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NASA NTRS2002

A Conceptual Design for a Reliable Optical Bus (ROBUS)

The Scalable Processor-Independent Design for Electromagnetic Resilience (SPIDER) is a new family of fault-tolerant architectures under development at NASA Langley Research Center (LaRC). The SPIDER is a general-purpose computational platform suitable for use in ultra-reliable embedded control applications. The design scales from a small configuration supporting a single aircraft function to a large distributed configuration capable of supporting several functions simultaneously. SPIDER consists of a collection of simplex processing elements communicating via a Reliable Optical Bus (ROBUS). The ROBUS is an ultra-reliable, time-division multiple access broadcast bus with strictly enforced write access (no babbling idiots) providing basic fault-tolerant services using formally verified fault-tolerance protocols including Interactive Consistency (Byzantine Agreement), Internal Clock Synchronization, and Distributed Diagnosis. The conceptual design of the ROBUS is presented in this paper including requirements, topology, protocols, and the block-level design. Verification activities, including the use of formal methods, are also discussed.

Miner, Paul S.↗
NASA NTRS2002

Reliability Analysis of Brittle Material Structures - Including MEMS(?) - With the CARES/Life Program

Brittle materials are being used, or considered, for a wide variety of high tech applications that operate in harsh environments, including static and rotating turbine parts. thermal protection systems, dental prosthetics, fuel cells, oxygen transport membranes, radomes, and MEMS. Designing components to sustain repeated load without fracturing while using the minimum amount of material requires the use of a probabilistic design methodology. The CARES/Life code provides a general-purpose analysis tool that predicts the probability of failure of a ceramic component as a function of its time in service. For this presentation an interview of the CARES/Life program will be provided. Emphasis will be placed on describing the latest enhancements to the code for reliability analysis with time varying loads and temperatures (fully transient reliability analysis). Also, early efforts in investigating the validity of using Weibull statistics, the basis of the CARES/Life program, to characterize the strength of MEMS structures will be described as as well as the version of CARES/Life for MEMS (CARES/MEMS) being prepared which incorporates single crystal and edge flaw reliability analysis capability. It is hoped this talk will open a dialog for potential collaboration in the area of MEMS testing and life prediction.

Nemeth, Noel N.↗
NASA NTRS2003

Design for Verification: Using Design Patterns to Build Reliable Systems

Components so far have been mainly used in commercial software development to reduce time to market. While some effort has been spent on formal aspects of components, most of this was done in the context of programming language or operating system framework integration. As a consequence, increased reliability of composed systems is mainly regarded as a side effect of a more rigid testing of pre-fabricated components. In contrast to this, Design for Verification (D4V) puts the focus on component specific property guarantees, which are used to design systems with high reliability requirements. D4V components are domain specific design pattern instances with well-defined property guarantees and usage rules, which are suitable for automatic verification. The guaranteed properties are explicitly used to select components according to key system requirements. The D4V hypothesis is that the same general architecture and design principles leading to good modularity, extensibility and complexity/functionality ratio can be adapted to overcome some of the limitations of conventional reliability assurance measures, such as too large a state space or too many execution paths.

Mehlitz, Peter C.↗
NASA NTRS2003

Long-Term Reliability of High Speed SiGe/Si Heterojunction Bipolar Transistors

Accelerated lifetime tests were performed on double-mesa structure Si/Si0.7Ge0.3/Si npn heterojunction bipolar transistors, grown by molecular beam epitaxy, in the temperature range of 175C-275C. Both single- and multiple finger transistors were tested. The single-finger transistors (with 5x20 micron sq m emitter area) have DC current gains approximately 40-50 and f(sub T) and f(sub MAX) of up to 22 GHz and 25 GHz, respectively. The multiple finger transistors (1.4 micron finger width, 9 emitter fingers with total emitter area of 403 micron sq m) have similar DC current gain but f(sub T) of 50 GHz. It is found that a gradual degradation in these devices is caused by the recombination enhanced impurity diffusion (REID) of boron atoms from the p-type base region and the associated formation of parasitic energy barriers to electron transport from the emitter to collector layers. This REID has been quantitatively modeled and explained, to the first order of approximation, and the agreement with the measured data is good. The mean time to failure (MTTF) of the devices at room temperature is estimated from the extrapolation of the Arrhenius plots of device lifetime versus reciprocal temperature. The results of the reliability tests offer valuable feedback for SiGe heterostructure design in order to improve the long-term reliability of the devices and circuits made with them. Hot electron induced degradation of the base-emitter junction was also observed during the accelerated lifetime testing. In order to improve the HBT reliability endangered by the hot electrons, deuterium sintered techniques have been proposed. The preliminary results from this study show that a deuterium-sintered HBT is, indeed, more resistant to hot-electron induced base-emitter junction degradation. SiGe/Si based amplifier circuits were also subjected to lifetime testing and we extrapolate MTTF is approximately 1.1_10(exp 6) hours at 125iC junction temperature from the circuit lifetime data.

