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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 73 records · Page 4
All sourcesNASA NTRSDOE OSTI
NASA NTRS2006

Qualification and Issues with Space Flight Laser Systems and Components

The art of flight quality solid-state laser development is still relatively young, and much is still unknown regarding the best procedures, components, and packaging required for achieving the maximum possible lifetime and reliability when deployed in the harsh space environment. One of the most important issues is the limited and unstable supply of quality, high power diode arrays with significant technological heritage and market lifetime. Since Spectra Diode Labs Inc. ended their involvement in the pulsed array business in the late 199O's, there has been a flurry of activity from other manufacturers, but little effort focused on flight quality production. This forces NASA, inevitably, to examine the use of commercial parts to enable space flight laser designs. System-level issues such as power cycling, operational derating, duty cycle, and contamination risks to other laser components are some of the more significant unknown, if unquantifiable, parameters that directly effect transmitter reliability. Designs and processes can be formulated for the system and the components (including thorough modeling) to mitigate risk based on the known failures modes as well as lessons learned that GSFC has collected over the past ten years of space flight operation of lasers. In addition, knowledge of the potential failure modes related to the system and the components themselves can allow the qualification testing to be done in an efficient yet, effective manner. Careful test plan development coupled with physics of failure knowledge will enable cost effect qualification of commercial technology. Presented here will be lessons learned from space flight experience, brief synopsis of known potential failure modes, mitigation techniques, and options for testing from the system level to the component level.

Ott, Melanie N.↗
NASA NTRS1997

Determining Functional Reliability of Pyrotechnic Mechanical Devices

This paper describes a new approach for evaluating mechanical performance and predicting the mechanical functional reliability of pyrotechnic devices. Not included are other possible failure modes, such as the initiation of the pyrotechnic energy source. The requirement of hundreds or thousands of consecutive, successful tests on identical components for reliability predictions, using the generally accepted go/no-go statistical approach routinely ignores physics of failure. The approach described in this paper begins with measuring, understanding and controlling mechanical performance variables. Then, the energy required to accomplish the function is compared to that delivered by the pyrotechnic energy source to determine mechanical functional margin. Finally, the data collected in establishing functional margin is analyzed to predict mechanical functional reliability, using small-sample statistics. A careful application of this approach can provide considerable cost improvements and understanding over that of go/no-go statistics. Performance and the effects of variables can be defined, and reliability predictions can be made by evaluating 20 or fewer units. The application of this approach to a pin puller used on a successful NASA mission is provided as an example.

Bement, Laurence J.↗
NASA NTRS2017

Applications of Fracture Mechanics to Quantitative Accelerated Life Testing of Plastic Encapsulated Microelectronics

Accelerated testing must address the failure mechanisms active within the devices undergoing tests in order to assess lifetimes in a meaningful way. The assumption of constant temperature, thermally activated lifetime, based upon the Arrhenius assumptions, does not always provide the necessary understanding to interpret accelerated tests in microelectronics. Plastic encapsulants, dielectric polymers, and underfill materials are subject to delamination and cracking with thermal cycling. Crack propagation during use environment exposure, drives the potential for failure of microelectronic devices and is therefore a necessary focal point in qualification and life testing. This paper reviews the available research in the application of fracture mechanics to this class of problems in microelectronics including relevant test data. In addition, useful acceleration factor models are derived for polymer crack propagation based on principles of linear elastic fracture mechanics. Further, a simple approach to estimating the minimum temperature cycling ranges, necessary to propagate a crack, is also presented. Finally, a methodology of applying acceleration factors to develop testing plans is shown, with an example in spaceflight for a cubesat in low Earth orbit. Overall, this is a paper that shows a useful and appropriate process for creating physics of failure based life testing for delamination and cracking failures in microelectronic polymers in a temperature cycling environment.

Accelerated testing↗
NASA NTRS2000

Reliability and Maintainability (RAM) Training

The theme of this manual is failure physics-the study of how products, hardware, software, and systems fail and what can be done about it. The intent is to impart useful information, to extend the limits of production capability, and to assist in achieving low-cost reliable products. In a broader sense the manual should do more. It should underscore the urgent need CI for mature attitudes toward reliability. Five of the chapters were originally presented as a classroom course to over 1000 Martin Marietta engineers and technicians. Another four chapters and three appendixes have been added, We begin with a view of reliability from the years 1940 to 2000. Chapter 2 starts the training material with a review of mathematics and a description of what elements contribute to product failures. The remaining chapters elucidate basic reliability theory and the disciplines that allow us to control and eliminate failures.

