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At least 73 records · Page 4
All sourcesNASA NTRSDOE OSTI
NASA NTRS2017

Board Level Proton Testing Book of Knowledge for NASA Electronic Parts and Packaging Program

This book of knowledge (BoK) provides a critical review of the benefits and difficulties associated with using proton irradiation as a means of exploring the radiation hardness of commercial-off-the-shelf (COTS) systems. This work was developed for the NASA Electronic Parts and Packaging (NEPP) Board Level Testing for the COTS task. The fundamental findings of this BoK are the following. The board-level test method can reduce the worst case estimate for a board's single-event effect (SEE) sensitivity compared to the case of no test data, but only by a factor of ten. The estimated worst case rate of failure for untested boards is about 0.1 SEE/board-day. By employing the use of protons with energies near or above 200 MeV, this rate can be safely reduced to 0.01 SEE/board-day, with only those SEEs with deep charge collection mechanisms rising this high. For general SEEs, such as static random-access memory (SRAM) upsets, single-event transients (SETs), single-event gate ruptures (SEGRs), and similar cases where the relevant charge collection depth is less than 10 μm, the worst case rate for SEE is below 0.001 SEE/board-day. Note that these bounds assume that no SEEs are observed during testing. When SEEs are observed during testing, the board-level test method can establish a reliable event rate in some orbits, though all established rates will be at or above 0.001 SEE/board-day. The board-level test approach we explore has picked up support as a radiation hardness assurance technique over the last twenty years. The approach originally was used to provide a very limited verification of the suitability of low cost assemblies to be used in the very benign environment of the International Space Station (ISS), in limited reliability applications. Recently the method has been gaining popularity as a way to establish a minimum level of SEE performance of systems that require somewhat higher reliability performance than previous applications. This sort of application of the method suggests a critical analysis of the method is in order. This is also of current consideration because the primary facility used for this type of work, the Indiana University Cyclotron Facility (IUCF) (also known as the Integrated Science and Technology (ISAT) hall), has closed permanently, and the future selection of alternate test facilities is critically important. This document reviews the main theoretical work on proton testing of assemblies over the last twenty years. It augments this with review of reported data generated from the method and other data that applies to the limitations of the proton board-level test approach. When protons are incident on a system for test they can produce spallation reactions. From these reactions, secondary particles with linear energy transfers (LETs) significantly higher than the incident protons can be produced. These secondary particles, together with the protons, can simulate a subset of the space environment for particles capable of inducing single event effects (SEEs). The proton board-level test approach has been used to bound SEE rates, establishing a maximum possible SEE rate that a test article may exhibit in space. This bound is not particularly useful in many cases because the bound is quite loose. We discuss the established limit that the proton board-level test approach leaves us with. The remaining possible SEE rates may be as high as one per ten years for most devices. The situation is actually more problematic for many SEE types with deep charge collection. In cases with these SEEs, the limits set by the proton board-level test can be on the order of one per 100 days. Because of the limited nature of the bounds established by proton testing alone, it is possible that tested devices will have actual SEE sensitivity that is very low (e.g., fewer than one event in 1 × 10(exp 4) years), but the test method will only be able to establish the limits indicated above. This BoK further examines other benefits of proton board-level testing besides hardness assurance. The primary alternate use is the injection of errors. Error injection, or fault injection, is something that is often done in a simulation environment. But the proton beam has the benefit of injecting the majority of actual SEEs without risk of something being missed, and without the risk of simulation artifacts misleading the SEE investigation.

Guertin, Steven M.↗
NASA NTRS2019

Electrostatic Solar Sail: A Propellantless Propulsion Concept for an Interstellar Probe Mission

The propulsion of an electrostatic solar sail (E Sail) is obtained by extracting momentum from the solar wind through electrostatic repulsion of the positively charged solar wind ions (see Figure 1). The positively charged solar wind protons are deflected by the electric field created around the tethers.This electric field grows in diameter as the spacecraft moves away from the Sun, therefore the E Sail effective area grows. The growth of the E-Sail effective area allows the propulsive force to decrease as 1/r up to distances of 20 AU as it moves away from the Sun, unlike solar sail propulsion whose thrust decreases as 1/r 2 but only to distances of 5AU. This propulsive force is created without using propellant and, therefore, E-sail avoids both the mass and complexity of chemical rockets (that require large amounts of propellant, propellant storage tanks, plumbing, valves, and insulation).