Ponchak, George E.↗
NASA NTRS2002

Reliability and Productivity Modeling for the Optimization of Separated Spacecraft Interferometers

As technological systems grow in capability, they also grow in complexity. Due to this complexity, it is no longer possible for a designer to use engineering judgement to identify the components that have the largest impact on system life cycle metrics, such as reliability, productivity, cost, and cost effectiveness. One way of identifying these key components is to build quantitative models and analysis tools that can be used to aid the designer in making high level architecture decisions. Once these key components have been identified, two main approaches to improving a system using these components exist: add redundancy or improve the reliability of the component. In reality, the most effective approach to almost any system will be some combination of these two approaches, in varying orders of magnitude for each component. Therefore, this research tries to answer the question of how to divide funds, between adding redundancy and improving the reliability of components, to most cost effectively improve the life cycle metrics of a system. While this question is relevant to any complex system, this research focuses on one type of system in particular: Separate Spacecraft Interferometers (SSI). Quantitative models are developed to analyze the key life cycle metrics of different SSI system architectures. Next, tools are developed to compare a given set of architectures in terms of total performance, by coupling different life cycle metrics together into one performance metric. Optimization tools, such as simulated annealing and genetic algorithms, are then used to search the entire design space to find the "optimal" architecture design. Sensitivity analysis tools have been developed to determine how sensitive the results of these analyses are to uncertain user defined parameters. Finally, several possibilities for the future work that could be done in this area of research are presented.

Kenny, Sean↗
NASA NTRS1991

The Infeasibility of Quantifying the Reliability of Life-Critical Real-Time Software

This paper affirms that the quantification of life-critical software reliability is infeasible using statistical methods whether applied to standard software or fault-tolerant software. The classical methods of estimating reliability are shown to lead to exhorbitant amounts of testing when applied to life-critical software. Reliability growth models are examined and also shown to be incapable of overcoming the need for excessive amounts of testing. The key assumption of software fault tolerance separately programmed versions fail independently is shown to be problematic. This assumption cannot be justified by experimentation in the ultrareliability region and subjective arguments in its favor are not sufficiently strong to justify it as an axiom. Also, the implications of the recent multiversion software experiments support this affirmation.

Butler, Ricky W.↗
NASA NTRS2005

A Reliable Service-Oriented Architecture for NASA's Mars Exploration Rover Mission

The Collaborative Information Portal (CIP) was enterprise software developed jointly by the NASA Ames Research Center and the Jet Propulsion Laboratory (JPL) for NASA's highly successful Mars Exploration Rover (MER) mission. Both MER and CIP have performed far beyond their original expectations. Mission managers and engineers ran CIP inside the mission control room at JPL, and the scientists ran CIP in their laboratories, homes, and offices. All the users connected securely over the Internet. Since the mission ran on Mars time, CIP displayed the current time in various Mars and Earth time zones, and it presented staffing and event schedules with Martian time scales. Users could send and receive broadcast messages, and they could view and download data and image files generated by the rovers' instruments. CIP had a three-tiered, service-oriented architecture (SOA) based on industry standards, including J2EE and web services, and it integrated commercial off-the-shelf software. A user's interactions with the graphical interface of the CIP client application generated web services requests to the CIP middleware. The middleware accessed the back-end data repositories if necessary and returned results for these requests. The client application could make multiple service requests for a single user action and then present a composition of the results. This happened transparently, and many users did not even realize that they were connecting to a server. CIP performed well and was extremely reliable; it attained better than 99% uptime during the course of the mission. In this paper, we present overviews of the MER mission and of CIP. We show how CIP helped to fulfill some of the mission needs and how people used it. We discuss the criteria for choosing its architecture, and we describe how the developers made the software so reliable. CIP's reliability did not come about by chance, but was the result of several key design decisions. We conclude with some of the important lessons we learned form developing, deploying, and supporting the software.

