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At least 775 records · Page 43
All sourcesNASA NTRSDOE OSTI
NASA NTRS2005

Sub-pixel Spatial Resolution Micro-roughness Measurements with Interlaced Stitching

In this paper we describe a method to increase the spatial resolution of surface micro-roughness measurements. As the surface specifications for precision optics become more demanding, the metrology instruments must cover a broad spatial frequency range. Generally, multiple instruments are used to cover the full range of the specifications. For example, a Fizeau interferometer would be used to test low spatial frequency surface errors, a white light interferometer would be used for mid spatial frequency errors, and an AFM would be used for high spatial frequency errors. For some precision optics, three instruments would be necessary. However, in many applications, an increase in the spatial resolution of a metrology instrument could negate the need for multiple instruments. A solution to increase the spatial resolution of micro-roughness measurements obtained using white light interferometry with "interlaced stitching" will be presented. In "interlaced stitching", multiple interferometric measurements are made as the optic under test (or the CCD array) is laterally shifted at sub-pixel increments. The measurements are then combined to construct a measurement with higher spatial resolution. Initial results obtained while implementing a similar process used to increase the spatial resolution of measurements made with a commercially available Fizeau interferometer will be presented.

Mooney, James T.↗
NASA NTRS2005

MOVPE of GaSb/InGaAsSb Multilayers and Fabrication of Dual Band Photodetectors

Metalorganic vapor phase epitaxy (MOVPE) of GaSb/InGaAsSb multilayer thin films and fabrication of bias-selectable dual band photodetectors are reported. For the dual band photodetectors the short wavelength detector, or the upper p- GaSb/n-GaSb junction photodiode, is placed optically ahead of the long wavelength one, or the lower photodiode. The latter is based on latticed-matched In0.13Ga0.87As0.11Sb0.89 with bandgap near 0.6 eV. Specifically, high quality multilayer thin films are grown sequentially from top to bottom as p+-GaSb/p-GaSb/n-GaSb/n-InGaAsSb/p-InGaAsSb/p-GaSb on undoped p-type GaSb substrate, and as n-GaSb/p-GaSb/p-InGaAsSb/n-InGaAsSb/n-GaSb on Te-doped n-type GaSb substrate respectively. The multilayer thin films are characterized by optical microscope, atomic force microscope (AFM), electron microprobe analyses etc. The photodiode mesa steps are patterned by photolithography with wet chemical etching and the front metallization is carried out by e-beam evaporation with Pd/Ge/Au/Ti/Au to give ohmic contact on both n- and p-type Sb based layer surfaces. Dark I-V measurements show typical diode behavior for both the upper and lower photodiodes. The photoresponsivity measurements indicate that both the upper and lower photodiodes can sense the infrared illumination corresponding to their cutoff wavelengths respectively, comparable with the simulation results. More work is underway to bring the long wavelength band to the medium infrared wavelength region near 4 micrometers.

Xiao, Ye-Gao↗
NASA NTRS1994

(abstract) Optical Scattering and Surface Microroughness of Ion Beam Deposited Au and Pt Thin Films

Thin films of gold and platinum have been deposited onto superpolished fused silica substrates using thermal evaporation, ion assisted deposition (IAD), and ion assisted sputtering. The influence of ion beam flux, thin film material, and deposition rate on the films microroughness have been investigated. Short range surface microroughness of the films has been examined using scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Long range surface microroughness has been characterized using an angle resolved optical scatterometer. Results indicate that ion beam deposited coatings have improved microstructure over thermally evaporated films.

assisted sputtering fused silica ion beam microrou↗
NASA NTRS2001

NanoElectronics and BioElectronics

This viewgraph presentation reviews the use of Carbon Nanotube electronics in the bioelectronics. Included is a brief review of the carbon nanotube manufacturing, the use of carbon nanotubes in Atomic Force Microscopy (AFM), and Computational Nanotechnology, that allows designers to understand nanotube characteristics and serves as a design tool.

