the mechanical equilibration corresponding to the thickness divided by the sound velocity of the photo-excited layer.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2016

Comparison of sub-Doppler-width resonances in transmission and reflection spectra of micrometer-thick Cs vapor layers

We report experimental study of resonance sign reversal at the hyperfine F{sub g} = 4 → F{sub e} = 5 transition on D{sub 2} line of {sup 133}Cs. Alkali vapors are confined in an optical cell with micrometric thickness. For circular polarization of the irradiating light, transmission and reflection spectra, recorded at different laser intensities and different temperature of alkali vapor, are studied and compared. At low laser intensity, in the transmission spectra we observe a narrow resonance of increased absorption (bright resonance) at the F{sub g} = 4 → F{sub e} = 5 transition, however in reflection spectra, recorded at the same experimental conditions, this bright resonance transforms into a dark resonance of reduced absorption. A simple explanation is proposed in order to explain the observed difference between the transmission and reflection spectra.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2016

Dependence of reflection and transmission of soliton on angle of incidence at an interface between chalcogenide fibre and gallium nanoparticle film by phase plane trajectories

In the present paper, we study propagation of a soliton at an interface formed between special type of chalcogenide fibre and gallium in three different phases with the help of equivalent particle theory. Critical angle of incidence and critical power required for transmission and reflection of soliton beam have investigated. Here it is found that if the incident angle of the beam or initial velocity of the equivalent particle is insufficient to overcome the maximum increase in potential energy then the particle (light beam) is reflected by the interface and if this incident angle is greater than a critical angle then light beam will be transmitted by the interface. From an equation these critical angles for α-gallium, one of a metastable phase and liquid gallium are calculated and concluded that at large incident angles, the soliton is transmitted through the boundary, whereas at small incidence angles the soliton get reflected on keeping the power of incident beam constant. These results are explained by phase plane trajectories of the effective potential which are experimentally as well as theoretically proved.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2016

Kramers-Kronig analysis of soft x-ray reflectivity data of platinum thin film in 40-200 Å wavelength region

Reflectivity beamline at Indus-1 synchrotron source is used to determine optical constants of a platinum thin film in the soft x-ray wavelength region of 40-200Å by applying Kramers-Kronig (KK) technique on R vs wavelength data. Upto 150Å wavelength region the results of KK analysis are found in good agreement with the Henke’s optical constants and also with those obtained by the angle dependent reflectivity technique. A significant mismatch is observed above 150Å wavelength region which could be due to the presence of higher harmonics in the toroidal grating spectra of the reflectivity beamline.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2016

Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependent structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.

77 NANOSCIENCE AND NANOTECHNOLOGY↗
DOE OSTI2016

Observation of strong reflection of electron waves exiting a ballistic channel at low energy

Wave scattering by a potential step is a ubiquitous concept. Thus, it is surprising that theoretical treatments of ballistic transport in nanoscale devices, from quantum point contacts to ballistic transistors, assume no reflection even when the potential step is encountered upon exiting the device. Experiments so far seem to support this even if it is not clear why. Here we report clear evidence of coherent reflection when electron wave exits the channel of a nanoscale transistor and when the electron energy is low. The observed behavior is well described by a simple rectangular potential barrier model which the Schrodinger’s equation can be solved exactly. We can explain why reflection is not observed in most situations but cannot be ignored in some important situations. Our experiment also represents a direct measurement of electron injection velocity - a critical quantity in nanoscale transistors that is widely considered not measurable.

77 NANOSCIENCE AND NANOTECHNOLOGY↗
DOE OSTI2016

Microstructure and composition analysis of low-Z/low-Z multilayers by combining hard and resonant soft X-ray reflectivity

Microstructure and composition analysis of periodic multilayer structure consisting of a low electron density contrast (EDC) material combination by grazing incidence hard X-ray reflectivity (GIXR), resonant soft X-ray reflectivity (RSXR), and transmission electron microscopy (TEM) are presented. Measurements of reflectivity at different energies allow combining the sensitivity of GIXR data to microstructural parameters like layer thicknesses and interfacing roughness, with the layer composition sensitivity of RSXR. These aspects are shown with an example of 10-period C/B{sub 4}C multilayer. TEM observation reveals that interfaces C on B{sub 4}C and B{sub 4}C on C are symmetric. Although GIXR provides limited structural information when EDC between layers is low, measurements using a scattering technique like GIXR with a microscopic technique like TEM improve the microstructural information of low EDC combination. The optical constants of buried layers have been derived by RSXR. The derived optical constants from the measured RSXR data suggested the presence of excess carbon into the boron carbide layer.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2013

