Two-Photon Interferometry for High Resolution Imaging
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entanglement EPR source optical nonlinearity↗
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Orbiting Stellar Interferometer: An Overview
The Orbiting Stellar Interferometer (OSI) is a concept for a first-generation space interferometer with astrometric and imaging capabilities and is responsive to the recommendations of the Astronomy and Astrophysics Survey Committee for an astrometric interferometry mission. OSI is a triple Michelson interferometer with articulating siderostats and optical delay lines. The design uses a 7m maximum baseline and aperture diameters of 33 cm; the targeted astrometric performance is a wide-field accuracy of 5µas for 20-mag objects. The instrument would also be capable of synthesis imaging with a resolution of 10mas. Laser metrology is used to relax structural requirements thereby reducing cost. The currently envisaged flight system fits into an Atlas II shroud, for insertion into a 900 km sun-synchronous orbit.
['OSI↗
The micro-arcsecond measurement testbed and its relationship to the Space Interferometer Mission
This paper describes the relationship between the Space Interferometer Mission (SIM) and the MicroArcsecond Measurment Testbed (MAM). MAM is necessary because differences exist between starlight and the metrology measurements through the SIM instrument optical path.
space-based↗
The Space Interferometry Mission
In this paper we will present selected topics from the SIM science program focusing on some specific astronomical questions to be addressed.
Space↗
Diamond electro-optomechanical resonators integrated in nanophotonic circuits
Diamond integrated photonic devices are promising candidates for emerging applications in nanophotonics and quantum optics. Here, we demonstrate active modulation of diamond nanophotonic circuits by exploiting mechanical degrees of freedom in free-standing diamond electro-optomechanical resonators. We obtain high quality factors up to 9600, allowing us to read out the driven nanomechanical response with integrated optical interferometers with high sensitivity. We are able to excite higher order mechanical modes up to 115 MHz and observe the nanomechanical response also under ambient conditions.
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
A 60-GHz interferometer with a local oscillator integrated antenna array for divertor simulation experiments on GAMMA 10/PDX
In conventional multichannel/imaging microwave diagnostics of interferometry, reflectometry, and electron cyclotron emission measurements, a local oscillator (LO) signal is commonly supplied to a receiver array via irradiation using LO optics. In this work, we present a 60-GHz interferometer with a new eight-channel receiver array, called a local oscillator integrated antenna array (LIA). An outstanding feature of LIA is that it incorporates a frequency quadrupler integrated circuit for LO supply to each channel. This enables simple and uniform LO supply to the receiver array using only a 15-GHz LO source and a coaxial cable transmission line instead of using an expensive 60-GHz source, LO optics, and a waveguide transmission line. The new interferometer system is first applied to measure electron line-averaged density inside the divertor simulation experimental module (D-module) on GAMMA 10/PDX tandem mirror device.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
Sub-pixel Spatial Resolution Micro-roughness Measurements with Interlaced Stitching
In this paper we describe a method to increase the spatial resolution of surface micro-roughness measurements. As the surface specifications for precision optics become more demanding, the metrology instruments must cover a broad spatial frequency range. Generally, multiple instruments are used to cover the full range of the specifications. For example, a Fizeau interferometer would be used to test low spatial frequency surface errors, a white light interferometer would be used for mid spatial frequency errors, and an AFM would be used for high spatial frequency errors. For some precision optics, three instruments would be necessary. However, in many applications, an increase in the spatial resolution of a metrology instrument could negate the need for multiple instruments. A solution to increase the spatial resolution of micro-roughness measurements obtained using white light interferometry with "interlaced stitching" will be presented. In "interlaced stitching", multiple interferometric measurements are made as the optic under test (or the CCD array) is laterally shifted at sub-pixel increments. The measurements are then combined to construct a measurement with higher spatial resolution. Initial results obtained while implementing a similar process used to increase the spatial resolution of measurements made with a commercially available Fizeau interferometer will be presented.
