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NASA NTRS1985

Assessing corrosion problems in photovoltaic cells via electrochemical stress testing

A series of accelerated electrochemical experiments to study the degradation properties of polyvinylbutyral-encapsulated silicon solar cells has been carried out. The cells' electrical performance with silk screen-silver and nickel-solder contacts was evaluated. The degradation mechanism was shown to be electrochemical corrosion of the cell contacts; metallization elements migrate into the encapsulating material, which acts as an ionic conducting medium. The corrosion products form a conductive path which results in a gradual loss of the insulation characteristics of the encapsulant. The precipitation of corrosion products in the encapsulant also contributes to its discoloration which in turn leads to a reduction in its transparency and the consequent optical loss. Delamination of the encapsulating layers could be attributed to electrochemical gas evolution reactions. The usefulness of the testing technique in qualitatively establishing a reliability difference between metallizations and antireflection coating types is demonstrated.

Shalaby, H.↗

NASA NTRS1963

Component design, construction and evaluation for satellites

Components for a high-reliability system such as the Telstar project are obtained by: (a) design of the component for the required environment, (b) careful control of manufacturing processes, (c) elimination of potential early failures by screening tests, and (d) selection of the most stable components. For passive components, these methods could be applied by using design parameters, suppliers and screening techniques established in the earlier submarine cable program, with consideration being given to the additional effects of the satellite launch and orbit environments. Semiconductor component designs were selected by qualification tests using accelerated electrical and environmental stress conditions. Screening tests were applied to eliminate early failures, and resulting components were aged from two to six months before selection for the satellite. The recognition of the effect of ionizing radiation on transistors caused the addition of a radiation qualification test, or a screening to assure selection of the least sensitive devices. Tests have shown this screening to be effective for the radiation intensity expected. Experience with the passive components, and evaluation of the accelerated test results and aging data of the semiconductor devices, indicate that the reliability objective was obtained.

TELSTAR SATELLITE↗

NASA NTRS1983

Assessing photovoltaic module degradation and lifetime from long term environmental tests

The photovoltaic module failure mechanisms related to temperature, humidity, and electrical bias are analyzed using the data collected over a period of 20 years from various sites in the U.S. The approach is based on measuring the rate dependence of the mechanisms on site stress levels, and then using the rate data to analytically estimate the field life by means of computer models of the site environment. A correlation is established between the accelerated constant-stress testing and the time-varying field exposures. Test results are presented for two failure mechanisms for a module design featuring polyvinyl butyral encapsulant for the temperature range of 85 to 100 C and 85-percent relative humidity.

Otth, D. H.↗

NASA NTRS2009

Bayes Analysis and Reliability Implications of Stress-Rupture Testing a Kevlar/Epoxy COPV Using Temperature and Pressure Acceleration

Composite Overwrapped Pressure Vessels (COPVs) that have survived a long service time under pressure generally must be recertified before service is extended. Flight certification is dependent on the reliability analysis to quantify the risk of stress rupture failure in existing flight vessels. Full certification of this reliability model would require a statistically significant number of lifetime tests to be performed and is impractical given the cost and limited flight hardware for certification testing purposes. One approach to confirm the reliability model is to perform a stress rupture test on a flight COPV. Currently, testing of such a Kevlar49 (Dupont)/epoxy COPV is nearing completion. The present paper focuses on a Bayesian statistical approach to analyze the possible failure time results of this test and to assess the implications in choosing between possible model parameter values that in the past have had significant uncertainty. The key uncertain parameters in this case are the actual fiber stress ratio at operating pressure, and the Weibull shape parameter for lifetime; the former has been uncertain due to ambiguities in interpreting the original and a duplicate burst test. The latter has been uncertain due to major differences between COPVs in the database and the actual COPVs in service. Any information obtained that clarifies and eliminates uncertainty in these parameters will have a major effect on the predicted reliability of the service COPVs going forward. The key result is that the longer the vessel survives, the more likely the more optimistic stress ratio model is correct. At the time of writing, the resulting effect on predicted future reliability is dramatic, increasing it by about one "nine," that is, reducing the predicted probability of failure by an order of magnitude. However, testing one vessel does not change the uncertainty on the Weibull shape parameter for lifetime since testing several vessels would be necessary.

