Initial Results of Accelerated Stress Testing on Single-Channel and Multichannel Drivers: Solid-State Lighting Technology Area
This report is the first in a series of studies on accelerated stress testing (AST) of drivers used for SSL luminaires, such as downlights, troffers, and streetlights. A representative group of two-stage commercial driver products was exposed to an AST environment consisting of 75°C and 75% relative humidity (7575). These drivers were a mix of single-channel drivers (i.e., a single output current for one LED primary) and multichannel drivers (i.e., separate output currents for multiple LED primaries). This AST environment was chosen because previous testing on downlights with integrated drivers demonstrated that 38% of the sample population failed in less than 2,500 hours of testing using this method. In addition to AST test results, the performance of an SSL downlight product incorporating an integrated, multichannel driver during extended room temperature operational life (RTOL) testing is also reported. A battery of measurements was used to evaluate these products during accelerated testing, including full electrical characterization (i.e., power consumption, PF, total harmonic distortion [THD], and inrush current) and photometric characterization of external LED loads attached to the drivers (i.e., flicker performance and lumen maintenance).