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Results for “accelerated degradation testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 73 records · Page 4
All sourcesNASA NTRSDOE OSTI
NASA NTRS1979

Accelerated stress testing of terrestrial solar cells

A program to investigate the reliability characteristics of unencapsulated low-cost terrestrial solar cells using accelerated stress testing is described. Reliability (or parametric degradation) factors appropriate to the cell technologies and use conditions were studied and a series of accelerated stress tests was synthesized. An electrical measurement procedure and a data analysis and management system was derived, and stress test fixturing and material flow procedures were set up after consideration was given to the number of cells to be stress tested and measured and the nature of the information to be obtained from the process. Selected results and conclusions are presented.

Prince, J. L.↗
NASA NTRS2004

Hubble Space Telescope Degradation Data Used for Ground-Based Durability Projection of Insulation on the International Space Station

Ground-based environmental durability tests have indicated that exposing materials in accelerated tests to known spacecraft mission degradation sources predicted by an environmental model does not simulate the extent of damage that occurs in the space environment. The reasons for this may include the complex nature of the space environment, which is not simulated completely in any ground-based facility, the extreme differences in exposure rates in space and in ground tests, and inaccuracies in environmental models. One approach to overcoming the difficulties in simulating the space environment using ground-based testing is to calibrate the facility using data from actual space-exposed materials to determine exposure levels required to replicate degraded properties observed in space. Research was conducted at the NASA Glenn Research Center to develop a ground-to-space correlation method that determines the durability of Teflon-based insulation for the International Space Station (ISS) by using data obtained in a ground facility and degraded Teflon thermal insulation retrieved from the Hubble Space Telescope.

deGroh, Kim K.↗
NASA NTRS2012

Prognostics Approach for Power MOSFET Under Thermal-Stress

The prognostic technique for a power MOSFET presented in this paper is based on accelerated aging of MOSFET IRF520Npbf in a TO-220 package. The methodology utilizes thermal and power cycling to accelerate the life of the devices. The major failure mechanism for the stress conditions is dieattachment degradation, typical for discrete devices with leadfree solder die attachment. It has been determined that dieattach degradation results in an increase in ON-state resistance due to its dependence on junction temperature. Increasing resistance, thus, can be used as a precursor of failure for the die-attach failure mechanism under thermal stress. A feature based on normalized ON-resistance is computed from in-situ measurements of the electro-thermal response. An Extended Kalman filter is used as a model-based prognostics techniques based on the Bayesian tracking framework. The proposed prognostics technique reports on preliminary work that serves as a case study on the prediction of remaining life of power MOSFETs and builds upon the work presented in [1]. The algorithm considered in this study had been used as prognostics algorithm in different applications and is regarded as suitable candidate for component level prognostics. This work attempts to further the validation of such algorithm by presenting it with real degradation data including measurements from real sensors, which include all the complications (noise, bias, etc.) that are regularly not captured on simulated degradation data. The algorithm is developed and tested on the accelerated aging test timescale. In real world operation, the timescale of the degradation process and therefore the RUL predictions will be considerable larger. It is hypothesized that even though the timescale will be larger, it remains constant through the degradation process and the algorithm and model would still apply under the slower degradation process. By using accelerated aging data with actual device measurements and real sensors (no simulated behavior), we are attempting to assess how such algorithm behaves under realistic conditions.

Power MOSFET PHM↗
DOE OSTI2022

Long-term impact of light- and elevated temperature-induced degradation on photovoltaic arrays

