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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 73 records · Page 4
All sourcesNASA NTRSDOE OSTI
DOE OSTI2026

WFSUITE: A PYTHON SOFTWARE SUITE FOR X-RAY WAVEFRONT SENDING AND AT-WAVELENGTH METROLOGY

SF-26-025 WFSuite is a graphical and command-line toolkit for coded-mask-based X-ray wavefront sensing and phase reconstruction at synchrotron beamlines. It integrates analysis tools for both relative and absolute speckle-based measurements. In the relative metrology module, WFSuite implements Wavelet-transform-based X-ray Speckle Tracking (WXST) and Wavelet-transform-based Speckle Vector Tracking (WSVT) methods to retrieve differential phase and wavefront distortions by comparing speckle patterns recorded with and without the test sample. In the absolute phase module, WFSuite uses coded-mask speckle patterns and replaces the measured reference with a numerically simulated one, enablingsingle-shot wavefront reconstruction using either WXST or a neural-network-based method (SPINNet).

Rebuffi, Luca [Argonne National Laboratory (ANL), ↗
DOE OSTI2021

Synchrotron X-ray metrology of dopant distribution and oxidation state in high pressure CVD grown TM 2+ :ZnSe optical fibers

High pressure chemical vapor deposition (HPCVD) has shown to be a promising method for producing Cr 2+ :ZnSe and Fe 2+ :ZnSe mid-IR optical fiber lasers. The oxidation state of the dopants and their spatial homogeneity are critical for the characterization of effective fiber laser performance; however, this is challenging for small fiber cores and small doping concentrations. We demonstrate using synchrotron micro X-ray fluorescence (XRF) mapping to study the distribution of the dopants throughout the fiber cross-sections. Furthermore, we study the local chemical environment of these unique fiber structures using micro X-ray near edge absorption spectroscopy (XANES). Our study reveals that transition metal doped ZnSe deposited using HPCVD has nanoscale dopant aggregation although the material is chemically identical to the commercially produced diffusion doped laser crystals, as indicated by the presence +2 oxidation state of the dopants. This work demonstrates the power of synchrotron-based X-ray techniques for use as metrology tools for improving the performance of laser materials in fiber geometry.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2022

Nonlocal subpicosecond delay metrology using spectral quantum interference

Precise knowledge of position and timing information is critical to support elementary protocols such as entanglement swapping on quantum networks. While approaches have been devised to use quantum light for such metrology, they largely rely on time-of-flight (ToF) measurements with single-photon detectors and, therefore, are limited to picosecond-scale resolution owing to detector jitter. In this work, we demonstrate an approach to distributed sensing that leverages phase modulation to map changes in the spectral phase to coincidence probability, thereby overcoming the limits imposed by single-photon detection. By extracting information about the joint biphoton phase, we measure a generalized delay—the difference in signal–idler arrival, relative to local radio frequency (RF) phase modulation. For nonlocal ranging measurements, we achieve (2$σ$) precision of ±0.04 ps and for measurements of the relative RF phase, (2$σ$) precision of ±0.7°. We complement this fine timing information with ToF data from single-photon time-tagging to demonstrate absolute measurement of time delay. By relying on off-the-shelf telecommunications equipment and standard quantum resources, this approach has the potential to reduce overhead in practical quantum networks.

42 ENGINEERING↗
DOE OSTI2022

Quantum enhanced metrology in the search for fundamental physical phenomena

These notes summarize lectures given at the 2019 Les Houches summer school on Quantum Information Machines. They describe and review an application of quantum metrology concepts to searches for ultralight dark matter. In particular, for ultralight dark matter that couples as a weak classical force to a laboratory harmonic oscillator, quantum squeezing benefits experiments in which the mass of the dark matter particle is unknown. This benefit is present even if the oscillatory dark matter signal is much more coherent than the harmonic oscillator that it couples to, as is the case for microwave frequency searches for dark matter axion particles.

Lehnert, Konrad↗
DOE OSTI2021

Radiation Transport Simulation of the Sulfur Counting System in the Radiation Metrology Laboratory (RML)

At the request of staff members from the Radiation Metrology Laboratory (RML), a series of Monte Carlo radiation transport calculations were performed using two different models of the detector geometry of the RMLs sulfur counting system. The fraction of electrons from each β-decay of 32 P in the sulfur pellet that enter the window of the sulfur counting system was calculated with both MCNP and ITS. In addition, the differential energy distributions of the electrons entering the counting system window were computed. There was significant agreement between the integral and differential quantities calculated by the two transport codes. Summary tables are for the integral efficiency values are found in the body of the report.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
DOE OSTI2020

Metrology of a Focusing Capillary Using Optical Ptychography

The focusing property of an ellipsoidal monocapillary has been characterized using the ptychography method with a 405 nm laser beam. The recovered wavefront gives a 12.5×10.4μm 2 focus. The reconstructed phase profile of the focused beam can be used to estimate the height error of the capillary surface. The obtained height error shows a Gaussian distribution with a standard deviation of 1.3 μm. This approach can be used as a quantitative tool for evaluating the inner functional surfaces of reflective optics, complementary to conventional metrology methods.