Phoenix, S. Leigh↗

NASA NTRS2015

Leakage Currents in Low-Voltage PME and BME Ceramic Capacitors

Introduction of BME capacitors to high-reliability electronics as a replacement for PME capacitors requires better understanding of changes in performance and reliability of MLCCs to set justified screening and qualification requirements. In this work, absorption and leakage currents in various lots of commercial and military grade X7R MLCCs rated to 100V and less have been measured to reveal difference in behavior of PME and BME capacitors in a wide range of voltages and temperatures. Degradation of leakage currents and failures in virgin capacitors and capacitors with introduced cracks has been studied at different voltages and temperatures during step stress highly accelerated life testing. Mechanisms of charge absorption, conduction and degradation have been discussed and a failure model in capacitors with defects suggested.

base metal electrode capacitor (BME)↗

NASA NTRS2018

Differential Adaptive Stress Testing of Airborne Collision Avoidance Systems

The next-generation Airborne Collision Avoidance System (ACAS X) is currently being developed and tested to replace the Traffic Alert and Collision Avoidance System (TCAS) as the next international standard for collision avoidance. To validate the safety of the system, stress testing in simulation is one of several approaches for analyzing near mid-air collisions (NMACs). Understanding how NMACs can occur is important for characterizing risk and informingdevelopment of the system. Recently, adaptive stress testing (AST) has been proposed as a way to find the most likely path to a failure event. The simulation-based approach accelerates search by formulating stress testing as a sequential decision process then optimizing it using reinforcement learning. The approach has been successfully applied to stress test a prototype of ACAS Xin various simulated aircraft encounters. In some applications, we are not as interestedin the system's absolute performance as its performance relative to another system. Such situations arise, for example, during regression testing or when deciding whether a new system should replace an existing system. In our collision avoidance application, we are interested in finding cases where ACAS X fails but TCAS succeeds in resolving a conflict. Existing approaches do not provide an efficient means to perform this type of analysis. This paper extends the AST approach to differential analysis by searching two simulators simultaneously and maximizing the difference between their outcomes. We call this approach differential adaptive stress testing (DAST). We apply DAST to compare a prototype of ACAS X against TCAS and show examples of encounters found by the algorithm.

Lee, Ritchie↗

NASA NTRS1969

Torsion system for creep testing with multiple stress reversals

Torsion system proves exploratory data on accelerated creep due to multiple stress reversals. Torsional testing of tubular specimens is best suited for reversed stress creep tests since large strains are obtainable while maintaining specimen geometry.

Lilienthal, P. A.↗

NASA NTRS1979

Development of an Accelerated Test Design for Predicting the Service Life of the Solar Array at Mead, Nebraska

An accelerated life test is described which was developed to predict the life of the 25 kW photovoltaic array installed near Mead, Nebraska. A quantitative model for accelerating testing using multiple environmental stresses was used to develop the test design. The model accounts for the effects of thermal stress by a relation of the Arrhenius form. This relation was then corrected for the effects of nonthermal environmental stresses, such as relative humidity, atmospheric pollutants, and ultraviolet radiation. The correction factors for the nonthermal stresses included temperature-dependent exponents to account for the effects of interactions between thermal and nonthermal stresses on the rate of degradation of power output. The test conditions, measurements, and data analyses for the accelerated tests are presented. Constant-temperature, cyclic-temperature, and UV types of tests are specified, incorporating selected levels of relative humidity and chemical contamination and an imposed forward-bias current and static electric field.

Gaines, G. B.↗

NASA NTRS2004

Preloading To Accelerate Slow-Crack-Growth Testing

An accelerated-testing methodology has been developed for measuring the slow-crack-growth (SCG) behavior of brittle materials. Like the prior methodology, the accelerated-testing methodology involves dynamic fatigue ( constant stress-rate) testing, in which a load or a displacement is applied to a specimen at a constant rate. SCG parameters or life prediction parameters needed for designing components made of the same material as that of the specimen are calculated from the relationship between (1) the strength of the material as measured in the test and (2) the applied stress rate used in the test. Despite its simplicity and convenience, dynamic fatigue testing as practiced heretofore has one major drawback: it is extremely time-consuming, especially at low stress rates. The present accelerated methodology reduces the time needed to test a specimen at a given rate of applied load, stress, or displacement. Instead of starting the test from zero applied load or displacement as in the prior methodology, one preloads the specimen and increases the applied load at the specified rate (see Figure 1). One might expect the preload to alter the results of the test and indeed it does, but fortunately, it is possible to account for the effect of the preload in interpreting the results. The accounting is done by calculating the normalized strength (defined as the strength in the presence of preload the strength in the absence of preload) as a function of (1) the preloading factor (defined as the preload stress the strength in the absence of preload) and (2) a SCG parameter, denoted n, that is used in a power-law crack-speed formulation. Figure 2 presents numerical results from this theoretical calculation.

