Comparative study of X-ray emission from plasma focus relative to different preionization schemes
A 2.7-kJ Mather-type plasma focus has been investigated for X-ray emission with preionization produced by an α-source, a β-source, and a shunt resistor. Time-resolved and time integrated measurements are carried out using a PIN-diode-based X-ray spectrometer and pinhole camera. The β-source ({sub 28}Ni{sup 63}) assisted preionization enhances the X-ray emission up to 25%, while preionization induced by depleted uranium ({sub 92}U{sup 238}) increases both Cu-K{sub α} and total X-ray yield of about 100%. The preionization caused by the optimum shunt resistor enhances the Cu-K{sub α} and total X-ray yield of about 53%. It is found that preionization also broadens the working pressure range for the high X-ray yield and improves the shot-to-shot reproducibility of the system. Pinhole images reveal that the X-ray emission from the anode tip is dominant owing to impact of electron bombardment, while the X-ray emission from hot spots is also visible.