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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 73 records · Page 4
All sourcesNASA NTRSDOE OSTI
NASA NTRS2017

High Temperature Ultrasonic Probe and Pulse-Echo Probe Mounting Fixture for Testing and Blind Alignment on Steam Pipes

A high temperature ultrasonic probe and a mounting fixture for attaching and aligning the probe to a steam pipe using blind alignment. The high temperature ultrasonic probe includes a piezoelectric transducer having a high temperature. The probe provides both transmitting and receiving functionality. The mounting fixture allows the high temperature ultrasonic probe to be accurately aligned to the bottom external surface of the steam pipe so that the presence of liquid water in the steam pipe can be monitored. The mounting fixture with a mounted high temperature ultrasonic probe are used to conduct health monitoring of steam pipes and to track the height of condensed water through the wall in real-time.

Bar-Cohen, Yoseph↗
DOE OSTI2018

Techniques for controlling distance between a sample and sample probe while such probe liberates analyte from a sample region for analysis with a mass spectrometer

A system includes a mass spectrometer and associated sample interfacing equipment. The sample interfacing equipment includes a platform structured to support a sample thereon, a fluid source, a high voltage source, a dispensing probe electrically coupled to the high voltage source and defining a fluid dispensing passage therethrough, a collection probe defining a collection passage therethrough, a sensing arrangement coupled to the dispensing probe, and control logic responsive to the sensing arrangement to control distance between the dispensing probe and the sample. The dispensing probe facilitates formation of one or more ionized sample analytes when dispensing the fluid through the dispensing passage proximate to the sample on the platform. The collecting probe receives at least some of the one or more ionized sample analytes to pass through the collection passage into the mass spectrometer for analysis.

47 OTHER INSTRUMENTATION↗
DOE OSTI2018

Atom probe tomography analysis of the reference Zircon GJ-1: An interlaboratory study

In recent years, atom probe tomography (APT) has been increasingly used to study minerals, and in particular the mineral zircon. Zircon (ZrSiO 4 ) is ideally suited for geochronology by utilising the U-Th-Pb isotope systems, and trace element compositions are also widely used to constrain petrogenetic processes. However, while standard geoanalytical techniques provide information at micron scale lengths, the unique combination of chemical/isotopic sensitivity and spatial resolution of APT allows compositional and textural measurements at the nanoscale. This round robin study aims to define the reproducibility of APT data across research facilities and assess the role of different aspects of the atom probe workflow on reproducibility. This is essential to allow correct evaluation of APT results and full utilization of this emerging technique within the geoscience community. In this study, nine samples from the same homogemeous, GJ-1/87 zircon reference grain were sent to nine APT institutes in Europe, USA, Canada and Australia. Each institute conducted three different rounds of APT analyses: using (i) unconstrained analysis parameters, [1] pre-defined analysis parameters, and (iii) a data analysis exercise. Data such as the measured composition, acquisition parameters, or mass spectrum peak identifications, were recorded and analyzed. We observe a significant variation in the measured composition across this round robin study as well as the number of trace elements identified. These differences are thought to directly result from the user's choice of peak identification, ranging and background correction model. The type of instrument does not seem to be a critical factor. Consequently, comparison of absolute trace element data on zircon using APT between laboratories is only valid if the same workflow has been ensured.

round robin, atom probe tomography, reference zirc↗
DOE OSTI2013

Langmuir probe measurements in a time-fluctuating-highly ionized non-equilibrium cutting arc: Analysis of the electron retarding part of the time-averaged current-voltage characteristic of the probe

This work describes the application of Langmuir probe diagnostics to the measurement of the electron temperature in a time-fluctuating-highly ionized, non-equilibrium cutting arc. The electron retarding part of the time-averaged current-voltage characteristic of the probe was analysed, assuming that the standard exponential expression describing the electron current to the probe in collision-free plasmas can be applied under the investigated conditions. A procedure is described which allows the determination of the errors introduced in time-averaged probe data due to small-amplitude plasma fluctuations. It was found that the experimental points can be gathered into two well defined groups allowing defining two quite different averaged electron temperature values. In the low-current region the averaged characteristic was not significantly disturbed by the fluctuations and can reliably be used to obtain the actual value of the averaged electron temperature. In particular, an averaged electron temperature of 0.98 ± 0.07 eV (= 11400 ± 800 K) was found for the central core of the arc (30 A) at 3.5 mm downstream from the nozzle exit. This average included not only a time-average over the time fluctuations but also a spatial-average along the probe collecting length. The fitting of the high-current region of the characteristic using such electron temperature value together with the corrections given by the fluctuation analysis showed a relevant departure of local thermal equilibrium in the arc core.

