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At least 667 records · Page 37

Image data compression with vector quantization in the transform domain

In this paper, an algorithm is presented for image data compression based upon vector quantization of the two-dimensional discrete cosine transformed coefficients. The ac energies of the transformed blocks are used to classify them into eight different ac classes. The ac coefficients of the transformed blocks of class one are set to zero, while those of classes two through eight are transmitted by seven different code books. The dc coefficients of all eight classes are scalar quantized by an adaptive uniform quantizer. As a result, only 4.5 bits instead of eight bits are required to transmit the dc coefficient with negligible additional degradation. Overall, this algorithm requires approximately 0.75 bits per pixel and gives an average reconstruction error of 7.1.

Abdelwahab, A. A.↗

Channel coding for digital HDTV terrestrial broadcasting

The Federal Communications Commission of the United States has ruled that high-definition television (HDTV) will occupy no more than 6 MHz of the VHF and UHF bands now used for conventional TV. In order to transmit the HDTV signal in 6 MHz, the four United States digital HDTV proponents, the DigiCipher, DSC-HDTV, ADTV, and ATVA-P systems, are reducing the video data rate of HDTV to 15-17 Mb/s, a compression ratio of approximately 60-70 times. The high compression dictates that channel coding be used to avoid block errors and multiframe error propagation. High efficiency in channel utilization required by the 6-MHz limitation means that the channel must be properly equalized and that the multipath and interfering signals must be severely limited. The channel coding techniques used for error reduction include data interleaving, error detection and replacement, and error correction at different levels of protection for bits and blocks of unequal importance.

Beakley, Guy W.↗

Triple-Error-Correcting Codec ASIC

Coder/decoder constructed on single integrated-circuit chip. Handles data in variety of formats at rates up to 300 Mbps, correcting up to 3 errors per data block of 256 to 512 bits. Helps reduce cost of transmitting data. Useful in many high-data-rate, bandwidth-limited communication systems such as; personal communication networks, cellular telephone networks, satellite communication systems, high-speed computing networks, broadcasting, and high-reliability data-communication links.

Jones, Robert E.↗

Analysis of earth albedo effect on sun sensor measurements based on theoretical model and mission experience

Analysis of flight data from previous missions indicates that anomalous Sun sensor readings could be caused by Earth albedo interference. A previous Sun sensor study presented a detailed mathematical model of this effect. The model can be used to study the effect of both diffusive and specular reflections and to improve Sun angle determination based on perturbed Sun sensor measurements, satellite position, and an approximate knowledge of attitude. The model predicts that diffuse reflected light can cause errors of up to 10 degrees in Coarse Sun Sensor (CSS) measurements and 5 to 10 arc sec in Fine Sun Sensor (FSS) measurements, depending on spacecraft orbit and attitude. The accuracy of these sensors is affected as long as part of the illuminated Earth surface is present in the sensor field of view. Digital Sun Sensors (DSS) respond in a different manner to the Earth albedo interference. Most of the time DSS measurements are not affected, but for brief periods of time the Earth albedo can cause errors which are a multiple of the sensor least significant bit and may exceed one degree. This paper compares model predictions with Tropical Rainfall Measuring Mission (TRMM) CSS measurements in order to validate and refine the model. Methods of reducing and mitigating the impact of Earth albedo are discussed. ne CSS sensor errors are roughly proportional to the Earth albedo coefficient. Photocells that are sensitive only to ultraviolet emissions would reduce the effective Earth albedo by up to a thousand times, virtually eliminating all errors caused by Earth albedo interference.

