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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 73 records · Page 4

NASA-DoD Lower Process Temperature Lead-Free Solder Project Overview

This project is a follow-on effort to the Joint Council on Aging AircraftJoint Group on Pollution Prevention (JCAAJG-PP) Pb-free Solder Project and NASA-DoD Lead-Free Electronics Project which were the first projects to test the reliability of Pb-free solder joints against the requirements of the aerospace and military community. This effort would continue to build on the results from the JCAAJG-PP Lead-Free Solder Project and NASA-DoD Lead-Free Electronics Project while focusing on a particular failure mechanism currently plaguing Pb-free assemblies, pad cratering.The NASA-DoD Lead-Free Electronics Project confirmed that pad cratering is one of the dominant failure modes that occur in various board level reliability tests, especially under dynamic loading. Pad Cratering is a latent defect that may occur during assembly, rework, and post assembly handling and testing.

electronics↗

Acceleration Factors for Reliability Assessment of Polymer Tantalum Capacitors

Using polymer tantalum capacitors in Hi-Rel systems requires an assessment of the reliability characteristics of the parts. For this assessment, tantalum capacitors are typically subjected to reliability testing at temperatures and voltages exceeding their specified values, and the failure rate (FR) — or the probability of failure during use conditions — is calculated based on voltage and temperature acceleration factors. In this work, various types and lots of polymer tantalum capacitors have been tested at highly accelerated life test (HALT) conditions and the acceleration factors have been determined using different techniques. It has been shown that the behavior of capacitors under HALT conditions can be described based on the time-dependent dielectric breakdown (TDDB) model, which explains the presence of infant mortality (IM) and wear-out failures using the same failure mechanisms and allows for an assessment of the acceleration factors. The difference in acceleration factors obtained using exponential and power models is discussed. Analysis shows that with proper derating, screening, and qualification testing, the reliability of frameless Hi-Rel COTS polymer tantalum capacitors is adequate for space missions.

Alex Eidelman↗

Acceleration Factors for Reliability Assessment of Polymer Tantalum Capacitors

Using polymer tantalum capacitors in Hi-Rel systems requires an assessment of the reliability characteristics of the parts. For this assessment, tantalum capacitors are typically subjected to reliability testing at temperatures and voltages exceeding their specified values, and the failure rate (FR) — or the probability of failure during use conditions — is calculated based on voltage and temperature acceleration factors. In this work, various types and lots of polymer tantalum capacitors have been tested at highly accelerated life test (HALT) conditions and the acceleration factors have been determined using different techniques. It has been shown that the behavior of capacitors under HALT conditions can be described based on the time-dependent dielectric breakdown (TDDB) model, which explains the presence of infant mortality (IM) and wear-out failures using the same failure mechanisms and allows for an assessment of the acceleration factors. The difference in acceleration factors obtained using exponential and power models is discussed. Analysis shows that with proper derating, screening, and qualification testing, the reliability of frameless Hi-Rel COTS polymer tantalum capacitors is adequate for space missions.

Alex Eidelman↗

Development of LISA Laser System at NASA

NASA Goddard Space Flight Center (GSFC) is developing a master oscillator power amplifier (MOPA) laser transmitter for the Laser Interferometer Space Antenna (LISA) mission. The laser transmitter is one of the potential contributions to the LISA mission from NASA. Our development effort has included a master oscillator (MO), a power amplifier (PA), a frequency reference system (FRS), a power monitor detector (PMON), and laser electronics module (LEM). We are working on their design, performance evaluation, environmental testing, and reliability testing for space flight. We have built TRL 4 laser optical modules based on the MO and PA, which meets most performance requirements. One of the TRL 4 laser optical modules has been delivered to ESA for independent evaluation. TRL 6 versions of MO and PA are being built and evaluated at GSFC. TRL 5 and 6 versions of laser electronics are under development. In this paper, we will describe our progress to date and plans to demonstrate and deliver a TRL 6 laser demonstrator system to ESA by 2024.

