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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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The development of thermal control systems with high reliability and long service life is discussed. Various passive and semi-active thermal control systems which have been installed on space vehicles are described. The properties of the various coatings are presented in tabular form.
A space-qualified, high reliability, 150 ft-lb rated torque rotary actuator is described. This drive is an integrated variable reluctance orbit motor-epicyclic transmission actuator. The performance goals were based on future control moment gyrotorquer applications and represent an advancement in the torque-to-weight ratio, backlash, inertia and response characteristics of electric rotary drives. The program accomplishments have been in two areas (1) the development of two high ratio (818:1) actuator configurations (breadboard and flightweight) and (2) the invention of a reliable proximity switch sensor system for self-commutation without use of optical or electrical brush techniques.
Highly reliable soldered joints for printed circuit boards
Electrical properties of high reliability computer grade miniature capacitors
The use of the lithium/sulfur dioxide system for aerospace applications is discussed. The high rate density in the system is compared to some primary systems: mercury zinc, silver zinc, and magnesium oxide. Estimates are provided of the storage life and shelf life of typical lithium sulfur batteries. The design of lithium cells is presented and criteria are given for improving the output of cells in order to achieve high rate and high reliability.
This paper summarizes and reports a radiation hardened spacecraft high temperature, high reliability Sensor/Circut Integrated Packaging Technology.
Release mechanism employing simple clevis fitting in combination with two pin-pullers achieves high reliability degree through active mechanical redundancy. Mechanism releases solar arrays. It is simple and inexpensive and performs effectively. It adapts to other release-system applications with variety of pin-puller devices.
Systems for Space Defense Initiative (SDI) space applications typically require both high performance and very high reliability. These requirements present the systems engineer evaluating such systems with the extremely difficult problem of conducting performance and reliability trade-offs over large design spaces. A controlled development process supported by appropriate automated tools must be used to assure that the system will meet design objectives. This report describes an investigation of methods, tools, and techniques necessary to support performance and reliability modeling for SDI systems development. Models of the JPL Hypercubes, the Encore Multimax, and the C.S. Draper Lab Fault-Tolerant Parallel Processor (FTPP) parallel-computing architectures using candidate SDI weapons-to-target assignment algorithms as workloads were built and analyzed as a means of identifying the necessary system models, how the models interact, and what experiments and analyses should be performed. As a result of this effort, weaknesses in the existing methods and tools were revealed and capabilities that will be required for both individual tools and an integrated toolset were identified.
The goal of the two phase program is to develop the technology and design and fabricate ultralightweight high reliability DC to DC converters for space power applications. The converters will operate from a 5000 V dc source and deliver 1 MW of power at 100 kV dc. The power weight density goal is 0.1 kg/kW. The cycle to cycle voltage stability goals was + or - 1 percent RMS. The converter is to operate at an ambient temperature of -40 C with 16 minute power pulses and one hour off time. The uniqueness of the design in Phase 1 resided in the dc switching array which operates the converter at 20 kHz using Hollotron plasma switches along with a specially designed low loss, low leakage inductance and a light weight high voltage transformer. This approach reduced considerably the number of components in the converter thereby increasing the system reliability. To achieve an optimum transformer for this application, the design uses four 25 kV secondary windings to produce the 100 kV dc output, thus reducing the transformer leakage inductance, and the ac voltage stresses. A specially designed insulation system improves the high voltage dielectric withstanding ability and reduces the insulation path thickness thereby reducing the component weight. Tradeoff studies and tests conducted on scaled-down model circuits and using representative coil insulation paths have verified the calculated transformer wave shape parameters and the insulation system safety. In Phase 1 of the program a converter design approach was developed and a preliminary transformer design was completed. A fault control circuit was designed and a thermal profile of the converter was also developed.