Srivastava, Deepak↗
NASA NTRS2008

NASA Tech Briefs, September 2008

Topics covered include: Nanotip Carpets as Antireflection Surfaces; Nano-Engineered Catalysts for Direct Methanol Fuel Cells; Capillography of Mats of Nanofibers; Directed Growth of Carbon Nanotubes Across Gaps; High-Voltage, Asymmetric-Waveform Generator; Magic-T Junction Using Microstrip/Slotline Transitions; On-Wafer Measurement of a Silicon-Based CMOS VCO at 324 GHz; Group-III Nitride Field Emitters; HEMT Amplifiers and Equipment for their On-Wafer Testing; Thermal Spray Formation of Polymer Coatings; Improved Gas Filling and Sealing of an HC-PCF; Making More-Complex Molecules Using Superthermal Atom/Molecule Collisions; Nematic Cells for Digital Light Deflection; Improved Silica Aerogel Composite Materials; Microgravity, Mesh-Crawling Legged Robots; Advanced Active-Magnetic-Bearing Thrust- Measurement System; Thermally Actuated Hydraulic Pumps; A New, Highly Improved Two-Cycle Engine; Flexible Structural-Health-Monitoring Sheets; Alignment Pins for Assembling and Disassembling Structures; Purifying Nucleic Acids from Samples of Extremely Low Biomass; Adjustable-Viewing-Angle Endoscopic Tool for Skull Base and Brain Surgery; UV-Resistant Non-Spore-Forming Bacteria From Spacecraft-Assembly Facilities; Hard-X-Ray/Soft-Gamma-Ray Imaging Sensor Assembly for Astronomy; Simplified Modeling of Oxidation of Hydrocarbons; Near-Field Spectroscopy with Nanoparticles Deposited by AFM; Light Collimator and Monitor for a Spectroradiometer; Hyperspectral Fluorescence and Reflectance Imaging Instrument; Improving the Optical Quality Factor of the WGM Resonator; Ultra-Stable Beacon Source for Laboratory Testing of Optical Tracking; Transmissive Diffractive Optical Element Solar Concentrators; Delaying Trains of Short Light Pulses in WGM Resonators; Toward Better Modeling of Supercritical Turbulent Mixing; JPEG 2000 Encoding with Perceptual Distortion Control; Intelligent Integrated Health Management for a System of Systems; Delay Banking for Managing Air Traffic; and Spline-Based Smoothing of Airfoil Curvatures.

Source record↗
NASA NTRS2007

Development of a Quantum Dot, 0.6 eV InGaAs Thermophotovoltaic (TPV) Converter

Thermophotovoltaic (TPV) power conversion has to date demonstrated conversion efficiencies exceeding 20% when coupled to a heat source. Current III-V semiconductor TPV technology makes use of planar devices with bandgaps tailored to the heat source. The efficiency can be improved further by increasing the collection efficiency through the incorporation of InAs quantum dots. The use of these dots can provide sub-gap absorption and thus improve the cell short circuit current without the normal increase in dark current associated with lowering the bandgap. We have developed self-assembled InAs quantum dots using the Stranski-Krastanov growth mode on 0.74 eV In0.53GaAs lattice-matched to InP and also on lattice-mismatched 0.6 eV In0.69GaAs grown on InP through the use of a compositionally graded InPAsx buffer structure, by metalorganic vapor phase epitaxy (MOVPE). Atomic force microscopy (AFM) measurements showed that the most reproducible dot pattern was obtained with 5 monolayers of InAs grown at 450 C. The lattice mismatch between InAs and In0.69GaAs is only 2.1%, compared to 3.2% between InAs and In0.53GaAs. The smaller mismatch results in lower strain, making dot formation somewhat more complicated, resulting in quantum dashes, rather than well defined quantum dots in the lattice-mismatched case. We have fabricated 0.6 eV InGaAs planer TPV cells with and without the quantum dashes