Light scattering by a rough surface of human skin. 2. Diffuse reflectance

Based on the previously calculated luminance factors, we have investigated the integral characteristics of light reflection from a rough surface of the skin with large-scale inhomogeneities under various conditions of the skin illumination. Shadowing of incident and scattered beams by relief elements is taken into account. Diffuse reflectances by the Gaussian and the quasi-periodic surfaces are compared and, in general, both these roughness models are shown to give similar results. We have studied the effect of the angular structure of radiation multiply scattered deep in the tissue and the refraction of rays as they propagate from the dermis to the surface of the stratum corneum on the reflection characteristics of the skin surface. The importance of these factors is demonstrated. The algorithms constructed can be included in the schemes of calculation of the light fields inside and outside the medium in solving various direct and inverse problems of optics of biological tissues. (biophotonics)

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2015

Comparative analysis of two methods for calculating reflectance of black silicon

We report a detailed numerical simulation of the reflection of visible light from a sub-wavelength grating with a rectangular profile on the silicon surface. Simulation is carried out by the effective refractive index method and rigorous coupled-wave analysis. The dependences of the reflectance on the grating depth, fill factor and angle of incidence for TE and TM polarisations are obtained and analysed. Good agreement between the results obtained by the two methods for grating periods of ∼100 nm is found. The possibility of reducing the polarised light reflectance to about 1% by adjusting the depth and the grating fill factor is demonstrated. The characteristics of the Brewster effect manifestation (pseudo-Brewster angle) in the system under study are considered. The possibility of the pseudo-Brewster angle existence and its absence for both polarisations of the incident light is shown as a function of the parameters of a rectangular nanostructure on the surface. (laser applications and other topics in quantum electronics)

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2017

Reflection of terahertz monochromatic surface plasmon-polaritons by a plane mirror

Using a free electron laser developed in Novosibirsk, we have studied the reflection of monochromatic ( λ = 130 μm) surface plasmon-polaritons (SPPs) from a plane mirror attached to a waveguiding surface. It is found that 100 % SPP reflection occurs not only in the perpendicular position of the mirror relative to the surface, but also when the mirror is deflected from the normal by the angle α being smaller than the limiting angle α * proportional to the SPP wave vector. When the mirror is deflected by the angle greater than α *, SPPs on a perfectly smooth surface must transform into a bulk wave, while, in the experiment, the SPP reflection coefficient decreases gradually to zero with increasing α , which is a manifestation of dispersion of the wave vector of monochromatic SPPs, caused by their scattering on the inhomogeneities of a real surface. (paper)

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2018

Reflective mode X-ray microscopy of inclined objects

We propose an optical configuration of a reflective mode X-ray microscope which operates by the reflection of radiation incident on an object at grazing incidence. Primary emphasis is placed on the image recording with minimal aberrations. Numerical simulations are used to estimate the spatial resolution and the field of view, and a comparison is made with the results of investigation of surface-modified objects with a reflective mode X-ray laser microscope operating at a wavelength of 14.9 nm. (laser applications and other topics in quantum electronics)

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2019

On the nonlocality of the reflection of an electromagnetic wave from a flat surface upon excitation of surface waves

Diffraction phenomena arising due to reflection of a plane electromagnetic wave from a metal film, which are caused by a limited size of the incident beam aperture, are considered in the Kretschmann scheme used to excite a surface plasmon wave. It is shown that the wave reflection occurs nonlocally, that is, the region of the surface on which the wave is incident and the region from which it is reflected do not substantially coincide. The localisation of the maximum field is investigated when a surface plasmon is excited on a silver film. The absolute values of the gain in terms of the amplitude of the field on the free surface of the film are calculated. The proposed theory is applied to explain the Goos – Hänchen effect. (integrated optics)

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2015

The NuSTAR view of reflection and absorption in NGC 7582

NGC 7582 is a well-studied X-ray bright Seyfert 2 with moderately heavy (N{sub H} ∼ 10{sup 23}−10{sup 24} cm{sup −2}), highly variable absorption and strong reflection spectral features. The spectral shape changed around the year 2000, dropping in observed flux and becoming much more highly absorbed. Two scenarios have been put forth to explain this spectral change: (1) the central X-ray source partially “shut off” around this time, decreasing in intrinsic luminosity, with a delayed decrease in reflection features due to the light-crossing time of the Compton-thick material or (2) the source became more heavily obscured, with only a portion of the power law continuum leaking through. NuSTAR observed NGC 7582 twice in 2012, two weeks apart, in order to quantify the reflection using high-quality data above 10 keV. We find that the most plausible scenario is that NGC 7582 has recently become more heavily absorbed by a patchy torus with a covering fraction of ∼80%–90% and an equatorial column density of ∼3×10{sup 24} cm{sup −2}. We find the need for an additional highly variable full-covering absorber with N{sub H} = (4–6) × 10{sup 23} cm{sup −2} in the line of sight, possibly associated with a hidden broad line region.

79 ASTRONOMY AND ASTROPHYSICS↗