Mak, Ronald↗
NASA NTRS2005

Reliability Improvements in Liquid Rocket Engine Instrumentation

Instrumentation hardware is often the weak link in advanced liquid fueled propulsion systems. The development of the Space Shuttle Main Engine (SSME) was no exception. By sheer necessity, a reusable, high energy, low weight engine system often relegates the instrumentation hardware to the backseat in the critical hardware development process. This produces less than optimum hardware constraints; including size, location, mounting, redundancy, and signal conditioning. This can negatively affect the development effort and ultimately the system reliability. The challenge was clear, however, the outcome was less certain. Unfortunately, the SSME hardware development culminated in series of measurement failures, most significant of which was the premature engine shutdown during the launch of STS-51F on July 29, 1985. The Return to Flight activities following the Challenger disaster redoubled our efforts to eliminate, once and for all, sensor malfunctions as the determining factor in overall engine reliability. This paper describes each phase of this effort in detail and includes discussion of the tasks related to improving measurement reliability.

Hill, A.↗
NASA NTRS2006

AST Critical Propulsion and Noise Reduction Technologies for Future Commercial Subsonic Engines Area of Interest 1.0: Reliable and Affordable Control Systems

The General Electric Reliable and Affordable Controls effort under the NASA Advanced Subsonic Technology (AST) Program has designed, fabricated, and tested advanced controls hardware and software to reduce emissions and improve engine safety and reliability. The original effort consisted of four elements: 1) a Hydraulic Multiplexer; 2) Active Combustor Control; 3) a Variable Displacement Vane Pump (VDVP); and 4) Intelligent Engine Control. The VDVP and Intelligent Engine Control elements were cancelled due to funding constraints and are reported here only to the state they progressed. The Hydraulic Multiplexing element developed and tested a prototype which improves reliability by combining the functionality of up to 16 solenoids and servo-valves into one component with a single electrically powered force motor. The Active Combustor Control element developed intelligent staging and control strategies for low emission combustors. This included development and tests of a Controlled Pressure Fuel Nozzle for fuel sequencing, a Fuel Multiplexer for individual fuel cup metering, and model-based control logic. Both the Hydraulic Multiplexer and Controlled Pressure Fuel Nozzle system were cleared for engine test. The Fuel Multiplexer was cleared for combustor rig test which must be followed by an engine test to achieve full maturation.

Myers, William↗
NASA NTRS2007

Design of Oil-Lubricated Machine for Life and Reliability

In the post-World War II era, the major technology drivers for improving the life, reliability, and performance of rolling-element bearings and gears have been the jet engine and the helicopter. By the late 1950s, most of the materials used for bearings and gears in the aerospace industry had been introduced into use. By the early 1960s, the life of most steels was increased over that experienced in the early 1940s, primarily by the introduction of vacuum degassing and vacuum melting processes in the late 1950s. The development of elastohydrodynamic (EHD) theory showed that most rolling bearings and gears have a thin film separating the contacting bodies during motion and it is that film which affects their lives. Computer programs modeling bearing and gear dynamics that incorporate probabilistic life prediction methods and EHD theory enable optimization of rotating machinery based on life and reliability. With improved manufacturing and processing, the potential improvement in bearing and gear life can be as much as 80 times that attainable in the early 1950s. The work presented summarizes the use of laboratory fatigue data for bearings and gears coupled with probabilistic life prediction and EHD theories to predict the life and reliability of a commercial turboprop gearbox. The resulting predictions are compared with field data.