36 MATERIALS SCIENCE↗
DOE OSTI2022

Quantum metrology of low frequency electromagnetic modes with frequency upconverters

We describe the RF Quantum Upconverter (RQU) and describe its application to quantum metrology of electromagnetic modes between dc and the Very High Frequency band (VHF) (≲300MHz). The RQU uses a Josephson interferometer made up of superconducting loops and Josephson junctions to implement a parametric interaction between a low-frequency electromagnetic mode (between dc and VHF) and a mode in the microwave C Band (~ 5GHz), analogous to the radiation pressure interaction between electromagnetic and mechanical modes in cavity optomechanics. The RQU can operate as a quantum-limited op-amp, or use protocols from optomechanics to implement non-classical measurement protocols equivalent to those used in cavity optomechanics, including back-action evading (BAE) measurements, sideband cooling, and two-mode squeezing. Furthermore, these protocols enable experiments using dc-VHF electromagnetic modes as quantum sensors.

Kuenstner, Stephen E.↗
DOE OSTI2021

Scalable multiphoton quantum metrology with neither pre- nor post-selected measurements

The quantum statistical fluctuations of electromagnetic fields establish a limit, known as the shot-noise limit, on the sensitivity of optical measurements performed with classical technologies. However, quantum technologies are not constrained by this shot-noise limit. In this regard, the possibility of using every photon produced by quantum sources of light to estimate small physical parameters, beyond the shot-noise limit, constitutes one of the main goals of quantum optics. Here, we experimentally demonstrate a scalable protocol for quantum-enhanced optical phase estimation across a broad range of phases, with neither pre- nor post-selected measurements. This is achieved through the efficient design of a source of spontaneous parametric downconversion in combination with photon-number-resolving detection. The robustness of two-mode squeezed vacuum states against loss allows us to outperform schemes based on N00N states, in which the loss of a single photon is enough to remove all phase information from a quantum state. In contrast to other schemes that rely on N00N states or conditional measurements, the sensitivity of our technique could be improved through the generation and detection of high-order photon pairs. This unique feature of our protocol makes it scalable. Furthermore, our work is important for quantum technologies that rely on multiphoton interference such as quantum imaging, boson sampling, and quantum networks.

36 MATERIALS SCIENCE↗
DOE OSTI2023

Self-consistent integrated modeling of combined hybrid discharge-laser produced plasma devices for extreme ultraviolet metrology

Discharge- and laser-produced plasma (DLPP) devices are being used as light sources for extreme ultraviolet (EUV) generation. A key challenge for both, DPP and LPP, is achieving sufficient brightness to support the throughput requirements of nanometrology tools. To simulate the environment of a hybrid DLPP device and optimize the EUV output, we have developed an integrated HEIGHTS-DLPP computer simulation package. The package integrates simulation of two evolving plasmas (DPP and LPP) and includes modeling of a set of integrated self-consistent processes: external power source and plasma energy balance, plasma resistive magnetohydrodynamics, plasma heat conduction, detailed radiation transport (RT), and laser absorption and refraction. We simulated and optimized DLPP devices using Xe gas as a target material. We synchronized the external circuit parameters, chamber gas parameters, and laser beam temporal and spatial profiles to achieve maximum EUV output. The full 3D Monte Carlo scheme was integrated for detailed RT and EUV output calculations in Xe using more than 3600 spectral groups. The modeling results are in good agreement with Julich Forschungszentrum experimental data. Theoretical models, developed and integrated into the HEIGHTS package, showed wide capabilities and flexibility. In conclusion, the models and package can be used for optimization of the experimental parameters and settings, investigation of DLPP devices with complex design, analyzing the impact of integrated spatial effects and working timeline arrangement on the final EUV output, and EUV source size, shape, and angular distribution.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
DOE OSTI2026

Correlation function metrology for warm dense matter: Recent developments and practical guidelines

X-ray Thomson scattering (XRTS) has emerged as a valuable diagnostic for matter under extreme conditions, as it captures the intricate many-body physics of the probed sample. Recent advances, such as the model-free temperature diagnostic of Dornheim et al. [Nat. Commun. 13 , 7911 (2022)], have demonstrated how much information can be extracted directly within the imaginary-time formalism. However, since the imaginary-time formalism is a concept often difficult to grasp, we provide here a systematic overview of its theoretical foundations and explicitly demonstrate its practical applications to temperature inference, including relevant subtleties. Furthermore, we present recent developments that enable the determination of the absolute normalization, Rayleigh weight, and density from XRTS measurements without reliance on uncontrolled model assumptions. Finally, we outline a unified workflow that guides the extraction of these key observables, offering a practical framework for applying the method to interpret experimental measurements.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
DOE OSTI2025

