Measuring Q And f(sub r) Of A Microwave Cavity: Part II
Frequency maintained at f(sub r), and Q determined from decay-rate measurement. Like "Measuring Q and f(sub r) of a Microwave Cavity: Part I" (NPO-19101), method used with microwave cavity in which sample of lossy dielectric material heated to specified high temperature by microwave power at resonant frequency. Methods contribute to accurate measurement of Q and f(sub r) for enhanced monitoring and control in contactless high-temperature processing of materials. Present method more effective in maintaining constant temperature. Also implemented more simply and at lower cost.