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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Heat conductive loss along supporting wires, air conductive loss in evacuated chamber - loss corrections for hemispherical emission measurements by decay method
Measurement techniques for determining emissions of satellite temperature control coatings or skin materials
Arc jet tests of candidate tile repair materials and baseline Orbiter uncoated reusable surface insulation (RSI) were performed in the Johnson Space Center's (JSC) Atmospheric Reentry Materials and Structures Evaluation Facility (ARMSEF) from June 23, 2003, through August 19, 2003. These tests were performed to screen candidate tile repair materials by verifying the high temperature performance and determining the thermal stability. In addition, tests to determine the surface emissivity at high temperatures and the geometric shrinkage of bare RSI were performed. In addition, tests were performed to determine the surface emissivity at high temperatures and the geometric shrinkage of uncoated RSI.
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Emittance measurements of space suit face shield and test chip
Studies were made to develop a test apparatus for the measurement of total emittance of materials under repeated exposure to simulated earth entry conditions. As no existing test facility met the emittance measurement and entry simulation goals, a new apparatus was designed, fabricated and checked out. This apparatus has the capability of performing total and spectral emittance measurements during cyclic temperature and pressure exposure under sonic and supersonic flow conditions. Emittance measurements were performed on a series of oxidized superalloys, silicide coated columbium alloys and ceramic coatings.
Apparatus and process for measuring the variation of directional emittance of surfaces at various temperatures using a radiometric infrared imaging system. A surface test sample is coated onto a copper target plate provided with selective heating within the desired incremental temperature range to be tested and positioned onto a precision rotator to present selected inclination angles of the sample relative to the fixed positioned and optically aligned infrared imager. A thermal insulator holder maintains the target plate on the precision rotator. A screen display of the temperature obtained by the infrared imager, and inclination readings are provided with computer calculations of directional emittance being performed automatically according to equations provided to convert selected incremental target temperatures and inclination angles to relative target directional emittance values. The directional emittance of flat black lacquer and an epoxy resin measurements obtained are in agreement with the predictions of the electromagnetic theory and with directional emittance data inferred from directional reflectance measurements made on a spectrophotometer.
Mid-IR spectral emittance measuring apparatus, discussing range of performance, systems response, etc
Total normal emittance measurements of charred ablator surfaces, discussing gas cap radiation effect
Fixed space planar thermionic diode with collector guard ring for studying various emitter materials, measuring emitter temperatures
This paper presents an overview of space environmental testing at NASA Goddard Space Flight Center. The contents include: 1) Solar Absorptance measurements; 2) Emittance measurements; 3) Transient Calorimetric Technique; 4) Electrostatic charge testing; 5) UV degradation testing; 6) Solar Wind Facility; and 7) Solar Wind testing.
Equipment for measuring total normal emittance and normal spectral emittance from 1 to 15 microns of nonmetals and metals from 1200 to 1800 degrees k
An electron bombardment argon ion source was used to ion etch polyimide (Kapton) and fluorinated ethylene, FEP (Teflon). Samples of polyimide and FEP were exposed to (0.5-1.0) keV Ar ions at ion current densities of (1.0-1/8) mA/sq cm for various exposure times. Changes in the optical and electrical properties of the samples were used to characterize the exposure. Spectral reflectance and transmittance measurements were made between 0.33 and 2.16 micron m using an integrating sphere after each exposure. From these measurements, values of solar absorptance were obtained. Total emittance measurements were also recorded for some samples. Surface resistivity was used to determine changes in the electrical conductivity of the etched samples. A scanning electron microscope recorded surface structure after exposure. Spectral optical data, resistivity measurements, calculated absorptance and emittance measurements are presented along with photomicrographs of the surface structure for the various exposures to Ar ions.
Apparatus for measuring emission of organic materials
Device for measuring total hemispherical emittance of materials for orbiting astronomical observatory satellite thermal control surface
Rotating cylinder equipment for measuring total and spectral normal emission of metals and nonmetals over temperature range of 1200 to 1800 deg K
Some basic concepts of radiation physics are briefly reviewed to provide an introduction to the radiative properties - including emittance, reflectance, absorptance, and transmittance - their definitions, interrelations, theory and methods of measurement. Analyzed data showing typical characteristics of temperature and wavelength dependence, surface effects and environmental influences on the radiation properties of selected classes of materials are presented. Emphasis is placed on those emittance properties of particular interest to conventional radiation thermometry applications, but sufficient generality on all properties is presented to be useful for new or unusual techniques where a more detailed understanding of the behavior of materials is desirable. Data sources are identified to assist the reader in locating property information. It is the intention of the paper to give the reader a background to become more fully aware of the pitfalls, limitations, but of course, advantages in the use of data from the literature. The paper is written in the form of an abbreviated review fully documenting the more important topics and concepts which can only be treated briefly.