Forbes, David↗
NASA NTRS2010

Reflective Coatings Protect People and Animals

Led by Marshall Space Flight Center, NASA engineers called upon National Metalizing of Cranbury, New Jersey, to help create a reflective sunshield to deploy on Skylab in place of a shield that was lost during launch in 1973. Years later, a former employee for National Metalizing founded Advanced Flexible Materials (AFM) Inc., of Petaluma, California, and utilized the radiant barrier technology in the public domain to produce a variety of products such as wraps to keep marathon finishers safe from hypothermia as well as a lining for mittens and vests. Recently, the material helped to keep manatees warm as they were lifted from the water as part of a tag-and-release program.

Source record↗
NASA NTRS2010

Method for nanoscale spatial registration of scanning probes with substrates and surfaces

Embodiments in accordance with the present invention relate to methods and apparatuses for aligning a scanning probe used to pattern a substrate, by comparing the position of the probe to a reference location or spot on the substrate. A first light beam is focused on a surface of the substrate as a spatial reference point. A second light beam then illuminates the scanning probe being used for patterning. An optical microscope images both the focused light beam, and a diffraction pattern, shadow, or light backscattered by the illuminated scanning probe tip of a scanning probe microscope (SPM), which is typically the tip of the scanning probe on an atomic force microscope (AFM). Alignment of the scanning probe tip relative to the mark is then determined by visual observation of the microscope image. This alignment process may be repeated to allow for modification or changing of the scanning probe microscope tip.

Wade, Lawrence A.↗
NASA NTRS2012

Quality Control Method for a Micro-Nano-Channel Microfabricated Device

A variety of silicon-fabricated devices is used in medical applications such as drug and cell delivery, and DNA and protein separation and analysis. When a fluidic device inlet is connected to a compressed gas reservoir, and the outlet is at a lower pressure, a gas flow occurs through the membrane toward the outside. The method relies on the measurement of the gas pressure over the elapsed time inside the upstream and downstream environments. By knowing the volume of the upstream reservoir, the gas flow rate through the membrane over the pressure drop can be calculated. This quality control method consists of measuring the gas flow through a device and comparing the results with a standard curve, which can be obtained by testing standard devices. Standard devices can be selected through a variety of techniques, both destructive and nondestructive, such as SEM, AFM, and standard particle filtration.

Grattoni, Alessandro↗
NASA NTRS2009

Observations of Screw Dislocation Driven Growth and Faceting During CVD Homoepitaxy on 4H-SiC On-Axis Mesa Arrays

Previous studies of (0001) homoepitaxial growth carried out on arrays of small-area mesas etched into on-axis silicon-face 4H-SiC wafers have demonstrated that spiral growth emanating from at least one screw dislocation threading the mesa is necessary in order for a mesa to grow taller in the <0001> (c-axis vertical) direction while maintaining 4H stacking sequence [1]. However, even amongst mesas containing the screw dislocation step source necessary for vertical c-axis growth, we have observed striking differences in the height and faceting that evolve during prolonged homoepitaxial growths. This paper summarizes Atomic Force Microscopy (AFM), Electron Channeling Contrast Imaging (ECCI), Scanning Electron Microscopy (SEM), and optical microscopy observations of this phenomenon. These observations support our initially proposed model [2] that the observed large variation (for mesas where 3C-SiC nucleation has not occurred) is related to the lateral positioning of a screw dislocation step source within each etched mesa. When the screw dislocation step source is located close enough to the developing edge/sidewall facet of a mesa, the c-axis growth rate and facet angle are affected by the resulting interaction. In particular, the intersection (or near intersection) of the inward-sloping mesa sidewall facet with the screw dislocation appears to impede the rate at which the spiral provides new steps required for c-axis growth. Also, the inward slope of the sidewall facet during growth (relative to other sidewalls of the same mesa not near the screw dislocation) seems to be impeded by the screw dislocation. In contrast, mesas whose screw dislocations are centrally located grow vertically, but inward sloping sidewall facets shrink the area of the top (0001) growth surface almost to the point of vanishing.

