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Described an optical hexapod metrology concept: a) Can work together with edge sensors; b) Can measure M1 - M2 distance and M1 global curvature. Swept-frequency laser metrology system: a) Absolute optical path length measurement (approx.1 micron); b) Relative optical path length measurement (approx.nm) Air turbulence is a concern for ground-based telescopes and needs further study.
Optical metrology system reliability during a prolonged space mission is often limited by the reliability of pump laser diodes. We developed a metrology laser pump module architecture that meets NASA SIM Lite instrument optical power and reliability requirements by combining the outputs of multiple single-mode pump diodes in a low-loss, high port count fiber coupler. We describe Monte-Carlo simulations used to calculate the reliability of the laser pump module and introduce a combined laser farm aging parameter that serves as a load-sharing optimization metric. Employing these tools, we select pump module architecture, operating conditions, biasing approach and perform parameter sensitivity studies to investigate the robustness of the obtained solution.
Modern synchrotron x-ray beamlines demand reflective optics with higher surface profile accuracy to achieve diffraction-limited focusing. This necessitates advanced metrology instruments capable of delivering repeatable measurements in the nanometer to sub-nanometer range. Slope ranges exceeding 15 mrad (0.86°) and greater pose significant challenges for mirror metrology using conventional interferometric methods. Here, to address this, we present a new relative angle determinable stitching interferometry instrument featuring a parallel flexure-based mechanical design. This approach enhances vibration and thermal stability while maintaining a compact and lightweight system. Initial measurements of a cylindrical mirror with a 16 m radius of curvature and a slope range of 5 mrad demonstrate nanometer-level repeatability. Comprehensive system characterization suggests the potential for achieving sub-nanometer repeatability with further refinement to the instrument.
Here, we establish a conservation law for the Quantum Fisher Information Matrix (QFIM) expressed as follows; when the QFIM is constructed from a set of observables closed under commutation, i.e., a Lie algebra, the spectrum of the QFIM is invariant under unitary dynamics generated by these same operators. Each Lie algebra therefore endows any quantum state with a fixed “budget” of metrological sensitivity—an intrinsic resource that we show, like optical squeezing in interferometry, cannot be amplified by symmetry-preserving operations. The Uhlmann curvature tensor naturally inherits the same symmetry group, and so quantum incompatibility is similarly fixed. As a result, a metrological analog to Liouville's theorem appears; statistical distances, volumes, and curvatures are invariant under the evolution generated by the Lie algebra. We discuss this as it relates to the quantum analogs of classical optimality criteria. This enables one to efficiently classify useful classes of quantum states at the level of Lie algebras through geometric invariants.
Concentrating Solar Power (CSP) requires precision mirrors, and these in turn require metrology systems to measure their optical slope. In this project we studied a color-based approach to the correspondence problem, which is the association of points on an optical target with their corresponding points seen in a reflection. This is a core problem in deflectometry-based metrology, and a color solution would enable important new capabilities. We modeled color as a vector in the [R,G,B] space measured by a digital camera, and explored a dual-image approach to compensate for inevitable changes in illumination color. Through a series of experiments including color target design and dual-image setups both indoors and outdoors, we collected reference/measurement image pairs for a variety of configurations and light conditions. We then analyzed the resulting image pairs by selecting example [R,G,B] pixels in the reference image, and seeking matching [R,G,B] pixels in the measurement image. Modulating a tolerance threshold enabled us to assess both match reliability and match ambiguity, and for some configurations, orthorectification enabled us to assess match accuracy. Using direct-direct imaging, we demonstrated color correspondence achieving average match accuracy values of 0.004 h, where h is the height of the color pattern. We found that wide-area two-dimensional and linear one-dimensional color targets outperformed hybrid linear/lateral gradient targets in the cases studied. Introducing a mirror degraded performance under our current techniques, and we did not have time to evaluate whether matches could be reliably achieved despite varying light conditions. Nonetheless, our results thus far are promising.
