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At least 73 records · Page 4

Quantum state preparation with resolution refinement

We introduce a method called resolution refinement that allows one to bootstrap eigenstate preparation on a quantum computer. We first prepare an eigenstate of a low-resolution Hamiltonian using any method of choice. The eigenstate is then lifted to higher resolution and adiabatically evolved to produce the corresponding eigenstate of a higher-fidelity Hamiltonian. We give examples of resolution refinement applied to both single-particle basis states as well as a spatial lattice grid. For basis refinement, we compute few-body ground states of the Busch model for interacting particles in a harmonic trap in one dimension. For lattice refinement, we compute Hartree-Fock nuclear states for a central Woods-Saxon potential in three dimensions, and we compute bound states and continuum states in a multi-species Hubbard model of fermions in one dimension. In all cases, the method is efficient and requires an adiabatic evolution time that scales with the inverse of the energy gap times the square root of the system size. We show that this very favorable scaling arises from the fact that resolution refinement does not make large changes to the structure or energies of the low-energy eigenstates.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

Atomic resolution scanning transmission electron microscopy at liquid helium temperatures for quantum materials

Fundamental quantum phenomena in condensed matter, ranging from correlated electron systems to quantum information processors, manifest their emergent characteristics and behaviors predominantly at low temperatures. This necessitates the use of liquid helium (LHe) cooling for experimental observation. Atomic resolution scanning transmission electron microscopy combined with LHe cooling (cryo-STEM) provides a powerful characterization technique to probe local atomic structural modulations and their coupling with charge, spin and orbital degrees-of-freedom in quantum materials. However, achieving atomic resolution in cryo-STEM is exceptionally challenging, primarily due to sample drifts arising from temperature changes and noises associated with LHe bubbling, turbulent gas flow, etc. In this work, we demonstrate atomic resolution cryo-STEM imaging at LHe temperatures using a commercial side-entry LHe cooling holder. Firstly, we examine STEM imaging performance as a function of He gas flow rate, identifying two primary noise sources: He-gas pulsing and He-gas bubbling. Secondly, we propose two strategies to achieve low noise conditions for atomic resolution STEM imaging: either by temporarily suppressing He gas flow rate using the needle valve or by acquiring images during the natural warming process. Lastly, we show the applications of image acquisition methods and image processing techniques in investigating structural phase transitions in Cr 2 Ge 2 Te 6 , CuIr 2 S 4 , and CrCl 3 . In conclusion, our findings represent an advance in the field of atomic resolution electron microscopy imaging for quantum materials and devices at LHe temperatures, which can be applied to other commercial side-entry LHe cooling TEM holders.

36 MATERIALS SCIENCE↗

Algebraic discrete quantum harmonic oscillator with dynamic resolution scaling

We develop an algebraic formulation for the discrete quantum harmonic oscillator (DQHO) from the Hamiltonian for two, coupled QHOs and provide a physical picture for the Kravchuk function eigenstates of the oscillator. The familiar $\mathfrak{su}(2)$ structure of the coupled QHO Hamiltonian divides its spectrum into sets corresponding to the DQHO at different resolutions. In addition to energy ladder operators, the formulation allows for the introduction of resolution ladder operators connecting all DQHOs with different resolutions, thus enabling the dynamic scaling of the resolution of finite degree-of-freedom quantum simulations. The coherent state of the DQHO is constructed, and its expected position is proven to oscillate as a classical harmonic oscillator. The DQHO coherent state recovers that of the quantum harmonic oscillator at large resolution.

97 MATHEMATICS AND COMPUTING↗

Could Microplasma Ionization and Ultrahigh Mass Resolution Alleviate Chemical Separations for Elemental and Isotopic Analysis?

