Dielectric materials in semiconductor devices.
Dielectric thin film electrical and mechanical properties and preparation for semiconductor devices, emphasizing Si compounds
Chu, T. L.↗
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Dielectric properties of reactively sputtered films of aluminum nitride.
Resistivity, capacitance and dielectric loss measurements for diode reactive sputtering grown AlN films and film sandwich structures of Ta, Au and Al films
Francombe, M. H.↗
The effects of dielectric overcoating on electromigration in aluminum interconnections.
Dielectric overcoating effects on electromigration Al interconnections, showing dependence on thickness and surface passivation
Schwartz, S.↗
Reflection coefficient of a TEM mode symmetric parallel-plate waveguide illuminating a dielectric layer.
Reflection coefficient of symmetric parallel plate waveguide operating in TEM mode illuminating lossless dielectric layer, using wedge diffraction and geometrical optics methods
Burnside, W. D.↗
Dielectric processing for low-cost ablation heat shields.
Ablation heat shields, emphasizing dielectric low cost fabrication and application to entry vehicles
King, C. B.↗
Measurements of the dielectric constant of saturated liquid oxygen.
Saturated liquid oxygen dielectric constant measurements to calculate polarizability
Younglove, B. A.↗
Admittance of a waveguide-fed aperture loaded with a dielectric plug.
Waveguide fed rectangular aperture antenna with dielectric plug load, describing admittance resonant perturbation due to excited TE mode
Swift, C. T.↗
Dopant for sodium niobate capacitor dielectric
Sodium niobate dielectric doped with barium titanate has potential application in integrated circuits with high packing densities and voltage levels below 5 to 8 volts.
Kandler, H. A.↗
Dielectric constant and loss tangent of Eccofoam PT, at 2.3 GHz, for various packing densities
Dielectric constant and loss tangent of epoxy foam for various packing densities in antenna system
Lane, F. L.↗
Measurements of dielectric constants and loss tangents at E-band using a Fabry-Perot interferometer
Fabry-Perot interferometer measurements of dielectric constants and loss for synthetic resins
Balanis, C. A.↗
Research on digital transducer principles. Volume 7 - Dielectric properties of thin polymer films, 1 July 1967 - 30 June 1968
Dielectric properties of thin films of polymerized oil-metal-silicon structures
Chuang, Y. S.↗
Dielectric studies of the cation substituted mixed crystals of niobates Annual report, 1 Jun. 1968 - 1 Jun. 1969
Preparation and dielectric properties of gadolinium substituted barium sodium niobate mixed crystals
Wang, F. F. Y.↗
Investigation of refractory dielectric for integrated circuits Second quarterly report, Dec. 1968
Process development for chemical deposition of aluminum oxide films as refractory dielectrics for integrated circuits
Doo, V. Y.↗
Investigation of refractory dielectric for integrated circuits Fourth quarterly report, May 1969
Refractory dielectric for integrated circuits
Doo, V. Y.↗
Investigation of refractory dielectric for integrated circuits Final report, Jul. 1969
Refractory material dielectrics for integrated circuits
Doo, V. Y.↗
Investigation of refractory dielectric for integrated circuits Third quarterly report, Feb. 1969
Research and development on refractory dielectrics for integrated circuits
Doo, V. Y.↗
Electron bremsstrahlung shielding at synchronous altitude by electron trapping in dielectrics
Electron bremsstrahlung shielding at synchronous altitude by electron trapping in dielectrics using Monte Carlo method
Hollis, D. L.↗
Testing of dielectric materials and application techniques in electronic packaging Final report
Physical, electrical, and mechanical property tests at temperatures between -125 and 125 deg C of dielectric materials for electronic packaging
Source record↗