36 MATERIALS SCIENCE↗
DOE OSTI2015

Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits

Knowledge on surface potential dynamics is crucial for understanding the performance of modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin-probe force microscopy that enables a quantitative measurement of dynamic surface potentials at nanosecond-time and nanometer-length scales. Also, we investigate the performance of pump-probe Kelvin-probe force microscopy with respect to the relevant experimental parameters. We exemplify a measurement on an organic field effect transistor that verifies the undisturbed functionality of our pump-probe approach in terms of simultaneous and quantitative mapping of topographic and electronic information at a high lateral and temporal resolution.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
NASA NTRS1971

A fixed bias, floating double probe technique with simple Langmuir probe characteristics

A new floating double-probe method is presented which has advantages over other floated-probe systems previously described in literature. The method utilized two electrodes, one of constant area and the other with a variable area. The two-electrode configuration is separated by a fixed bias voltage. The current-voltage characteristics of the new technique, which are generated by varying the area of the one electrode, are identical to those of a simple Langmuir probe, thus coupling all the advantages of a floated-probe system with the simple analysis scheme generally applied to the Langmuir probe for the determination of plasma density and temperature.

Szuszczewicz, E. P.↗
NASA NTRS1972

Fixed-bias floating double-probe technique with simple Langmuir-probe characteristics.

A new floating double-probe method is presented which has advantages over other floated-probe systems heretofore described in the literature. The method utilizes two electrodes, one of constant area and the other with a variable area, and the two-electrode configuration is separated by a fixed bias voltage. The current-voltage characteristics of the new technique, which are generated by varying the area of one electrode, are identical to those of a simple Langmuir probe, thus coupling all the advantages of a floated-probe system with the simple analysis scheme generally applied to the Langmuir probe for the determination of plasma density and temperature.

Szuszczewicz, E. P.↗
NASA NTRS1984

Evaluation of a flow direction probe and a pitot-static probe on the F-14 airplane at high angles of attack and sideslip

The measurement performance of a hemispherical flow-angularity probe and a fuselage-mounted pitot-static probe was evaluated at high flow angles as part of a test program on an F-14 airplane. These evaluations were performed using a calibrated pitot-static noseboom equipped with vanes for reference flow direction measurements, and another probe incorporating vanes but mounted on a pod under the fuselage nose. Data are presented for angles of attack up to 63, angles of sideslip from -22 deg to 22 deg, and for Mach numbers from approximately 0.3 to 1.3. During maneuvering flight, the hemispherical flow-angularity probe exhibited flow angle errors that exceeded 2 deg. Pressure measurements with the pitot-static probe resulted in very inaccurate data above a Mach number of 0.87 and exhibited large sensitivities with flow angle.

Larson, T. J.↗
NASA NTRS2001

Carbon Nanotube Tip Probes: Stability and Lateral Resolution in Scanning Probe Microscopy and Application to Surface Science to Semiconductors

In this paper we present results on the stability and lateral resolution capability of carbon nanotube (CNT) scanning probes as applied to atomic force microscopy (AFM). Surface topography images of ultra-thin films (2-5 nm thickness) obtained with AFM are used to illustrate the lateral resolution capability of single-walled carbon nanotube probes. Images of metal films prepared by ion beam sputtering exhibit grain sizes ranging from greater than 10 nm to as small as approximately 2 nm for gold and iridium respectively. In addition, imaging stability and lifetime of multi-walled carbon nanotube scanning probes are studied on a relatively hard surface of silicon nitride (Si3N4). AFM images Of Si3N4 surface collected after more than 15 hrs of continuous scanning show no detectable degradation in lateral resolution. These results indicate the general feasibility of CNT tips and scanning probe microscopy for examining nanometer-scale surface features of deposited metals as well as non-conductive thin films. AFM coupled with CNT tips offers a simple and nondestructive technique for probing a variety of surfaces, and has immense potential as a surface characterization tool in integrated circuit manufacturing.