At the extremes, all analytical spectrometric measurements are limited by the resolution of the spectrometer system. Spectral overlaps, isobars in the case of mass spectrometry, can lead to the implementation of complex and time-consuming chemical separations to alleviate those interferences. In the area of elemental/isotopic mass spectrometry, use of sector-field instruments can provide a mass resolution of ~10,000, but still necessitate chemical separations. Described here is the coupling of the liquid sampling-atmospheric pressure glow discharge (LS-APGD) microplasma to ultra-high resolution Orbitrap mass analyzer systems to yield mass resolution values ranging from 70k to 1M. Resolution of this order, with commensurate improvements in precision and accuracy, holds the promise to affect elemental/isotopic determinations without the need for chemical separations.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

High-Resolution ESM Projections for Energy Applications Over the CONUS

Assessing energy resources under future scenarios requires high-resolution meteorological information that is physically consistent and suitable for regional-scale analysis. While Earth system model (ESM) projections provide valuable large-scale information, their coarse resolution and systematic biases limit direct applicability for energy system modeling and planning. In this study, we develop a high-resolution dynamical downscaling framework based on the Weather Research and Forecasting (WRF) model to translate global-scale ESM data into energy-relevant regional projections over the contiguous United States (CONUS). The framework identifies an optimized WRF configuration through numerical experiments and evaluates raw and bias-corrected ESM initial and boundary conditions, with soil moisture (SM) and soil temperature (ST) bias correction implemented as an integral part of the bias-corrected ESM forcing to improve land-atmosphere coupling prior to WRF dynamical downscaling. Using an optimized WRF configuration at 4-km resolution, we show that raw ESM forcing introduces systematic dry and cold soil biases that propagate into pronounced warm biases in near-surface air temperature and positive biases in solar irradiance, particularly during summer. Applying bias-corrected atmospheric forcing together with bias-corrected SM and ST substantially reduces these downstream biases and improves the surface energy balance and near-surface atmospheric fields. These results demonstrate that bias-aware treatment of initial conditions is critical for producing high-resolution downscaled projections suitable for energy system modeling and planning applications.

24 POWER TRANSMISSION AND DISTRIBUTION↗

Measurement of energy resolution with the NEXT-White silicon photomultipliers

The NEXT-White detector, a high-pressure gaseous xenon time projection chamber, demonstrated the excellence of this technology for future neutrinoless double beta decay searches using photomultiplier tubes (PMTs) to measure energy and silicon photomultipliers (SiPMs) to extract topology information. This analysis uses $^{83m}$Kr data from the NEXT-White detector to measure and understand the energy resolution that can be obtained with the SiPMs, rather than with PMTs. The energy resolution obtained of (10.9 ± 0.6)%, full-width half-maximum, is slightly larger than predicted based on the photon statistics resulting from very low light detection coverage of the SiPM plane in the NEXT-White detector. The difference in the predicted and measured resolution is attributed to poor corrections, which are expected to be improved with larger statistics. Furthermore, the noise of the SiPMs is shown to not be a dominant factor in the energy resolution and may be negligible when noise subtraction is applied appropriately, for high-energy events or larger SiPM coverage detectors. These results, which are extrapolated to estimate the response of large coverage SiPM planes, are promising for the development of future, SiPM-only, readout planes that can offer imaging and achieve similar energy resolution to that previously demonstrated with PMTs.[graphic not available: see fulltext]

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Influence of background sources and topographic resolution in the Weather Research and Forecasting Model on xenon plume characteristics at monitoring stations

For many atmospheric monitoring applications, networks of measurement sites—such as the radionuclide stations of the International Monitoring System—can be sparse. With measurement locations potentially hundreds to thousands of kilometers from a release it is important to quantify the effects of physical processes on transport and dispersion of plumes between source and measurement locations. This study addresses the effects of background sources and topography resolution near the release location of radionuclides. We use the Weather Research and Forecasting (WRF) model with inline chemistry to investigate (1) how an additional, time-varying source of 133 Xe, such as an operational medical isotope production facility, contributes to activity concentration measurements at monitoring sites, and (2) how complex topography influences on atmospheric conditions near emission sources impact plume concentrations at varying distances from the source. Two 133 Xe emission sources, including (1) a high flux rate of short duration representing an explosive event, and (2) a variable and continuous background source, are simulated. The continuous background source contributes significantly to total 133 Xe concentrations at several monitoring stations. Further, a WRF simulation at 9 km horizontal resolution is compared with a nested grid simulation, where the innermost domain has a resolution of 1 km. Increased topographic resolution leads to an improved representation of plume responses to local winds, with topographic influences greatest at locations closest to the sources. Differences between the two domain resolutions decrease at greater distances from the sources, as plumes have time to spread and mix and are influenced by synoptic scale circulation patterns that are represented similarly in both simulations.

