Drag coefficients of microscopic spheres in free-molecule flow
Drag coefficients of microscopic spheres in free molecule flow
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Drag coefficients of microscopic spheres in free molecule flow
Computer methods and microscopic plasma theory
Microscopic interpretation of generalized Helmholtz equation, considering particle in charged gas in adiabatic flow as rotating cylinder model
Cesium ion emission patterns from rear-fed porous refractory metals studied by thermal emission microscope
Thermionic emission microscope was designed to operate with metal specimen cathode temperatures of 2000 degrees C.
Electron, and ion microscopic study of structural defects in quenched platinum
Electron microscope technique for revealing microstructures of dispersion strengthened materials
Scanning electron mirrors microscope design and development
Nucleation and growth of iron and vanadium thin films to observe polymorphic transformation using electron microscope
Crystal structure and growth, and nucleation observed by electron diffraction and microscope in formation of thin metal films during vacuum deposition on carbon
Tip radius variation effect on field-ion microscope operation, noting field-temperature characteristics
Atom probe field ion microscope combining probe hole FIM and mass spectrometer with single particle sensitivity
Microscope using tandem scanning of reflected light for image contrast and sharpness for semitransparent materials
Electron microscope analysis of micrometeoroid particle size distribution on sampling surfaces recovered from space with Luster sounding rockets
Si lattice vibrations, calculating phonon dispersion curves from microscopic model by dielectric screening theory
Olefins of high molecular weight in microscopic algae, discussing hydrocarbon composition investigation by gas chromatography mass spectrometry
Computerized image simulation to interpret crystal dislocations in field ion microscope images, investigating dislocations in various lattice systems by shell model
Scanning microscope uses a field-emission tip for the electron source, an electron gun that simultaneously accelerates and focuses electrons from the source, and one auxiliary lens to produce a final probe size at the specimen on the order of angstroms.