LISA, Space Lasers↗

Testing the reliability of interpretable neural networks in geoscience using the Madden–Julian oscillation

Abstract. We test the reliability of two neural network interpretation techniques, backward optimization and layerwise relevance propagation, within geoscientific applications by applying them to a commonly studied geophysical phenomenon, the Madden–Julian oscillation. The Madden–Julian oscillation is a multi-scale pattern within the tropical atmosphere that has been extensively studied over the past decades, which makes it an ideal test case to ensure the interpretability methods can recover the current state of knowledge regarding its spatial structure. The neural networks can, indeed, reproduce the current state of knowledge and can also provide new insights into the seasonality of the Madden–Julian oscillation and its relationships with atmospheric state variables. The neural network identifies the phase of the Madden–Julian oscillation twice as accurately as a linear regression approach, which means that nonlinearities used by the neural network are important to the structure of the Madden–Julian oscillation. Interpretations of the neural network show that it accurately captures the spatial structures of the Madden–Julian oscillation, suggest that the nonlinearities of the Madden–Julian oscillation are manifested through the uniqueness of each event, and offer physically meaningful insights into its relationship with atmospheric state variables. We also use the interpretations to identify the seasonality of the Madden–Julian oscillation and find that the conventionally defined extended seasons should be shifted later by 1 month. More generally, this study suggests that neural networks can be reliably interpreted for geoscientific applications and may thereby serve as a dependable method for testing geoscientific hypotheses.

58 GEOSCIENCES↗

Test-retest reliability of cognitive EEG

OBJECTIVE: Task-related EEG is sensitive to changes in cognitive state produced by increased task difficulty and by transient impairment. If task-related EEG has high test-retest reliability, it could be used as part of a clinical test to assess changes in cognitive function. The aim of this study was to determine the reliability of the EEG recorded during the performance of a working memory (WM) task and a psychomotor vigilance task (PVT). METHODS: EEG was recorded while subjects rested quietly and while they performed the tasks. Within session (test-retest interval of approximately 1 h) and between session (test-retest interval of approximately 7 days) reliability was calculated for four EEG components: frontal midline theta at Fz, posterior theta at Pz, and slow and fast alpha at Pz. RESULTS: Task-related EEG was highly reliable within and between sessions (r0.9 for all components in WM task, and r0.8 for all components in the PVT). Resting EEG also showed high reliability, although the magnitude of the correlation was somewhat smaller than that of the task-related EEG (r0.7 for all 4 components). CONCLUSIONS: These results suggest that under appropriate conditions, task-related EEG has sufficient retest reliability for use in assessing clinical changes in cognitive status.

Non-NASA Center↗

Secure Time Synchronization in Power Grids and Network HIL Synchrophasor Testing

Reliable and secure time synchronization underpins the monitoring and control functions of modern power grids. As GPS-based timing infrastructures grow more susceptible to spoofing and jamming, their vulnerabilities pose escalating risks to grid stability. This work investigates a secure, resilient timing framework that can serve as an alternative or redundant source for power grids, with a particular focus on synchrophasorbased applications. A candidate timing system architecture is evaluated to guarantee trustworthy time dissemination, even in degraded conditions. A network hardware-in-the-loop testing of two synchrophasors validates the concepts, demonstrating enhanced timing integrity, improved detection of timing anomalies, and sustained observability during adverse timing events.

Wu, Ori [ORNL] (ORCID:0000000326723410)↗

Statistical Tests of Reliability of NDE

Capabilities of advanced material-testing techniques analyzed. Collection of four reports illustrates statistical method for characterizing flaw-detecting capabilities of sophisticated nondestructive evaluation (NDE). Method used to determine reliability of several state-of-the-art NDE techniques for detecting failure-causing flaws in advanced ceramic materials considered for use in automobiles, airplanes, and space vehicles.

Baaklini, George Y.↗

Testing of reliability - Analysis tools

An outline is presented of issues raised in verifying the accuracy of reliability analysis tools. State-of-the-art reliability analysis tools implement various decomposition, aggregation, and estimation techniques to compute the reliability of a diversity of complex fault-tolerant computer systems. However, no formal methodology has been formulated for validating the reliability estimates produced by these tools. The author presents three states of testing that can be performed on most reliability analysis tools to effectively increase confidence in a tool. These testing stages were applied to the SURE (semi-Markov Unreliability Range Evaluator) reliability analysis tool, and the results of the testing are discussed.

Hayhurst, Kelly J.↗

Effect of Surge Current Testing on Reliability of Solid Tantalum Capacitors

Tantalum capacitors manufactured per military specifications are established reliability components and have less than 0.001% of failures per 1000 hours for grades D or S, thus positioning these parts among electronic components with the highest reliability characteristics. Still, failures of tantalum capacitors do happen and when it occurs it might have catastrophic consequences for the system. To reduce this risk, further development of a screening and qualification system with special attention to the possible deficiencies in the existing procedures is necessary. The purpose of this work is evaluation of the effect of surge current stress testing on reliability of the parts at both steady-state and multiple surge current stress conditions. In order to reveal possible degradation and precipitate more failures, various part types were tested and stressed in the range of voltage and temperature conditions exceeding the specified limits. A model to estimate the probability of post-surge current testing-screening failures and measures to improve the effectiveness of the screening process has been suggested.