Low levelized cost of electricity (LCOE) has been identified as critical for widespread adoption of photovoltaics (PV) without subsidies. Maintaining decades-long high-energy production is often an under-recognized opportunity in meeting cost goals because component lifetimes are not fully quantified at the time of manufacture. Whereas certain standardized tests minimize risk of early failure, there is little guidance to quantitatively predict degradation (or lack thereof) over decades, based on accelerated tests. In this article, we move toward bridging the understanding between indoor accelerated tests and outdoor performance data, with the goal of predicting energy yield with enough accuracy to inform financial decisions. Light- and elevated temperature-induced degradation (LETID) in p-type Si modules is analyzed in terms of impact on long-term module performance and thus LCOE. A method to predict the progression of LETID, using fixed kinetic constants and a numerical solution to the basic reaction rate equations, is detailed. Predictions are compared against both published data and that new to this study. These data include both indoor accelerated tests and fielded modules. We use the results in financial models to derive LCOE of modules in different climates with varying amounts of LETID, including uncertainty. Cost models based on the predictions indicate that LETID has a significant and climate-dependent impact on LCOE. Finally, we show that - even given the uncertainties identified in the study - these financial calculations can provide useful guidance to quantify risk based on accelerated test results. The analysis serves as an example of developing a predictive approach to PV reliability using physics of failure.

14 SOLAR ENERGY↗
DOE OSTI2020

Novel Lightweight, Low-Cost Heliostat for Concentrating Solar Power (SBIR Phase I Final Report)

The overall goal of this Department of Energy (DOE) SBIR Phase I project was to demonstrate the feasibility of the L.Garde, Inc. heliostat mirror facet for use in concentrated solar power applications. Prior to this Phase I project, L.Garde, Inc. developed a design for a lightweight and low cost mirror facet and successfully fabricated small scale (0.667 m 2 ) with a mirror surface flatness of 0.7 mrad. Therefore, the focus of the Phase I effort was to (1) demonstrate scalability by fabricating larger size mirrors while retaining the same mirror surface flatness, (2) demonstrate the design can withstand operating environment conditions through field testing, and (3) perform cost analysis to show the heliostat mirror facet design can meet DoE goals of < 12 kg/m2 and <$30/m 2 . During the Phase I project, L.Garde successfully fabricated large area (1.395 m 2 ) heliostat mirror facets, with a mass per unit area of 8 kg/m 2 and a cost of $29.80/m 2 . Surface flatness measurements (using contact probe technique) were performed on the mirror surface and results showed a flatness of 0.68 mrad, which were in agreement with previously fabricated small scale mirror facets. Slope error measurements was also performed on the mirror surface and results showed a slope error of 0.77 mrad which also was in agreement with previously fabricated small scale mirror facets. One large area mirror facet was subjected to a three (3) month field test. Surface flatness and slope error measurements were performed on the mirror surface after the field test and results were 0.663 mrad and 0.58 mrad respectively. The large scale heliostat mirror facets were also subjected to accelerated aging. However, during this exposure we observed failure due to the breaking of the mirror facets. Further investigation into the source of the failure showed that the mirror component alone showed signs of degradation during the same accelerated aging test. We believe that moisture ingress is occurring when subjected to high humidity, leading to buildup of water with the layers of protective paints and resulting in mirror breakage when water expands in freezing conditions. In order to mitigate or eliminate this issue, a new weatherproofing strategy may be implemented or a new mirror component may be used that is able to survive accelerated aging conditions.

14 SOLAR ENERGY↗
DOE OSTI2023

Estimate long-term impact on battery degradation by considering electric vehicle real-world end-use factors

Many estimates of battery capacity degradation are based on accelerated lab tests that involve charge-discharge cycles or rely on data or electrochemical modeling. These methods are reasonable for technology benchmarking but rarely consider real-world end-use factors. To address this issue, this study develops the Battery Run-down under Electric Vehicle Operation (BREVO) model. It links the driver's travel pattern to physics-based battery degradation and powertrain energy consumption models. The model simulates the impacts of charging behavior, charging rate, driving patterns, and multiple energy management modules on battery capacity degradation. It finds that, over a 10-year timespan, firstly, for a random driver situated in the New England area, daily direct-current fast charging (60 kW) could lead to up to 22% less battery capacity when compared to daily Level-1 charging (1.8 kW). Second, the battery thermal management system can delay battery degradation by approximately 0.5% in the New England area. Third, warmer ambient temperatures enhance BEV battery usage. The model indicates that the battery capacity in the Los Angeles area is 6% higher than that in the New England area. The BREVO model provides crucial information for consumers and BEV manufacturers on range anxiety, BEV battery design, and decision support of battery warranty.