Neudeck, Philip G.↗
NASA NTRS2018

Photochemical Haze Formation in the Atmospheres of Super-Earths and Mini-Neptunes

UV (ultraviolet) radiation can induce photochemical processes in the atmospheres of exoplanet and produce haze particles. Recent transmission spectra of super-Earths and mini-Neptunes have demonstrated the possibility that exoplanets have haze/cloud layers at high altitudes in their atmospheres. Haze particles play an important role in planetary atmospheres because they affect the chemistry, dynamics, and radiation flux in planetary atmospheres, and may provide a source of organic material to the surface which may impact the origin or evolution of life. However, very little information is known about photochemical processes in cool, high-metallicity exoplanetary atmospheres. We present here photochemical haze formation in laboratory simulation experiments with UV radiation; we explored temperatures ranging from 300 to 600 degrees Kelvin and a range of atmospheric metallicities (100 times, 1000 times, and 10000 times solar metallicity). We find that photochemical hazes are generated in all simulated atmospheres, but the haze production rates appear to be temperature dependent: the particles produced in each metallicity group decrease as the temperature increases. The images taken with an atomic force microscope (AFM) show that the particle size (15 nanometers to 190 nanometers) varies with temperature and metallicity. Our results provide useful laboratory data on the photochemical haze formation and particle properties, which can serve as critical inputs for exoplanet atmosphere modeling, and guide future observations of exoplanets with the Transiting Exoplanet Survey Satellite (TESS), the James Webb Space Telescope (JWST), and the Wide-Field Infrared Survey Telescope (WFIRST).

He, Chao↗
NASA NTRS2019

Plasma Surface Functionalization of AFP Manufactured Composites for Improved Adhesive Bond Performance

Application of carbon fiber reinforced polymer (CFRP) as a high-performance structural material has widespread application in the present aerospace industry. However, as-processed composite materials require a comprehensive surface treatment prior to bonding to remove contaminants and impart surface functionality and topography to overcome their poor adhesion properties. Atmospheric pressure plasma jet treatment (APPJT) has been increasingly garnering attention as an alternate method for surface preparation of CFRP. This method has been reported to achieve success in imparting favorable polar functional groups into the composite surfaces enhancing wettability and surface energy of the bonded surfaces. In some cases, APPJT has been demonstrated to remove contaminants or, in the case of silicones, convert them to silica. In this study, an atmospheric pressure plasma jet (APPJ) system was used for surface activation of a composite laid-up by an automated fiber placement (AFP) machine. Surface modifications prior to and after treatment were characterized using water contact angle (WCA) measurements, X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Double cantilever beam (DCB) tests were performed to quantify the bonding performance of the composites. The results show a marked enhancement of the mode I interlaminar fracture toughness with the application of APPJT.

Sarikaya, Ibrahim↗
NASA NTRS1994

Optical Scattering and Microstructure of Ion Beam Deposited Metal Coatings

Thin films of gold and platinum have been deposited onto super-polished fused silica substrates using thermal evaporation, ion assisted deposition (IAD), sputtering and ion assisted sputtering. The influence of ion beam flux, coating material and deposition rate on the films microroughness have been investigated. Coatings of gold and platinum have been bombarded with low energy (10-20 eV) Ar ions from an electron cyclotron resonance (ECR) ion source during deposition. Short range surface microroughness of coated surfaces has been examined using scanning tunneling microscopy (STM) and atomic force microscopy (AFM), while long range surface microroughness has been characterized using an angle resolved optical scatterometer. Results indicate that bombardment with low energy ions causes significant reduction in microroughness of metal coatings.

metal↗
NASA NTRSDate not supplied

Characterization of Novel Spacecraft Materials aboard the Materials International Space Station Experiment-Flight Facility (Preliminary Results)