Brasoveanu, Dan↗

Coding for Communication Channels with Dead-Time Constraints

Coding schemes have been designed and investigated specifically for optical and electronic data-communication channels in which information is conveyed via pulse-position modulation (PPM) subject to dead-time constraints. These schemes involve the use of error-correcting codes concatenated with codes denoted constrained codes. These codes are decoded using an interactive method. In pulse-position modulation, time is partitioned into frames of Mslots of equal duration. Each frame contains one pulsed slot (all others are non-pulsed). For a given channel, the dead-time constraints are defined as a maximum and a minimum on the allowable time between pulses. For example, if a Q-switched laser is used to transmit the pulses, then the minimum allowable dead time is the time needed to recharge the laser for the next pulse. In the case of bits recorded on a magnetic medium, the minimum allowable time between pulses depends on the recording/playback speed and the minimum distance between pulses needed to prevent interference between adjacent bits during readout. The maximum allowable dead time for a given channel is the maximum time for which it is possible to satisfy the requirement to synchronize slots. In mathematical shorthand, the dead-time constraints for a given channel are represented by the pair of integers (d,k), where d is the minimum allowable number of zeroes between ones and k is the maximum allowable number of zeroes between ones. A system of the type to which the present schemes apply is represented by a binary- input, real-valued-output channel model illustrated in the figure. At the transmitting end, information bits are first encoded by use of an error-correcting code, then further encoded by use of a constrained code. Several constrained codes for channels subject to constraints of (d,infinity) have been investigated theoretically and computationally. The baseline codes chosen for purposes of comparison were simple PPM codes characterized by M-slot PPM frames separated by d-slot dead times.

Moision, Bruce↗

Microdensitometer errors: Their effect on photometric data reduction

The performance of densitometers used for photometric data reduction of high dynamic range electrographic plate material is analyzed. Densitometer repeatability is tested by comparing two scans of one plate. Internal densitometer errors are examined by constructing histograms of digitized densities and finding inoperative bits and differential nonlinearity in the analog to digital converter. Such problems appear common to the four densitometers used in this investigation and introduce systematic algorithm dependent errors in the results. Strategies to improve densitometer performance are suggested.

Bozyan, E. P.↗

Extending the impulse response in order to reduce errors due to impulse noise and signal fading

A finite impulse response (FIR) digital smearing filter was designed to produce maximum intersymbol interference and maximum extension of the impulse response of the signal in a noiseless binary channel. A matched FIR desmearing filter at the receiver then reduced the intersymbol interference to zero. Signal fades were simulated by means of 100 percent signal blockage in the channel. Smearing and desmearing filters of length 256, 512, and 1024 were used for these simulations. Results indicate that impulse response extension by means of bit smearing appears to be a useful technique for correcting errors due to impulse noise or signal fading in a binary channel.

Webb, Joseph A.↗

Injecting Errors for Testing Built-In Test Software

Two algorithms have been conceived to enable automated, thorough testing of Built-in test (BIT) software. The first algorithm applies to BIT routines that define pass/fail criteria based on values of data read from such hardware devices as memories, input ports, or registers. This algorithm simulates effects of errors in a device under test by (1) intercepting data from the device and (2) performing AND operations between the data and the data mask specific to the device. This operation yields values not expected by the BIT routine. This algorithm entails very small, permanent instrumentation of the software under test (SUT) for performing the AND operations. The second algorithm applies to BIT programs that provide services to users application programs via commands or callable interfaces and requires a capability for test-driver software to read and write the memory used in execution of the SUT. This algorithm identifies all SUT code execution addresses where errors are to be injected, then temporarily replaces the code at those addresses with small test code sequences to inject latent severe errors, then determines whether, as desired, the SUT detects the errors and recovers

Gender, Thomas K.↗

The use of minimum order state observers in digital flight-control systems.

This paper deals with the problem of selecting the 'arbitrary' design parameters of digital state observers when they are being used as a part of a digital flight-control system. A cost index is developed which indicates the output noise caused by input quantization due to analog-to-digital conversion. The cost index assumes that the input quantization error is uniformly distributed over the least-significant-bit of the conversion. Formulas relating the cost index to the observer design parameters are presented. The cost index is minimized with respect to the design parameters using a conjugate gradient algorithm. An example of the theory is presented in which a digital observer is designed so that a satisfactory digital flight-control system is obtained starting from an unacceptable one.