25 ENERGY STORAGE↗
DOE OSTI2026

Collaborative R&D with REEL Solar Inc (REEL) to Understand and Overcome Performance Limitations in CdTe Solar Cells: Cooperative Research and Development (Final Report)

This CRADA will focus on processing, advanced characterization, and testing of photovoltaic materials and devices to understand and improve REEL CdTe solar technology. This will include examining process variations and different buffer, absorber, and contact layers from REEL and NLR to maximize performance. The unique and diverse advanced characterization tools at NLR, such as time-resolved photoluminescence, capacitance-voltage measurements, electron beam scattered diffraction, cathodoluminescence, electron microscopy, TOF-SIMS, and other measurements will be applied to characterize REEL processing to improve understanding and guide experimental directions. Accelerated stability and potential induced degradation tests will be used to analyze metastability, short-and-long term degradation, and improve bankability. A second and major thrust this period will be joint development of Si/CdTe tandem solar cells to overcome industry wide terrestrial solar efficiency limits with the two lowest cost and manufacturable solar materials today. This will include developing novel transparent back contacts that can be incorporated into tandem structures and other novel solar applications, detailed analysis of designs and configurations for CdTe/Si tandem modules, and prototyping REEL CdTe Technology with Si bottom cells in tandem structures.

14 SOLAR ENERGY↗
NASA NTRS2014

Evaluation of Commercial Automotive-Grade BME Capacitors

Three Ni-BaTiO3 ceramic capacitor lots with the same specification (chip size, capacitance, and rated voltage) and the same reliability level, made by three different manufacturers, were degraded using highly accelerated life stress testing (HALST) with the same temperature and applied voltage conditions. The reliability, as characterized by mean time to failure (MTTF), differed by more than one order of magnitude among the capacitor lots. A theoretical model based on the existence of depletion layers at grain boundaries and the entrapment of oxygen vacancies has been proposed to explain the MTTF difference among these BME capacitors. It is the conclusion of this model that reliability will not be improved simply by increasing the insulation resistance of a BME capacitor. Indeed, Ni-BaTiO3 ceramic capacitors with a smaller degradation rate constant K will always give rise to a longer reliability life

capacitor↗
NASA NTRS2014

Evaluation of Commercial Automotive-Grade BME Capacitors

Three Ni-BaTiO3 ceramic capacitor lots with the same specification (chip size, capacitance, and rated voltage) and the same reliability level, made by three different manufacturers, were degraded using highly accelerated life stress testing (HALST) with the same temperature and applied voltage conditions. The reliability, as characterized by mean time to failure (MTTF), differed by more than one order of magnitude among the capacitor lots. A theoretical model based on the existence of depletion layers at grain boundaries and the entrapment of oxygen vacancies has been proposed to explain the MTTF difference among these BME capacitors. It is the conclusion of this model that reliability will not be improved simply by increasing the insulation resistance of a BME capacitor. Indeed, Ni-BaTiO3 ceramic capacitors with a smaller degradation rate constant K will always give rise to a longer reliability life.

reliability↗
NASA NTRS1978

Dynamics of cell degradation

The use of chemical and physical data as a supplement to linear regression models in the prediction of cell failure is discussed. Principal factors to be considered are the positive thickness and weight, and the negative thickness. A model for cell degradation and failure in accelerated life test cells is presented and predictions based on a teardown analysis are included.

Mcdermott, P. P.↗
NASA NTRS2016

Degradation of Leakage Currents and Reliability Prediction for Tantalum Capacitors

Two types of failures in solid tantalum capacitors, catastrophic and parametric, and their mechanisms are described. Analysis of voltage and temperature reliability acceleration factors reported in literature shows a wide spread of results and requires more investigation. In this work, leakage currents in two types of chip tantalum capacitors were monitored during highly accelerated life testing (HALT) at different temperatures and voltages. Distributions of degradation rates were approximated using a general log-linear Weibull model and yielded voltage acceleration constants B = 9.8 +/- 0.5 and 5.5. The activation energies were Ea = 1.65 eV and 1.42 eV. The model allows for conservative estimations of times to failure and was validated by long-term life test data. Parametric degradation and failures are reversible and can be annealed at high temperatures. The process is attributed to migration of charged oxygen vacancies that reduce the barrier height at the MnO2/Ta2O5 interface and increase injection of electrons from the MnO2 cathode. Analysis showed that the activation energy of the vacancies' migration is ~ 1.1 eV.

