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At least 685 records · Page 38

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NASA NTRS1983

Analysis of strain gage reliability in F-100 jet engine testing at NASA Lewis Research Center

A reliability analysis was performed on 64 strain gage systems mounted on the 3 rotor stages of the fan of a YF-100 engine. The strain gages were used in a 65 hour fan flutter research program which included about 5 hours of blade flutter. The analysis was part of a reliability improvement program. Eighty-four percent of the strain gages survived the test and performed satisfactorily. A post test analysis determined most failure causes. Five failures were caused by open circuits, three failed gages showed elevated circuit resistance, and one gage circuit was grounded. One failure was undetermined.

Holanda, R.↗

NASA NTRS1984

An approximation formula for a class of Markov reliability models

A way of considering a small but often used class of reliability model and approximating algebraically the systems reliability is shown. The models considered are appropriate for redundant reconfigurable digital control systems that operate for a short period of time without maintenance, and for such systems the method gives a formula in terms of component fault rates, system recovery rates, and system operating time.

White, A. L.↗

NASA NTRS1984

Upper and lower bounds for semi-Markov reliability models of reconfigurable systems

This paper determines the information required about system recovery to compute the reliability of a class of reconfigurable systems. Upper and lower bounds are derived for these systems. The class consists of those systems that satisfy five assumptions: the components fail independently at a low constant rate, fault occurrence and system reconfiguration are independent processes, the reliability model is semi-Markov, the recovery functions which describe system configuration have small means and variances, and the system is well designed. The bounds are easy to compute, and examples are included.

White, A. L.↗

NASA NTRS1984

Ultrahigh reliability prediction for fault-tolerant computer systems

A review and a critical evaluation of a representative class of state-of-the-art models for ultrahigh reliability prediction is presented. This evaluation naturally leads to a new model for ultrahigh reliability prediction now under development. The new model combines the flexibility and accuracy of simulation with the speed of analytic models.

Geist, R. M.↗

NASA NTRS1983

Reliability with imperfect diagnostics

A reliability estimation method for systems that continually accumulate faults because of imperfect diagnostics is developed and an application for redundant digital avionics is presented. The present method assumes that if a fault does not appear in a short period of time, it will remain hidden until a majority of components are faulty and the system fails. A certain proportion of a component's faults are detected in a short period of time, and a description of their detection is included in the reliability model. A Markov model of failure during flight for a nonreconfigurable five-plex is presented for a sequence of one-hour flights followed by maintenance.

White, A. L.↗

NASA NTRS1986

Computer-Aided Reliability Estimation

CARE III (Computer-Aided Reliability Estimation, Third Generation) helps estimate reliability of complex, redundant, fault-tolerant systems. Program specifically designed for evaluation of fault-tolerant avionics systems. However, CARE III general enough for use in evaluation of other systems as well.

Bavuso, S. J.↗

NASA NTRS1984

Reliability considerations for the total strain range version of strainrange partitioning

A proposed total strainrange version of strainrange partitioning (SRP) to enhance the manner in which SRP is applied to life prediction is considered with emphasis on how advanced reliability technology can be applied to perform risk analysis and to derive safety check expressions. Uncertainties existing in the design factors associated with life prediction of a component which experiences the combined effects of creep and fatigue can be identified. Examples illustrate how reliability analyses of such a component can be performed when all design factors in the SRP model are random variables reflecting these uncertainties. The Rackwitz-Fiessler and Wu algorithms are used and estimates of the safety index and the probablity of failure are demonstrated for a SRP problem. Methods of analysis of creep-fatigue data with emphasis on procedures for producing synoptic statistics are presented. An attempt to demonstrate the importance of the contribution of the uncertainties associated with small sample sizes (fatique data) to risk estimates is discussed. The procedure for deriving a safety check expression for possible use in a design criteria document is presented.

Wirsching, P. H.↗

NASA NTRS1984

High performance fibers for structurally reliable metal and ceramic composites

Very few of the commercially available high performance fibers with low densities, high Young's moduli, and high tensile strengths possess all the necessary property requirements for providing either metal matrix composites (MMC) or ceramic matrix composites (CMC) with high structural reliability. These requirements are discussed in general and examples are presented of how these property guidelines are influencing fiber evaluation and improvement studies at NASA aimed at developing structurally reliable MMC and CMC for advanced gas turbine engines.

Dicarlo, J. A.↗

NASA NTRS1985

Life and reliability modeling of bevel gear reductions

A reliability model is presented for bevel gear reductions with either a single input pinion or dual input pinions of equal size. The dual pinions may or may not have the same power applied for the analysis. The gears may be straddle mounted or supported in a bearing quill. The reliability model is based on the Weibull distribution. The reduction's basic dynamic capacity is defined as the output torque which may be applied for one million output rotations of the bevel gear with a 90 percent probability of reduction survival.

Savage, M.↗

NASA NTRS1984

Thin-film reliability and engineering overview

The reliability and engineering technology base required for thin film solar energy conversions modules is discussed. The emphasis is on the integration of amorphous silicon cells into power modules. The effort is being coordinated with SERI's thin film cell research activities as part of DOE's Amorphous Silicon Program. Program concentration is on temperature humidity reliability research, glass breaking strength research, point defect system analysis, hot spot heating assessment, and electrical measurements technology.