Dielectric degradation as low as 0.3 % has been observed for a highly reliable Titanium dioxide (TiO{sub 2}) film after constant voltage stressing (CVS) with – 4 V for 10{sup 5} second at room temperature (300 K). The film was fabricated by sol –gel spin – coating method on a lightly doped p-Si (~10{sup 15} cm{sup −3}) substrate. The equivalent oxide thickness (EOT) is 7 nm with a dielectric constant 33 (at 1 MHz). Metal – Oxide – Semiconductor (MOS) capacitors have been fabricated with an optimum annealing temperature of 800°C for one hour in a preheated furnace. The dielectric degradation is annealing temperature dependent. A degradation of 1.4 %, 1.2 % and 1.1 % has been observed for 400°C, 600°C and 1000°C temperature annealed MOS respectively. The dielectric degradation increases below or above the optimum temperature of annealing.
This paper presents a new concept of high-reliability strapdown attitude sensing systems for space vehicles. Each system utilizes a set of redundant two-degree-of-freedom gyros. An optimum system configuration is obtained for maximum system reliability and the best measurement accuracy. Improved accuracy of the final data is obtained by using the least-square data reduction technique. Each system possesses a 'sensor performance management' feature which is capable of failure detection, faulty gyro identification, system reconfiguration, and, possibly, sensor recalibration. Improvement in reliability, as compared to other types of strapdown systems, is demonstrated. Details of the development are described in terms of a system containing four gyros.
We propose and have demonstrated a prototype high-reliability pump module for pumping a Non-Planar Ring Oscillator (NPRO) laser suitable for space missions. The pump module consists of multiple fiber-coupled single-mode laser diodes and a fiber array micro-lens array based fiber combiner. The reported Single-Mode laser diode combiner laser pump module (LPM) provides a higher normalized brightness at the combined beam than multimode laser diode based LPMs. A higher brightness from the pump source is essential for efficient NPRO laser pumping and leads to higher reliability because higher efficiency requires a lower operating power for the laser diodes, which in turn increases the reliability and lifetime of the laser diodes. Single-mode laser diodes with Fiber Bragg Grating (FBG) stabilized wavelength permit the pump module to be operated without a thermal electric cooler (TEC) and this further improves the overall reliability of the pump module. The single-mode laser diode LPM is scalable in terms of the number of pump diodes and is capable of combining hundreds of fiber-coupled laser diodes. In the proof-of-concept demonstration, an e-beam written diffractive micro lens array, a custom fiber array, commercial 808nm single mode laser diodes, and a custom NPRO laser head are used. The reliability of the proposed LPM is discussed.
We present statistical techniques for evaluating random and systematic errors for use in flight performance predictions for large flight lots and ultra-high reliability applications.
NASA is pursuing a program in Advanced Subsonic Transport (AST) to develop the technology for a highly reliable Fly-By-Light/Power-By-WIre aircraft. One of the primary objectives of the program is to develop the technology base for confident application of integrated PBW components and systems to transport aircraft to improve operating reliability and efficiency. Technology will be developed so that the present hydraulic and pneumatic systems of the aircraft can be systematically eliminated and replaced by electrical systems. These motor driven actuators would move the aircraft wing surfaces as well as the rudder to provide steering controls for the pilot. Existing aircraft electrical systems are not flight critical and are prone to failure due to Electromagnetic Interference (EMI) (1), ground faults and component failures. In order to successfully implement electromechanical flight control actuation, a Power Management and Distribution (PMAD) System must be designed having a reliability of 1 failure in 10(exp +9) hours, EMI hardening and a fault tolerance architecture to ensure uninterrupted power to all aircraft flight critical systems. The focus of this paper is to analyze, define, and describe technically challenging areas associated with the development of a Power By Wire Aircraft and typical requirements to be established at the box level. The authors will attempt to propose areas of investigation, citing specific military standards and requirements that need to be revised to accommodate the 'More Electric Aircraft Systems'.