This work will encompass the preflight characterization of 15 novel and heritage materials currently under observation on the Materials International Space Station Experiment-Flight Facility (MISSE-FF). MISSE-FF has been upgraded to perform active reflectance measurements of the materials. Images taken in RGB/IR colors are compared to results from an extensive ground testing campaign to obtain quantitative on-orbit material evolution data. Identical materials samples are to be flown on the ram, wake, and zenith faces of MISSE-FF, enabling deconvolution of the energetic electron, proton, atomic oxygen, and ultraviolet damage pathways. Energy deposition from the space environment leads to chemical changes in the material that in turn alter the optical properties. The same chemical damage that manifests as changes in optical reflectance and absorptance also leads to changes in myriad physical properties such as mechanical strength, electrical conductivity, and chemical reactivity. Therefore, flight materials are able to be characterized based on their unique reflectance spectra by comparing on-orbit measurements of optical reflectance with extensive terrestrial experiments, which help to correlate changes in reflectance with respect to changes in other material properties. The MISSE program has been a part of the International Space Station National Laboratory for many years and has been instrumental in understanding space weather modification of material properties. However, MISSE-FF has been limited to passive experiments with only pre/post flight material studies possible. In advance of the MISSE-16 experiment, the flight facility has received a major upgrade to provide daily spectral observations by way of a RGB/IR camera and a tunable light source. The MISSE-16 mission launched in February 2022 and carries 15 material samples for 6 months of the low Earth orbital exposure. Identical materials samples are to be flown on the ram, wake, and zenith faces of MISSE-FF, enabling deconvolution of the energetic electron, proton, atomic oxygen, and ultraviolet damage pathways. This paper discusses the MISSE-16 experiment, highlights the first use of the facility upgrades, and presents results from the extensive preflight material characterization that includes directional hemispherical reflectance, bidirectional reflectance, AFM, SEM, and electrical conductivity. Additionally, data showing the modification of these properties by ground-based exposure to space-like electron and atomic oxygen flux will be discussed. Finally, updates on deployment and initial check-out of the experiment on MISSE-FF will be presented. It is the ultimate goal of this program to provide validation for the development of ground based space weather simulation facilities and techniques.

Ryan Hoffman↗
NASA NTRSDate not supplied

Metrological and Spectral Characterization of the Aspera Flight Optics

Aspera is a NASA's Astrophysics Pioneers mission, led by the University of Arizona. The aim of this mission is to study the presence of hot gasses (T=10^5-10^6 K) in the circumgalactic medium (CGM) and how the flow of these gasses affects galactic formation. One key enabling technology in the Aspera optical system is the use of more efficient UV-reflective optical coatings particularly at around 103.2 nm where the O VI emission line is located . In order to meet radiometric effective area requirements, the Goddard Space Flight Center (GSFC) code 551 Optics Branch applied Al (aluminum) + eLiF (enhanced lithium fluoride) on these optics, where the Al+LiF is annealed at elevated temperature (~250˚C) after the deposition and thus providing an improved version of the Al+LiF used in FUSE . Furthermore, these optics are encapsulated with a thin film of atomic layer deposited MgF2 at the Jet Propulsion Laboratory for enhanced durability . The efficiency and durability of these coatings depends on the quality of the optical surface in terms of cleanliness and roughness. Roughness increases the scatter off the coating and reduces the specular reflectance, and surface contaminants can accommodate moisture and other contaminants, increase scattering, and are weak points in the coating that may affect adhesion and subsequently the longevity of these coatings. Extensive optical metrology is necessary to minimize and quantify the impact of surface roughness and contaminants on optical surfaces. In this proceeding we report the inspection procedure implemented for Aspera optics at GSFC, from initial receiving of the optics to post-coating. Inspection includes Atomic Force Microscopy (AFM), Scanning White Light Interferometry (SWILI), Dark Field Microscopy (DFM), Phase Shifting Interferometry (PSI), and Vacuum ultraviolet (VUV) spectroscopy. Combinations of these techniques are used to inspect flight optics at each of the following steps: i) as-received, pre-cleaning inspection, ii) pre-coating, post-cleaning inspection, and iii) post-coating inspection. The evolution of roughness and other surface inspections such as contaminants are compared between each step to quantify the effect each step has on the flight optics. The final far ultraviolet (FUV) spectral performance of witness samples coated with the flight optics are presented.