Lalli, Vincent R.↗
NASA NTRS1979

Development of a realistic stress analysis for fatigue analysis of notched composite laminates

A finite element stress analysis which consists of a membrane and interlaminar shear spring analysis was developed. This approach was utilized in order to model physically realistic failure mechanisms while maintaining a high degree of computational economy. The accuracy of the stress analysis predictions is verified through comparisons with other solutions to the composite laminate edge effect problem. The stress analysis model was incorporated into an existing fatigue analysis methodology and the entire procedure computerized. A fatigue analysis is performed upon a square laminated composite plate with a circular central hole. A complete description and users guide for the computer code FLAC (Fatigue of Laminated Composites) is included as an appendix.

Humphreys, E. A.↗
NASA NTRS1987

A study of charged particles/radiation damage to VLSI device materials

Future spacecraft systems such as the manned space station will be subjected to low-dose long term radiation particles. Most electronic systems are affected by such particles. There is therefore a great need to understand device physics and failure mechanisms affected by radiation and to design circuits that would be less susceptible to radiation. Using 2 MeV electron radiation and bias temperature aging, it was found that MOS capacitors that were prepositively biased have lower flatband voltage shift and lesser increase in density of surface state charge than those that were not prepositively biased. In addition, it was shown that there is continued recovery of flatband voltage and density of state charge in irradiated capacitors during both room temperature anneal and 137 degree anneal. When nMOS transistors were subjected to 1 MeV proton radiation, charge pumping and current versus voltage measurements indicated that transconductance degradation, threshold voltage shifts and changes in interface states density may be the primary cause of nMOS transistor failure after radiation. Simulation studies using SPICE were performed on CMOS SRAM cells of various transistor sizes. It is shown that transistor sizing affects the noise margins of CMOS SRAM cells, and that as the beta ratio of the transistors of the CMOS SRAM cell decreases, the effective noise margin of the SRAM cell increases. Some suggestions were made in connection with the design of CMOS SRAMS that are hardened against single event upsets.

Okyere, John G.↗
NASA NTRS1992

An evidential reasoning extension to quantitative model-based failure diagnosis

The detection and diagnosis of failures in physical systems characterized by continuous-time operation are studied. A quantitative diagnostic methodology has been developed that utilizes the mathematical model of the physical system. On the basis of the latter, diagnostic models are derived each of which comprises a set of orthogonal parity equations. To improve the robustness of the algorithm, several models may be used in parallel, providing potentially incomplete and/or conflicting inferences. Dempster's rule of combination is used to integrate evidence from the different models. The basic probability measures are assigned utilizing quantitative information extracted from the mathematical model and from online computation performed therewith.

Gertler, Janos J.↗
NASA NTRS2006

Photonic Component Qualification and Implementation Activities at NASA Goddard Space Flight Center

The photonics group in Code 562 at NASA Goddard Space Flight Center supports a variety of space flight programs at NASA including the: International Space Station (ISS), Shuttle Return to Flight Mission, Lunar Reconnaissance Orbiter (LRO), Express Logistics Carrier, and the NASA Electronic Parts and Packaging Program (NEPP). Through research, development, and testing of the photonic systems to support these missions much information has been gathered on practical implementations for space environments. Presented here are the highlights and lessons learned as a result of striving to satisfy the project requirements for high performance and reliable commercial optical fiber components for space flight systems. The approach of how to qualify optical fiber components for harsh environmental conditions, the physics of failure and development lessons learned will be discussed.

Ott, Melanie N.↗
NASA NTRS2011

High-Fidelity Modeling for Health Monitoring in Honeycomb Sandwich Structures

High-Fidelity Model of the sandwich composite structure with real geometry is reported. The model includes two composite facesheets, honeycomb core, piezoelectric actuator/sensors, adhesive layers, and the impactor. The novel feature of the model is that it includes modeling of the impact and wave propagation in the structure before and after the impact. Results of modeling of the wave propagation, impact, and damage detection in sandwich honeycomb plates using piezoelectric actuator/sensor scheme are reported. The results of the simulations are compared with the experimental results. It is shown that the model is suitable for analysis of the physics of failure due to the impact and for testing structural health monitoring schemes based on guided wave propagation.