Mooney, James T.↗
Spectral interferometry-based microwave-frequency vibrometry for integrated acoustic wave devices
Microwave phononics is a promising platform for sensing, computing, and quantum information science; thus, sensitive and high-throughput characterization tools are needed not only for device verification and optimization but also for revealing transient and nonlinear dynamics. Existing interferometric optical vibrometers for 2D mapping are challenged by operating point stabilization, surface reflectivity contrast, and long acquisition time. Here, we use spectral interferometry, which is insensitive to these factors and utilizes a continuous raster scanning scheme for vibration mapping with high throughput. We intensity-modulate our broadband light source with an electro-optic modulator to resolve vibrations at microwave frequencies. Our system requires no fast photodetector or digitizer operating in the microwave frequency range. We image the 1 GHz vibration field of a 300 × 150 µm 2 area of an entire surface acoustic wave device in 10 min with simultaneous surface profilometry. Our system has a vibration sensitivity of 120 fm/sqrt(Hz) and a linear throughput of 0.77 mm/s on the chip surface. The technique offers capabilities for characterizing a wide range of acoustic wave and micromechanical devices to better understand their behavior and performance.
47 OTHER INSTRUMENTATION↗
INTERFEROMETRY OF ϵ AURIGAE: CHARACTERIZATION OF THE ASYMMETRIC ECLIPSING DISK
We report on a total of 106 nights of optical interferometric observations of the ϵ Aurigae system taken during the last 14 years by four beam combiners at three different interferometric facilities. This long sequence of data provides an ideal assessment of the system prior to, during, and after the recent 2009–2011 eclipse. We have reconstructed model-independent images from the 10 in-eclipse epochs which show that a disk-like object is indeed responsible for the eclipse. Using new three-dimensional, time-dependent modeling software, we derive the properties of the F-star (diameter, limb darkening), determine previously unknown orbital elements (Ω, i), and access the global structures of the optically thick portion of the eclipsing disk using both geometric models and approximations of astrophysically relevant density distributions. These models may be useful in future hydrodynamical modeling of the system. Finally, we address several outstanding research questions including mid-eclipse brightening, possible shrinking of the F-type primary, and any warps or sub-features within the disk.
79 ASTRONOMY AND ASTROPHYSICS↗
VUV thin films, chapter 7
The application of thin film technology to the vacuum ultraviolet (VUV) wavelength region from 120 nm to 230 nm has not been fully exploited in the past because of absorption effects which complicate the accurate determination of the optical functions of dielectric materials. The problem therefore reduces to that of determining the real and imaginary parts of a complex optical function, namely the frequency dependent refractive index n and extinction coefficient k. We discuss techniques for the inverse retrieval of n and k for dielectric materials at VUV wavelengths from measurements of their reflectance and transmittance. Suitable substrate and film materials are identified for application in the VUV. Such applications include coatings for the fabrication of narrow and broadband filters and beamsplitters. The availability of such devices open the VUV regime to high resolution photometry, interferometry and polarimetry both for space based and laboratory applications. This chapter deals with the optics of absorbing multilayers, the determination of the optical functions for several useful materials, and the design of VUV multilayer stacks as applied to the design of narrow and broadband reflection and transmission filters and beamsplitters. Experimental techniques are discussed briefly, and several examples of the optical functions derived for selected materials are presented.
Zukic, Muamer↗
Phase Sensor for Aligning a Segmented Telescope Mirror
A phase sensor has been developed for use in aligning a segmented telescope mirror to within a fraction of a wavelength in piston. (As used here, piston signifies displacement of a mirror segment along the optical axis of the telescope.) Such precise alignment is necessary in order to realize the full benefit of the large aperture achievable through segmentation. This phase sensor is achromatic. It is based on two-wavelength shearing interferometry, and can be modified to utilize an extended or broad-band (e.g., white) light source. The sensor optics include a ruled diffraction grating and an imaging lens. The sensor can measure the piston shift between segments as well as aberrations of the segments. It can measure the surface error of an individual segment, making it possible to compensate for the error with optimal amount(s) of piston and/or tilt. The precise capture range of the sensor depends partly on the telescope design; the largest relative piston shifts measurable by use of this sensor are of the order of 100 m. The accuracy of the sensor also depends partly on the telescope design; in general, the accuracy is sufficient to enable alignment to within approximately half a wavelength. The interferometric image is digitized and processed by a simple algorithm in real time, and the output of the algorithm can be used to maintain alignment in real time, even in the presence of atmospheric turbulence. The sensor is robust. Through calibration, it can be made insensitive to (and, hence, tolerant of) misalignments and aberrations of its own optics, most aberrations of the telescope as a whole (in contradistinction to aberrations of individual segments), and most aberrations introduced by atmospheric turbulence
Stahl, Philip↗
Error Modeling of Multi-baseline Optical Truss: Application to SIM Metrology Truss Field Dependent Error - Part II
