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At least 73 records · Page 4

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NASA NTRS1990

Electron beam induced damage in PECVD Si3N4 and SiO2 films on InP

Phosphorus rich plasma enhanced chemical vapor deposition (PECVD) of silicon nitride and silicon dioxide films on n-type indium phosphide (InP) substrates were exposed to electron beam irradiation in the 5 to 40 keV range for the purpose of characterizing the damage induced in the dielectic. The electron beam exposure was on the range of 10(exp -7) to 10(exp -3) C/sq cm. The damage to the devices was characterized by capacitance-voltage (C-V) measurements of the metal insulator semiconductor (MIS) capacitors. These results were compared to results obtained for radiation damage of thermal silicon dioxide on silicon (Si) MOS capacitors with similar exposures. The radiation induced damage in the PECVD silicon nitride films on InP was successfully annealed out in an hydrogen/nitrogen (H2/N2) ambient at 400 C for 15 min. The PECVD silicon dioxide films on InP had the least radiation damage, while the thermal silicon dioxide films on Si had the most radiation damage.

Pantic, Dragan M.↗

NASA NTRSDate not supplied

Parallel Plate Capacitor Aluminum KIDs for Future Far-Infrared Space-Based Observatories

Future space-based far-infrared astrophysical observatories will require exquisitely sensitive detectors consistent with the low optical backgrounds. The PRobe far-Infrared Mission for Astrophysics (PRIMA) will deploy arrays of thousands of superconducting kinetic inductance detectors (KIDs) sensitive to radiation between 25 and 265 μm. Here, we present laboratory characterization of prototype, 25 – 80 μm wavelength, low-volume, aluminum KIDs designed for the low-background environment expected with PRIMA. A compact parallel plate capacitor is used to minimize the detector footprint and suppress TLS noise. A novel resonant absorber is designed to enhance response in the band of interest. We present noise and optical efficiency measurements of these detectors taken with a low background cryostat and a cryogenic blackbody. A microlens-hybridized KID array is found to be photon noise limited down to about 50 aW with a limiting detector NEP of about 6.5×10 −19 W/Hz 1/2 . A fit to an NEP model shows that our optical system is well characterized and understood down to 50 aW. We discuss future plans for low-volume aluminum KID array development as well as the testbeds used for these measurements.

Far-Infrared↗

NASA NTRS1983

Techniques for improving the Si-SiO2 interface characterization

The two techniques which have provided most of the information on interface states in MIS-C (metal-insulator-semiconductor-capacitor) structures are the 'quasi-static method' and the 'conductance method'. Sher et al. (1979) and Su et al. (1980) have suggested a number of improvements concerning these methods. The present investigation has the objective to extend the earlier results and to offer a new tentative interpretation of the data. A critical review is conducted of the data collection and reduction techniques for the quasi-static method, taking into account the sample, the quasi-static capacitance, and the surface potential. In connection with a discussion of the conductance method, attention is given to parallel conductance and capacitance measurements, interface-state densities, time constants, and measurements on a (110) surface orientation.

Sher, A.↗

NASA NTRS1998

Performance of Surface-Mount Ceramic and Solid Tantalum Capacitors for Cryogenic Applications

Low temperature electronics are of great interest for space exploration programs. These include missions to the outer planets, earth-orbiting and deep-space probes, remote-sensing and communication satellites. Terrestrial applications would also benefit from the availability of low temperature electronics. Power components capable of low temperature operation would, thus, enhance the technologies needed for the development of advanced power systems suitable for use in harsh environments. In this work, ceramic and solid tantalum capacitors were evaluated in terms of their dielectric properties as a function of temperature and at various frequencies. The surface-mount devices were characterized in terms of their capacitance stability and dissipation factor in the frequency range of 50 Hz to 100 kHz at temperatures ranging from room temperature (20 deg. C) to about liquid nitrogen temperature (-190 deg. C). The results are discussed and conclusions made concerning the suitability of the capacitors investigated for low temperature applications.