Luchinsky, Dimitry G.↗
NASA NTRS2011

Cryogenic Quenching Process for Electronic Part Screening

The use of electronic parts at cryogenic temperatures (less than 100 C) for extreme environments is not well controlled or developed from a product quality and reliability point of view. This is in contrast to the very rigorous and well-documented procedures to qualify electronic parts for mission use in the 55 to 125 C temperature range. A similarly rigorous methodology for screening and evaluating electronic parts needs to be developed so that mission planners can expect the same level of high reliability performance for parts operated at cryogenic temperatures. A formal methodology for screening and qualifying electronic parts at cryogenic temperatures has been proposed. The methodology focuses on the base physics of failure of the devices at cryogenic temperatures. All electronic part reliability is based on the bathtub curve, high amounts of initial failures (infant mortals), a long period of normal use (random failures), and then an increasing number of failures (end of life). Unique to this is the development of custom screening procedures to eliminate early failures at cold temperatures. The ability to screen out defects will specifically impact reliability at cold temperatures. Cryogenic reliability is limited by electron trap creation in the oxide and defect sites at conductor interfaces. Non-uniform conduction processes due to process marginalities will be magnified at cryogenic temperatures. Carrier mobilities change by orders of magnitude at cryogenic temperatures, significantly enhancing the effects of electric field. Marginal contacts, impurities in oxides, and defects in conductor/conductor interfaces can all be magnified at low temperatures. The novelty is the use of an ultra-low temperature, short-duration quenching process for defect screening. The quenching process is designed to identify those defects that will precisely (and negatively) affect long-term, cryogenic part operation. This quenching process occurs at a temperature that is at least 25 C colder than the coldest expected operating temperature. This quenching process is the opposite of the standard burn-in procedure. Normal burn-in raises the temperature (and voltage) to activate quickly any possible manufacturing defects remaining in the device that were not already rejected at a functional test step. The proposed inverse burn-in or quenching process is custom-tailored to the electronic device being used. The doping profiles, materials, minimum dimensions, interfaces, and thermal expansion coefficients are all taken into account in determining the ramp rate, dwell time, and temperature.

Sheldon, Douglas J.↗
NASA NTRS2012

Using Markov Models of Fault Growth Physics and Environmental Stresses to Optimize Control Actions

A generalized Markov chain representation of fault dynamics is presented for the case that available modeling of fault growth physics and future environmental stresses can be represented by two independent stochastic process models. A contrived but representatively challenging example will be presented and analyzed, in which uncertainty in the modeling of fault growth physics is represented by a uniformly distributed dice throwing process, and a discrete random walk is used to represent uncertain modeling of future exogenous loading demands to be placed on the system. A finite horizon dynamic programming algorithm is used to solve for an optimal control policy over a finite time window for the case that stochastic models representing physics of failure and future environmental stresses are known, and the states of both stochastic processes are observable by implemented control routines. The fundamental limitations of optimization performed in the presence of uncertain modeling information are examined by comparing the outcomes obtained from simulations of an optimizing control policy with the outcomes that would be achievable if all modeling uncertainties were removed from the system.

Bole, Brian↗
NASA NTRS2014

Engineering Risk Assessment of Space Thruster Challenge Problem

The Engineering Risk Assessment (ERA) team at NASA Ames Research Center utilizes dynamic models with linked physics-of-failure analyses to produce quantitative risk assessments of space exploration missions. This paper applies the ERA approach to the baseline and extended versions of the PSAM Space Thruster Challenge Problem, which investigates mission risk for a deep space ion propulsion system with time-varying thruster requirements and operations schedules. The dynamic mission is modeled using a combination of discrete and continuous-time reliability elements within the commercially available GoldSim software. Loss-of-mission (LOM) probability results are generated via Monte Carlo sampling performed by the integrated model. Model convergence studies are presented to illustrate the sensitivity of integrated LOM results to the number of Monte Carlo trials. A deterministic risk model was also built for the three baseline and extended missions using the Ames Reliability Tool (ART), and results are compared to the simulation results to evaluate the relative importance of mission dynamics. The ART model did a reasonable job of matching the simulation models for the baseline case, while a hybrid approach using offline dynamic models was required for the extended missions. This study highlighted that state-of-the-art techniques can adequately adapt to a range of dynamic problems.

Assessment↗
NASA NTRS1995

A Systematic Approach to Hardware Qualification

A systematic approach for the development of a hardware qualification approach is described. This approach stems from the need to break the "Catch-22" of not being able to fly new technology because it hasn't flown. A physics of failure approach is used to identify failure modes and the impact and likelihood of these failures on the mission requirements is plotted in a Requirements Matrix. These same failure modes are plotted against the effectiveness of the available Preventions, Analyses, Control and Tests (PACTs) at screening for, or eliminating, these failure modes in a Test Effectiveness Matrix. Matrix multiplication results in a ranked set of PACTs which can be sorted according to cost and redundancy with other PACTs. This, and other information which results from the process, will allow project managers to make more informed decisions regarding the cost and risk tradeoffs inherent in any qualification program.

hardware↗
NASA NTRS2022

Reliability Assurance for COTS Capacitors

Burn-in (BI) and life testing (LT) are the most important reliability related elements of quality assurance for components used in space systems. This presentation discusses the need of transition from the existing approach to BI, LT, and destructive physical analysis (DPA) of COTS capacitors that is based on military specifications to an alternative approach that is based on Physics of Failure and HALT.