Far Ultraviolet (FUV)↗
NASA NTRS2026

Fatigue Behavior of Laser Powder Bed Fused HAYNES 214: Effects of Different Surface Treatments

In this study, under NASA’s Rapid and Analysis Manufacturing Propulsion Technology (RAMPT) project, effects of different surface post-treatments on surface texture and fatigue behavior of L-PBF Alloy 214 were investigated. Various subtractive SPTs including abrasive flow machining (AFM), machining (M), shot peening (SP), vapormatt (VM), dry electropolishing (DE), chemical milling (CM), chemical-mechanical polishing (CMP), electro chemical (ECP) were applied to study the variations of the surface texture, microstructure and uniaxial fatigue behavior under fully reversed strain-controlled condition at four different strain amplitudes of 0.005, 0.004, 0.003, and 0.0025 mm/mm. The insights gained regarding the relationship between structural and mechanical properties for different SPTs can help establish guidelines for selecting the most effective process to enhance the performance of Laser Powder Bed Fusion (L-PBF) Alloy 214, especially for critical aerospace applications.

Post-Processing↗
NASA NTRSDate not supplied

Exposure of Highly Reflective Far-Ultraviolet Coatings to LEO Environment for TRL Advancement for the Habitable Worlds Observatory

Over the past several years, our team at the NASA Goddard Space Flight Center (GSFC), in collaboration with the Jet Propulsion Laboratory (JPL) and the Naval Research Laboratory (NRL), have developed several new protected Al coating technologies with improved Far-Ultraviolet (FUV) reflectance performance and more robust environmental stability. These include Al protected with lithium-based fluoride (LiF) coatings such as hot deposited LiF (eLiF), XeF 2 -passivated LiF coatings (XeLiF), Li 3 AlF 6 overcoats, AlF 3 (plasma passivated), and XeF 2 passivated MgF 2 coatings (XeMgF 2 ). However, despite these developments, relatively little experimental information exists regarding the long-term stability of these coatings after simultaneous exposure to the Low Earth Orbit (LEO) environment. To evaluate their environmental durability and advance their Technology Readiness Level (TRL), representative samples of these coating technologies, Al+XeLiF, Al+eLiF, Al+Li 3 AlF 6 , Al+AlF 3 , Al+XeMgF 2 , and bare Al as reference samples, were flown onboard the International Space Station (ISS) as part of the Materials International Space Station Experiment 20 (MISSE-20). The MISSE platform is operated by Aegis Aerospace for relatively long-duration (e.g. 6 months) external exposure experiments in a space environment. The coatings were deposited on ULE and Zerodur substrates, and witness samples deposited on the same coatings runs, but on glass slides were left on Earth as control. A subset of the flight samples were fitted with MgF 2 windows to reduce direct exposure to atomic oxygen (AO) and charged particles, and still let through UV and other types of radiation on these samples. After approximately 6 months of exposure in the forward-facing (RAM) direction, the samples were returned to Earth and characterized by performing FUV/NUV/VIS/NIR reflectance measurements to quantify degradation, spectroscopic ellipsometry to evaluate coating thickness and optical constants, atomic force microscopy (AFM) to quantify surface roughness evolution during the flight in the ISS. The MgF 2 protective windows were also analyzed through FUV transmission measurements. Comparison with the witness samples left on the ground and with the flown bare Al samples (with just the naturally occurring Al 2 O 3 layer) provided a quantitative assessment of coating thickness variations, optical performance degradation, and morphological changes induced by prolonged exposure to the LEO environment.

Far Ultraviolet (FUV)↗