DeStefano, Anthony M.↗
NASA NTRS1999

Proton Effects and Test Issues for Satellite Designers

Microelectronic and photonic systems in the natural space environment are bombarded by a variety of charged particles including electrons, trapped protons, cosmic rays, and solar particles (protons and other heavy ions). These incident particles cause both ionizing and non-ionizing effects when traversing a device, and the effects can be either transient or permanent. The vast majority of the kinetic energy of an incident proton is lost to ionization, creating the single event effects (SEES) and total ionizing dose (TID) effects. However, the small portion of energy lost in non-ionizing processes causes atoms to be removed from their lattice sites and form permanent electrically active defects in semiconductor materials. These defects, i.e., "displacement damage," can significantly degrade device performance. In general, most of the displacement damage effects in the natural space environment can be attributed to protons since they are plentiful and extremely energetic (and therefore not readily shielded against). For this reason, we consider only proton induced displacement damage in this course. (Nevertheless, we identify solar cells as an important example of a case where both electron and proton damage can be important since only very light shielding is feasible.) The interested reader is encouraged to explore the three previous NSREC and RADECS short courses which also treat displacement damage issues for satellite applications. Part A of this segment of the short course introduces the space environment, proton shielding issues, and requirements specifications for proton-rich environments. In order to exercise the displacement damage analysis tools for on-orbit performance predictions, the requirements document must provide the relevant proton spectra in addition to the usual total ionizing dose-depth curves. Ion-solid interactions and the nature of the displacement damage they generate have been studied extensively for over half a century, yet they still remain a subject of investigation. In this section, a description of the mechanisms by which displacement damage is produced will be followed by a summary of the major consequences for device performance in a space environment. Often the degradation of a device parameter can be characterized by a damage factor (measured in a laboratory using monoenergetic protons) that is simply the change in a particular electrical or optical parameter per unit proton fluence. In addition, we will describe the concept of a non-ionizing energy loss rate (NIEL) which quantifies that portion of the energy lost by an incident ion that goes into displacements. It has been calculated as a function of proton energy, and is analogous to (and has the same units as) the linear energy transfer (LET) for ionizing energy. We will discover that, to first order, the calculated NIEL describes the energy dependence of the measured device damage factors. This observation provides the basis for predicting proton induced device degradation in a space environment based on both the calculated NIEL and relatively few laboratory test measurements. The methodology of such on-orbit device performance predictions will be described, as well as the limitations. Several classes of devices for which displacement damage is a significant (if not the dominant) mode of radiation induced degradation will be presented.

Marshall, Cheryl J.↗
NASA NTRS1999

Proton Effects and Test Issues for Satellite Designers: Displacement Effects - Section 4

Microelectronic and photonic systems in the natural space environment are bombarded by a variety of charged particles including electrons, trapped protons, cosmic rays, and solar particles (protons and other heavy ions). These incident particles cause both ionizing and non-ionizing effects when traversing a device, and the effects can be either transient or permanent. The vast majority of the kinetic energy of an incident proton is lost to ionization, creating the single event effects (SEES) and total ionizing dose (TID) effects described in section IVA. However, the small portion of energy lost in non-ionizing processes causes atoms to be removed from their lattice sites and form permanent electrically active defects in semiconductor materials. These defects, i.e., "displacement damage," can significantly degrade device performance. In general, most of the displacement damage effects in the natural space environment can be attributed to protons since they are plentiful and extremely energetic (and therefore not readily shielded against). For this reason, we consider only proton induced displacement damage in this course. (Nevertheless, we identify solar cells as an important example of a case where both electron and proton damage can be important since only very light shielding is feasible.) The interested reader is encouraged to explore the three previous NSREC and RADECS short courses [Srou88a, Summ92, Hopk97] which also treat displacement damage issues for satellite applications. Part A of this segment of the short course introduces the space environment, proton shielding issues, and requirements specifications for proton-rich environments. In order to exercise the displacement damage analysis tools for on-orbit performance predictions, the requirements document must provide the relevant proton spectra in addition to the usual total ionizing dose-depth curves.