The current design of the Space Interferometry Mission (SIM) employs a 19 laser-metrology-beam system (also called L19 external metrology truss) to monitor changes of distances between the fiducials of the flight system's multiple baselines. The function of the external metrology truss is to aid in the determination of the time-variations of the interferometer baseline. The largest contributor to truss error occurs in SIM wide-angle observations when the articulation of the siderostat mirrors (in order to gather starlight from different sky coordinates) brings to light systematic errors due to offsets at levels of instrument components (which include comer cube retro-reflectors, etc.). This error is labeled external metrology wide-angle field-dependent error. Physics-based model of field-dependent error at single metrology gauge level is developed and linearly propagated to errors in interferometer delay. In this manner delay error sensitivity to various error parameters or their combination can be studied using eigenvalue/eigenvector analysis. Also validation of physics-based field-dependent model on SIM testbed lends support to the present approach. As a first example, dihedral error model is developed for the comer cubes (CC) attached to the siderostat mirrors. Then the delay errors due to this effect can be characterized using the eigenvectors of composite CC dihedral error. The essence of the linear error model is contained in an error-mapping matrix. A corresponding Zernike component matrix approach is developed in parallel, first for convenience of describing the RMS of errors across the field-of-regard (FOR), and second for convenience of combining with additional models. Average and worst case residual errors are computed when various orders of field-dependent terms are removed from the delay error. Results of the residual errors are important in arriving at external metrology system component requirements. Double CCs with ideally co-incident vertices reside with the siderostat. The non-common vertex error (NCVE) is treated as a second example. Finally combination of models, and various other errors are discussed.
comer cube retro-reflector↗
Determining the tilt of the Raman laser beam using an optical method for atom gravimeters
The tilt of a Raman laser beam is a major systematic error in precision gravity measurement using atom interferometry. The conventional approach to evaluating this tilt error involves modulating the direction of the Raman laser beam and conducting time-consuming gravity measurements to identify the error minimum. In this work, we demonstrate a method to expediently determine the tilt of the Raman laser beam by transforming the tilt angle measurement into characterization of parallelism, which integrates the optical method of aligning the laser direction, commonly used in freely falling corner-cube gravimeters, into an atom gravimeter. A position-sensing detector (PSD) is utilized to quantitatively characterize the parallelism between the test beam and the reference beam, thus measuring the tilt precisely and rapidly. After carefully positioning the PSD and calibrating the relationship between the distance measured by the PSD and the tilt angle measured by the tiltmeter, we achieved a statistical uncertainty of less than 30 µrad in the tilt measurement. Furthermore, we compared the results obtained through this optical method with those from the conventional tilt modulation method for gravity measurement. The comparison validates that our optical method can achieve tilt determination with an accuracy level of better than 200 µrad, corresponding to a systematic error of 20 µGal in g measurement. This work has practical implications for real-world applications of atom gravimeters.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
An Overview of Broadband Laser Ranging (BLR) Architecture and Measurement Considerations
Broadband Laser Ranging (BLR) is a developmental diagnostic intended to measure the position of rapidly moving surfaces in combination with optical velocimetry. Design and employment of a BLR diagnostic on dynamic experiments requires consideration for both the inherent measurement system tradeoffs as well as architectural choices appropriate to the nature of investigation. The diagnostic uses spectral interferometry to measure distance by mapping femtosecond laser pulses to the time domain via chromatic dispersion within the fiber-optic architecture. The system parameters and governing equations that describe measurement range, resolution, and Doppler sensitivity will be discussed. We will also briefly review the impact of diagnostic architectural choices including: nature of interferometer, Interferometric dispersion matching, optical amplification, integration of optical velocimetry, BLR calibration, and field operability. To summarize we will present the architectural and operational approach currently being pursued by NSTec within an on-going collaboration between NSTec, Lawrence Livermore and Los Alamos National Labs.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
The Catalog of Positions of Optically Bright Extragalactic Radio Sources OBRS-1
It is expected that the European Space Agency mission Gaia will make it possible to determine coordinates in the optical domain of more than 500,000 quasars. In 2006, a radio astrometry project was launched with the overall goal of making comparisons between coordinate systems derived from future space-born astrometry instruments and the coordinate system constructed from analysis of global very long baseline interferometry (VLBI) more robust. Investigation of the rotation, zonal errors, and non-alignment of the radio and optical positions caused by both radio and optical structures is needed to validate both techniques. In order to support these studies, the densification of the list of compact extragalactic objects that are bright in both radio and optical ranges is desirable. A set of 105 objects from the list of 398 compact extragalactic radio sources with decl. > -10deg was observed with the Very Long Baseline Array and European VLBI Network (EVN) with the primary goal of producing images with milliarcsecond resolution. These sources are brighter than 18 mag in the V band, and they were previously detected by the EVN. In this paper, coordinates of observed sources have been derived with milliarcsecond accuracies from analysis of these VLBI observations using an absolute astrometry method. The catalog of positions for 105 target sources is presented. The accuracies of source coordinates are in the range of 0.3.7 mas, with a median of 1.1 mas.
