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At least 703 records · Page 39

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NASA NTRS2005

Electron-beam lithography for micro and nano-optical applications

Direct-write electron-beam lithography has proven to be a powerful technique for fabricating a variety of micro- and nano-optical devices. Binary E-beam lithography is the workhorse technique for fabricating optical devices that require complicated precision nano-scale features. We describe a bi-layer resist system and virtual-mark height measurement for improving the reliability of fabricating binary patterns. Analog E-beam lithography is a newer technique that has found significant application in the fabrication of diffractive optical elements. We describe our techniques for fabricating analog surface-relief profiles in E-beam resist, including some discussion regarding overcoming the problems of resist heating and charging. We also describe a multiple-field-size exposure scheme for suppression of field-stitch induced ghost diffraction orders produced by blazed diffraction gratings on non-flat substrates.

electron-beam lithography↗

NASA NTRS1973

Glancing incidence telescopes for space astronomy

A technique for determining the state of polarization of a light source by evaluating its image at the focus of a glancing telescope is reported. An analysis of the central disc of the diffraction image reveals if the light source is polarized, the plane of polarization, and the degree of polarization. When polarized light is incident at the aperture of a diffraction limited glancing telescope, the central disc of the diffraction pattern takes on an elliptical configuration. This ellipticity is caused by the tendency of the electric vector component in the plane of incidence to be absorbed by the reflecting material. As the state of polarization goes from plane polarized to decreasing degrees of elliptically polarized light, the ellipticity of the central disc goes from a maximum at plane polarization to zero at circular polarization. These curves give a direct relationship between the degree of polarization of a light source and the ellipticity of the central disc for this particular telescope, independent of the light source wavelength.

Alonso, J., Jr.↗

NASA NTRS1972

Disproportionation of Fe2SiO4 to 2FeO plus SiO2 at pressures up to 250kbar and temperatures up to 3000 C

A sample of Fe2SiO4 (spinel) at approximately 250 kbar in a diamond anvil press was heated to approximately 3000 C for a duration of some ms using a focused light beam from a pulsed ruby laser. After quenching and unloading, X-ray diffraction patterns indicated that the portion of the sample that had been heated contained wustite and stishovite. A sample of Fe2SiO4 (fayalite) at approximately 200 kbar in a diamond anvil press has been heated to 800 C for 20 min in a furnace. After quenching and unloading, the sample was found to have concentric zones with the fayalite phase at the lowest pressure, the spinel phase at the intermediate pressure, and a dark region at the center where the pressure was highest. An X-ray diffraction pattern of the dark central region indicated the presence of wustite. A microprobe analysis of a sample produced by a similar procedure indicated that SiO2 is apparently evolved along with wustite but is not sufficiently crystalline to be detected by X-ray diffraction.

Bassett, W. A.↗

NASA NTRS1977

The use of analytical surface tools in the fundamental study of wear

Various techniques and surface tools available for the study of the atomic nature of the wear of materials are reviewed These include chemical etching, x-ray diffraction, electron diffraction, scanning electron microscopy, low-energy electron diffraction, Auger emission spectroscopy analysis, electron spectroscopy for chemical analysis, field ion microscopy, and the atom probe. Properties of the surface and wear surface regions which affect wear, such as surface energy, crystal structure, crystallographic orientation, mode of dislocation behavior, and cohesive binding, are discussed. A number of mechanisms involved in the generation of wear particles are identified with the aid of the aforementioned tools.

Buckley, D. H.↗

NASA NTRS1978

Aircraft noise propagation

Sound diffraction experiments conducted at NASA Langley Research Center to study the acoustical implications of the engine over wing configuration (noise-shielding by wing) and to provide a data base for assessing various theoretical approaches to the problem of aircraft noise reduction are described. Topics explored include the theory of sound diffraction around screens and wedges; the scattering of spherical waves by rectangular patches; plane wave diffraction by a wedge with finite impedence; and the effects of ambient flow and distribution sources.

Hadden, W. J.↗

NASA NTRS1977

The use of analytical surface tools in the fundamental study of wear

This paper reviews the various techniques and surface tools available for the study of the atomic nature of the wear of materials. These include chemical etching, X-ray diffraction, electron diffraction, scanning electron microscopy, low-energy electron diffraction, Auger emission spectroscopy analysis, electron spectroscopy for chemical analysis, field ion microscopy, and the atom probe. Properties of the surface and wear surface regions which effect wear such as surface energy, crystal structure, crystallographic orientation, mode of dislocation behavior, and cohesive binding are discussed. A number of mechanisms involved in the generation of wear particles are identified with the aid of the aforementioned tools.