The proceedings of the fourth annual NASA Metrology and Calibration Workshop are presented. This workshop covered (1) review and assessment of NASA metrology and calibration activities by NASA Headquarters, (2) results of audits by the Office of Inspector General, (3) review of a proposed NASA Equipment Management System, (4) current and planned field center activities, (5) National Bureau of Standards (NBS) calibration services for NASA, (6) review of NBS's Precision Measurement and Test Equipment Project activities, (7) NASA instrument loan pool operations at two centers, (8) mobile cart calibration systems at two centers, (9) calibration intervals and decals, (10) NASA Calibration Capabilities Catalog, and (11) development of plans and objectives for FY 1981. Several papers in this proceedings are slide presentations only.
The status of the Langley Research Center's metrology program for fiscal year 1987 is presented. The NASA Metrology Information System, which was operational for the entire year, provided the majority of performance data describing work analysis, turnaround time, out-of-tolerance instrument data, and other instrument service data. Calibration system development, equipment replacing and updating, status of last year's planned objectives, and Reference Standard certification requirements are described. The status of the LaRC voltage and resistance measurement assurance program and the agency-wide resistance program are reviewed. Progress on fiscal year 1987 objectives is discussed and fiscal year 1988 objectives are stated.
Front-end processor for NASA Metrology Information System (NMIS) is real-time relational data-base computer system designed to distribute processing for NMIS mainframe system or run as stand-alone local-area-network data-base system. System used in large calibration laboratories for work control and to maintain records of calibration, repair, costs, manpower usage, traceability, and other pertinent facts about instruments supported by laboratories. Provides enhancements to existing NASA Metrology Information System and batches upload to minimize mainframe I/O at times of heavy usage.
Radial metrology combines standard optical measurement techniques with a unique panoramic annular lens (PAL) system to study material properties and deformations on the inner surfaces of the cavities found, for example, inside pipes, tubes, and boreholes. A PAL profilometer using speckle metrology is analyzed and the equations obtained from the analysis are used to calibrate the PAL profilometer when it is used to profile the inner surface of a cylindrical pipe and to measure the deformation of the pipe when it is subjected to diametral compression.
This paper will discuss the optical testing of extreme grazing incidence mirror systems and normal incidence high-precision mirror systems during fabrication processing of the optical substrates. The optical metrology is closely coupled with an advanced material removal process which will be discussed in terms of the optical metrology. Interferometric data will be presented of the optical surfaces. Surface roughness data will be shown and discussed.
The success of the National Aeronautics and Space Administration's scientific and engineering projects is often based on the capability and quality of the metrology and calibration programs of its field centers and facilities. A Metrology and Calibration Working Group, having representation from each of the NASA field centers and facilities, was established to develop and implement a program to provide a centralized direction and agency wide focus. A brief history of the Group is presented. The development of the Group's operating philosophy, the long term objectives, the measurement research and development program, and review of accomplishments is discussed.
The NASA Metrology Information System (NMIS) was developed as a subsystem of the NASA Equipment Management System (NEMS) to provide a standardized technique in managing the calibration programs of its field Centers and facilities. The NMIS is a computerized data-base system providing: automatic instrument calibration recall and control, historical data including calibration and repair labor and parts costs, incoming instrument performance condition; instrument data including description, manufacturer, model and serial number, and instrument user name location. NMIS automatically provides 28 standardized calibration system performance reports on a user selected schedule. An ad hoc report generation capability is also provided. A standardized form, the Metrology Control Document, was developed for use as a calibration work order and data input document. System implementation plan is presented.
Report describes proposed laser metrology system in far-infrared telescope with segmented primary reflector. Telescope to be flown in outer space and used to observe celestial objects. Laser metrology system mounted on structure that supported secondary telescope reflector and measures relative positions and alignments of segments of primary reflector. System used in pointing as well as in maintaining surface figure.