Patterson, Richard L.↗

NASA NTRS2005

High Temperature Performance of a SiC MESFET Based Oscillator

A hybrid, UHF-Band differential oscillator based on 10 w SiC RF Power Metal Semiconductor Field Effect Transistor (MESFET) has been designed, fabricated and characterized through 475 C. Circuit is fabricated on an alumina substrate with thin film spiral inductors, chip capacitors, chip resistors, and wire bonds for all crossovers and interconnectors. The oscillator delivers 15.7 dBm at 515 MHz into a 50 Ohm load at 125 C with a DC to RF conversion efficiency of 2,8%. After tuning the load impedance, the oscillator delivers 18.8 dBm at 610 MHz at 200 C with a DC to RF conversion efficiency of 5.8%. Finally, by tuning the load and bias conditions, the oscillator delivers 4.9 dBm at 453 MHz at 475 C.

Schwartz, Zachary D.↗

NASA NTRS2015

Rocket Propulsion 21 Steering Committee Meeting (RP21) NASA In-Space Propulsion Update

In-house Support of NEXT-C Contract Status Thruster NEXT Long Duration Test post-test destructive evaluation in progress Findings will be used to verify service life models identify potential design improvements Cathode heater fabrication initiated for cyclic life testing Thruster operating algorithm definition verification initiated to provide operating procedures for mission users High voltage propellant isolator life test voluntarily terminated after successfully operating 51,200 h Power processor unit (PPU) Replaced all problematic stacked multilayer ceramic dual inline pin capacitors within PPU Test bed Rebuilt installed discharge power supply primary power board Completed full functional performance characterization Final test report in progress Transferred PPU Testbed to contractor to support prototype design effort.

Electric Propulsion↗

NASA NTRS1993

The PIT MkV pulsed inductive thruster

The pulsed inductive thruster (PIT) is an electrodeless, magnetic rocket engine that can operate with any gaseous propellant. A puff of gas injected against the face of a flat (spiral) coil is ionized and ejected by the magnetic field of a fast-rising current pulse from a capacitor bank discharge. Single shot operation on an impulse balance has provided efficiency and I(sub sp) data that characterize operation at any power level (pulse rate). The 1-m diameter MkV thruster concept offers low estimated engine mass at low powers, together with power capability up to more than 1 MW for the 1-m diameter design. A 20 kW design estimate indicates specific mass comparable to Ion Engine specific mass for 10,000 hour operation, while a 100,000 hour design would have a specific mass 1/3 that of the Ion Engine. Performance data are reported for ammonia and hydrazine. With ammonia, at 32 KV coil voltage, efficiency is a little more than 50 percent from 4000 to more than 8000 seconds I(sub sp). Comparison with data at 24 and 28 kV indicates that a wider I(sub sp) range could be achieved at higher coil voltages, if required for deep space missions.

Dailey, C. Lee↗

NASA NTRS2014

A Reliability Model for Ni-BaTiO3-Based (BME) Ceramic Capacitors

The evaluation of multilayer ceramic capacitors (MLCCs) with base-metal electrodes (BMEs) for potential NASA space project applications requires an in-depth understanding of their reliability. The reliability of an MLCC is defined as the ability of the dielectric material to retain its insulating properties under stated environmental and operational conditions for a specified period of time t. In this presentation, a general mathematic expression of a reliability model for a BME MLCC is developed and discussed. The reliability model consists of three parts: (1) a statistical distribution that describes the individual variation of properties in a test group of samples (Weibull, log normal, normal, etc.), (2) an acceleration function that describes how a capacitors reliability responds to external stresses such as applied voltage and temperature (All units in the test group should follow the same acceleration function if they share the same failure mode, independent of individual units), and (3) the effect and contribution of the structural and constructional characteristics of a multilayer capacitor device, such as the number of dielectric layers N, dielectric thickness d, average grain size r, and capacitor chip size S. In general, a two-parameter Weibull statistical distribution model is used in the description of a BME capacitors reliability as a function of time. The acceleration function that relates a capacitors reliability to external stresses is dependent on the failure mode. Two failure modes have been identified in BME MLCCs: catastrophic and slow degradation. A catastrophic failure is characterized by a time-accelerating increase in leakage current that is mainly due to existing processing defects (voids, cracks, delamination, etc.), or the extrinsic defects. A slow degradation failure is characterized by a near-linear increase in leakage current against the stress time; this is caused by the electromigration of oxygen vacancies (intrinsic defects). The two identified failure modes follow different acceleration functions. Catastrophic failures follow the traditional power-law relationship to the applied voltage. Slow degradation failures fit well to an exponential law relationship to the applied electrical field. Finally, the impact of capacitor structure on the reliability of BME capacitors is discussed with respect to the number of dielectric layers in an MLCC unit, the number of BaTiO3 grains per dielectric layer, and the chip size of the capacitor device.