acceleration factors↗
NASA NTRS1979

Development of an Accelerated Test Design for Predicting the Service Life of the Solar Array at Mead, Nebraska

Potential long-term degradation modes for the two types of modules in the Mead array were determined and judgments were made as to those environmental stresses and combinations of stresses which accelerate the degradation of the power output. Hierarchical trees representing the severity of effects of stresses (test conditions) on eleven individual degradation modes were constructed and were pruned of tests judged to be nonessential. Composites of those trees were developed so that there is now one pruned tree covering eight degradation modes, another covering two degradation modes, and a third covering one degradation mode. These three composite trees form the basis for selection of test conditions in the final test plan which is now being prepared.

Gaines, G. B.↗
DOE OSTI2024

Increasing Multilayer Ceramic Capacitor Lifetime With Bipolar Voltage Cycling

Enhancing the lifetime of multilayer ceramic capacitors (MLCCs) is critical in many aerospace, naval, or electrical grid applications, where device failure could lead to catastrophic consequences. The migration of oxygen vacancies from the ceramic to the electrode interface under constant bias is known to reduce the lifetime of oxide-based MLCCs. Bias cycling presents an opportunity to enhance MLCC lifetime by reducing oxygen vacancy migration. The ideal frequency range is expected to lie between frequencies low enough to avoid self-heating but high enough to avoid interfacial defect formation. However, the impact of low-frequency bipolar voltage cycling (BVC) on MLCC degradation mechanisms has not been well studied. This work investigates the impact of periodic BVC on the degradation of MLCCs through highly accelerated lifetime testing (HALT) on X7R capacitors. HALT tests were conducted at 255 °C and 60 V using different switching frequencies: 0 (dc), 0.1, 2.5, and 10 Hz. BVC was found to improve the lifetime of MLCCs compared to dc test conditions. MLCCs tested at 10-Hz BVC showed a 311% increase in average time to failure compared to the dc case. Impedance spectroscopy shows that BVC decreases the rate of resistance degradation within MLCCs, indicating that oxygen vacancy migration to the electrodes is mitigated. The impedance spectra taken on BVC samples highlight how grain boundaries play a vital role in trapping oxygen vacancies. Periodic cycling causes oxygen vacancies to become trapped at grain boundaries, resulting in oxygen vacancies taking longer to reach the electrode interface and thus increasing MLCC lifetime. This work highlights not only how BVC can be used to increase MLCC lifetime but also how periodically cycling MLCCs could increase lifetime in extreme environments, such as at elevated temperatures and electric fields.

Chuong, Kayla Y.↗
DOE OSTI2022

Evaluation of bifacial module technologies with combined–accelerated stress testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. Furthermore, this is attributed to previous X-ray topography and modeling work showing higher stress in cells and interconnections in glass-glass modules than glass-backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. We found light-induced degradation (LID) in module types with regenerated (inactive) cells with C-AST, suggesting the possibility of LID destabilization in some field conditions. We could also distinguish potential-induced degradation (PID) on the back of the bifacial passivated emitter and rear cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass-glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while –1200 V system voltage is applied in C-AST, supporting the conclusion that this module type with glass-glass construction would be susceptible to PID in the field.