Th sixteenth annual workshop of NASA's Metrology and Calibration Working Group was held April 20-22, 1993. The goals of the Working Group are to provide Agencywide standardization of individual metrology programs, where appropriate; to promote cooperation and exchange of information within NASA, with other Government agencies, and with industry; to serve as the primary Agency interface with the National Institute of Standards and Technology; and to encourage formal quality control techniques such as Measurement Assurance Programs. These proceedings contain unedited reports and presentations from the workshop and are provided for information only.
The guide is intended as a resource to aid engineers and systems contracts in the design, implementation, and operation of metrology, calibration, and measurement systems, and to assist NASA personnel in the uniform evaluation of such systems supplied or operated by contractors. Methodologies and techniques acceptable in fulfilling metrology quality requirements for NASA programs are outlined. The measurement process is covered from a high level through more detailed discussions of key elements within the process, Emphasis is given to the flowdown of project requirements to measurement system requirements, then through the activities that will provide measurements with defined quality. In addition, innovations and techniques for error analysis, development of statistical measurement process control, optimization of calibration recall systems, and evaluation of measurement uncertainty are presented.
To obtain imaging performance as for monolithic mirrors, large segmented reflectors used for astronomy must be actively aligned and pointed to extreme levels of precision. A system concept for a dual purpose optical truss laser metrology system is described which is used for both figure and alignment maintenance and telescope pointing. A two-stage figure active control approach was developed for several proposed spaceborne far infrared segmented telescopes, one of which is the 10-20 meters Large Deployable Reflector (LDR). The first active control stage, the figure initialization control system, aligns the optical elements (i.e., the primary segments, secondary and focal plane assembly) based on images obtained. The second stage, the figure maintenance control system, maintains the alignment between re-initializations using measurements provided by laser interferometers arranged in an optical truss configuration. It measures the relative positions and alignments of the telescope segments so that a controller can reposition them appropriately. The application of this optical truss for figure maintenance control is the subject of the first part of this paper. The second portion of this paper discusses the application of the optical truss to telescope pointing. Here, the laser metrology system is used to transfer pointing information from an external fine guidance sensor (FGS) to the telescope optical boresight as defined by the primary mirror, secondary mirror, and focal plane assembly. Thus, any alignment variations between the two boresights can be observed and accounted for.
We have superpolished a diamond-turned aluminum mandrel (coated with electroless Ni) to an axial roughness of 6.34 nm rms. The mandrel is made to the Astro-E secondary mirror design for the 81st shell. Precision metrology at 100 mm to submicron scales has established the power spectral density of the mandrel and ultralightweight gold coated replicated segments. Predicted image quality of a set of optimally aligned replicated segments of this and a matching primary is substantially improved as compared to the flight mirrors for Astro-E. This approach using metal mandrels, superpolishing, and replicated ultralightweight foil mirrors, may represent a cost-effective approach to meeting the 15 arcsec half-energy width and weight requirements for the Constellation-X mission. Descriptions of the polishing apparatus, the precision metrology instruments, and the surface data analysis are presented. The general methods described are applicable to precision optics for both normal incidence and grazing incidence optics.
We have superpolished a diamond-turned aluminum mandrel (coated with electroless Ni) to an axial roughness of 0.34 nm rms. The mandrel is made to the Astro-E secondary mirror design for the 81st shell. Precision metrology at 100 mm to submicron scales has established the power spectral density of the mandrel and ultralightweight gold coated replicated segments. Predicted image quality of a set of optimally aligned replicated segments of this and a matching primary is substantially improved as compared to the flight mirrors for Astro-E. This approach using metal mandrels, superpolishing, and replicated ultralightweight foil mirrors, may represent a cost-effective approach to meeting the 15 arcsec half-energy width and weight requirements for the Constellation-X mission. Descriptions of the polishing apparatus, the precision metrology instruments, and the surface data analysis are presented. The general methods described are applicable to precision optics for both normal incidence and grazing incidence optics.