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At least 667 records · Page 37

Patterns of broad-beam antennas of different polarizations next to simple Hangar models

Broad-beam antennas of different polarizations radiating next to simple hangar models are investigated. Expressions that represent the elevation-plane patterns of slots in and 1/4 wavelength monopoles on a finite rectangular ground plane upon which a rectangular scattering object was placed were derived using geometrical theory of diffraction. These expressions were obtained by superposing the infinite ground plane solutions, reflected field solutions from the scattering object and diffracted field solutions in their respective regions of validity. Patterns for a 1/2 wavelength slot and 1/4 wavelength electric monopole are verified experimentally for a number of source locations. Data pertaining to the polarization question in regard to the multipath problem are presented.

Cockrell, C. R.↗

Diffraction theory techniques applied to aperture antennas on finite circular and square ground planes

Expressions which represent the elevation-plane patterns of a large TEM mode coax aperture and a TM-01 mode circular aperture on finite circular and square ground planes have been derived using geometrical theory of diffraction; design curves for the coax case are presented. The expressions for the field pattern were obtained by superposing the infinite ground plane solutions, the first-order diffracted field solutions, and the axial caustic solutions in their respective regions of validity. The pattern analyses for the coax and circular apertures are verified experimentally.

Cockrell, C. R.↗

Tomography of ultrarelativistic nuclei with polarized photon-gluon collisions

A linearly polarized photon can be quantized from the Lorentz-boosted electromagnetic field of a nucleus traveling at ultrarelativistic speed. When two relativistic heavy nuclei pass one another at a distance of a few nuclear radii, the photon from one nucleus may interact through a virtual quark-antiquark pair with gluons from the other nucleus, forming a short-lived vector meson (e.g., ρ 0 ). In this experiment, the polarization was used in diffractive photoproduction to observe a unique spin interference pattern in the angular distribution of ρ 0 → π + π – decays. The observed interference is a result of an overlap of two wave functions at a distance an order of magnitude larger than the ρ0 travel distance within its lifetime. The strong-interaction nuclear radii were extracted from these diffractive interactions and found to be 6.53 ± 0.06 fm ( 197 Au) and 7.29 ± 0.08 fm ( 238 U), larger than the nuclear charge radii. The observable is demonstrated to be sensitive to the nuclear geometry and quantum interference of nonidentical particles.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

Crystal Structure of Colloidally Prepared Metastable Ag 2 Se Nanocrystals

Structural polymorphism is known for many bulk materials; however, on the nanoscale metastable polymorphs tend to form more readily than in the bulk, and with more structural variety. One such metastable polymorph observed for colloidal Ag 2 Se nanocrystals has traditionally been referred to as the “tetragonal” phase. While there are reports on the chemistry and properties of this metastable polymorph, its crystal structure, and therefore electronic structure, has yet to be determined. We report that an anti-PbCl 2 -like structure type (space group P2 1 /n) more accurately describes the powder X-ray diffraction and X-ray total scattering patterns of colloidal Ag 2 Se nanocrystals prepared by several different methods. Density functional theory (DFT) calculations indicate that this anti-PbCl 2 -like Ag 2 Se polymorph is a dynamically stable, narrow-band-gap semiconductor. Here, the anti-PbCl 2 -like structure of Ag 2 Se is a low-lying metastable polymorph at 5–25 meV/atom above the ground state, depending on the exchange-correlation functional used.

77 NANOSCIENCE AND NANOTECHNOLOGY↗

On the Crystal Structure of Colloidally Prepared Metastable Ag2Se Nanocrystals

Structural polymorphism is known for many bulk materials; however, on the nanoscale metastable polymorphs tend to form more readily than in the bulk, and with more structural variety. One such metastable polymorph observed for colloidal Ag2Se nanocrystals has traditionally been referred to as the “tetragonal” phase of Ag2Se. While there are reports on the chemistry and properties of this metastable polymorph, its crystal structure, and therefore electronic structure, has yet to be determined. We report that an anti-PbCl2-like structure type (space group P21/n) accurately describes the powder X-ray diffraction and X-ray total scattering patterns of colloidal Ag2Se nanocrystals prepared by several different methods. Density functional theory (DFT) calculations indicate that the anti-PbCl2-like Ag2Se polymorph is a dynamically stable, narrow-band gap semiconductor. DFT results reveal a dense theoretical Ag2Se phase space with many low-energy polymorphs, which helps explain the large number of polymorphs reported in the literature. Analysis and calculation data are stored in the zip archive. The `ag2se-calcs.aiida.` contains the provenance of the calculations and can be imported into an AiiDA database instance. The antiPbCl2like_Ag2Se_laboratory.cif file is the Reitveld refined Ag2Se structure starting from the PbCl2 structure.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