54 ENVIRONMENTAL SCIENCES↗

Impact of light output on the timing resolution of organic glass scintillator bars in a dual-ended readout configuration

The effectiveness of detector system modeling and validation depends on the quality of characterization performed on the system. For nuclear nonproliferation applications, which require detectors to address complex and variable field conditions, access to accurate system models is essential. This study presents the timing characterization of organic glass scintillator bars used in an imaging system developed at the University of Michigan. 137 Cs and 60 Co gamma-ray sources were used to determine the coincidence time resolution as a function of measured light output for two Compton scatter events between two organic glass scintillator bars. Timing resolution for two events, each with light output ranging from 100 to 1100 keVee were characterized. The resulting data were fit to a parametric function that was validated to agree with experimental results within ±25 ps. Simulations were performed to establish appropriate calibration points for each organic scintillator, thereby ensuring accurate calibration of light output values during analysis. This work successfully characterized the light output dependence of the coincidence timing resolution of a pair of organic glass detectors for use in an imaging system. Depending on the amount of scintillation light output from the events, the full width at half maximum of the measured coincidence time resolution ranged from 653.2 ± 16.1 ps for low light yields, 100 keVee, to 121.0 ± 8.4 ps for higher yields at 1100 keVee. The insights obtained from the timing resolution behavior will allow for accurate simulation capabilities in future security and verification efforts using scatter-based imaging systems.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Combined effects of horizontal and vertical resolution on reliable turbulence prediction at tidal energy sites: A systematic study in the Salish Sea, WA

Predicting turbulence characteristics with coastal ocean models is essential for tidal energy converter deployment. While large eddy simulation provides a detailed turbulence representation, computational limitations restrict its use to smaller domains. We systematically evaluate whether well-configured coastal models can provide reliable turbulence prediction through progressive refinement of 3D model representation. We implemented four model configurations (Levels 1–4) using terrain-following coordinates, isolating the impacts of horizontal resolution, vertical resolution, and layer distribution. We validated all configurations against field measurements from the Salish Sea, WA. Results show that tidal current velocity predictions remain unchanged regarding model configuration, but turbulence properties are sensitive to resolution refinement. Increasing vertical resolution alone proved insufficient; even with vertical sigma-levels rising from 11 to 41, significant underprediction persisted until finer horizontal resolution better captured bathymetric variations. The Level 4 configuration, incorporating geometric sigma-levels distribution, achieved turbulence prediction skill scores exceeding 0.90. Turbulence closure comparison revealed Mellor- Yamada 2.5 outperformed k-epsilon in TKE prediction (skill scores 0.84–0.94 versus 0.72–0.81) due to better boundary layer parameterization. This study shows that well-configured coastal models effectively bridge the gap between simplified tools and costly high-fidelity modeling, offering the tidal energy industry practical and cost-effective turbulence data at commercially relevant scales.

Marine Energy↗

Experimental study of energy-dependent angular broadening of MeV electron beams for high-resolution imaging in thick samples

In scanning transmission electron microscopy (STEM), spatial resolution is primarily influenced by the projected size of the electron probe within the specimen. In thin samples, a large semi-convergence angle enables a tightly focused beam and sub-nanometer resolution. However, in thick specimens, resolution is fundamentally limited by transverse beam broadening from multiple large-angle scattering events—for example, a probe with 10 mrad angular divergence can broaden by ∼100 nm over a 10 μm path. Since this broadening scales inversely with beam energy, MeV-STEM offers a promising route for high-resolution imaging in thick materials. To quantitatively assess this effect, we performed high-precision measurements at UCLA’s PEGASUS beamline, characterizing beam divergence and intensity profiles for 3–8 MeV electrons transmitted through a wedged-silicon sample of varying thickness. Our results reconcile discrepancies among analytical models and validate Monte Carlo simulations. Here, we find that increasing beam energy from 3.0 to 5.8 MeV reduces angular broadening by a factor of 2.6, with diminishing returns observed at 7.6 MeV. These findings provide a quantitative framework for optimizing MeV-STEM parameters in high-resolution imaging of thick biological and microelectronic specimens, and for guiding beam energy selection in other advanced imaging modes beyond STEM.

