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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 73 records · Page 4
All sourcesNASA NTRSDOE OSTI
NASA NTRS2004

Kite: Status of the External Metrology Testbed for SIM

Kite is a system level testbed for the External Metrology system of the Space Interferometry Mission (SIM). The External Metrology System is used to track the fiducial that are located at the centers of the interferometer's siderostats. The relative changes in their positions needs to be tracked to tens of picometers in order to correct for thermal measurements, the Kite testbed was build to test both the metrology gauges and out ability to optically model the system at these levels. The Kite testbed is an over-constraint system where 6 lengths are measured, but only 5 are needed to determine the system. The agreement in the over-constrained length needs to be on the order of 140 pm for the SIM Wide-Angle observing scenario and 8 pm for the Narrow-Angle observing scenario. We demonstrate that we have met the Wide-Angle goal with our current setup. For the Narrow-Angle case, we have only reached the goal for on-axis observations. We describe the testbed improvements that have been made since our initial results, and outline the future Kite changes that will add further effects that SIM faces in order to make the testbed more SIM like.

metrology↗
NASA NTRS2004

White Light Modeling, Algorithm Development, and Validation on the Micro-arcsecond Metrology Testbed

The Space Interferometry Mission (SIM) scheduled for launch in early 2010, is an optical interferometer that will perform narrow angle and global wide angle astrometry with unprecedented accuracy, providing differential position accuracies of 1uas, and 4uas global accuracies in position, proper motion and parallax. The astrometric observations of the SIM instrument are performed via delay measurements provided by three Michelson-type, white light interferometers. Two 'guide' interferometers acquire fringes on bright guide stars in order to make highly precise measurements of variations in spacecraft attitude, while the third interferometer performs the science measurement. SIM derives its performance from a combination of precise fringe measurements of the interfered starlight (a few ten-thousandths of a wave) and very precise (tens of picometers) relative distance measurements made between a set of fiducials. The focus of the present paper is on the development and analysis of algorithms for accurate white light estimation, and on validating some of these algorithms on the MicroArcsecond Testbed.

metrology↗
NASA NTRS2004

Search for general relativistic effects in table-top displacement metrology

As displacement metrology accuracy improves, general relativistic effects will become noticeable. Metrology gauges developed for the Space Interferometry Mission were used to search for locally anisotropic space-time, with a null result at the 10 to the negative tenth power level.

displacement metrology↗
NASA NTRS2004

Search for general relativistic effects in table-top displacement metrology

As displacement metrology accuracy improves, general relativistic effects will become noticeable. Metrology gauges developed for the Space Interferometry Mission, were used to search for locally anisotropic space-time, with a null result at the 10 to the negative 10th power level.

displacement metrology↗
NASA NTRS2004

White light modeling, algorithm development, and validation on the micro-arcsecond metrology testbed

The Space Interferometry Mission (SIM), scheduled for launch in early 2010, is an optical interferometer that will perform narrow angle and global wide angle astrometry with unprecedented accuracy, providing differential position accuracies of 1uas, and 4uas global accuracies in position, proper motion and parallax. SIM astrometric measurements are synthesized from pathlength delay measurements provided by three Michelson-type, white light interferometers. Two of the interferometers are used for making precise measurements of variations in the spacecraft attitude, while the third interferometer performs the science measurement. The ultimate performance of SIM relies on a combination of precise fringe measurements of the interfered starlight with picometer class relative distance measurements made between a set of fiducials that define the interferometer baseline vectors. The focus of the present paper is on the development and analysis of algorithms for accurate white light fringe estimation, and on the preliminary validation of these algorithms on the Micro-Arcsecond Testbed (MAM).

Shen, Janice TsaePyng↗
NASA NTRS1996

Meteorology Gauges for Spatial Interferometry

Heterodyne interferometers have been commercially available for many years. In addition, many versions have been built at JPL for various projects. This activity is aimed at improving the accuracy of such interferometers from the 1-30 nanometer level to the picometer level for use in the proposes Stellar Interferometry Mission (SIM) as metrology gauges.

heterodyne interferometers heterodyne interferomet↗
NASA NTRS2006

SIM PlanetQuest: Status and Recent Progress

The SIM project is approaching the end of its technology development phase. With the successful completion of a number of testbeds, including micro-arcsecond stellar interferometry, picometer optical truss metrology, and milli-kelvin thermo-optical characterization, the project is now on a sure footing for the development of requirement for the flight instrument. Here we review the latest technological progress and give a status of the project.

astrometry↗
NASA NTRS2006

The Least-Squares Calibration on the Micro-Arcsecond Metrology Test Bed

The Space Interferometry Mission (S1M) will measure optical path differences (OPDs) with an accuracy of tens of picometers, requiring precise calibration of the instrument. In this article, we present a calibration approach based on fitting star light interference fringes in the interferometer using a least-squares algorithm. The algorithm is first analyzed for the case of a monochromatic light source with a monochromatic fringe model. Using fringe data measured on the Micro-Arcsecond Metrology (MAM) testbed with a laser source, the error in the determination of the wavelength is shown to be less than 10pm. By using a quasi-monochromatic fringe model, the algorithm can be extended to the case of a white light source with a narrow detection bandwidth. In SIM, because of the finite bandwidth of each CCD pixel, the effect of the fringe envelope can not be neglected, especially for the larger optical path difference range favored for the wavelength calibration.

interferometer calibrations↗