A method for determining the preferred orientation of crystallites normal to a surface

Techniques representing the angular distribution of a particular direction in a crystallographic reference frame or analytical methods were developed. The data required by these techniques for displaying preferred orientation is obtained by measuring the orientation of a large number of crystallites. This may be done visually using etch-pit or Laue techniques which, experimentally, are both tedious and difficult. The intensities of X ray diffraction maxima are proportional to the number of crystallites whose crystallographic plane normals bisect the incident and diffracted beams. Parameters used in calculating powder patterns are also presented.

Snyder, R. L.↗

Analyzing Microchips With Dark-Field Negative Photomicrography

Inverse development process yields fine details. Photomicrographic technique produces images of integrated-circuit chips. Technique based on dark-field illumination: (chip lit with bright central spot of light and photographed by light scattered or diffracted from spot. Reveals more about microstructure patterns related to photoresist masking than more conventional bright-field method.

Suszko, S. F.↗

Amplitude and phase-shaping effects in beamwaveguides

Results are presented of an investigation on improvements in a geometrical optics (GO) design of a beam-waveguide antenna for operation at multiple frequency bands. Improvements might be possible by changing the design of the lower-frequency input pattern to the beam waveguide. The effects of amplitude and phase shaping the input pattern have been studied with an aperture diffraction model. Accurate vector near-field computations were made rapidly with a spherical wave expansion of the input and scattered fields. Numerical results indicate that for aperture sizes of less than 30 wavelengths, there is insufficient control on defocusing due to amplitude and phase shaping. Design tradeoffs on spillover loss and defocusing are possible by changing the amplitude and phase distribution of the input wavefront for larger size apertures.

Rengarajan, Sembiam R.↗

Extreme Universe Space Observatory (EUSO) Optics Module

A demonstration part will be manufactured in Japan on one of the large Toshiba machines with a diameter of 2.5 meters. This will be a flat PMMA disk that is cut between 0.5 and 1.25 meters radius. The cut should demonstrate manufacturing the most difficult parts of the 2.5 meter Fresnel pattern and the blazed grating on the diffractive surface. Optical simulations, validated with the subscale prototype, will be used to determine the limits on manufacturing errors (tolerances) that will result in optics that meet EUSO s requirements. There will be limits on surface roughness (or errors at high spatial frequency); radial and azimuthal slope errors (at lower spatial frequencies) and plunge cut depth errors in the blazed grating. The demonstration part will be measured to determine whether it was made within the allowable tolerances.

Young, Roy↗

Scattering effects of Space Station structure on Assembly/Contingency Subsystem (ACS) antenna performance

ACS antenna patterns were computed using the Geometrical Theory of Diffraction (GTD) modeling technique in which the multipath interference from the Space Station structures was included. The accuracy of the numerical results obtained is verified by comparing them against a series of RF anechoic chamber measurements. Less than 1 dB degradation is expected if a +/- 15 deg cone is used to protect the ACS high gain antenna boresight pattern; a +/- 20 deg cone is required if no more than 0.5 dB gain degradation is desired.

Hwu, Shian U.↗

Scattering patterns of dihedral corner reflectors with impedance surface impedances

The radar cross section patterns of lossy dihedral corner reflectors are calculated using a uniform geometrical theory of diffraction for impedance surfaces. All terms of up to third order reflections are considered for patterns in the principal plane. The surface waves are included whenever they exist for reactive surface impedances. The dihedral corner reflectors examined have right, obtuse, and acute interior angles, and patterns over the entire 360 deg azimuthal plane are calculated. The surface impedances can be different on the four faces of the dihedral corner reflector; however, the surface impedance must be uniform over each face. Computed cross sections are compared with a moment method technique for a dielectric/ferrite absorber coating on a metallic corner reflector. The analysis of the dihedral corner reflector is important because it demonstrates many of the important scattering contributors of complex targets including both interior and exterior wedge diffraction, half-plane diffraction, and dominant multiple reflections and diffractions.