Teverovsky, Alexander↗

Lessons from NASA

Particular requirements related to the design and the operation of spacecraft have forced NASA to take a reliability approach that differs somewhat from that used in many other applications. NASA has found that some of the traditional tools of reliability engineering, such as life testing, reliability demonstration testing, maintainability analysis, and direct failure analysis, are impractical for spacecraft. In place of a statistical approach, the space agency uses an engineering approach to mission reliability. Reliability is to be obtained with the aid of three different approaches, including the application of effective design principles, the control and screening of all parts, and the testing of the entire spacecraft or its prototype for predicted capabilities. Attention is given to failure-mode analysis, the enhancement of Voyager reliability by autonomous operation, the redundancy in Shuttle design, the weeding out of bad hardware, and the preference for off-the-shelf devices.

Williams, W. C.↗

Developing VSC-HVDC Oscillation Damping Control Constraints in Unit Commitment

High-voltage direct current (HVDC) systems within the existing power grids will play a pivotal role in enabling high share of renewable power integration and transportation electrification. There is a need for transmission planning models to accurately capture the impact of VSC-HVDC oscillation damping control on the system planning and model the constraints in the security constrained unit commitment (SCUC) problem. In this paper, the SCUC problem in a hybrid DC-AC grid considering damping on electromechanical inter-area oscillation is studied. An electromechanical oscillation-driven transmission capability constraints are derived from system swing equation and incorporated into the SCUC. Multiple system damping control scenarios are set based on the extracted plausible bounds of damping coefficient and inertia constant to linearize the nonlinear expressions. The SCUC problem with proposed constraints is tested on the Reliability Test System Grid Modernization Lab Consortium (RTS-GMLC) via PLEXOS. The impact of the proposed constraints on regional generation, inertia, power flow, annual system cost, and renewable energy curtailment are fully assessed.

damping control↗

Accelerated life testing and reliability of high K multilayer ceramic capacitors

The reliability of one lot of high K multilayer ceramic capacitors was evaluated using accelerated life testing. The degradation in insulation resistance was characterized as a function of voltage and temperature. The times to failure at a voltage-temperature stress conformed to a lognormal distribution with a standard deviation approximately 0.5.

Minford, W. J.↗

Arcjet starting reliability: A multistart test on hydrogen/nitrogen mixtures

An arcjet starting reliability test was performed to investigate one feasibility issue in the use of arcjets onboard a satellite for north-south stationkeeping. A 1 kW arcjet was run on hydrogen/nitrogen gas mixtures simulating decomposed hydrazine. A pulse width modulated power supply with an integral high voltage starting pulser was used for arc ignition and steady-state operation. The test was performed in four phases in order to determine if starting characteristics changed as a result of long term thruster operation. More than 300 successful starts were accumulated over an operating time of 18 hrs. Overall results indicate that there is a link between starting characteristics and long term thruster operation; however, the large number of starts had no effect on steady-state performance.

Haag, Thomas W.↗

Arcjet starting reliability - A multistart test on hydrogen/nitrogen mixtures

An arcjet starting reliability test was performed to investigate one feasibility issue in the use of arcjets on board a satellite for north-south stationkeeping. A 1 kW arcjet was run on hydrogen/nitrogen gas mixtures simulating decomposed hydrazine. A pulse width modulated power supply with an integral high voltage starting pulser was used for arc ignition and steady-state operation. The test was performed in four phases in order to determine if starting characteristics changed as a result of long term thruster operation. More than 300 successful starts were accumulated over an operating time of 18 hr. Overall results indicate that there is a link between starting characteristics and long term thruster operation; however, the large number of starts had no effect on steady-state performance.

Haag, Thomas W.↗

( Invited ) Ruggedness of SiC and GaN Power Transistors in Switching Based Tests

Currently, a spectrum of reliability tests are being performed by both device manufacturers and end users. Many of these qualification tests are operated within the device safe-operating-area (SOA), however, the devices often undergo dynamic events in many converter applications that can exceed the SOA boundaries. This paper presents our recent work on quantifying the out-of-SOA robustness of GaN power high-electron-mobility transistors (HEMTs) and SiC power MOSFETs by switching based tests. The unclamped inductive switching stresses are applied to p-gate GaN HEMTs to evaluate their surge-energy and overvoltage robustness. The continuous, hard-switching, turn-off stresses are applied to SiC MOSFETs to evaluate their overvoltage switching robustness. As a result, both experiments demonstrate the robustness of SiC and GaN devices under out-of-SOA switching events, and the physics of degradation and failure are understood.

42 ENGINEERING↗