Covariant Quantum Error-Correcting Codes with Metrological Entanglement Advantage

Here, we show that a subset of the basis for the irreducible representations of a tensor-product SU(2) rotation forms a covariant approximate quantum error-correcting code with transversal U(1) logical gates. Generalizing previous work on “thermodynamic codes” to general local spin and different irreducible representations using only properties of the angular momentum algebra, we obtain bounds on the code inaccuracy under generic noise on any known 𝑑 sites, under independent and identically distributed noise, and under heralded 𝑑-local erasures. We demonstrate that this family of codes protects a probe state with quantum Fisher information surpassing the standard quantum limit when the sensing parameter couples to the generator of the U(1) logical gate.

quantum error correction↗
DOE OSTI2022

Quantum metrology timing limits of the Hong-Ou-Mandel interferometer and of general two-photon measurements

We examine the precision limits of Hong-Ou-Mandel (HOM) timing measurements, as well as precision limits applying to generalized two-photon measurements. As a special case, we consider the use of two-photon measurements using photons with variable bandwidths and frequency correlations. When the photon bandwidths are not equal, maximizing the measurement precision involves a trade-off between high interference visibility and strong frequency anticorrelations, with the optimal precision occurring when the photons share non-maximal frequency anticorrelations. We show that a generalized measurement has precision limits that are qualitatively similar to those of the HOM measurement whenever the generalized measurement is insensitive to the net delay of both photons. Finally, by examining the performance of states with more general frequency distributions, our analysis allows for engineering of the joint spectral amplitude for use in realistic situations, in which both photons may not have ideal spectral properties.

79 ASTRONOMY AND ASTROPHYSICS↗
DOE OSTI2021

Adaptive Circuit Learning for Quantum Metrology

Quantum sensing is an important application of emerging quantum technologies. We explore whether a hybrid system of quantum sensors and quantum circuits can surpass the classical limit of sensing. In particular, we use optimization techniques to search for encoder and decoder circuits that scalably improve sensitivity under given application and noise characteristics. Furthermore, our approach uses a variational algorithm that can learn a quantum sensing circuit based on platform-specific control capacity, noise, and signal distribution. The quantum circuit is composed of an encoder which prepares the optimal sensing state and a decoder which gives an output distribution containing information of the signal. We optimize the full circuit to maximize the Signal-to-Noise Ratio (SNR). Furthermore, this learning algorithm can be run on real hardware scalably by using the "parameter-shift" rule which enables gradient evaluation on noisy quantum circuits, avoiding the exponential cost of quantum system simulation. We demonstrate up to 13.12x SNR improvement over existing fixed protocol (GHZ), and 3.19x Classical Fisher Information (CFI) improvement over the classical limit on 15 qubits using IBM quantum computer. More notably, our algorithm overcomes the decreasing performance of existing entanglement-based protocols with increased system sizes.

42 ENGINEERING↗
DOE OSTI2021

Picometer sensitivity metrology for EUV absorber phase

With growing interest in EUV attenuated phase-shift masks due to their superior image quality for applications such as dense contact and pillar arrays, it is becoming critical to model, measure, and monitor the intensity and relative phase of multilayer and absorber reflections. We present a solution based on physical modeling of reflectometry data, which can achieve single picometer phase precision and sensitivity to changes in average film thickness below one atomic monolayer. We measure absorber and multilayer reflectivity to determine thin-film parameters with a multidimensional optimization and then acquire a new measurement of either multilayer or absorber to determine perturbations in surface contamination thickness. While it is difficult to assess the accuracy of the first step, the simplicity of the second step allows us to characterize our sensitivity to changes in contamination thickness. Thus, we apply this analysis using an initial set of measurements and repeated measurements after a period of storage. For the multilayer, the total contamination growth was 1068 pm, which occurred almost exclusively during storage (1085 pm) and decreased very slightly during repeated measurements (-17 pm). For the absorber, the behavior was quite different, with a total growth of 126 pm, which occurred much less during storage (28 pm) and primarily during repeated measurements (98 pm). Ultimately, the change in relative phase (absorber minus multilayer) was -0.86 deg for the multilayer and -1.12 deg for the absorber. We estimate the precision of the surface contamination measurement to be 3σ < 6 pm for measuring thickness and 3σ < 0.2 deg for measuring phase.

36 MATERIALS SCIENCE↗