Balanis, Constantine A.↗

Diffractive Optic Fluid Shear Stress Sensor

Light scattering off particles flowing through a two-slit inteference pattern can be used to measure the shear stress of the fluid. We have designed and fabricated a miniature diffractive optic sensor based on this principle.

fluid shear stress micro sensor non-invasive senso↗

Diffractive Optic Fluid Shear Stress Sensor

Light scattering off particles flowing through a two-slit interference pattern can be used to measure the shear stress of the fluid. We have designed and fabricated a miniature diffractive optic sensor based on this principle.

optics↗

Detecting Nanophase Weathering Products with CheMin: Reference Intensity Ratios of Allophane, Aluminosilicate Gel, and Ferrihydrite

X-ray diffraction (XRD) data collected of the Rocknest samples by the CheMin instrument on Mars Science Laboratory suggest the presence of poorly crystalline or amorphous materials [1], such as nanophase weathering products or volcanic and impact glasses. The identification of the type(s) of X-ray amorphous material at Rocknest is important because it can elucidate past aqueous weathering processes. The presence of volcanic and impact glasses would indicate that little chemical weathering has occurred because glass is highly susceptible to aqueous alteration. The presence of nanophase weathering products, such as allophane, nanophase iron-oxides, and/or palagonite, would indicate incipient chemical weathering. Furthermore, the types of weathering products present could help constrain pH conditions and identify which primary phases altered to form the weathering products. Quantitative analysis of phases from CheMin data is achieved through Reference Intensity Ratios (RIRs) and Rietveld refinement. The RIR of a mineral (or mineraloid) that relates the scattering power of that mineral (typically the most intense diffraction line) to the scattering power of a separate mineral standard such as corundum [2]. RIRs can be calculated from XRD patterns measured in the laboratory by mixing a mineral with a standard in known abundances and comparing diffraction line intensities of the mineral to the standard. X-ray amorphous phases (e.g., nanophase weathering products) have broad scattering signatures rather than sharp diffraction lines. Thus, RIRs of X-ray amorphous materials are calculated by comparing the area under one of these broad scattering signals with the area under a diffraction line in the standard. Here, we measured XRD patterns of nanophase weathering products (allophane, aluminosilicate gel, and ferrihydrite) mixed with a mineral standard (beryl) in the CheMinIV laboratory instrument and calculated their RIRs to help constrain the abundances of these phases in the Rocknest samples.

Rampe, E. B.↗

A GTD study of pyramidal horns for offset reflector antenna applications

An efficient computational method is demonstrated for determining the far-field patterns of reflectors illuminated by pyramidal horns. A uniform geometrical theory of diffraction (GTD) formulation is used to determine the near- and far-fields of the horn. The far-field patterns of the offset reflector are constructed using the physical optics (PO) formulation in conjunction with the Jacobi-Bessel expansion method. Many representative results are shown for the far-field patterns of the reflector. In particular, the concept of the optimum phase center for the best location of a horn illuminating a reflector is carefully studied and some useful observations are made.

Huang, J.↗

Extending in situ X-ray Temperature Diagnostics to Internal Components

Time-resolved X-ray thermometry is an enabling technology for measuring temperature and phase change of components. However, current diagnostic methods are limited in their ability due to the invasive nature of probes or the requirement of coatings and optical access to the component. Our proposed developments overcome these challenges by utilizing X-rays to directly measure the objects temperature. Variable-Temperature X-ray Diffraction (VT-XRD) was performed over a wide range of temperatures and diffraction angles and was performed on several materials to analyze the patterns of the bulk materials for sensitivity. "High-speed" VT-XRD was then performed for a single material over a small range of diffraction angles to see how fast the experiments could be performed, whilst still maintaining peaks sufficiently large enough for analysis.

36 MATERIALS SCIENCE↗