36 MATERIALS SCIENCE↗

Approaching Angstrom-Scale Resolution in Lithography Using Low-Molecular-Mass Resists (<500 Da)

Resists that enable high-throughput and high-resolution patterning are essential in driving the semiconductor technology forward. The ultimate patterning performance of a resist in lithography is limited because of the trade-off between resolution, line-width roughness, and sensitivity; improving one or two of these parameters typically leads to a loss in the third. As the patterned feature sizes approach angstrom scale, the trade-off between these three metrics becomes increasingly hard to resolve and calls for a fundamental rethinking of the resist chemistry. Low-molecular-mass monodispersed metal-containing resists of high atom economy can provide not only very high resolution but also very low line-width roughness without sacrificing sensitivity. Here we describe a modular metal-containing resist platform (molecular mass <500 Da) where a molecular resist consists of just two components: a metal and a radical initiator bonded to it. This simple system not only is amenable to high-resolution electron beam lithography (EBL) and extreme ultraviolet lithography (EUVL) but also unites them mechanistically, giving a consolidated perspective of molecular and chemical processes happening during exposure. Irradiation of the resist leads to the production of secondary electrons that generate radicals in the initiator bonded to metal. This brings about an intramolecular rearrangement and causes solubility switch in the exposed resist. We demonstrate record 1.9–2.0 nm isolated patterns and 7 nm half-pitch dense line-space features over a large area using EBL. With EUVL, 12 nm half-pitch line-space features are shown at a dose of 68 mJ/cm 2 . In both of these patterning techniques, the line-width roughness was found to be ≤2 nm, a record low value for any resist platform, also leading to a low-performance trade-off metric, Z factor, of 0.6 × 10 –8 mJ·nm 3 . With the ultimate resolution limited by instrumental factors, potential patterning at the level of a unit cell can be envisaged, making low-molecular-mass resists best poised for angstrom-scale lithography.

77 NANOSCIENCE AND NANOTECHNOLOGY↗

High-resolution mountain topography can inform global snow vulnerability estimates

Snow is changing globally. Computationally intensive snow reanalysis products and downscaled climate model projections allow for the estimation of historical and projected changes in snow over ∼4–10 km resolutions, but these resolutions are coarse relative to the scales needed for water supply and flood planning. Fine-scale digital elevation models (DEMs) are widely available but are underutilized to make first-order assessments of snow vulnerability. Here, we leverage DEMs at a 7.5 arc s (∼250 m) resolution, combining these with historical freezing level height estimates from ERA-5 to derive estimates of changes in the snow-receiving area (SRA) and its variability across global mountain ranges. Results show estimated SRA declines in 29% (1.9 million km2) of the global mountain area from 1982–2020; 66% of the mountainous areas had no change over the historical period. At +1.5 °C of warming relative to the pre-industrial control, global mountain SRA would decline by 9.5% (1.0 million km2) relative to recent conditions. This loss would be approximately doubled with +2 °C of warming. In a +4 °C warming scenario, an additional 34% (3.6 million km2) of SRA would be lost beyond the +2 °C case. Across individual mountain ranges, SRA losses can occur nonlinearly with warming, with some locations that have historically had relatively minor SRA losses at risk of substantially larger losses in warmer climates. Analysis using coarser-resolution DEMs can underestimate or overestimate SRA and its rate of loss, with the largest impacts in relatively warm, low-elevation mountain ranges. Results of this work provide estimates of projected loss in SRA at policy-relevant warming levels; inform the resolutions needed for process-based snow modeling; identify snow vulnerability hotspots; and provide a new integrated approach to snow vulnerability assessment that is achievable at global scales and highlights potential nonlinearities from recent trends to a variety of future warming scenarios.

climate, mountains↗

Deep Learning Super-Resolution X-Ray Computed Tomography Algorithms for Additive Manufacturing