14 SOLAR ENERGY↗
DOE OSTI2026

Measuring the Stress Factors for Photovoltaic (PV) Backsheet Degradation

Back sheet failure has resulted in power loss and large-scale recall of photovoltaic modules, resulting in billions of dollars in lost revenue. The light exposure on the backside of a photovoltaic module comes primarily from reflected light which alters the distribution of natural sunlight. Because of this, modelling the backside exposure and duplicating the exposure is much more difficult than modeling the frontside exposure. This project aims to study how various back sheets and junction box materials degrade under different conditions and to develop Python code to help model and predict degradation. The stress factors for back-sheet degradation must be quantified to extrapolate accelerated stress tests to the field. Test samples were placed in the A3, A4, and A5 conditions, as defined in IEC 62788-7-2, to assess the temperature and humidity dependence of ultraviolet (UV) induced degradation. We are utilizing a custom chamber with exposure from 0.5 UV-suns to 5 UV-suns to understand the dependence of degradation on light intensity. A group of samples put in the A3 condition had glass filters with 50% UV cut-offs of 320 nm, 335 nm, and 360 nm to assess the wavelength dependence of UV degradation. All this data is necessary to assess the impact of non-standard UV light exposure. The material evaluation tests include gloss measurements, attenuated total internal reflectance Fourier transform infrared spectroscopy (ATR-FTIR), UV-visible reflectance/transmittance utilizing a Cary Ci7000 spectrophotometer, and a nano-indenter for surface hardness and modulus measurements. Alongside the experimental work, there is a computational effort using raytracing and Python open-source tools in PVDeg , PVLib, and Bifacial_Radiance. This code will create specific exposure scenarios and enable the evaluation of chamber degradation relative to field degradation. Equation 1 is a strawman equation used to model degradation on the backside of a PV module. We will create simplified code, based on the results of ray-tracing calculations, which uses a view factor approach to provide fast calculations for the most common exposure scenarios.

14 SOLAR ENERGY↗
DOE OSTI2023

Irradiation and corrosion testing of laser powder bed fusion-manufactured materials in the AMMT program

The Advanced Materials and Manufacturing Technologies (AMMT) program operating under the Department of Energy Office of Nuclear Energy is accelerating the qualification and deployment of additively manufactured materials in advanced reactor environments. Laser powder bed fusion (LPBF) has emerged as a promising additive manufacturing technique to fabricate complex components with the potential of tailored material properties. In the nuclear industry, metal additive manufacturing can offer numerous advantages, such as reduced lead times, streamlined quality assurance, and cost-effective low-volume production of new and replacement components with conventional or novel materials and geometries. The rapid and effective qualification of the effect of processing variability on the performance and degradation of additively manufactured materials is essential for the deployment of these components into advanced reactor environments. As part of this effort, AMMT is performing irradiation and corrosion testing of several materials built by LPBF, including 316L and 316H stainless steels. Our efforts encompass neutron irradiation testing, ion irradiation testing, and advanced modeling to provide a robust technical basis for understanding the effect of process variability on materials degradation and developing a sound methodology for accelerated ion irradiation testing. We develop focused irradiation test plans that align well with risk-informed and technologically inclusive approaches to licensing. We will also discuss our plans and specific concerns for corrosion testing additively manufactured material, with a primary focus on molten salt and liquid sodium environments.

22 GENERAL STUDIES OF NUCLEAR REACTORS↗
DOE OSTI2024

Nanochannel electrodes facilitating interfacial transport for PEM water electrolysis

Proton-exchange membrane water electrolyzers (PEMWEs) are a promising technology for green hydrogen production; however, interfacial transport behaviors are poorly understood, hindering device performance and longevity. Here, we first utilized finite-gap electrolyzer to demonstrate the possibility of proton transfer through water in PEMWEs. The measured high-frequency resistances (HFRs) exhibit a linear trend with increasing gap distance, where extrapolation shows a lower value compared with HFRs in regular zero-gap electrolyzers, indicating that ohmic resistance could be further reduced. We introduce nanochannels to facilitate mass transport, as evidenced by both liquid-fed and vapor-fed electrolysis. Nanochannel electrodes achieve a voltage reduction of 190 mV at 9 A·cm –2 compared with the Ir-PTEs without nanochannels. Furthermore, nanochannel electrodes show negligible degradation through 100,000 accelerated-stress tests and over 2,000 h of operation at 1.8 A·cm –2 with a decay rate of 11.66 μV·h –1 . These results provide new insights into localized transport dynamics for PEMWEs and highlight the significance of interfacial engineering for electrochemical devices.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