Zaretsky, Erwin V.↗
NASA NTRS2007

Stress Rupture Life Reliability Measures for Composite Overwrapped Pressure Vessels

Composite Overwrapped Pressure Vessels (COPVs) are often used for storing pressurant gases onboard spacecraft. Kevlar (DuPont), glass, carbon and other more recent fibers have all been used as overwraps. Due to the fact that overwraps are subjected to sustained loads for an extended period during a mission, stress rupture failure is a major concern. It is therefore important to ascertain the reliability of these vessels by analysis, since the testing of each flight design cannot be completed on a practical time scale. The present paper examines specifically a Weibull statistics based stress rupture model and considers the various uncertainties associated with the model parameters. The paper also examines several reliability estimate measures that would be of use for the purpose of recertification and for qualifying flight worthiness of these vessels. Specifically, deterministic values for a point estimate, mean estimate and 90/95 percent confidence estimates of the reliability are all examined for a typical flight quality vessel under constant stress. The mean and the 90/95 percent confidence estimates are computed using Monte-Carlo simulation techniques by assuming distribution statistics of model parameters based also on simulation and on the available data, especially the sample sizes represented in the data. The data for the stress rupture model are obtained from the Lawrence Livermore National Laboratories (LLNL) stress rupture testing program, carried out for the past 35 years. Deterministic as well as probabilistic sensitivities are examined.

Murthy, Pappu L. N.↗
NASA NTRS2007

Design for Reliability and Safety Approach for the New NASA Launch Vehicle

The United States National Aeronautics and Space Administration (NASA) is in the midst of a space exploration program intended for sending crew and cargo to the international Space Station (ISS), to the moon, and beyond. This program is called Constellation. As part of the Constellation program, NASA is developing new launch vehicles aimed at significantly increase safety and reliability, reduce the cost of accessing space, and provide a growth path for manned space exploration. Achieving these goals requires a rigorous process that addresses reliability, safety, and cost upfront and throughout all the phases of the life cycle of the program. This paper discusses the "Design for Reliability and Safety" approach for the NASA new launch vehicles, the ARES I and ARES V. Specifically, the paper addresses the use of an integrated probabilistic functional analysis to support the design analysis cycle and a probabilistic risk assessment (PRA) to support the preliminary design and beyond.

Safie, Fayssal M.↗
NASA NTRS2006

Thermal Cycle Reliability of PBGA/CCGA 717 I/Os

Status of thermal cycle test results for a nonfunctional daisy-chained peripheral ceramic column grid array (CCGA) and its plastic ball grid array (PBGA) version. both having 560 I/Os. were presented in last year's conference. Test results included environmental data for three different thermal cycle regimes (-55 C/125 C, -55 C/100 C, and -50 C /75 C). Update information on these - especially failure type for assemblies with high and low solder volumes-were presented. The thermal cycle test procedure followed those recommended IPC-9701 for tin-lead solder joint assemblies. Revision A of this specification covers guideline thermal cycle requirements for Pb-free solder joints. Some background information discussed during release of this specification with its current guideline recommendations were also presented. In a recent reliability investigation a fully populated CCGA with 717 I/Os was also considered for assembly reliability. evaluation. The functional package is a field-programmable gate array that has much higher processing power than its previous version. This new package is smaller in dimension, has no interposer, and has a thinner column wrapped with copper for reliability improvement. This paper will also present thermal cycle test results for this package assembly and its plastic version with 728 I/Os. both of which were exposed to three different cycle regimes. Two cycle profiles were those specified by IPC- 9701A for tin-lead, i.e. -55 to 100 C and -55 to 125 C and one was a cycle profile specified by Mil-Std-883, i.e.. -65 C/150 C which is generally used for ceramic hybrid packages. Per IPC-9701 A, test vehicles were built using daisy chain packages and were continuously monitored. The effects of many process and assembly variables-including corner staking commonly used for improving resistance to mechanical loading such as drop and vibration loads--were also considered as part of the test matrix. Optical photomicrographs were taken at various thermal cycle intervals to document damage progress and behavior. Representative samples of these along with cross-sectional photomicrographs at higher magnification taken by scanning electron microscopy (SEM) to determine crack propagation and failure analyses for packages are also presented.