Gyekenyesi, John P.↗

NASA NTRS1977

Lifetimes of fiber composites under sustained tensile loading

Results are presented for a study intended to summarize lifetime data on several fiber/epoxy composite materials subjected to sustained uniaxial tensile loading, to report preliminary results of an accelerated test method for predicting the life of simple composites, and to describe related work in progress on pressure vessels and other filament-wound structures. The lifetime performance of the tested composites was compared by plotting the percent of ultimate strength (applied fiber stress normalized with respect to fiber failure stress in a composite) versus lifetime. In terms of performance in long-term tensile applications, the tested composites are ranked in the following order: graphite/epoxy, Be wire/epoxy, Aramid/epoxy, and S-glass/epoxy. The accelerated test using temperature and stress to simulate the passage of time proves to be encouraging, at least in the case of the Aramid/epoxy composite. The potential of a statistical analysis based on Weibull distribution analyses or a power law relationship is demonstrated.

Chiao, T. T.↗

NASA NTRS2009

Bayes Analysis and Reliability Implications of Stress-Rupture Testing a Kevlar/Epoxy COPV using Temperature and Pressure Acceleration

Composite Overwrapped Pressure Vessel (COPVs) that have survived a long service time under pressure generally must be recertified before service is extended. Sometimes lifetime testing is performed on an actual COPV in service in an effort to validate the reliability model that is the basis for certifying the continued flight worthiness of its sisters. Currently, testing of such a Kevlar49(registered TradeMark)/epoxy COPV is nearing completion. The present paper focuses on a Bayesian statistical approach to analyze the possible failure time results of this test and to assess the implications in choosing between possible model parameter values that in the past have had significant uncertainty. The key uncertain parameters in this case are the actual fiber stress ratio at operating pressure, and the Weibull shape parameter for lifetime; the former has been uncertain due to ambiguities in interpreting the original and a duplicate burst test. The latter has been uncertain due to major differences between COPVs in the data base and the actual COPVs in service. Any information obtained that clarifies and eliminates uncertainty in these parameters will have a major effect on the predicted reliability of the service COPVs going forward. The key result is that the longer the vessel survives, the more likely the more optimistic stress ratio is correct. At the time of writing, the resulting effect on predicted future reliability is dramatic, increasing it by about one nine , that is, reducing the probability of failure by an order of magnitude. However, testing one vessel does not change the uncertainty on the Weibull shape parameter for lifetime since testing several would be necessary.

Phoenix, S. Leigh↗

NASA NTRS2006

Effect of High Temperature Storage in Vacuum, Air, and Humid Conditions on Degradation of Gold/Aluminum Wire Bonds in PEMs

Microcircuits encapsulated in three plastic package styles were stored in different environments at temperatures varying from 130 C to 225 C for up to 4,000 hours in some cases. To assess the effect of oxygen, the parts were aged at high temperatures in air and in vacuum chambers. The effect of humidity was evaluated during long-term highly accelerated temperature and humidity stress testing (HAST) at temperatures of 130 C and 150 C. High temperature storage testing of decapsulated microcircuits in air, vacuum, and HAST chambers was carried out to evaluate the role of molding compounds in the environmentally-induced degradation and failure of wire bonds (WB). This paper reports on accelerating factors of environment and molding compound on WB failures. It has been shown that all environments, including oxygen, moisture, and the presence of molding compounds reduce time-to-failures compared to unencapsulated devices in vacuum conditions. The mechanism of the environmental effect on KB degradation is discussed.

Teverovsky, Alexander↗

NASA NTRS2012

Towards A Model-Based Prognostics Methodology for Electrolytic Capacitors: A Case Study Based on Electrical Overstress Accelerated Aging

A remaining useful life prediction methodology for electrolytic capacitors is presented. This methodology is based on the Kalman filter framework and an empirical degradation model. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management. Prognostics provides a way to assess remaining useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. We present here also, experimental results of an accelerated aging test under electrical stresses. The data obtained in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This preliminary remaining life prediction algorithm serves as a demonstration of how prognostics methodologies could be used for electrolytic capacitors. In addition, the use degradation progression data from accelerated aging, provides an avenue for validation of applications of the Kalman filter based prognostics methods typically used for remaining useful life predictions in other applications.