reliability↗
NASA NTRS2026

AC and DC Fault Management for Megawatt Electrified Aircraft Electrical Powertrains Task 3: Lifetime and Reliability of Electrical Insulators

This research project was a collaborative investigation between researchers at the RTX Technology Research Center (RTRC) and the University of Texas at Austin and made a significant contribution to enabling electric aircraft. The transport of electric power between the points of generation and use requires power cables. These cables must be smaller, lighter and provide a more predictable life than power cables used in stationary applications. Consequently, this investigation provided heretofore unavailable information supporting the safety and reliability of smaller lighter power cables for electrified aircraft. In addition, the research identified key additional engineering data needed to support quantitative reliability assessments. Important advances included: • Demonstrated that at least one manufacturer can make a novel, smaller, lighter power cable that is free from serious defects. • Developed and published an appropriate analytical construct to describe the life of this novel cable. This is a necessary step for use in aviation where the understanding of remaining life is critical. • Demonstrated thermal-mechanical aging that suggested 1000+ flights before the thermal-mechanical processes produced defects large enough that the defect growth was accelerated electrically. • Showed that electrical aging took place at two rates. The first possibly lasting weeks to months and the second possibly days to weeks. If robust, this provides a good diagnostic for cable replacement. • Demonstrated that the traditional electrical testing of cable materials using manufactured voids can be misleading due to the size of the voids. Emerging laser drilling technology permitted demonstration that the physics of failure in realistically small voids is different from that in the unrealistically large voids used in earlier research, which is very important for high-quality, high-performance, small aircraft cables. Although this project represents a significant contribution to the specifics of cable aging in the aircraft environment, important additional research remains to be completed, including: • Non-uniform thermal cycling by applying the heat from the center conductor to maximize thermal stress next to the core area where the electric gradient is the strongest. This builds on the uniform thermal cycling that has been completed. • The augmentation of the thermal-mechanical failure rate by electrical processes. Better understanding of these time constants strongly affects the ability to predict life. • Termination design: Terminations provide not only electrical reflection potential, but a location for a series arc fault and an area where ozone can diffuse into the center conductor and negatively affect cable insulation. • The abrasion and ozone resistance of the cable jacket. • Pressure cycling as an accelerant of thermal, mechanical, and/or electrical aging. • Possible methods for online PD detection and offline PD localization

model↗
NASA NTRS1990

A methodology for probabilistic prediction of structural failures of launch vehicle propulsion systems

A quantitative methodology for estimating the probability of occurrence of critical structural failure modes of launch vehicle propulsion systems during mission operation is presented. In this approach, engineering analysis models that characterize specific failure modes based on the physics and mechanics of the failure phenomenon are used in a prescribed probabalistic structure in which quantified uncertainty in the information used in the analysis and quantified uncertainty of the engineering analysis models themselves are both considered in estimating failure risk. The methodology is applicable to high cycle fatigue, low cycle fatigue, flaw propagation stress rupture, and other failure modes of launch vehicle propulsion systems and other space-flight systems. The probabalistic failure assessment presented provides the capability of performing quantitative analyses to rank options to improve reliability, thereby enabling limited financial resources of development and improvement programs to be more effectively allocated.

Moore, N.↗
NASA NTRS1990

An improved approach for flight readiness assessment

An improved methodology for quantitatively evaluating failure risk for a spaceflight system in order to assess flight readiness is presented. This methodology is of particular value when information relevant to failure prediction, including test experience and knowledge of parameters used in engineering analyses of failure phenomena, is limited. In this approach, engineering analysis models that characterize specific failure modes based on the physics and mechanics of the failure phenomena are used in a prescribed probabilistic structure to generate a failure probability distribution that is modified by test and flight experience in a Bayesian statistical procedure. The probabilistic structure and statistical methodology are generally applicable to any failure mode for which quantitative engineering analysis can be employed to characterize the failure phenomenon and are particularly well suited for use under the constraints on information availability that are typical of such spaceflight systems as the Space Shuttle and planetary spacecraft.

Moore, N. R.↗
NASA NTRS1993

Evaluating Risk Of Failure With Limited Information

Report describes probabilistic failure assessment (PFA). Developed for application to spaceflight systems for sufficient testing of hardware to ensure reliability not feasible. However, must be ascertained that critical failure modes extremely unlikely to occur during service. PFA applied to any failure mode described by quantitative models of physics and mechanics of failure phenomena, such as fatigue crack in initiation or propagation in structures, leakage of seals, wear in bearings, and erosion of arcjet thrustor cathodes.

Moore, N. R.↗