Nguyen, Cattien V.↗
NASA NTRS1999

Langmuir Probe Distortions and Probe Compensation in an Inductively Coupled Plasma

In many RF discharges, Langmuir probe measurements are usually made against a background of sinusoidal (and not so sinusoidal) fluctuations in the plasma parameters such as the plasma potential (Vp), the electron number density (ne), and the electron temperature (Te). The compensation of sinusoidal fluctuations in Vp has been extensively studied and is relatively well understood. Less attention has been paid to the possible distortions introduced by small fluctuations in plasma density and/or plasma temperature, which may arise in the sheath and pre-sheath regions of RF discharges. Here, we present the results of a model simulation of probe characteristics subject to fluctuations in both Vp and ne. The modeling of probe distortion due to possible fluctuations in Te is less straightforward. A comparison is presented of calculations with experimental measurements using a compensated and uncompensated Langmuir probe in an inductively coupled GEC reference cell plasma, operating on Ar and Ar/CF4 mixtures. The plasma parameters determined from the compensated probe characteristics are compared to previous measurements of others made in similar discharges, and to our own measurements of the average electron density derived from electrical impedance measurements.

Ji, J. S.↗
DOE OSTI2013

A Level Set Evaporation Model for Heterogeneous Atom Probe Tip

With the development of local electrode atom probe tomography (LEAP), the materials systems feasible for atomic structure determination has expanded from predominantly metals to include heterogeneous materials with complex structure and compositions. This makes the 3D atomic structure determination possible for most energy materials in battery, fuel cell, semiconductor, and nuclear applications. Atom probe tomography (APT) has been utilized to study multiphase materials with segregation and interface problems. The unique and quantitative information retrieved from APT can provide a foundation for the study of kinetic pathways, nanoscale composition mapping, multilayer interfacial segregation, dislocations and grain boundaries. However, a new challenge surfaces when the materials systems expand into heterogeneous materials: the traditional structure reconstruction introduces false magnification and large artifacts due to the underlying assumption of uniform and isotropic evaporation.

Atom probe, heterogeneous structure, evporation mo↗
DOE OSTI2012

Heavy ion beam probe advances from the first installation of the diagnostic on an RFP (invited)

Heavy ion beam probes have been installed on a variety of toroidal devices, but the first and only application on a reversed field pinch is the diagnostic on the Madison Symmetric Torus. Simultaneous measurements of spatially localized equilibrium potential and fluctuations of density and potential, previously inaccessible in the core of the reversed field pinch (RFP), are now attainable. These measurements reflect the unique strength of the heavy ion beam probe (HIBP) diagnostic. They will help determine the characteristics and evolution of electrostatic fluctuations and their role in transport, and determine the relation of the interior electric field and flows. Many aspects of the RFP present original challenges to HIBP operation and inference of plasma quantities. The magnetic field contributes to a number of the issues: the comparable magnitudes of the toroidal and poloidal fields and edge reversal result in highly three-dimensional beam trajectories; partial generation of the magnetic field by plasma current cause it and hence the beam trajectories to vary with time; and temporal topology and amplitude changes are common. Associated complications include strong ultraviolet radiation and elevated particle losses that can alter functionality of the electrostatic systems and generate noise on the detectors. These complexities have necessitated the development of new operation and data analysis techniques: the implementation of primary and secondary beamlines, adoption of alternative beam steering methods, development of higher precision electrostatic system models, refinement of trajectory calculations and sample volume modeling, establishment of stray particle and noise reduction methods, and formulation of alternative data analysis techniques. These innovative methods and the knowledge gained with this system are likely to translate to future HIBP operation on large scale stellarators and tokamaks.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2012

Optical diagnostic suite (schlieren, interferometry, and grid image refractometry) on OMEGA EP using a 10-ps, 263-nm probe beam