Montgomery, R. C.↗

Compressed/reconstructed test images for CRAF/Cassini

A set of compressed, then reconstructed, test images submitted to the Comet Rendezvous Asteroid Flyby (CRAF)/Cassini project is presented as part of its evaluation of near lossless high compression algorithms for representing image data. A total of seven test image files were provided by the project. The seven test images were compressed, then reconstructed with high quality (root mean square error of approximately one or two gray levels on an 8 bit gray scale), using discrete cosine transforms or Hadamard transforms and efficient entropy coders. The resulting compression ratios varied from about 2:1 to about 10:1, depending on the activity or randomness in the source image. This was accomplished without any special effort to optimize the quantizer or to introduce special postprocessing to filter the reconstruction errors. A more complete set of measurements, showing the relative performance of the compression algorithms over a wide range of compression ratios and reconstruction errors, shows that additional compression is possible at a small sacrifice in fidelity.

Dolinar, S.↗

Reed Solomon codes for error control in byte organized computer memory systems

A problem in designing semiconductor memories is to provide some measure of error control without requiring excessive coding overhead or decoding time. In LSI and VLSI technology, memories are often organized on a multiple bit (or byte) per chip basis. For example, some 256K-bit DRAM's are organized in 32Kx8 bit-bytes. Byte oriented codes such as Reed Solomon (RS) codes can provide efficient low overhead error control for such memories. However, the standard iterative algorithm for decoding RS codes is too slow for these applications. Some special decoding techniques for extended single-and-double-error-correcting RS codes which are capable of high speed operation are presented. These techniques are designed to find the error locations and the error values directly from the syndrome without having to use the iterative algorithm to find the error locator polynomial.

Lin, S.↗

Error control for reliable digital data transmission and storage systems

A problem in designing semiconductor memories is to provide some measure of error control without requiring excessive coding overhead or decoding time. In LSI and VLSI technology, memories are often organized on a multiple bit (or byte) per chip basis. For example, some 256K-bit DRAM's are organized in 32Kx8 bit-bytes. Byte oriented codes such as Reed Solomon (RS) codes can provide efficient low overhead error control for such memories. However, the standard iterative algorithm for decoding RS codes is too slow for these applications. In this paper we present some special decoding techniques for extended single-and-double-error-correcting RS codes which are capable of high speed operation. These techniques are designed to find the error locations and the error values directly from the syndrome without having to use the iterative alorithm to find the error locator polynomial. Two codes are considered: (1) a d sub min = 4 single-byte-error-correcting (SBEC), double-byte-error-detecting (DBED) RS code; and (2) a d sub min = 6 double-byte-error-correcting (DBEC), triple-byte-error-detecting (TBED) RS code.

Costello, D. J., Jr.↗

Validity of the two-level model for Viterbi decoder gap-cycle performance

A two-level model has previously been proposed for approximating the performance of a Viterbi decoder which encounters data received with periodically varying signal-to-noise ratio. Such cyclically gapped data is obtained from the Very Large Array (VLA), either operating as a stand-alone system or arrayed with Goldstone. This approximate model predicts that the decoder error rate will vary periodically between two discrete levels with the same period as the gap cycle. It further predicts that the length of the gapped portion of the decoder error cycle for a constraint length K decoder will be about K-1 bits shorter than the actual duration of the gap. The two-level model for Viterbi decoder performance with gapped data is subjected to detailed validation tests. Curves showing the cyclical behavior of the decoder error burst statistics are compared with the simple square-wave cycles predicted by the model. The validity of the model depends on a parameter often considered irrelevant in the analysis of Viterbi decoder performance, the overall scaling of the received signal or the decoder's branch-metrics. Three scaling alternatives are examined: optimum branch-metric scaling and constant branch-metric scaling combined with either constant noise-level scaling or constant signal-level scaling. The simulated decoder error cycle curves roughly verify the accuracy of the two-level model for both the case of optimum branch-metric scaling and the case of constant branch-metric scaling combined with constant noise-level scaling. However, the model is not accurate for the case of constant branch-metric scaling combined with constant signal-level scaling.