Buckley, D. H.↗

NASA NTRS1979

A model for correlating damage and ultrasonic attenuation in composites

Ultrasonic attenuation data measured by the pulse-echo technique have been obtained versus load for two graphite-epoxy laminates and are presented. The attenuation-load data display distinct changes at load values associated with the initiation of transverse cracks in the weakest plies and with the knee in the bilinear stress-strain curve. It was intended to determine if a simplified diffraction model could be used to account for the attenuation changes. The basis of the diffraction model is that transverse cracks or delaminations, or both, initiating and progressing in the specimen under the area covered by the ultrasonic transducer would cause diffraction of the ultrasonic beam and changes in the measured attenuation.

Hayford, D. T.↗

NASA NTRS1978

Infrared Astronomical Satellite (IRAS) analysis, appendix B

Analytical results derived during the development of the PADE program are presented. Near field on-axis diffraction from a circular aperture is analyzed by integrating Kirchhoff's formula, the boundary wave formulation, and the Rayleigh-Sommerfeld theory. Far field on-axis diffraction from obliquely illuminated apertures is described using the angular spectrum approach. Transmission functions and diffracted fields for rectangular, circular, and rotated square apertures are presented.

Source record↗

NASA NTRS1981

GTD analysis of airborne antennas radiating in the presence of lossy dielectric layers

The patterns of monopole or aperture antennas mounted on a perfectly conducting convex surface radiating in the presence of a dielectric or metal plate are computed. The geometrical theory of diffraction is used to analyze the radiating system and extended here to include diffraction by flat dielectric slabs. Modified edge diffraction coefficients valid for wedges whose walls are lossy or lossless thin dielectric or perfectly conducting plates are developed. The width of the dielectric plates cannot exceed a quarter of a wavelength in free space, and the interior angle of the wedge is assumed to be close to 0 deg or 180 deg. Systematic methods for computing the individual components of the total high frequency field are discussed. The accuracy of the solutions is demonstrated by comparisons with measured results, where a 2 lambda by 4 lambda prolate spheroid is used as the convex surface. A jump or kink appears in the calculated pattern when higher order terms that are important are not included in the final solution. The most immediate application of the results presented here is in the modelling of structures such as aircraft which are composed of nonmetallic parts that play a significant role in the pattern.

Rojas-Teran, R. G.↗

NASA NTRS1982

Very high X-ray efficiency from a blazed grating

The efficiency of X-ray diffraction from reflection gratings has been investigated experimentally using a gold-coated plane grating of 25 x 120 mm with a nominal blaze angle of 21 deg in a conical diffraction mount. Results show that conical diffraction is capable of producing very high dispersion efficiencies. The peak of first order at 13.3 A is 40%; at 44 A, the peak is 34%. The most immediate application of this result is to X-ray astronomy where sources are weak.

Cash, W.↗

NASA NTRS1984

Structure of the Uranian rings. I - Square-well model and particle-size constraints

A least squares fitting is added to the diffraction model for the Uranian rings and the model is then used to determine the relative optical depths of the rings at visible and near-IR wavelengths. Light transmission is assumed constant on a scale of a few radial km in the rings. The amount of starlight passing through the rings is calculated from occultations with account taken of a monolayer ring, diffraction effects, and multiple ring layers. A diffracted occultation profile is generated with consideration given to the angular diameter of the star, the impulse response of the detector, and atmospheric aberrations. Calculation procedures which remove noise are outlined and results are compared with the observational data base. The wavelength dependence of optical depth is formulated. It is shown that occultation data do not support the presence of a large fraction of submicron particles. No optical depth variations are projected for 0.88-2.2 microns wavelengths. Unchopped data are needed to verify the model predictions.

Elliot, J. L.↗

NASA NTRS1985

Focal plane optics in far-infrared and submillimeter astronomy

The construction of airborne observatories, high mountain-top observatories, and space observatories designed especially for infrared and submillimeter astronomy has opened fields of research requiring new optical techniques. A typical far-IR photometric study involves measurement of a continuum spectrum in several passbands between approx 30 microns and 1000 microns and diffraction-limited mapping of the source. At these wavelengths, diffraction effects strongly influence the design of the field optics systems which couple the incoming flux to the radiation sensors (cold bolometers). The Airy diffraction disk for a typical telescope at submillimeter wavelengths approx 100 microns-1000 microns is many millimeters in diameter; the size of the field stop must be comparable. The dilute radiation at the stop is fed through a Winston nonimaging concentrator to a small cavity containing the bolometer. The purpose of this paper is to review the principles and techniques of infrared field optics systems, including spectral filters, concentrators, cavities, and bolometers (as optical elements), with emphasis on photometric systems for wavelengths longer than 60 microns.

