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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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The presentation will cover a variety of mitigation strategies that were developed for critical applications. An emphasis is placed on strengths and weaknesses per mitigation technique as it pertains to different Field programmable gate array (FPGA) device types.
This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independent Single Event Upset (SEU) Field Programmable Gate Array (FPGA) testing including FPGA test guidelines, Microsemi RTG4 heavy-ion results, Xilinx Kintex-UltraScale heavy-ion results, Xilinx UltraScale+ single event effect (SEE) test plans, development of a new methodology for characterizing SEU system response, and NEPP involvement with FPGA security and trust.
Concepts of using modular computer system processing units using today's technology are described. Topics covered are: reasons for modularizing, reasons for stacking modules, module packaging & inter- module packaging, interconnection between modules, space-bus require- ments, gateway features, general architecture, single string and dual string architecture (and examples), and triple module redundancy.