reliability↗

NASA NTRS2012

Some Aspects of the Failure Mechanisms in BaTiO3-Based Multilayer Ceramic Capacitors

The objective of this presentation is to gain insight into possible failure mechanisms in BaTiO3-based ceramic capacitors that may be associated with the reliability degradation that accompanies a reduction in dielectric thickness, as reported by Intel Corporation in 2010. The volumetric efficiency (microF/cm3) of a multilayer ceramic capacitor (MLCC) has been shown to not increase limitlessly due to the grain size effect on the dielectric constant of ferroelectric ceramic BaTiO3 material. The reliability of an MLCC has been discussed with respect to its structure. The MLCCs with higher numbers of dielectric layers will pose more challenges for the reliability of dielectric material, which is the case for most base-metal-electrode (BME) capacitors. A number of MLCCs manufactured using both precious-metal-electrode (PME) and BME technology, with 25 V rating and various chip sizes and capacitances, were tested at accelerated stress levels. Most of these MLCCs had a failure behavior with two mixed failure modes: the well-known rapid dielectric wearout, and so-called 'early failures." The two failure modes can be distinguished when the testing data were presented and normalized at use-level using a 2-parameter Weibull plot. The early failures had a slope parameter of Beta >1, indicating that the early failures are not infant mortalities. Early failures are triggered due to external electrical overstress and become dominant as dielectric layer thickness decreases, accompanied by a dramatic reduction in reliability. This indicates that early failures are the main cause of the reliability degradation in MLCCs as dielectric layer thickness decreases. All of the early failures are characterized by an avalanche-like breakdown leakage current. The failures have been attributed to the extrinsic minor construction defects introduced during fabrication of the capacitors. A reliability model including dielectric thickness and extrinsic defect feature size is proposed in this presentation. The model can be used to explain the Intel-reported reliability degradation in MLCCs with respect to the reduction of dielectric thickness. It can also be used to estimate the reliability of a MLCC based on its construction and microstructure parameters such as dielectric thickness, average grain size, and number of dielectric layers. Measures for preventing early failures are also discussed in this document.

Liu, David Donhang↗

NASA NTRS2006

Embedded Resistors and Capacitors in Organic and Inorganic Substrates

Embedded resistors and capacitors were purchased from two technology; organic PWB and inorganic low temperature co-fire ceramic (LTCC). Small groups of each substrate were exposed to four environmental tests and several characterization tests to evaluate their performance and reliability. Even though all passive components maintained electrical performance throughout environmental testing, differences between the two technologies were observed. Environmental testing was taken beyond manufacturers' reported testing, but general not taken to failure. When possible, data was quantitatively compared to manufacturer's data.