Dolinar, S.↗

Decoding of DBEC-TBED Reed-Solomon codes

A problem in designing semiconductor memories is to provide some measure of error control without requiring excessive coding overhead or decoding time. In LSI and VLSI technology, memories are often organized on a multiple bit (or byte) per chip basis. For example, some 256 K bit DRAM's are organized in 32 K x 8 bit-bytes. Byte-oriented codes such as Reed-Solomon (RS) codes can provide efficient low overhead error control for such memories. However, the standard iterative algorithm for decoding RS codes is too slow for these applications. The paper presents a special decoding technique for double-byte-error-correcting, triple-byte-error-detecting RS codes which is capable of high-speed operation. This technique is designed to find the error locations and the error values directly from the syndrome without having to use the iterative algorithm to find the error locator polynomial.

Deng, Robert H.↗

Highly linear, sensitive analog-to-digital converter

Analog-to-digital converter converts 10 volt full scale input signal into 13 bit digital output. Advantages include high sensitivity, linearity, low quantitizing error, high resistance to mechanical shock and vibration loads, and temporary data storage capabilities.

Cox, J.↗

Floating-point system quantization errors in digital control systems

The results are reported of research into the effects on system operation of signal quantization in a digital control system. The investigation considered digital controllers (filters) operating in floating-point arithmetic in either open-loop or closed-loop systems. An error analysis technique is developed, and is implemented by a digital computer program that is based on a digital simulation of the system. As an output the program gives the programing form required for minimum system quantization errors (either maximum of rms errors), and the maximum and rms errors that appear in the system output for a given bit configuration. The program can be integrated into existing digital simulations of a system.

Phillips, C. L.↗

The data-handling problem with television recording of spectra.

A television tube is a useful way to record a many-element picture such as is obtained from an echelle spectrograph. The signal on the tube target is scanned and relayed to the data-processing center where it must be reconstituted into the scene that was present in the focal plane of the spectrograph camera. A typical television frame will contain four million bits of information which must be processed to remove transmission errors and random noise pulses, to remove periodic noise, to correct for optical and electrical distortion, to remove sensitivity variations across the face of the tube, to calibrate from the photoelectrons back to incident energy, and to provide a wavelength scale. Results of a study of these problems is presented.

Underhill, A. B.↗

SEU/SET Tolerant Phase-Locked Loops

The phase-locked loop (PLL) is an old and widely used circuit for frequency and phase demodulation, carrier and clock recovery, and frequency synthesis [1]. Its implementations range from discrete components to fully integrated circuits and even to firmware or software. Often the PLL is a highly critical component of a system, as for example when it is used to derive the on-chip clock, but as of this writing no definitive single-event upset (SET)/single-event transient (SET) tolerant PLL circuit has been described. This chapter hopes to rectify that situation, at least in regard to PLLs that are used to generate clocks. Older literature on fault-tolerant PLLs deals with detection of a hard failure, which is recovered by replacement, repair, or manual restart of discrete component systems. Several patents exist along these lines (6349391, 6272647, and 7089442). A newer approach is to harden the parts of a PLL system, to one degree or another, such as by using a voltage-based charge pump or a triple modular redundant (TMR) voted voltage-controlled oscillator (VCO). A more comprehensive approach is to harden by triplication and voting (TMR) all the digital pieces (primarily the divider) of a frequency synthesis PLL, but this still leaves room for errors in the VCO and the loop filter. Instead of hardening or voting pieces of a system, such as a frequency synthesis system (i.e., clock multiplier), we will show how the entire system can be voted. There are two main ways of doing this, each with advantages and drawbacks. We will show how each has advantages in certain areas, depending on the lock acquisition and tracking characteristics of the PLL. Because of this dependency on PLL characteristics, we will briefly revisit the theory of PLLs. But first we will describe the characteristics of voters and their correct application, as some literature does not follow the voting procedure that guarantees elimination of errors. Additionally, we will find that voting clocks is a bit trickier than voting data where an infallible clock is assumed. It is our job here to produce (or recover) that assumed infallible clock!

Shuler, Robert L., Jr.↗