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The present invention provides organic single crystal films of less than 20 .mu.m, and devices and methods of making such films. The crystal films are useful in electro-optical applications and can be provided as part of an electro-optical device which provides strength, durability, and relative ease of manipulation of the mono-crystalline films during and after crystal growth.
We present our results for using thin film lithium niobate devices for electric field sensing applications. Micro-ring modulator and Mach–Zehnder modulator-based electric field sensors are demonstrated. Micro-ring resonator sensors can be used for low frequency (up to several GHz) electric field sensing applications and achieve a high sensitivity of 80 mV/(m Hz 1/2 ) with a very compact size of 300 μm, as limited by the intensity and phase noise of the used distributed feedback laser. A measurement bandwidth of 2.5 GHz is measured for these sensors and is limited by the detector bandwidth. Alternatively, Mach–Zehnder modulators allow for perfect phase matching between the radio frequency signals and optical signals, and they can be used for electric field sensing up to several THz. A sensitivity of 2.2 V/(m Hz 1/2 ) was obtained using our Mach–Zehnder electric field sensor with an interaction length of 600 μm. The Mach–Zehnder sensor can sense electric fields with frequencies reaching 0.6 THz based on the calculated results.
To simplify the process of thermally bonding thin plastic films to optical elements and to help eliminate the source of the flaws, a film-application device (FAD) is developed. Any plastic film may be used to make the coatings, but thin polyethylene is particularly useful for this application since it is readily available. If more than one layer of polyethylene is required, several layers may be applied, one layer at a time. The coatings may be used for protecting optical elements or to reduce surface reflection of radiation with wavelengths greater than 20 microns. When the FAD is used without the central plate it may be used to stretch single sheets of plastic material to make pellicles or beam-splitters for many applications.
Colloidal quantum dots (QDs) are semiconductor nanocrystals that have unique size-tunable optoelectronic properties and are suitable for wet processing. QD research aims to answer fundamental questions about the chemical and physical properties of nanoscale materials and use these tools for technological applications ranging from bio-imaging to quantum optics. At the core of this field is a set of synthetic, processing and analytical methods designed to produce QDs in uniform ensembles that meet the highest performance standards. Here, this Primer reviews QD fabrication methods with a focus on the applications of QDs in printed optoelectronics and quantum optics. After outlining the current state-of-the-art QD syntheses, the experimental and computational analysis of QDs is discussed. These topics are then connected to the methodologies, processes and concepts required for developing QD-based photodetectors, light-emitting devices and quantum optics applications. Special attention is paid to challenges in reproducibility and current limitations of the field, such as the need to balance non-restricted material composition with high performing technology while achieving long-term stability in QD devices under operating conditions. Finally, the ongoing advancement in QD synthesis, precise atomic-level analysis and computational methodologies are highlighted as key drivers towards rational QD design, particularly in understanding how structural changes under loading impact QD properties.
McDonnell Douglas Missile Systems Company (MDMSC) has developed a laser ignition subsystem (LIS) for air-to-air missile applications. The MDMSC subsystem is designed to activate batteries, unlock fins, and sequence propulsion system events. The subsystem includes Pyro Zirconium Pump (PZP) lasers, mechanical Safe & Arm, fiber-optic distribution system, and optically activated pyrotechnic devices (initiators, detonators, and thermal batteries). The LIS design has incorporated testability features for the laser modules, drive electronics, fiber-optics, and pyrotechnics. Several of the LIS have been fabricated and have supported thermal battery testing, integral rocket ramjet testing, and have been integrated into integral rocket ramjet flight test vehicles as part of the flight control subsystem.
A dual beam interferometer device is disclosed that enables moving an optics module in a direction, which changes the path lengths of two beams of light. The two beams reflect off a surface of an object and generate different speckle patterns detected by an element, such as a camera. The camera detects a characteristic of the surface.
Methods, devices and systems for providing accurate measurements of timing errors using optical techniques are described. An example timing measurement device includes an optical hybrid that receives two optical pulse trains and produces two or more phase shifted optical outputs. The timing measurement device further includes two or more optical filters that receive the outputs of the optical hybrid to produce multiple pulse signals with distinctive frequency bands. The device also includes one or more photodetectors and analog-to-digital converters to receive to produce electrical signals in the digital domain corresponding to the optical outputs of the hybrid. A timing error associated with the optical pulse trains can be determined using the electrical signals in digital domain based on a computed phase difference between a first frequency band signal and a second frequency band signal and a computed frequency difference between the first frequency band signal and the second frequency band.