Marshall, Cheryl J.↗
DOE OSTI2024

PILBCP-IL Composite Ionomers for High Current Density Performance

Wide-spread commercialization of fuel cell electric vehicles using proton exchange membrane fuel cell (PEMFC) power sources requires that several existing limitations be addressed. These include: (1) a reduction in platinum (Pt) loading in the catalytic electrodes, (2) improvements in reactant and electronic mobility throughout the catalytic electrodes, (3) reduction in the reliance on materials derived from polluting “forever chemicals”, and (4) a significant improvement in the operational longevity of catalytic electrode components. In this project, a team of two universities, Drexel University and Texas A&M University, one national lab, National Renewable Energy Laboratory, and one company, General Motors, collaborated to develop a new cathode ionomer chemistry that would address these limitations and result in an improvement in performance over existing ionomer materials. The key technology developed through this collaborative project was a composite cathode ionomer encompassing an ionic liquid interlayer between Pt catalysts and a sulfonated polymerized ionic liquid block co-polymer (S-PILBCP) that possess the orthogonal properties of protonic conductivity and ionic liquid enhanced kinetics and durability (see schematic in Figure 1). The composite S-PILBCP ionomer eliminates many of the existing issues with perfluorosulfonic acid-based ionomers including active site blocking by sulfonate specific adsorption, restricted O 2 transport through ionomer films, limited humidity tolerance and active area loss for carbon pore confined catalyst particles, and use of polluting “forever chemicals”. Following successful integration of the developed composite ionic liquid into a PEMFC cathode catalyst layer, we demonstrate enhanced performance over Nafion containing cathodes with Pt/C and PtCo/C at both low and high current density. The performance with our composite S-PILBCP ionomer meets the Department of Energy (DOE) targets for light duty vehicle applications

08 HYDROGEN↗
NASA NTRS1999

Space Environment Effects: Model for Emission of Solar Protons (ESP)--Cumulative and Worst-Case Event Fluences

The effects that solar proton events have on microelectronics and solar arrays are important considerations for spacecraft in geostationary and polar orbits and for interplanetary missions. Designers of spacecraft and mission planners are required to assess the performance of microelectronic systems under a variety of conditions. A number of useful approaches exist for predicting information about solar proton event fluences and, to a lesser extent, peak fluxes. This includes the cumulative fluence over the course of a mission, the fluence of a worst-case event during a mission, the frequency distribution of event fluences, and the frequency distribution of large peak fluxes. Naval Research Laboratory (NRL) and NASA Goddard Space Flight Center, under the sponsorship of NASA's Space Environments and Effects (SEE) Program, have developed a new model for predicting cumulative solar proton fluences and worst-case solar proton events as functions of mission duration and user confidence level. This model is called the Emission of Solar Protons (ESP) model.

Xapsos, M. A.↗
NASA NTRS1999

Space Environment Effects: Model for Emission of Solar Protons (ESP): Cumulative and Worst Case Event Fluences

The effects that solar proton events have on microelectronics and solar arrays are important considerations for spacecraft in geostationary and polar orbits and for interplanetary missions. Designers of spacecraft and mission planners are required to assess the performance of microelectronic systems under a variety of conditions. A number of useful approaches exist for predicting information about solar proton event fluences and, to a lesser extent, peak fluxes. This includes the cumulative fluence over the course of a mission, the fluence of a worst-case event during a mission, the frequency distribution of event fluences, and the frequency distribution of large peak fluxes. Naval Research Laboratory (NRL) and NASA Goddard Space Flight Center, under the sponsorship of NASA's Space Environments and Effects (SEE) Program, have developed a new model for predicting cumulative solar proton fluences and worst-case solar proton events as functions of mission duration and user confidence level. This model is called the Emission of Solar Protons (ESP) model.