printed circuit board (PCB)↗

NASA NTRS2004

Advanced Technology Development for Stirling Convertors

A high-efficiency Stirling Radioisotope Generator (SRG) for use on potential NASA Space Science missions is being developed by the Department of Energy, Lockheed Martin, Stirling Technology Company, and NASA Glenn Research Center (GRC). These missions may include providing spacecraft onboard electric power for deep space missions or power for unmanned Mars rovers. GRC is also developing advanced technology for Stirling convertors, aimed at substantially improving the specific power and efficiency of the convertor and the overall power system. Performance and mass improvement goals have been established for second- and thirdgeneration Stirling radioisotope power systems. Multiple efforts are underway to achieve these goals, both in-house at GRC and under various grants and contracts. The status and results to date for these efforts will be discussed in this paper. Cleveland State University (CSU) is developing a multi-dimensional Stirling computational fluid dynamics code, capable of modeling complete convertors. A 2-D version of the code is now operational, and validation efforts at both CSU and the University of Minnesota are complementing the code development. A screening of advanced superalloy, refractory metal alloy, and ceramic materials has been completed, and materials have been selected for creep and joining characterization as part of developing a high-temperature heater head. A breadboard characterization is underway for an advanced controller using power electronics for active power factor control with a goal of eliminating the heavy tuning capacitors that are typically needed to achieve near unity power factors. Key Stirling developments just initiated under recent NRA (NASA Research Announcement) awards will also be discussed. These include a lightweight convertor to be developed by Sunpower Inc. and an advanced microfabricated regenerator to be done by CSU.

Thieme, Lanny G.↗

NASA NTRS2004

2.45 GHz Rectenna Designed for Wireless Sensors Operating at 500 C

High temperature wireless sensors that operate at 500 C are required for aircraft engine monitoring and performance improvement These sensors would replace currently used hard-wired sensors and lead to a substantial reduction in mass. However, even if the sensor output data is transmitted wirelessly to a receiver in the cooler part of the engine, and the associated cables are eliminated, DC power cables are still required to operate the sensors and power the wireless circuits. To solve this problem, NASA is developing a rectenna, a circuit that receives RF power and converts it to DC power. The rectenna would be integrated with the wireless sensor, and the RF transmitter that powers the rectenna would be located in the cooler part of the engine. In this way, no cables to or from the sensors are required. Rectennas haw been demonstrated at ambient room temperature, but to date, no high temperature rectennas haw been reported. In this paper, we report the first rectenna designed for 2.45 GHz operation at 500 C. The circuit consists of a microstrip dipole antenna, a stripline impedance matching circuit, and a stripline low pass filter to prevent transmission of higher harmonics created by the rectifying diode fabricated on an Alumina substrate. The rectifying diode is the gate to source junction of a 6H Sic MESFET and the capacitor and load resistor are chip elements that are each bonded to the Alumina substrate. Each element and the hybrid, rectenna circuit haw been characterized through 500 C.

Ponchak, George E.↗

NASA NTRS2012

Capacitance Probe Resonator for Multichannel Electrometer

A multichannel electrometer voltmeter has been developed that employs a mechanical resonator with voltage-sensing capacitance-probe electrodes that enable high-impedance, high-voltage, radiation-hardened measurement of an Internal Electrostatic Discharge Monitor (IESDM) sensor. The IESDM is new sensor technology targeted for integration into a Space Environmental Monitor (SEM) subsystem used for the characterization and monitoring of deep dielectric charging on spacecraft. The resonator solution relies on a non-contact, voltage-sensing, sinusoidal-varying capacitor to achieve input impedances as high as 10 petaohms as determined by the resonator materials, geometries, cleanliness, and construction. The resonator is designed with one dominant mechanical degree of freedom, so it resonates as a simple harmonic oscillator and because of the linearity of the variable sense capacitor to displacement, generates a pure sinusoidal current signal for a fixed input voltage under measurement. This enables the use of an idealized phase-lock sensing scheme for optimal signal detection in the presence of noise.

Blaes, Brent R.↗

NASA NTRS1973

On the Design and Test of a Liquid Injection Electric Thruster

A liquid injection electric thruster (LINJET) was designed and tested. The results of the tests were very encouraging with thruster performance levels well in excess of design goals. Supporting activities to the engine design and test included a five-million pulse life test on the main capacitor, a 46-million pulse test on the trigger electronics, design and fabrication of a zero resistance torque connector for use with the torsional pendulum thrust stand, design and fabrication of a logic box for control of engine firing, and a physical and chemical properties characterization of the perfluorocarbon propellant. While the results were encouraging, testing was limited, as many problems existed with the design. The most significant problem was involved with excessive propellant flow which contributed to false triggering and shorting. Low power active thermal control of the propellant storage cavity, coupled with a re-evaluation of the injection ring pore size and area exposed to the main capacitor discharge are areas that should be investigated should this design be carried forward.