Industrial X-ray computed tomography (XCT) is a nondestructive method for inspection and characterization of additively manufactured (AM) materials and parts. In practice, the resolution of XCT can be limited by factors such as detector binning, restricted field of view for large-scale objects, system blur, motion during scanning, and acquisition settings. These limitations can reduce the detectability of critical flaws such as pores, cracks, and lack of fusion. Super-resolution (SR) techniques offer a promising solution for improving the effective resolution and image quality of XCT reconstructions without the need for expensive hardware upgrades or laborious, time-consuming scans. In particular, deep learning-based SR methods have garnered attention in recent years as powerful tools for reconstructing high-resolution volumes from low-resolution inputs. In this work, a novel deep learning-based SR method is proposed for XCT scans of AM parts, and compared against several existing state-of-the-art (SOTA) methods. The proposed method, Simurgh-SR, is built on the pre-existing Simurgh framework and consists of a 2.5D U-Net trained to map low-quality inputs containing noise and artifacts to high-quality reconstructions characterized by higher flaw contrast, better noise texture, and reduced artifacts. The experimental results demonstrate superior performance of Simurgh-SR in performing 4× SR on real industrial XCT scans of thick 316L components, enhancing the structural similarity score and peak signal-to-noise ratio (>7dB) compared to the LR counterpart while improving the F1-score for flaw detection by more than 2.3× when compared to alternative SOTA SR methods. This improvement enables more accurate and significantly faster characterization of metal AM components. Additionally, Simurgh-SR was trained for both 2X and 4X SR and performs effectively at both levels, enabling the use of a single model for various SR factors.

Rahman, Obaid [ORNL] (ORCID:0000000277810840)↗

2D Polyhedral Template Matching for Atomic Resolution Microscopy

SAND2024-13879O The 2D Polyhedral Template Matching for Atomic Resolution Microscopy is a suite of functions for analyzing atomic resolution electron microscopy images using the 2D polyhedral template matching (2D-PTM) method. This software analyzes atomic resolution microscopy data from electron microscopic imaging or scanning probe microscopies. The primary application is for identifying different crystal phases, crystal orientations, and defect structures obtained in such atomic resolution images. Written in MATLAB and starting from an atomic resolution image, the code identifies the positions of atomic intensity peaks. It then matches predefined structural templates to the local atomic environments. Outputs include the local structural identification, the template scaling factor and rotation angle, root-mean-squared deviation (RMSD), and centrosymmetry parameter.

Medlin, Douglas↗

Laser-driven high-resolution MeV x-ray tomography

The need for high-resolution MeV x-ray tomography to observe the three-dimensional structure of dense, large-sized objects is rapidly increasing for the non-destructive evaluation of critical additively manufactured parts, national security, and other applications. We report a demonstration of high-resolution MeV computed tomography of a dense, large object with a laser-driven x-ray source. A record detector-limited MeV radiograph resolution of < 200 µm as determined with the Bennett approximation of the point spread function was achieved by irradiating millimeter-thick tungsten targets with 300 TW femtosecond laser pulses at a 0.5 Hz repetition rate. A tungsten alloy step wedge spectrometer indicates that the peak of the x-ray emission is between 1 and 2 MeV, with an endpoint energy of 19 MeV. To illustrate the radiographic imaging capability of the system, a tomographic reconstruction of a nickel superalloy turbine blade ( maximum $ρr$ = 139 g/cm 2 ) with sub-millimeter resolution was performed using 2160 individual radiographs. The small x-ray source size opens the prospect of extremely high-resolution tomographs of large, dense objects. This laser-driven approach has major advantages for non-destructive evaluation.