Methods, devices and systems for providing accurate measurements of timing errors using optical techniques are described. An example timing measurement device includes an optical hybrid that receives two optical pulse trains and produces two or more phase shifted optical outputs. The timing measurement device further includes two or more optical filters that receive the outputs of the optical hybrid to produce multiple pulse signals with distinctive frequency bands. The device also includes one or more photodetectors and analog-to-digital converters to receive to produce electrical signals in the digital domain corresponding to the optical outputs of the hybrid. A timing error associated with the optical pulse trains can be determined using the electrical signals in digital domain based on a computed phase difference between a first frequency band signal and a second frequency band signal and a computed frequency difference between the first frequency band signal and the second frequency band.
The Laser Geodynamic Satellite-2 (LAGEOS-2) has undergone extensive optical testing at NASA Goddard Space Flight Center during 1989. The techniques included measuring the far field diffraction pattern using cw and pulsed lasers. In the pulsed measurement technique, response of the satellite was studied by measuring the far-field diffraction pattern (FFDP) as a function of pulsewidth, wavelength, polarization, position in the FFDP, detector/processing techniques, and satellite orientation. The purpose of the pulsed laser testing was two-fold: (1) to characterize the satellite optical response with the detector and signal processing electronics currently used in most SLR stations using the portable laser ranging standard, and (2) to characterize the satellite response for various conditions using the highest bandwidth optical detector (streak camera) available for the next generation of satellite laser ranging (SLR) technology. The portable ranging standard employed multiple measurement devices and an optical calibration scheme to eliminate range-dependent and amplitude-dependent systematics. These precautions were taken to eliminate/minimize instrumental errors and provide maximum accuracy. For LAGEOS orbit (6000 Km), ground stations are located 34 to 38 Mu radians off the axis of the return signal from the satellite; therefore, an optical mask was used to restrict the field of view (FOV) of detection to this annular region of the FFDP. The two measurement techniques were implemented using an aperture sharing scheme and complemented each other by providing mutual verification.
A device used in the optical alignment of machinery to maintain a measuring scale in the proper position for optical readings to be taken is described. The device consists of a block containing a notch in the shape of an inverted ""v'' and a rotatable plug positioned over the centerline of notch. The block is placed on the object to be aligned, the notch allows the block to be securely placed upon flat or curved surfaces. A weighted measuring scale is inserted through plug so that it contacts the object to be aligned. The scale and plug combination can be rotated so that the scale faces an optical aligning instrument. The instrument is then used in conjunction with the scale to measure the distance of the machinery from a reference plane.
The facsimile camera is an optical-mechanical scanning device which is an attractive candidate for planetary lander imaging systems and has been selected for the Viking/Mars mission because of its light weight, small size, and low power requirement. Other advantages are that it can provide good radiometric and photogrammetric accuracy because the complete field of view is scanned with a single photodetector located on or near the optical axis of the objective lens. In addition, this device has the potential capability of multispectral imaging and spectrometric measurements.
NASA s Space Shuttle was built to withstand multiple failures while still keeping the crew and vehicle safe. Although the design of the Space Shuttle had a great deal of redundancy built into each system, there were often additional ways to keep systems in the best configuration if a failure were to occur. One such method was to use select pieces of hardware in a way for which they were not primarily intended. The primary function of the Heads-Up Display (HUD) was to provide the crew with a display of flight critical information during the entry phase. The primary function of the Crew Optical Alignment Sight (COAS) was to provide the crew an optical alignment capability for rendezvous and docking phases. An alignment device was required to keep the Inertial Measurement Units (IMUs) well aligned for a safe Entry; nominally this alignment device would be the two on-board Star Trackers. However, in the event of a Star Tracker failure, the HUD or COAS could also be used as a backup alignment device, but only if the device had been calibrated beforehand. Once the HUD or COAS was calibrated and verified then it was considered an adequate backup to the Star Trackers for entry IMU alignment. There were procedures in place and the astronauts were trained on how to accurately calibrate the HUD or COAS and how to use them as an alignment device. The calibration procedure for the HUD and COAS had been performed on many Shuttle missions. Many of the first calibrations performed were for data gathering purposes to determine which device was more accurate as a backup alignment device, HUD or COAS. Once this was determined, the following missions would frequently calibrate the HUD in order to be one step closer to having the device ready in case it was needed as a backup alignment device.