A 10-ps, 263-nm (4{omega}) laser is being built to probe plasmas produced on the OMEGA EP [J. H. Kelly, L. J. Waxer, V. Bagnoud, I. A. Begishev, J. Bromage, B. E. Kruschwitz, T. E. Kessler, S. J. Loucks, D. N. Maywar, R. L. McCrory et al., J. Phys. IV France 133, 75-80 (2006)]. A suite of optical diagnostics (schlieren, interferometry, and grid image refractometry) has been designed to diagnose and characterize a wide variety of plasmas. Light scattered by the probe beam is collected by an f/4 catadioptric telescope and a transport system is designed to image with a near-diffraction-limited resolution ({approx}1 -{mu}m full width at half maximum) over a 5-mm field of view to a diagnostic table. The transport system provides a contrast greater than 1 : 10{sup 4} with respect to all wavelengths outside of the 263 {+-} 2 nm measurement range.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2015

Vibrational dynamics of aqueous hydroxide solutions probed using broadband 2DIR spectroscopy

We employed ultrafast transient absorption and broadband 2DIR spectroscopy to study the vibrational dynamics of aqueous hydroxide solutions by exciting the O–H stretch vibrations of the strongly hydrogen-bonded hydroxide solvation shell water and probing the continuum absorption of the solvated ion between 1500 and 3800 cm{sup −1}. We observe rapid vibrational relaxation processes on 150–250 fs time scales across the entire probed spectral region as well as slower vibrational dynamics on 1–2 ps time scales. Furthermore, the O–H stretch excitation loses its frequency memory in 180 fs, and vibrational energy exchange between bulk-like water vibrations and hydroxide-associated water vibrations occurs in ∼200 fs. The fast dynamics in this system originate in strong nonlinear coupling between intra- and intermolecular vibrations and are explained in terms of non-adiabatic vibrational relaxation. These measurements indicate that the vibrational dynamics of the aqueous hydroxide complex are faster than the time scales reported for long-range transport of protons in aqueous hydroxide solutions.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2024

MISIP: a data standard for the reuse and reproducibility of any stable isotope probing-derived nucleic acid sequence and experiment

DNA/RNA-stable isotope probing (SIP) is a powerful tool to link in situ microbial activity to sequencing data. Every SIP dataset captures distinct information about microbial community metabolism, process rates, and population dynamics, offering valuable insights for a wide range of research questions. Data reuse maximizes the information derived from the labor and resource-intensive SIP approaches. Yet, a review of publicly available SIP sequencing metadata showed that critical information necessary for reproducibility and reuse was often missing. Here, we outline the Minimum Information for any Stable Isotope Probing Sequence (MISIP) according to the Minimum Information for any (x) Sequence (MIxS) framework and include examples of MISIP reporting for common SIP experiments. Our objectives are to expand the capacity of MIxS to accommodate SIP-specific metadata and guide SIP users in metadata collection when planning and reporting an experiment. The MISIP standard requires 5 metadata fields—isotope, isotopolog, isotopolog label, labeling approach, and gradient position—and recommends several fields that represent best practices in acquiring and reporting SIP sequencing data (e.g., gradient density and nucleic acid amount). The standard is intended to be used in concert with other MIxS checklists to comprehensively describe the origin of sequence data, such as for marker genes (MISIP-MIMARKS) or metagenomes (MISIP-MIMS), in combination with metadata required by an environmental extension (e.g., soil). The adoption of the proposed data standard will improve the reuse of any sequence derived from a SIP experiment and, by extension, deepen understanding of in situ biogeochemical processes and microbial ecology.

Simpson, Abigayle↗
DOE OSTI2019

Ultrafast probes at the interfaces of solar energy conversion materials

Ultrafast carrier dynamics at interfaces plays a major role in governing solar energy conversion efficiency in solar conversion systems, especially in solar cells and photoelectrochemical devices. Here, we discuss recent advances in ultrafast spectroscopic probes to understand the dynamics at such interfaces. Transient reflectance (TR) enables monitoring of the surface carriers that are within ~10 nm of the surface or interface of interest. Crucial parameters such as surface recombination velocity and carrier diffusion can be determined. When a strong surface or interfacial field is present the reflectance spectrum will exhibit Franz–Kelydesh oscillations. Monitoring the transient formation or decay of such oscillations informs about the interfacial field and is referred to as transient photoreflectance (TPR). Such fields are helpful in designing systems in order to move carriers away from surfaces where photocorrosion can occur and towards catalytic surfaces. Finally, we discuss transient infrared attenuated total reflection (TATR) to probe the ultrafast reaction intermediates in a photo-driven chemical reaction.

14 SOLAR ENERGY↗