Study of failure and reliability in microelectronics devices Second quarterly report
Failure analyses on microelectronic devices subjected to temperature-stress cycling, and life testing
MICROMINIATURIZED ELECTRONIC EQUIPMENT↗
SEARCH · Engineering Papers
Results for “Microelectronics”
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Reparable, high-density microelectronic module provides effective heat sink
Reparable modular system is used for packaging microelectronic flat packs and miniature discrete components. This three-dimensional compartmented structure incorporates etched phosphor bronze sheets and frames with etched wire conductors. It provides an effective heat sink for electric power dissipation in the absence of convective cooling means.
Carlson, K. J.↗
Study of failure and reliability in microelectronic devices
Failure modes and mechanisms in integrated microcircuits and other microelectronic devices
Muncheryan, H. M.↗
Development of ion implantation techniques for microelectronics
Ion implementation for microelectronics
Dunlap, H. L.↗
NASA microelectronics data bank pilot program. Volume 2 - Program description
Microelectronics data bank pilot program, with directory and indexes on monolithic microcircuits
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NASA microelectronics data bank pilot program. Volume 1 - Management summary and technical evaluation
Pilot test evaluation of microelectronics data bank response to operational communication
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Characterization of ceramic materials for microelectronic applications
Barium titanate ceramic materials applications in microelectronics
Mountvala, A. J.↗
Microelectronic device data handbook. Volume 1 - Text
Microelectronic device data handbook /text/
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Microelectronic device data handbook. Volume 2 - Manufacturer and specific device information
Microelectronic device data handbook /manufacturer and specific device information/
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High-speed micropower microelectronic logic circuits Final technical documentary report, 18 May 1967 - 18 Jun. 1968
High speed micropower microelectronic transistor logic circuits in integrated form
Stehlin, R.↗
Microelectronics in space
Reliability control problems of high temperature microelectronics
Dunlap, W. C.↗
Microelectronic Data and Control Transmission System for Dynamic Wind-tunnel Testing
Microelectronic data and remote control system for dynamic transonic wind tunnel testing
Nichols, C. D.↗
An independent management critique of the NASA microelectronic reliability program
Probable effectiveness of NASA microelectronic reliability program and data bank services
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Microelectronics on the Applications Technology Satellite.
Reliability, handling and packaging of microelectronic submodules used in integrated circuits on Applications Technology Satellite
Van Allen, R. L.↗
Microelectronic oscillator, 2
Microelectronic oscillator uses a bipolar transistor to circumvent the problem of developing suitable inductors for lower frequencies. The oscillator is fabricated by hybrid thin film techniques or by monolithic construction. Discrete microminiature components may also be employed.
Kleinberg, L. L.↗
Microelectronic oscillator
Bipolar transistor operated in a grounded base configuration is used as the inductor in a microelectronic oscillator. This configuration is employed using thin-film hybrid technology and is also applicable to monolithic technology.
Kleinberg, L. L.↗
Establishment of quality and reliability standards and development of screening techniques for MOS microelectronic devices Final report
Quality and reliability standard development and screening test results for MOS microelectronic devices
Drum, D.↗
Study of failure and reliability of microelectronics devices Quarterly report, 1 Jul. - 30 Sep. 1968
Environmental tests on microelectronic devices having surface defects
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