Jones, T. A.↗

NASA NTRS1988

A complete dc characterization of a constant-frequency, clamped-mode, series-resonant converter

The dc behavior of a clamped-mode series-resonant converter is characterized systematically. Given a circuit operating condition, the converter's mode of operation is determined and various circuit parameters are calculated, such as average inductor current (load current), rms inductor current, peak capacitor voltage, rms switch currents, average diode currents, switch turn-on currents, and switch turn-off currents. Regions of operation are defined, and various circuit characteristics are derived to facilitate the converter design.

Tsai, Fu-Sheng↗

NASA NTRS1994

Active antenna

An antenna, which may be a search coil, is connected to an operational amplifier circuit which provides negative impedances, each of which is in the order of magnitude of the positive impedances which characterize the antenna. The antenna is connected to the inverting input of the operational amplifier; a resistor is connected between the inverting input and the output of the operational amplifier; a capacitor-resistor network, in parallel, is connected between the output and the noninverting input of the operational amplifier; and a resistor is connected from the noninverting input and the circuit common. While this circuit provides a negative resistance and a negative inductance, in series, which appear, looking into the noninverting input of the operational amplifier, in parallel with the antenna, these negative impedances appear in a series loop with the antenna positive impedances, so as to algebraically add. This circuit is tuned by varying the various circuit components so that the negative impedances are very close, but somewhat less, in magnitude, to the antenna impedances. The result is to increase the sensitivity of the antenna by lowering its effective impedance. This, in turn, increases the effective area of the antenna, which may be broadband.

Sutton, John F.↗

NASA NTRS2010

Method and Circuit for In-Situ Health Monitoring of Solar Cells in Space

This innovation represents a method and circuit realization of a system designed to make in-situ measurements of test solar-cell operational parameters on orbit using readily available high-temperature and high-ionizing-radiation- tolerant electronic components. This innovation enables on-orbit in-situ solar-array health monitoring and is in response to a need recognized by the U.S. Air Force for future solar arrays for unmanned spacecraft. This system can also be constructed out of commercial-grade electronics and can be embedded into terrestrial solar power system as a diagnostics instrument. This innovation represents a novel approach to I-V curve measurement that is radiation and temperature hard, consumes very few system resources, is economical, and utilizes commercially available components. The circuit will also operate at temperatures as low as 55 C and up to +225 C, allowing it to reside close to the array in direct sunlight. It uses a swept mode transistor functioning as a resistive load while utilizing the solar cells themselves as the biasing device, so the size of the instrument is small and there is no danger of over-driving the cells. Further, this innovation utilizes nearly universal spacecraft bus resources and therefore can be readily adapted to any spacecraft bus allowing for ease of retrofit, or designed into new systems without requiring the addition of infrastructure. One unique characteristic of this innovation is that it effects the measurement of I-V curves without the use of large resistor arrays or active current sources normally used to characterize cells. A single transistor is used as a variable resistive load across the cell. This multi-measurement instrument was constructed using operational amplifiers, analog switches, voltage regulators, MOSFETs, resistors, and capacitors. The operational amplifiers, analog switches, and voltage regulators are silicon-on-insulator (SOI) technology known for its hardness to the effects of ionizing radiation. The SOI components used can tolerate temperatures up to 225 C, which gives plenty of thermal headroom allowing this circuit to perhaps reside in the solar cell panel itself where temperatures can reach over 100 C.

Krasowski, Michael J.↗

NASA NTRS2017

A Novel Solid State Ultracapacitor

Novel dielectric materials were researched to develop an internal barrier layer capacitor that is fully solid state. These materials included reduced nanoparticles of barium titanate that were coated with various atomic layer deposited oxides. The nanoparticle powders were then densified into pellets and characterized using a dielectric test fixture over a frequency range of 20 Hz to 2 MHz. Densification and sintering were evaluated using scanning electron microscopic techniques. Ultimately, the samples showing the most promising electrical characteristics of permittivity, dissipation factor and equivalent series resistance were chosen to manufacture devices for subsequent testing.

Cortes-Pena, A. Y.↗