Petrov, L.↗
3D Reconstruction of a High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning with High-Precision EBSD and Surface Profilometry
High-energy diffraction microscopy (HEDM) combined with in situ mechanical testing is a powerful nondestructive technique for tracking the evolving microstructure within polycrystalline materials during deformation. This technique relies on a sophisticated analysis of X-ray diffraction patterns to produce a three-dimensional reconstruction of grains and other microstructural features within the interrogated volume. However, it is known that HEDM can fail to identify certain microstructural features, particularly smaller grains or twinned regions. Characterization of the identical sample volume using high-resolution surface-specific techniques, particularly electron backscatter diffraction (EBSD), can not only provide additional microstructure information about the interrogated volume but also highlight opportunities for improvement of the HEDM reconstruction algorithms. In this study, a sample fabricated from undeformed “low solvus, high refractory” nickel-based superalloy was scanned using HEDM. The volume interrogated by HEDM was then carefully characterized using a combination of surface-specific techniques, including epi-illumination optical microscopy, zero-tilt secondary and backscattered electron imaging, scanning white light interferometry, and high-precision EBSD. Custom data fusion protocols were developed to integrate and align the microstructure maps captured by these surface-specific techniques and HEDM. The raw and processed data from HEDM and serial sectioning have been made available via the Materials Data Facility (MDF) at https://doi.org/10.18126/4y0p-v604 for further investigation.
36 MATERIALS SCIENCE↗
Nonlinear Photoemission Electron Micrographs of Plasmonic Nanoholes in Gold Thin Films
Nonlinear photoemission electron microscopy of isolated nanoholes in gold thin films map propagating surface plasmon polaritons (SPPs) launched from the lithographically patterned plasmonic structures. A damped sinusoidal elongated ring-like photoemission beat pattern is observed from the nanoholes, following low angle of incidence irradiation of these structures with sub-15 fs 780 nm laser pulses. A notable agreement between finite difference time domain simulations and experiment corroborates our assignment of the observed photoemission patterns to SPPs launched from isolated nanoholes and probed through nonlinear photoemission. We also demonstrate how the efficiency of coupling light waves into isolated plasmonic holes can be tuned by varying hole diameter. In this regard, a simple intuitive geometrical model, which accounts for the observed and simulated diameter dependent plasmonic response, is proposed. Overall, this study paves the way for designing nanohole assemblies where optical coupling and subsequent plasmon propagation can be rationally controlled through 2D SPP interferometry
Environmental Molecular Sciences Laboratory↗
Final binary star results from the ESO VLT Lunar occultations program
We report on 13 subarcsecond binaries, detected by means of lunar occultations in the near-infrared at the ESO Very Large Telescope (VLT). They are all first-time detections except for the visual binary HD 158122, which we resolved for the first time in the near-infrared. The primaries have magnitudes in the range K = 4.5-10.0, and companions in the range K = 6.8-11.1. The magnitude differences have a median value of 2.4, with the largest being 4.6. The projected separations are in the range of 4-168 mas, with a median of 13 mas. We discuss and compare our results with the available literature. With this paper, we conclude the mining for binary star detections in the 1226 occultations recorded at the VLT with the ISAAC instrument. We expect that the majority of these binaries may be unresolvable by adaptive optics on current telescopes, and they might be challenging for long-baseline interferometry. However, they constitute an interesting sample for future larger telescopes and for astrometric missions such as GAIA.
79 ASTRONOMY AND ASTROPHYSICS↗