Hildebrand, R. H.↗

NASA NTRS1986

Quantitative flaw characterization with scanning laser acoustic microscopy

Surface roughness and diffraction are two factors that have been observed to affect the accuracy of flaw characterization with scanning laser acoustic microscopy. In accuracies can arise when the surface of the test sample is acoustically rough. It is shown that, in this case, Snell's law is no longer valid for determining the direction of sound propagation within the sample. The relationship between the direction of sound propagation within the sample, the apparent flaw depth, and the sample's surface roughness is investigated. Diffraction effects can mask the acoustic images of minute flaws and make it difficult to establish their size, depth, and other characteristics. It is shown that for Fraunhofer diffraction conditions the acoustic image of a subsurface defect corresponds to a two-dimensional Fourier transform. Transforms based on simulated flaws are used to infer the size and shape of the actual flaw.

Generazio, E. R.↗

NASA NTRS1986

Focal plane optics in far-infrared and submillimeter astronomy

Hildebrand, R. H.↗

NASA NTRS1986

Quantitative flaw characterization with scanning laser acoustic microscopy

Surface roughness and diffraction are two factors that have been observed to affect the accuracy of flaw characterization with scanning laser acoustic microscopy. Inaccuracies can arise when the surface of the test sample is acoustically rough. It is shown that, in this case, Snell's law is no longer valid for determining the direction of sound propagation within the sample. The relationship between the direction of sound propagation within the sample, the apparent flaw depth, and the sample's surface roughness is investigated. Diffraction effects can mask the acoustic images of minute flaws and make it difficult to establish their size, depth, and other characteristics. It is shown that for Fraunhofer diffraction conditions the acoustic image of a subsurface defect corresponds to a two-dimensional Fourier transform. Transforms based on simulated flaws are used to infer the size and shape of the actual flaw.

Generazio, E. R.↗

NASA NTRS1986

Bistatic scattering from a cone frustum

The bistatic scattering from a perfectly conducting cone frustum is investigated using the Geometrical Theory of Diffraction (GTD). The first-order GTD edge-diffraction solution has been extended by correcting for its failure in the specular region off the curved surface and in the rim-caustic regions of the endcaps. The corrections are accomplished by the use of transition functions which are developed and introduced into the diffraction coefficients. Theoretical results are verified in the principal plane by comparison with the moment method solution and experimental measurements. The resulting solution for the scattered fields is accurate, easy to apply, and fast to compute.

Ebihara, W.↗

NASA NTRS1987

Electromagnetic scattering by impedance structures

The scattering of electromagnetic waves from impedance structures is investigated, and current work on antenna pattern calculation is presented. A general algorithm for determining radiation patterns from antennas mounted near or on polygonal plates is presented. These plates are assumed to be of a material which satisfies the Leontovich (or surface impedance) boundary condition. Calculated patterns including reflection and diffraction terms are presented for numerious geometries, and refinements are included for antennas mounted directly on impedance surfaces. For the case of a monopole mounted on a surface impedance ground plane, computed patterns are compared with experimental measurements. This work in antenna pattern prediction forms the basis of understanding of the complex scattering mechanisms from impedance surfaces. It provides the foundation for the analysis of backscattering patterns which, in general, are more problematic than calculation of antenna patterns. Further proposed study of related topics, including surface waves, corner diffractions, and multiple diffractions, is outlined.

Balanis, Constantine A.↗

NASA NTRS1986

Analysis and measurement of electromagnetic scattering by pyramidal and wedge absorbers

By modifying the reflection coefficients in the Uniform Geometrical Theory of Diffraction a solution that approximates the scattering from a dielectric wedge is found. This solution agrees closely with the exact solution of Rawlins which is only valid for a few minor cases. This modification is then applied to the corner diffraction coefficient and combined with an equivalent current and geometrical optics solutions to model scattering from pyramid and wedge absorbers. Measured results from 12 inch pyramid absorbers from 2 to 18 GHz are compared to calculations assuming the returns add incoherently and assuming the returns add coherently. The measured results tend to be between the two curves. Measured results from the 8 inch wedge absorber are also compared to calculations with the return being dominated by the wedge diffraction. The procedures for measuring and specifying absorber performance are discussed and calibration equations are derived to calculate a reflection coefficient or a reflectivity using a reference sphere. Shaping changes to the present absorber designs are introduced to improve performance based on both high and low frequency analysis. Some prototypes were built and tested.

Dewitt, B. T.↗