47 OTHER INSTRUMENTATION↗

Aberration corrected RF flipper for high resolution neutron spectroscopy

Project Summary Company: Adelphi Technology, Inc. Title: Aberration-corrected High Frequency RF Flipper for High-Resolution Neutron Spectroscopy PI: Dr. Jay Theodore Cremer Topic: C55-11 Enhancement of Scattering Instrumentation Technology Used at Pulsed and Continuous Sources Subtopic: d. Other Statement of the problem or situation that is being addressed. The quest to understand heterogeneous and hierarchical materials is gathering momentum, as described in a 2015 report by the Basic Energy Sciences Advisory Committee on Challenges at the Frontiers of Matter and Energy. For the past 40 years a technique called neutron spin echo (NSE) has been used to probe molecular motions in such non-crystalline materials over time scales from 10’s of picoseconds to 100’s of nanoseconds. The method has provided unique information about the dynamics of soft heterogeneous materials, including confirmation of the de Gennes model of polymer reptation and quantitative measurement of bending constants of biologically relevant lipid membranes. However, scientists continue to clamor for even higher resolution than NSE can provide. Biomaterials, polymers, glasses, and artificially nanostructured materials all manifest slow molecular motions because of weak or competing interactions between subunits and are amenable to study with neutrons, provided sufficiently long dynamical correlation times can be achieved. All these materials have important applications to advanced technologies so understanding them is key to technological progress. General statement of how this problem is being addressed. We will address the need for high-resolution neutron spectroscopy by using a technique called Neutron Resonance Spin Echo (NRSE). While similar to NSE in many respects, this method has the potential to exceed the NSE capabilities, if 2 technical hurdles can be overcome. The major impediments to successful high-resolution NRSE are the availability of two technologies: a very high frequency, efficient, radiofrequency (rf) flipper for neutrons and a method to correct certain magnetic aberrations. Based on previous STTR support and follow-on research we have developed a suitable rf flipper and we have invented a method to correct the magnetic aberrations. Both technologies need refinement to make them suitable for implementation at a neutron source such as the Oak Ridge National Laboratory nuclear reactor. In this proposal we seek to perfect the two technologies and to combine them into a single, operationally convenient device. Commercial Applications and Other Benefits In view of the increasing demand for the unique scientific information that high resolution neutron spectroscopy can provide, we expect several major instrumentation upgrades at both U.S. and foreign neutron centers will require make use of the NRSE method over the coming decade, creating a market for the devices we will design. These components will enhance scientists’ abilities to probe the time dependence of density fluctuations in a wide range of hierarchical and heterogeneous materials many of which are vital to existing and future technologies. Key Words – Polarized Neutrons, Neutron Spin Echo, Neutron Scattering, advanced materials. Summary for Members of Congress Neutron beams are a powerful materials-science probe that provide unique information about the structure of matter. The proposed devices will accelerate scientific discoveries required to achieve national goals for new technological materials.

36 MATERIALS SCIENCE↗

Resolution dependence of the turbulent atmospheric boundary layer in global storm-resolving climate simulations

The current generation of state-of-the-art global climate models are being run at increasingly higher horizontal resolutions, with the goal of resolving organised deep convection explicitly. How a kilometre-scale resolution impacts the representation of the atmospheric boundary layer is, however, not well known. Using statistical analysis on global fields as well as high-frequency data at selected locations, produced with the Integrated Forecasting System (IFS) model for the Next Generation Earth-system Models (nextGEMS) project, we investigate the horizontal resolution dependence of some boundary-layer processes. We find that a change in resolution from 9 to 2.8 km causes no substantial changes to boundary-layer properties and processes at most of the locations studied, although some global changes are detected that indicate circulation changes. Small changes to the boundary-layer depth and structure are found in the Tropics. The short simulation length and lack of data for optimal boundary-layer analysis limits the conclusions, especially in relation to the connection between the boundary layer and the atmosphere general circulation.

54 ENVIRONMENTAL SCIENCES↗

High-resolution in-situ characterization of laser powder bed fusion via transmission X-ray microscopy at X-ray free electron lasers

In this work, we describe the instrumentation used to perform the first operando transmission X-ray microscopy (TXM) and simultaneous X-ray diffraction of laser melting simulating laser powder bed fusion on the XCS instrument at the Linac Coherent Light Source (LCLS) X-ray free-electron laser (XFEL). Our TXM with 40× magnification in the X-ray regime at 11 keV gave spatial resolutions down to 940 nm per line pair, with effective pixel sizes down to 206 nm, image integration times of <100 fs, and frame rates tunable between 2.1 and 119 ns for two probe frames (0.48 GHz to 8.4 MHz). Images were recorded on Zyla and Icarus (UXI) detectors to trade off between spatial resolution and time dynamics. A 1 kW CW IR laser was coupled into the interaction point to conduct pump–probe studies of laser melting and solidification dynamics. Our temporal and spatial resolution with attenuation-based contrast exceeds that currently possible with synchrotron-based high-speed radiography. This system was sensitive to feature velocities of 10–12000 m s −1 but we did not observe any motion in this range in the laser melting of Al6061 alloy. Shockwaves were not observed and hot cracking proceeded at velocities below the detection limits. Pore accumulation was observed between successive shots, indicating that bubble escape mechanisms were not active. With proper experimental design, the spatial resolution, contrast and field of view could be further improved or modified. The increased brightness and narrower bandwidth of the XFEL allowed for this imaging technique and it lays the groundwork for a wide range of operando techniques to study additive manufacturing.

47 OTHER INSTRUMENTATION↗