A multilayer dielectric device has been fabricated as a prototype of a low-loss, low-distortion, transmissive optical phase modulator that would provide as much as a full cycle of phase change for all frequency components of a transmitted optical pulse over a frequency band as wide as 6.3 THz. Arrays of devices like this one could be an alternative to the arrays of mechanically actuated phase-control optics (adaptive optics) that have heretofore been used to correct for wave-front distortions in highly precise optical systems. Potential applications for these high-speed wave-front-control arrays of devices include agile beam steering, optical communications, optical metrology, optical tracking and targeting, directional optical ranging, and interferometric astronomy. The device concept is based on the same principle as that of band-pass interference filters made of multiple dielectric layers with fractional-wavelength thicknesses, except that here there is an additional focus on obtaining the desired spectral phase profile in addition to the device s spectral transmission profile. The device includes a GaAs substrate, on which there is deposited a stack of GaAs layers alternating with AlAs layers, amounting to a total of 91 layers. The design thicknesses of the layers range from 10 nm to greater than 1 micrometer. The number of layers and the thickness of each layer were chosen in a computational optimization process in which the wavelength dependences of the indices of refraction of GaAs and AlAs were taken into account as the design was iterated to maximize the transmission and minimize the group-velocity dispersion for a wavelength band wide enough to include all significant spectral components of the pulsed optical signal to be phase modulated.
Active or "smart" electro-optical shutters proposed for protection of photodetectors, imaging devices, and other sensitive optical or optoelectronic elements. Responds rapidly and automatically to increase in illumination above prescribed level.
The Optical Vector Analyzer (OVA) 1550 significantly reduces the time and cost of testing sophisticated optical components. The technology grew from the research Luna Technologies' Dr. Mark Froggatt conducted on optical fiber strain measurement while working at Langley Research Center. Dr. Froggatt originally developed the technology for non- destructive evaluation testing at Langley. The new technique can provide 10,000 independent strain measurements while adding less than 10 grams to the weight of the vehicle. The OVA is capable of complete linear characterization of single-mode optical components used in high- bit-rate applications. The device can test most components over their full range in less than 30 seconds, compared to the more than 20 minutes required by other testing methods. The dramatically shortened measurement time results in increased efficiency in final acceptance tests of optical devices, and the comprehensive data produced by the instrument adds considerable value for component consumers. The device eliminates manufacturing bottlenecks, while reducing labor costs and wasted materials during production.
NASA's Marshall Space Flight Center has developed a simple, cost-effective optical method for thin film stress measurements during growth and/or subsequent annealing processes. Stress arising in thin film fabrication presents production challenges for electronic devices, sensors, and optical coatings; it can lead to substrate distortion and deformation, impacting the performance of thin film products. NASA's technique measures in-situ stress using a simple, noncontact fiber optic probe in the thin film vacuum deposition chamber. This enables real-time monitoring of stress during the fabrication process and allows for efficient control of deposition process parameters. By modifying process parameters in real time during fabrication, thin film stress can be optimized or controlled, improving thin film product performance.
An approach for the development of the optical scanner as a screening inspection instrument for microcircuits involves comparing the quantitative differences in photoresponse images and then correlating them with electrical parameter differences in test devices. The existing optical scanner was modified so that the photoresponse data could be recorded and subsequently digitized. A method was devised for applying digital image processing techniques to the digitized photoresponse data in order to quantitatively compare the data. Electrical tests were performed and photoresponse images were recorded before and following life test intervals on two groups of test devices. Correlations were made between differences or changes in the electrical parameters of the test devices.
A device for eliminating unwanted reflections from refractive optical elements in an optical system is provided. The device operates to prevent desired multiple fringe patterns from being obscured by reflections from refractive elements positioned in proximity to a focal plane of the system. The problem occurs when an optical beam is projected into, and reflected back out of, the optical system. Surfaces of the refractive elements reflect portions of the beam which interfere with portions of the beam which are transmitted through the refractive elements. Interference between the reflected and transmitted portions of the beam produce multiple fringe sets which tend to obscure desired interference fringes. With the refractive optical element in close proximity to the focal plane of the system, the undesired reflected light reflects at an angle 180 degrees opposite from the desired transmitted beam. The device exploits the 180-degree offset, or rotational shear, of the undesired reflected light by providing an optical stop for blocking one-half of the cross-section of the test beam. By blocking one-half of the test beam, the undesired offset beam is blocked, while the returning transmitted beam passes into the optical system unaffected. An image is thereby produced from only the desired transmitted beam. In one configuration, the blocking device includes a semicircular aperture which is caused to rotate about the axis of the test beam. By rotating, all portions of the test beam are cyclically projected into the optical system to thereby produce a complete test image. The rotating optical stop is preferably caused to rotate rapidly to eliminate flicker in the resulting image.