Xapsos, M. A.↗
NASA NTRS2018

Lessons and Recommendations for Board-Level Testing with Protons

Protons with sufficiently high energy, provided in a broad field covering on the order of 0.1m2 can be used to perform board-level testing for single event effects (SEE). NASA has used this approach for board-level testing over the last 20 years. Although many difficulties inherent in SEE testing are simplified when using a board-level test, including reduced cost, the method is inherently risky because of the limited value of the collected data and the potential to make critical mistakes when performing SEE testing this way, leading to data of less value. Historically, NASA’s approach to proton board-level testing has been limited to lower criticality applications. However, with users both inside and outside NASA using this method for higher levels of mission assurance, we have put together a set of lessons and recommendations to improve the value of data collected using this method. Focus areas covered include test preparation, test execution, and interpretation of results.

Guertin, Steven M.↗
NASA NTRS2012

Space Environmental Effects Testing Capability at the Marshall Space Flight Center

Understanding the effects of the space environment on materials and systems is fundamental and essential for mission success. If not properly understood and designed for, the effects of the environment can lead to degradation of materials, reduction of functional lifetime, and system failure. In response to this need, the Marshall Space Flight Center has developed world class Space Environmental Effects (SEE) expertise and test facilities to simulate the space environment. Capabilities include multiple unique test systems comprising the most complete SEE testing capability available. These test capabilities include charged particle radiation (electrons, protons, ions), ultraviolet radiation (UV), vacuum ultraviolet radiation (VUV), atomic oxygen, plasma effects, space craft charging, lunar surface and planetary effects, vacuum effects, and hypervelocity impacts as well as the combination of these capabilities. In addition to the uniqueness of the individual test capabilities, MSFC is the only NASA facility where the effects of the different space environments can be tested in one location. Combined with additional analytical capabilities for pre- and post-test evaluation, MSFC is a one-stop shop for materials testing and analysis. The SEE testing and analysis are performed by a team of award winning experts nationally recognized for their contributions in the study of the effects of the space environment on materials and systems. With this broad expertise in space environmental effects and the variety of test systems and equipment available, MSFC is able to customize tests with a demonstrated ability to rapidly adapt and reconfigure systems to meet customers needs. Extensive flight experiment experience bolsters this simulation and analysis capability with a comprehensive understanding of space environmental effects.

DeWittBurns, H.↗
NASA NTRSDate not supplied

NAIRAS Model Nowcasting and Forecasting of the Aviation Radiation Environment

The Nowcast of Aerospace Ionizing RAdiation System (NAIRAS) predicts dosimetric quantities for quantifying human radiation exposure and differential/integral flux/fluence quantities for assessing single event effects (SEE) in avionic systems from galactic cosmic rays (GCR), trapped inner belt protons, and solar energetic particle (SEP) events from the Earth’s surface to the space environment. Real-time predictions of the aviation radiation environment are available at NASA Goddard Space Flight Center’s Community Coordinated Modeling Center (CCMC) integrated Space Weather Analysis (iSWA) data feeds and cygnets, and a run-on-request (RoR) capability has also been deployed at CCMC. Recent model improvements include a more accurate atmospheric ionizing radiation transport methodology and more robust and reliable SEP nowcast dose predictions. In addition, preliminary results of SEP dose forecasts are shown by coupling the University of Malaga Solar Energetic Particle (UMASEP) model of integral proton flux forecasts with the NAIRAS model. These model updates and improvements are presented, and results are shown for aircraft, high-latitude balloon, and low-Earth orbit flights during quiescent and solar-geomagnetic disturbed conditions. Model comparisons with flight measurements are also shown.