Celaya, Jose R.↗

NASA NTRS2011

A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging

Electrolytic capacitors↗

NASA NTRS2006

Effect of Environments on Degradation of Molding Compound and Wire Bonds in PEMs

Degradation of wire bonds (WBs) is one of the major factors limiting reliability of plastic encapsulated microcircuits (PEMs) at high temperatures. Use of PEMs in military and aerospace applications requires extended and thorough evaluation of encapsulating materials and reliability of packages in harsh environments. However, the effect of environmental conditions on characteristics of molding compounds (MCs) and reliability of wire bonds has not been studied sufficiently to date. In this work, two types of PEMs in QFP-style packages have been stored in different environments at temperatures from 130 C to 225 C for up to 4,500 hours in some cases. To assess the effect of oxygen, the parts were aged at 198 C in air and vacuum chambers. The effect of humidity was evaluated during long-term highly accelerated temperature and humidity stress testing (HAST) at temperatures of 130 C and 150 C. Thermo-mechanical and thermo-gravimetrical analyses were used to evaluate the effect of environment on characteristics of molding compound used. Measurements of contact resistances of wire bonds and their mechanical strength were employed to monitor degradation of wire bonds throughout the testing. Correlation between degradation of MC and WB failures has been analyzed. The effect of environmental conditions on accelerating factors of WB failures has been assessed, and the mechanism of wire bond degradation due to the presence of moisture and oxygen is discussed.

Teverosky, Alexander↗

NASA NTRSDate not supplied

Stress Testing of Chip Aluminum Polymer Capacitors

Layered aluminum polymer capacitors (APC) may be viable replacements to current chip tantalum capacitors due to their lower ESR, weight, and smaller size. So far, there is a lack of information regarding the reliability of these parts. Available technical literature is mostly related to the effect on humidity. Although APCs have a limited moisture resistance, it may be contained to the level sufficient for space applications. In this work, seven types of commercial APCs manufactured by four vendors and rated to voltages from 6.3 to 35 V were used to evaluate reliability of the parts under environmental stresses and highly accelerated life tests. Characteristics of the parts, including breakdown voltages, the level of anomalous charging currents (ACC), capacitance, DF, ESR and leakage currents were measured in the process of storage at high-temperatures (from 100 to 150 °C) and high humidity at 85 °C. Monitored highly accelerated life tests have been carried out at temperatures of 85 °C and 125 °C and voltages varying from 1.2 to 1.9 times the rated voltage. Degradation processes and reliability of APCs have been analyzed and compared to polymer tantalum capacitors.

Alexander Teverovsky↗

NASA NTRS2011

Towards Prognostics of Electrolytic Capacitors

A remaining useful life prediction algorithm and degradation model for electrolytic capacitors is presented. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management research. Prognostics provides a way to assess remaining useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. In particular, experimental results of an accelerated aging test under electrical stresses are presented. The capacitors used in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This preliminary remaining life prediction algorithm serves as a demonstration of how prognostics methodologies could be used for electrolytic capacitors.

Celaya, Jose R.↗

NASA NTRS2024

Evaluation of Aluminum Polymer Capacitors for Space Applications

Layered aluminum polymer capacitors (APC) may be viable replacements to currently used chip tantalum capacitors due to their lower ESR, weight, and smaller size. So far, there is a lack of information regarding the reliability of these parts. Available technical literature is mostly related to the effect of humidity. Although APCs have a limited moisture resistance, it may be contained to the level sufficient for space applications. This work analyzes construction and characteristics of seven types of commercial APCs manufactured by four vendors and rated to voltages from 6.3 to 35 V were analyzed. Their reliability under environmental stresses and highly accelerated life tests was assessed in the range of temperatures and voltages to determine reliability acceleration factors. For this purpose, characteristics of the parts, including breakdown voltages, the level of anomalous charging currents (ACC), capacitance, DF, ESR and leakage currents were measured in the process of storage at high-temperatures (from 100 to 150 °C) and high humidity at 85 °C. Monitored highly accelerated life tests have been carried out at temperatures of 85 °C and 125 °C and voltages varying from 1.2 to 1.9 times the rated voltage. Degradation processes and reliability of APCs have been compared to polymer tantalum capacitors.

Alexander A Teverovsky↗