staking↗
NASA NTRS2008

Robustness Analysis and Reliable Flight Regime Estimation of an Integrated Resilent Control System for a Transport Aircraft

Formal robustness analysis of aircraft control upset prevention and recovery systems could play an important role in their validation and ultimate certification. As a part of the validation process, this paper describes an analysis method for determining a reliable flight regime in the flight envelope within which an integrated resilent control system can achieve the desired performance of tracking command signals and detecting additive faults in the presence of parameter uncertainty and unmodeled dynamics. To calculate a reliable flight regime, a structured singular value analysis method is applied to analyze the closed-loop system over the entire flight envelope. To use the structured singular value analysis method, a linear fractional transform (LFT) model of a transport aircraft longitudinal dynamics is developed over the flight envelope by using a preliminary LFT modeling software tool developed at the NASA Langley Research Center, which utilizes a matrix-based computational approach. The developed LFT model can capture original nonlinear dynamics over the flight envelope with the ! block which contains key varying parameters: angle of attack and velocity, and real parameter uncertainty: aerodynamic coefficient uncertainty and moment of inertia uncertainty. Using the developed LFT model and a formal robustness analysis method, a reliable flight regime is calculated for a transport aircraft closed-loop system.

Shin, Jong-Yeob↗
NASA NTRS2008

Effect of Surge Current Testing on Reliability of Solid Tantalum Capacitors

Tantalum capacitors manufactured per military specifications are established reliability components and have less than 0.001% of failures per 1000 hours for grades D or S, thus positioning these parts among electronic components with the highest reliability characteristics. Still, failures of tantalum capacitors do happen and when it occurs it might have catastrophic consequences for the system. To reduce this risk, further development of a screening and qualification system with special attention to the possible deficiencies in the existing procedures is necessary. The purpose of this work is evaluation of the effect of surge current stress testing on reliability of the parts at both steady-state and multiple surge current stress conditions. In order to reveal possible degradation and precipitate more failures, various part types were tested and stressed in the range of voltage and temperature conditions exceeding the specified limits. A model to estimate the probability of post-surge current testing-screening failures and measures to improve the effectiveness of the screening process has been suggested.

Teverovsky, Alexander↗
NASA NTRS2008

Reliability Assessment of Graphite Specimens under Multiaxial Stresses

An investigation was conducted to predict the failure strength response of IG-100 nuclear grade graphite exposed to multiaxial stresses. As part of this effort, a review of failure criteria accounting for the stochastic strength response is provided. The experimental work was performed in the early 1990s at the Oak Ridge National Laboratory (ORNL) on hollow graphite tubes under the action of axial tensile loading and internal pressurization. As part of the investigation, finite-element analysis (FEA) was performed and compared with results of FEA from the original ORNL report. The new analysis generally compared well with the original analysis, although some discrepancies in the location of peak stresses was noted. The Ceramics Analysis and Reliability Evaluation of Structures Life prediction code (CARES/Life) was used with the FEA results to predict the quadrants I (tensile-tensile) and quadrant IV (compression-tension) strength response of the graphite tubes for the principle of independent action (PIA), the Weibull normal stress averaging (NSA), and the Batdorf multiaxial failure theories. The CARES/Life reliability analysis showed that all three failure theories gave similar results in quadrant I but that in quadrant IV, the PIA and Weibull normal stress-averaging theories were not conservative, whereas the Batdorf theory was able to correlate well with experimental results. The conclusion of the study was that the Batdorf theory should generally be used to predict the reliability response of graphite and brittle materials in multiaxial loading situations.

Sookdeo, Steven↗
NASA NTRS2008

Reliability Practice at NASA Goddard Space Flight Center

This paper describes in brief the Reliability and Maintainability (R&M) Programs performed directly by the reliability branch at Goddard Space Flight Center (GSFC). The mission assurance requirements flow down is explained. GSFC practices for PRA, reliability prediction/fault tree analysis/reliability block diagram, FMEA, part stress and derating analysis, worst case analysis, trend analysis, limit life items are presented. Lessons learned are summarized and recommendations on improvement are identified.

Pruessner, Paula S.↗