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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 811 records · Page 45

Examining the Angular Resolution of the Astro-H's Soft X-Ray Telescopes

The international x-ray observatory ASTRO-H was renamed Hitomi after launch. It covers a wide energy range from a few hundred eV to 600 keV. It is equipped with two soft x-ray telescopes (SXTs: SXT-I and SXT-S) for imaging the soft x-ray sky up to 12 keV, which focus an image onto the respective focal-plane detectors: CCD camera (SXI) and a calorimeter (SXS). The SXTs are fabricated in a quadrant unit. The angular resolution in half-power diameter (HPD) of each quadrant of the SXTs ranges between 1.1 and 1.4 arc min at 4.51 keV. It was also found that one quadrant has an energy dependence on the HPD. We examine the angular resolution with spot scan measurements. In order to understand the cause of imaging capability deterioration and to reflect it to the future telescope development, we carried out spot scan measurements, in which we illuminate all over the aperture of each quadrant with a square beam 8 mm on a side. Based on the scan results, we made maps of image blurring and a focus position. The former and the latter reflect figure error and positioning error, respectively, of the foils that are within the incident 8 mm x 8 mm beam. As a result, we estimated those errors in a quadrant to be approx. 0.9 to 1.0 and approx. 0.6 to 0.9 arc min, respectively. We found that the larger the positioning error in a quadrant is, the larger its HPD is. The HPD map, which manifests the local image blurring, is very similar from quadrant to quadrant, but the map of the focus position is different from location to location in each telescope. It is also found that the difference in local performance causes energy dependence of the HPD.

Astro-H/Hitomi; soft x-ray telescope; SXT; Wolter ↗

Calculation of top-of-atmosphere, surface and atmospheric cloud radiative kernels and feedbacks based on ISCCP-H datasets

This study aims to create observation-based cloud radiative kernel (CRK) datasets and evaluate them by direct comparison of CRK and the CRK-derived cloud feedback datasets. Based on the International Satellite Cloud Climatology Project (ISCCP) H datasets, we calculate CRKs (called FH CRKs) as 2D joint function/histogram of cloud optical depth and cloud top pressure for shortwave, longwave, and their sum, Net, at the top of atmosphere (TOA), as well as, for the first time, at the surface (SFC) and in the atmosphere (ATM). The direct comparison shows that FH agrees reasonably well with three other TOA CRK datasets. With cloud fraction change (CFC) datasets of the same histogram for doubled-CO2 simulation from 10 CFMIP1 models, we derive all the TOA, SFC and ATM cloud feedback using the FH CRKs. Our TOA cloud feedback is highly similar to the previous counterparts. Based on the comparison for the 4 CRK datasets and the 10 CFC datasets, we estimate the uncertainty budget for the CRK-derived cloud feedback and show that the CFC-associated uncertainty contributes > 98.5% of the total cloud feedback uncertainty while CRK’s is very small. Our preliminary evaluation shows that some near-zero/small cloud feedback in the TOA-alone feedback indeed results from the compensation of sizable cloud feedback of the SFC and ATM feedback, demonstrating that they help reveal some significant surface and atmospheric cloud feedback whose sum appears insignificant in TOA-alone feedback

cloud radiative kernel (CRK) datasets↗

Physical processes in H II regions.

Physical process effect on structure of H II REGIONS, noting ionization, Lyman continuum spectral distribution and radiative transfer frequency dependence on absorptive processes

FREQUENCY RESPONSE↗

Transistor h parameter conversion slide rule

Slide rule enables the ready conversion of transistor h parameters from one form to another and reduces calculation time by a factor of 5 to 10. The scales are selected to cover all ranges of each parameter that will normally exist for any transistor, and answers are given in the correct order of magnitude, making powers-of-ten calculations unnecessary.

Brantner, R. E.↗