NAIRAS↗
NASA NTRS2018

The Probability of False Go/No-Go Determined by GOES Proton Flux: Proposed Launch Constraints for Avoiding Damaging Solar Energetic Particle Events

The space environment is full of harmful radiation and high energy particles that can cause damage to materials and affect computer systems by e.g., single event effects (SEEs), total ionizing dose (TID), etc. There are three main sources of high energy particles: Trapped radiation in Earth's Van Allen belts (electrons and protons); Solar energetic particles (SEPs) (protons and heavy ions); Galactic cosmic rays (GCRs) (protons and heavy ions). In this study, we focus on the SEPs and their time series and energy spectrum to quantify probabilities of launch go/no-go. The SEPs originate from solar particle events (SPEs) that are associated with a solar flare and/or a coronal mass ejection (CME). These events are difficult to predict. Recent work has been done on these prediction techniques. The Geostarionary Operational Environmental Satellite (GOES) has been observing SEPs for decades. The greater than 10 megaelectronvolt proton flux is shown in Figure 2 since 1986. The SEPs are influenced by the 11-year solar cycle and typically come from active regions on the Sun.

DeStefano, Anthony M.↗
NASA NTRS1999

New Trapped Proton Model

The space radiation environment is of crucial importance to all manned and unmanned space activities. As spacecraft and their systems and instruments have become more sophisticated, they have also become more susceptible to the space radiation environment. New requirements for the radiation models have made it evident that the existing models are now inadequate. NASA, ESA, and other agencies are consequently working to develop new models. In particular, under NASA's Space Environments and Effects (SEE) program, a new model has been developed which correctly models the solar cycle variations in the trapped proton flux at low altitudes. This model is now being merged with the U.S. Air Force model based on data from the CRRES satellite; the resulting model will be a replacement for the current models. In this paper we discuss the models currently available and their drawbacks. We also discuss the development of the new model and present some preliminary results.

Huston, Stuart L.↗
NASA NTRS1992

An observation of proton-induced latchup

Proton-induced latchup in a CMOS microprocessor known to have a very low heavy-ion-induced latchup threshold LET was observed. The latchup cross section vs. proton energy for three different bias conditions is displayed. Average measures of latchup current within an 11-ms window following the onset of latchup are provided, as a function of bias and incident proton energy. These data can be interpreted in terms of the present understanding of SEE phenomena.

Nichols, Donald K.↗
NASA NTRS2006

Electron-Impact Ionization and Dissociative Ionization of Biomolecules

It is well recognized that secondary electrons play an important role in radiation damage to humans. Particularly important is the damage of DNA by electrons, potentially leading to mutagenesis. Molecular-level study of electron interaction with DNA provides information on the damage pathways and dominant mechanisms. Our study of electron-impact ionization of DNA fragments uses the improved binary-encounter dipole model and covers DNA bases, sugar phosphate backbone, and nucleotides. An additivity principle is observed. For example, the sum of the ionization cross sections of the separate deoxyribose and phosphate fragments is in close agreement with the C3(sup prime)- and C5 (sup prime)-deoxyribose-phospate cross sections, differing by less than 5%. Investigation of tandem double lesion initiated by electron-impact dissociative ionization of guanine, followed by proton reaction with the cytosine in the Watson-Crick pair, is currently being studied to see if tandem double lesion can be initiated by electron impact. Up to now only OH-induced tandem double lesion has been studied.

Huo, Winifred M.↗
NASA NTRS2002

SEE and TID extension testing of the Xilinx XQR18V04 4Mbit radiation hardened configuration PROM

The XQR18V04 was evaluated for single event upset rates using proton and heavy ions. The PROM was demonstrated to be immune to latch-up, as well as to static upset in the flash memory cells, to an LET > 125 MeV/mg/cmz (effective). The PROM was also tested in a dynamic mode, which revealed three distinct error modes: Read Bit Errors, Address Errors, and a Single Event Functional Interrupt (SEW which affected the data output drivers. Saturation cross-sections, and onset thresholds, for these errorinodes were measured at the heavy ion facility at Texas A&M University, and the proton facility at UC Davis. Additional testing was performed at UC Davis and the Cobalt 60 source at McClellan Air Force Base to examine the effect to TID life as a function of power biasing. The PROM demonstrated a 100% improvement in total TID life with an 84% percent decrease in device usage.

FPGA Virtex II SEU↗