It is sometimes optimistically hoped that a space life support system can be kept working throughout a long duration mission by repairing failed components, as long as sufficient spares are flown. It is usually assumed that the components have constant known failure rates. Then the needed numbers of spares can be computed to have any particular probability that all failed components can be replaced by available spares. This approach can provide high reliability if its favorable assumptions, including constant known failure rates, are satisfied. Other favorable assumptions are that the failures are statistically independent, repair will be successful without causing further failures, and all failures are due to internal component failures. These assumptions are not usually justified. The failure rates may be estimates that are inadequately verified because of insufficient testing. Failure rates may change due to materials substitutions, manufacturing changes, redesigns to fix failures, and new failures caused by redesigns. Failures that are not statistically independent may result from one common cause, such as a design or manufacturing error or a cascade of cause and effect, possibly caused by an external event such as a power outage. Repair may be unsuccessful or cause damage. Many failures occur at component interfaces or at the overall systems level, not within isolated components. Other failures causes are completely external to the system, due to assembly, maintenance, and operational errors or to unexpected environmental challenges. Replacement with sufficient spares can compensate for expected internal component failures but may not be able to cope with unpredictable design and manufacturing flaws, human errors, and environmental impacts. Reliability estimates based on providing sufficient spares to compensate for expected failures may be far too high. They are essentially upper bounds on reliability that might be approached if many frequent but often unconsidered failure causes can be eliminated.
Current and future space and defense systems face potential risks from the continued use of tin-lead solder, including: compliance with current environmental regulations, concerns about potential environmental legislation banning lead-containing products, reduced mission readiness, and component obsolescence with lead surface finishes. For example, the United States Environmental Protection Agency (USEPA) has lowered the Toxic Chemical Release reporting threshold for lead to 100 pounds. Overseas, the Waste Electrical and Electronic Equipment (WEEE) and the Restriction on Hazardous Substances (RoHS) Dicctives in Europe and similar mandates in Japan have instilled concern that a legislative body will prohibit the use of lead in aerospace/military electronics soldering. Any potential banning of lead compounds could reduce the supplier base and adversely affect the readiness of missions led by the National Aeronautics and Space Administration (NASA) and the U.S. Department of Defense (DoD). Before considering lead-free electronics for system upgrades or future designs, however, it is important for the DoD and NASA to know whether lead-free solders can meet their systems' requirements. No single lead-free solder is likely to qualify for all defense and space applications. Therefore, it is important to validate alternative solders for discrete applications. As a result of the need for comprehensive test data on the reliability of lead-free solders, a partnership was formed between the DoD, NASA, and several original equipment manufactures (OEMs) to conduct solder-joint reliability (laboratory) testing of three lead-free solder alloys on newly manufactured and reworked circuit cards to generate performance data for high-reliability (IPC Class 3) applications.
In this letter, we demonstrate a high reliable and stable organic field-effect transistor (OFET) based nonvolatile memory (NVM) with a polymer poly(4-vinyl phenol) (PVP) as the charge trapping layer. In the unipolar OFETs, the inreversible shifts of the turn-on voltage (V{sub on}) and severe degradation of the memory window (ΔV{sub on}) at programming (P) and erasing (E) voltages, respectively, block their application in NVMs. The obstacle is overcome by using a pn-heterojunction as the active layer in the OFET memory, which supplied a holes and electrons accumulating channel at the supplied P and E voltages, respectively. Both holes and electrons transferring from the channels to PVP layer and overwriting the trapped charges with an opposite polarity result in the reliable bidirectional shifts of V{sub on} at P and E voltages, respectively. The heterojunction OFET exhibits excellent nonvolatile memory characteristics, with a large ΔV{sub on} of 8.5 V, desired reading (R) voltage at 0 V, reliable P/R/E/R dynamic endurance over 100 cycles and a long retention time over 10 years.
Presentation to be given at the FY 2020 SDRD Annual Meeting, to be held Sept. 23-24, on WebEx. Cognitive Hybrid Radio Waveforms for High-Reliability Secure Wireless Communications, STL-013-19, Year 2