Ross, R. G., Jr.↗

NASA NTRS1983

Practical preventive reliability using matrix forms

This paper describes a practical new tool to improve the reliability of equipment. It uses a matrix form to help monitor anticipated component faults precisely. The tool provides the practical measures necessary to generate matrix tables that accurately display all causes of failure and all planned programmatic analyses, tests, processes, and inspections. When completed, the matrix tables give users in-depth visibility of the degree of protection against component failure that is provided by the program's preventive measure plans. The matrix form is an excellent technique for tracking, and thereby influencing, the reliability of nonelectronic spacecraft subsystems or components. No electronic applications have been tried, but the procedure can be useful in the electronics field, e.g., in integrated circuit production planning, and perhaps in process control, inspection or test lines for other electronic components. The drawing of forms, and the recording/manipulation of the data can be computerized.

Johnson, S. A.↗

NASA NTRS1985

Thin-film module circuit design: Practical and reliability aspects

This paper will address several aspects of the design and construction of submodules based on thin film amorphous silicon (a-Si) p i n solar cells. Starting from presently attainable single cell characteristics, and a realistic set of specifications, practical module designs are discussed from the viewpoints of efficient designs, the fabrication requirements, and reliability concerns. The examples center mostly on series interconnected modules of the superstrate type with detailed discussions of each portion of the structure in relation to its influence on module efficiency. Emphasis is placed on engineering topics such as: area coverage, optimal geometries, and cost and reliability. Practical constraints on achieving optimal designs, along with some examples of potential pitfalls in the manufacture and subsequent performance of a-Si modules are discussed.

Daiello, R. V.↗

NASA NTRS1985

SCARE: A post-processor program to MSC/NASTRAN for the reliability analysis of structural ceramic components

A computer program was developed for calculating the statistical fast fracture reliability and failure probability of ceramic components. The program includes the two-parameter Weibull material fracture strength distribution model, using the principle of independent action for polyaxial stress states and Batdorf's shear-sensitive as well as shear-insensitive crack theories, all for volume distributed flaws in macroscopically isotropic solids. Both penny-shaped cracks and Griffith cracks are included in the Batdorf shear-sensitive crack response calculations, using Griffith's maximum tensile stress or critical coplanar strain energy release rate criteria to predict mixed mode fracture. Weibull material parameters can also be calculated from modulus of rupture bar tests, using the least squares method with known specimen geometry and fracture data. The reliability prediction analysis uses MSC/NASTRAN stress, temperature and volume output, obtained from the use of three-dimensional, quadratic, isoparametric, or axisymmetric finite elements. The statistical fast fracture theories employed, along with selected input and output formats and options, are summarized. An example problem to demonstrate various features of the program is included.

Gyekenyesi, J. P.↗

NASA NTRS1985

Synthetic bounds for semi-Markov reliability models

Upper and lower bounds are derived for the probability of failure for a class of highly reliable process control computers. The bounds are synthetic in the sense that the descriptions of component failure and system recovery are assumed to be obtained from different sources. The reliability model is constructed under the assumption that the processes are independent.

White, A. L.↗

NASA NTRS1985

Reliability and mass analysis of dynamic power conversion systems with parallel of standby redundancy

A combinatorial reliability approach is used to identify potential dynamic power conversion systems for space mission applications. A reliability and mass analysis is also performed, specifically for a 100 kWe nuclear Brayton power conversion system with parallel redundancy. Although this study is done for a reactor outlet temperature of 1100K, preliminary system mass estimates are also included for reactor outlet temperatures ranging up to 1500 K.

Juhasz, A. J.↗

NASA NTRS1986

System life and reliability modeling for helicopter transmissions

A computer program which simulates life and reliability of helicopter transmissions is presented. The helicopter transmissions may be composed of spiral bevel gear units and planetary gear units - alone, in series or in parallel. The spiral bevel gear units may have either single or dual input pinions, which are identical. The planetary gear units may be stepped or unstepped and the number of planet gears carried by the planet arm may be varied. The reliability analysis used in the program is based on the Weibull distribution lives of the transmission components. The computer calculates the system lives and dynamic capacities of the transmission components and the transmission. The system life is defined as the life of the component or transmission at an output torque at which the probability of survival is 90 percent. The dynamic capacity of a component or transmission is defined as the output torque which can be applied for one million output shaft cycles for a probability of survival of 90 percent. A complete summary of the life and dynamic capacity results is produced by the program.

Savage, M.↗

NASA NTRS1985

Reliability analysis

The objective was to search for and demonstrate approaches and concepts for fast wafer probe tests of mechanisms affecting the reliability of MOS technology and, based on these, develop and optimize test chips and test procedures. Progress is reported on four important wafer-level reliability problems: gate-oxide radiation hardness; hot-electron effects; time-dependence dielectric breakdown; and electromigration.

Source record↗

NASA NTRS1986

Factors that affect reliability of nondestructive detection of flaws in structural ceramics

The factors that affect reliability of nondestructive detection of flaws in structural ceramics by microfocus radiography and scanning laser acoustic microscopy (SLAM) were investigated. Reliability of void detection in silicon nitride and silicon carbide by microfocus X-rays was affected by photon energy level, material chemistry in the immediate vicinity of the void, and the presence of loose powder aggregates inside the void cavity. The sensitivity of SLAM to voids was affected by material microstructure, the level of porosity, and the condition of the specimen surfaces. Statistical results are presented in the form of probability of detection as a function of void diameter for green compacts and sintered materials.

Klima, S. J.↗